JP2008530546A5 - - Google Patents

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Publication number
JP2008530546A5
JP2008530546A5 JP2007554628A JP2007554628A JP2008530546A5 JP 2008530546 A5 JP2008530546 A5 JP 2008530546A5 JP 2007554628 A JP2007554628 A JP 2007554628A JP 2007554628 A JP2007554628 A JP 2007554628A JP 2008530546 A5 JP2008530546 A5 JP 2008530546A5
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Japan
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internal structure
measuring
output signals
wave energy
subset
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JP2007554628A
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Japanese (ja)
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JP5312802B2 (ja
JP2008530546A (ja
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Priority claimed from GBGB0502651.3A external-priority patent/GB0502651D0/en
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JP2007554628A 2005-02-09 2006-01-30 物体の内部構造を測定する方法および装置 Expired - Fee Related JP5312802B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GBGB0502651.3A GB0502651D0 (en) 2005-02-09 2005-02-09 Methods and apparatus for measuring the internal structure of an object
GB0502651.3 2005-02-09
PCT/GB2006/000303 WO2006085052A2 (en) 2005-02-09 2006-01-30 Methods and apparatus for measuring the internal structure of an object

Related Child Applications (1)

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JP2012243592A Division JP5646574B2 (ja) 2005-02-09 2012-11-05 物体の内部構造を測定する方法および装置

Publications (3)

Publication Number Publication Date
JP2008530546A JP2008530546A (ja) 2008-08-07
JP2008530546A5 true JP2008530546A5 (enExample) 2009-03-12
JP5312802B2 JP5312802B2 (ja) 2013-10-09

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JP2007554628A Expired - Fee Related JP5312802B2 (ja) 2005-02-09 2006-01-30 物体の内部構造を測定する方法および装置
JP2012243592A Expired - Fee Related JP5646574B2 (ja) 2005-02-09 2012-11-05 物体の内部構造を測定する方法および装置

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US (1) US20080071169A1 (enExample)
EP (1) EP1850743B1 (enExample)
JP (2) JP5312802B2 (enExample)
GB (1) GB0502651D0 (enExample)
WO (1) WO2006085052A2 (enExample)

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