JP2008511255A - 画素リセット電圧昇圧用画素 - Google Patents

画素リセット電圧昇圧用画素 Download PDF

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Publication number
JP2008511255A
JP2008511255A JP2007529958A JP2007529958A JP2008511255A JP 2008511255 A JP2008511255 A JP 2008511255A JP 2007529958 A JP2007529958 A JP 2007529958A JP 2007529958 A JP2007529958 A JP 2007529958A JP 2008511255 A JP2008511255 A JP 2008511255A
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JP
Japan
Prior art keywords
transistor
storage node
circuit
reset
output
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2007529958A
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English (en)
Japanese (ja)
Inventor
リチャード、エイ．マウリッツォン
ジョーイ、シャー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Micron Technology Inc
Original Assignee
Micron Technology Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Micron Technology Inc filed Critical Micron Technology Inc
Publication of JP2008511255A publication Critical patent/JP2008511255A/ja
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/50—Control of the SSIS exposure
    • H04N25/57—Control of the dynamic range
    • H04N25/59—Control of the dynamic range by controlling the amount of charge storable in the pixel, e.g. modification of the charge conversion ratio of the floating node capacitance
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
    • H01L27/144—Devices controlled by radiation
    • H01L27/146—Imager structures
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/771—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising storage means other than floating diffusion

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2007529958A 2004-08-25 2005-08-18 画素リセット電圧昇圧用画素 Pending JP2008511255A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/925,172 US7652704B2 (en) 2004-08-25 2004-08-25 Pixel for boosting pixel reset voltage
PCT/US2005/029179 WO2006026163A1 (en) 2004-08-25 2005-08-18 Pixel for boosting pixel reset voltage

Publications (1)

Publication Number Publication Date
JP2008511255A true JP2008511255A (ja) 2008-04-10

Family

ID=35455987

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007529958A Pending JP2008511255A (ja) 2004-08-25 2005-08-18 画素リセット電圧昇圧用画素

Country Status (7)

Country Link
US (2) US7652704B2 (ko)
EP (1) EP1784974A1 (ko)
JP (1) JP2008511255A (ko)
KR (1) KR20070055545A (ko)
CN (1) CN101044749A (ko)
TW (1) TWI309809B (ko)
WO (1) WO2006026163A1 (ko)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012010106A (ja) * 2010-06-24 2012-01-12 Canon Inc 固体撮像装置及び固体撮像装置の駆動方法

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EP1459356A2 (en) * 2001-12-21 2004-09-22 Koninklijke Philips Electronics N.V. Image pick-up device and camera system comprising an image pick-up device
JP4161855B2 (ja) * 2003-09-10 2008-10-08 ソニー株式会社 固体撮像装置、駆動制御方法及び駆動制御装置
US7446807B2 (en) * 2004-12-03 2008-11-04 Micron Technology, Inc. Imager pixel with capacitance for boosting reset voltage
JP4955262B2 (ja) * 2004-12-07 2012-06-20 サムスン エレクトロニクス カンパニー リミテッド 液晶表示装置、光感知素子、及びバックライト光源の照度制御装置
US7791664B1 (en) * 2006-07-20 2010-09-07 Advasense Technologies Ltd. Methods for reading a pixel and for writing to a pixel and a device having pixel reading capabilities and pixel writing capabilities
CN102017147B (zh) 2007-04-18 2014-01-29 因维萨热技术公司 用于光电装置的材料、系统和方法
US20100044676A1 (en) 2008-04-18 2010-02-25 Invisage Technologies, Inc. Photodetectors and Photovoltaics Based on Semiconductor Nanocrystals
US8525287B2 (en) 2007-04-18 2013-09-03 Invisage Technologies, Inc. Materials, systems and methods for optoelectronic devices
KR101344441B1 (ko) * 2007-07-16 2013-12-23 삼성전자 주식회사 이미지 센서 및 그 제조 방법
JP2009130679A (ja) * 2007-11-26 2009-06-11 Sony Corp 固体撮像素子、固体撮像素子の駆動方法および撮像装置
US8203195B2 (en) 2008-04-18 2012-06-19 Invisage Technologies, Inc. Materials, fabrication equipment, and methods for stable, sensitive photodetectors and image sensors made therefrom
JP5029624B2 (ja) * 2009-01-15 2012-09-19 ソニー株式会社 固体撮像装置及び電子機器
CN101902583B (zh) * 2009-05-26 2013-03-13 英属开曼群岛商恒景科技股份有限公司 影像传感器及具有高转换增益的低噪声像素读出电路
KR101074795B1 (ko) * 2009-07-03 2011-10-19 삼성모바일디스플레이주식회사 광 센싱 회로, 이를 포함하는 터치 패널, 및 광 센싱 회로의 구동 방법
CN102782622B (zh) 2010-03-12 2016-11-02 株式会社半导体能源研究所 显示装置的驱动方法
US8916947B2 (en) 2010-06-08 2014-12-23 Invisage Technologies, Inc. Photodetector comprising a pinned photodiode that is formed by an optically sensitive layer and a silicon diode
KR102008233B1 (ko) 2012-06-29 2019-08-07 삼성전자주식회사 거리 측정 장치 및 상기 거리 측정 장치를 이용한 거리 측정 방법
CN104427266B (zh) * 2013-09-03 2017-08-25 英属开曼群岛商恒景科技股份有限公司 像素感测单元
US9560301B2 (en) * 2014-05-16 2017-01-31 Taiwan Semiconductor Manufacturing Company, Ltd. Pixel unit cell having conversion circuit
US10110783B2 (en) * 2017-03-27 2018-10-23 Omnivision Technologies, Inc. Image sensor precharge boost
CN108205152B (zh) * 2018-02-26 2019-06-28 京东方科技集团股份有限公司 一种像元电路、其驱动方法及x射线探测器
KR102476751B1 (ko) * 2018-03-29 2022-12-13 에스케이하이닉스 주식회사 전자 장치
US10728472B2 (en) * 2018-10-09 2020-07-28 Shenzhen Goodix Technology Co., Ltd Image sensor with dynamic charge-domain sampling
US11451729B2 (en) 2018-10-24 2022-09-20 Ningbo ABAX Sensing Electronic Technology Co., Ltd. Reset method, reset device, and reset system and pixel array using the same
KR20200118687A (ko) 2019-04-08 2020-10-16 삼성전자주식회사 이미지 센서 장치 및 그것의 동작 방법
US10771725B1 (en) * 2019-07-03 2020-09-08 Himax Imaging Limited Pixel circuit

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0591424A (ja) * 1991-09-30 1993-04-09 Mitsubishi Electric Corp 電荷転送装置の駆動方法
JPH11355664A (ja) * 1998-06-05 1999-12-24 Matsushita Electron Corp 固体撮像装置およびその駆動方法
JP2003087662A (ja) * 2001-09-17 2003-03-20 Sony Corp 固体撮像装置

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US5952686A (en) * 1997-12-03 1999-09-14 Hewlett-Packard Company Salient integration mode active pixel sensor
US6046444A (en) * 1997-12-08 2000-04-04 Intel Corporation High sensitivity active pixel with electronic shutter
US6850278B1 (en) * 1998-11-27 2005-02-01 Canon Kabushiki Kaisha Solid-state image pickup apparatus
US6252462B1 (en) * 1999-06-30 2001-06-26 Raytheon Company Capacitor transimpedance amplifier ( CTIA) with shared load
US7053945B1 (en) * 2000-07-26 2006-05-30 Micron Technolopgy, Inc. Image sensor having boosted reset
US7224389B2 (en) * 2001-07-16 2007-05-29 Cypress Semiconductor Corporation (Belgium) Bvba Method to adjust the signal level of an active pixel and corresponding active pixel
US6504196B1 (en) 2001-08-30 2003-01-07 Micron Technology, Inc. CMOS imager and method of formation
CN1225897C (zh) * 2002-08-21 2005-11-02 佳能株式会社 摄像装置
US7277129B1 (en) * 2002-10-31 2007-10-02 Sensata Technologies, Inc. Pixel design including in-pixel correlated double sampling circuit
JP4161855B2 (ja) * 2003-09-10 2008-10-08 ソニー株式会社 固体撮像装置、駆動制御方法及び駆動制御装置

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0591424A (ja) * 1991-09-30 1993-04-09 Mitsubishi Electric Corp 電荷転送装置の駆動方法
JPH11355664A (ja) * 1998-06-05 1999-12-24 Matsushita Electron Corp 固体撮像装置およびその駆動方法
JP2003087662A (ja) * 2001-09-17 2003-03-20 Sony Corp 固体撮像装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012010106A (ja) * 2010-06-24 2012-01-12 Canon Inc 固体撮像装置及び固体撮像装置の駆動方法

Also Published As

Publication number Publication date
US20060044438A1 (en) 2006-03-02
TW200622968A (en) 2006-07-01
WO2006026163A1 (en) 2006-03-09
US7652704B2 (en) 2010-01-26
EP1784974A1 (en) 2007-05-16
US20100097509A1 (en) 2010-04-22
US8026969B2 (en) 2011-09-27
KR20070055545A (ko) 2007-05-30
CN101044749A (zh) 2007-09-26
TWI309809B (en) 2009-05-11

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