JP2008219232A5 - - Google Patents
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- Publication number
- JP2008219232A5 JP2008219232A5 JP2007051170A JP2007051170A JP2008219232A5 JP 2008219232 A5 JP2008219232 A5 JP 2008219232A5 JP 2007051170 A JP2007051170 A JP 2007051170A JP 2007051170 A JP2007051170 A JP 2007051170A JP 2008219232 A5 JP2008219232 A5 JP 2008219232A5
- Authority
- JP
- Japan
- Prior art keywords
- signal
- type transistor
- circuit
- delay clock
- inverter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 230000003111 delayed effect Effects 0.000 claims description 38
- 239000004065 semiconductor Substances 0.000 claims description 26
- 239000000758 substrate Substances 0.000 claims description 24
- 230000001934 delay Effects 0.000 claims description 4
- 239000011159 matrix material Substances 0.000 claims description 4
- 230000007704 transition Effects 0.000 claims description 4
- 230000000630 rising effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 24
- 230000004913 activation Effects 0.000 description 18
- 230000004044 response Effects 0.000 description 10
- 238000001514 detection method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 230000007257 malfunction Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000007599 discharging Methods 0.000 description 2
- 238000000605 extraction Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 238000007796 conventional method Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 1
- 238000007562 laser obscuration time method Methods 0.000 description 1
- 230000003068 static effect Effects 0.000 description 1
- 230000009466 transformation Effects 0.000 description 1
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007051170A JP2008219232A (ja) | 2007-03-01 | 2007-03-01 | 半導体集積回路 |
| US12/027,411 US20080211556A1 (en) | 2007-03-01 | 2008-02-07 | Semiconductor integrated circuit |
| CNA2008100809379A CN101256824A (zh) | 2007-03-01 | 2008-02-29 | 半导体集成电路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2007051170A JP2008219232A (ja) | 2007-03-01 | 2007-03-01 | 半導体集積回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2008219232A JP2008219232A (ja) | 2008-09-18 |
| JP2008219232A5 true JP2008219232A5 (enExample) | 2010-02-25 |
Family
ID=39732670
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2007051170A Withdrawn JP2008219232A (ja) | 2007-03-01 | 2007-03-01 | 半導体集積回路 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20080211556A1 (enExample) |
| JP (1) | JP2008219232A (enExample) |
| CN (1) | CN101256824A (enExample) |
Families Citing this family (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP5963647B2 (ja) * | 2012-01-30 | 2016-08-03 | エスアイアイ・セミコンダクタ株式会社 | 半導体記憶回路を備えた半導体装置 |
| CN110956990B (zh) * | 2018-09-26 | 2022-03-01 | 展讯通信(上海)有限公司 | Sram读取延时控制电路及sram |
| CN114545807B (zh) * | 2020-11-25 | 2024-03-26 | 长鑫存储技术有限公司 | 控制电路和延时电路 |
| EP4033661B1 (en) | 2020-11-25 | 2024-01-24 | Changxin Memory Technologies, Inc. | Control circuit and delay circuit |
| US11681313B2 (en) | 2020-11-25 | 2023-06-20 | Changxin Memory Technologies, Inc. | Voltage generating circuit, inverter, delay circuit, and logic gate circuit |
| EP4033664B1 (en) | 2020-11-25 | 2024-01-10 | Changxin Memory Technologies, Inc. | Potential generation circuit, inverter, delay circuit, and logic gate circuit |
| EP4033312B1 (en) | 2020-11-25 | 2024-08-21 | Changxin Memory Technologies, Inc. | Control circuit and delay circuit |
| CN114582392B (zh) * | 2021-12-14 | 2025-04-18 | 上海华力集成电路制造有限公司 | 写入辅助电路 |
Family Cites Families (25)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3071915B2 (ja) * | 1991-12-20 | 2000-07-31 | 株式会社東芝 | 出力回路 |
| US5424985A (en) * | 1993-06-30 | 1995-06-13 | Sgs-Thomson Microelectronics, Inc. | Compensating delay element for clock generation in a memory device |
| US5841300A (en) * | 1994-04-18 | 1998-11-24 | Hitachi, Ltd. | Semiconductor integrated circuit apparatus |
| US6590423B1 (en) * | 1994-10-11 | 2003-07-08 | Derek Wong | Digital circuits exhibiting reduced power consumption |
| US5517136A (en) * | 1995-03-03 | 1996-05-14 | Intel Corporation | Opportunistic time-borrowing domino logic |
| US5661675A (en) * | 1995-03-31 | 1997-08-26 | Intel Corporation | Positive feedback circuit for fast domino logic |
| US6104213A (en) * | 1998-03-02 | 2000-08-15 | International Business Machines Corporation | Domino logic circuit having a clocked precharge |
| US6097207A (en) * | 1998-08-21 | 2000-08-01 | International Business Machines Corporation | Robust domino circuit design for high stress conditions |
| JP3358612B2 (ja) * | 1999-03-15 | 2002-12-24 | 日本電気株式会社 | 半導体集積回路 |
| JP3241686B2 (ja) * | 1999-03-26 | 2001-12-25 | 日本電気株式会社 | ダイナミック型論理回路及びドミノ論理素子 |
| US6137319A (en) * | 1999-04-30 | 2000-10-24 | Intel Corporation | Reference-free single ended clocked sense amplifier circuit |
| US6346831B1 (en) * | 1999-09-28 | 2002-02-12 | Intel Corporation | Noise tolerant wide-fanin domino circuits |
| US6549040B1 (en) * | 2000-06-29 | 2003-04-15 | Intel Corporation | Leakage-tolerant keeper with dual output generation capability for deep sub-micron wide domino gates |
| US6469953B1 (en) * | 2001-08-08 | 2002-10-22 | Intel Corporation | Latch circuit |
| US6429689B1 (en) * | 2001-10-10 | 2002-08-06 | International Business Machines Corporation | Method and apparatus for controlling both active and standby power in domino circuits |
| US6933744B2 (en) * | 2002-06-11 | 2005-08-23 | The Regents Of The University Of Michigan | Low-leakage integrated circuits and dynamic logic circuits |
| US7218151B1 (en) * | 2002-06-28 | 2007-05-15 | University Of Rochester | Domino logic with variable threshold voltage keeper |
| JP2004048313A (ja) * | 2002-07-11 | 2004-02-12 | Matsushita Electric Ind Co Ltd | ダイナミック回路 |
| US6765414B2 (en) * | 2002-09-17 | 2004-07-20 | Intel Corporation | Low frequency testing, leakage control, and burn-in control for high-performance digital circuits |
| US7034576B2 (en) * | 2003-06-27 | 2006-04-25 | Sun Microsystems, Inc. | Pulsed dynamic keeper gating |
| US7202705B2 (en) * | 2004-10-14 | 2007-04-10 | International Business Machines Corporation | Dynamic logic circuit apparatus and method for reducing leakage power consumption via separate clock and output stage control |
| US7282960B2 (en) * | 2005-06-28 | 2007-10-16 | International Business Machines Corporation | Dynamic logical circuit having a pre-charge element separately controlled by a voltage-asymmetric clock |
| JP2007096907A (ja) * | 2005-09-29 | 2007-04-12 | Matsushita Electric Ind Co Ltd | 半導体集積回路 |
| US7764087B2 (en) * | 2006-02-01 | 2010-07-27 | Wisconsin Alumni Research Foundation | Low swing domino logic circuits |
| US7332938B2 (en) * | 2006-06-23 | 2008-02-19 | The Curators Of The University Of Missouri | Domino logic testing systems and methods |
-
2007
- 2007-03-01 JP JP2007051170A patent/JP2008219232A/ja not_active Withdrawn
-
2008
- 2008-02-07 US US12/027,411 patent/US20080211556A1/en not_active Abandoned
- 2008-02-29 CN CNA2008100809379A patent/CN101256824A/zh active Pending
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