JP2008112988A5 - - Google Patents

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Publication number
JP2008112988A5
JP2008112988A5 JP2007260681A JP2007260681A JP2008112988A5 JP 2008112988 A5 JP2008112988 A5 JP 2008112988A5 JP 2007260681 A JP2007260681 A JP 2007260681A JP 2007260681 A JP2007260681 A JP 2007260681A JP 2008112988 A5 JP2008112988 A5 JP 2008112988A5
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JP
Japan
Prior art keywords
electrode
semiconductor device
insulating film
thin film
semiconductor layer
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Application number
JP2007260681A
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English (en)
Japanese (ja)
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JP5296360B2 (ja
JP2008112988A (ja
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Priority to JP2007260681A priority Critical patent/JP5296360B2/ja
Priority claimed from JP2007260681A external-priority patent/JP5296360B2/ja
Publication of JP2008112988A publication Critical patent/JP2008112988A/ja
Publication of JP2008112988A5 publication Critical patent/JP2008112988A5/ja
Application granted granted Critical
Publication of JP5296360B2 publication Critical patent/JP5296360B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2007260681A 2006-10-04 2007-10-04 半導体装置およびその作製方法 Expired - Fee Related JP5296360B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007260681A JP5296360B2 (ja) 2006-10-04 2007-10-04 半導体装置およびその作製方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006273394 2006-10-04
JP2006273394 2006-10-04
JP2007260681A JP5296360B2 (ja) 2006-10-04 2007-10-04 半導体装置およびその作製方法

Publications (3)

Publication Number Publication Date
JP2008112988A JP2008112988A (ja) 2008-05-15
JP2008112988A5 true JP2008112988A5 (https=) 2010-11-11
JP5296360B2 JP5296360B2 (ja) 2013-09-25

Family

ID=39445318

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007260681A Expired - Fee Related JP5296360B2 (ja) 2006-10-04 2007-10-04 半導体装置およびその作製方法

Country Status (1)

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JP (1) JP5296360B2 (https=)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5415713B2 (ja) * 2008-05-23 2014-02-12 株式会社半導体エネルギー研究所 半導体装置
US8044499B2 (en) 2008-06-10 2011-10-25 Semiconductor Energy Laboratory Co., Ltd. Wiring substrate, manufacturing method thereof, semiconductor device, and manufacturing method thereof
JP5473413B2 (ja) 2008-06-20 2014-04-16 株式会社半導体エネルギー研究所 配線基板の作製方法、アンテナの作製方法及び半導体装置の作製方法
JP2010041045A (ja) 2008-07-09 2010-02-18 Semiconductor Energy Lab Co Ltd 半導体装置及びその作製方法
WO2010032599A1 (en) 2008-09-19 2010-03-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP5583951B2 (ja) 2008-11-11 2014-09-03 株式会社半導体エネルギー研究所 半導体装置の作製方法
JP5470054B2 (ja) 2009-01-22 2014-04-16 株式会社半導体エネルギー研究所 半導体装置
JP7559563B2 (ja) * 2020-01-28 2024-10-02 東レ株式会社 無線通信デバイス、およびその製造方法

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3559580B2 (ja) * 1993-12-17 2004-09-02 財団法人国際科学振興財団 半導体装置
JP3501416B2 (ja) * 1994-04-28 2004-03-02 忠弘 大見 半導体装置
JPH08316324A (ja) * 1995-05-16 1996-11-29 Kawasaki Steel Corp 半導体集積回路装置の製造方法
JP4912641B2 (ja) * 2004-08-23 2012-04-11 株式会社半導体エネルギー研究所 無線チップの作製方法

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