JP2008047657A - Electrostatic chuck device - Google Patents

Electrostatic chuck device Download PDF

Info

Publication number
JP2008047657A
JP2008047657A JP2006220786A JP2006220786A JP2008047657A JP 2008047657 A JP2008047657 A JP 2008047657A JP 2006220786 A JP2006220786 A JP 2006220786A JP 2006220786 A JP2006220786 A JP 2006220786A JP 2008047657 A JP2008047657 A JP 2008047657A
Authority
JP
Japan
Prior art keywords
terminal
electrostatic chuck
tip
end member
base end
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006220786A
Other languages
Japanese (ja)
Other versions
JP4767788B2 (en
Inventor
Naotoshi Morita
直年 森田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Niterra Co Ltd
Original Assignee
NGK Spark Plug Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NGK Spark Plug Co Ltd filed Critical NGK Spark Plug Co Ltd
Priority to JP2006220786A priority Critical patent/JP4767788B2/en
Publication of JP2008047657A publication Critical patent/JP2008047657A/en
Application granted granted Critical
Publication of JP4767788B2 publication Critical patent/JP4767788B2/en
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Abstract

<P>PROBLEM TO BE SOLVED: To prevent an occurrence of an excessive bending moment to a chuck side terminal when the chuck side terminal on the back side of an electrostatic chuck is joined to the other side terminal of a processing device side, even though there is a planar displacement between the both terminals. <P>SOLUTION: The chuck side terminal 31 is formed with a base end member 32 joined to the back side 4 of the electrostatic chuck 1a, and a front edge member 36 joined to a front edge 35 of the base substance member 32. Both a plug terminal 32b of the front edge 35 of the base substance member 32 and a socket terminal 37 of the base edge of the front edge member 36 are fit and joined. An elastically deformable metallic intermediary joining member 61 is interposed between the inner periphery surface and the outer circumference surface of the socket termianl 37 and the plug terminal 32b, and the front edge member 36 is joined to the base edge member 32 eccentrically and sideling by the deformation. The front edge member 36 is screwed down to a screw 56 of the inner periphery surface of an insulating member 51 fixed within a through-hole 26 of a base member 21 through a screw 38 of the outer circumference surface of the socket terminal 37. <P>COPYRIGHT: (C)2008,JPO&INPIT

Description

本発明は、半導体の製造において使用されるエッチング装置、イオン注入装置、或いは電子ビーム露光装置などにおいて、半導体ウエハの固定、平面度の矯正、或いは搬送に用いられる静電チャック装置に関する。   The present invention relates to an electrostatic chuck device used for fixing a semiconductor wafer, correcting flatness, or transporting it in an etching apparatus, ion implantation apparatus, electron beam exposure apparatus or the like used in semiconductor manufacturing.

半導体の製造工程において、半導体ウエハ(例えば、シリコンウエハ)に精度良く成膜やドライエッチング等の処理(加工)を施すには、その処理装置において、半導体ウエハの平面度(平坦度)を保ちながら、それを固定(保持)する必要がある。このような固定手段の代表的なものとして、静電気力によって半導体ウエハをチャックする静電チャックがある(特許文献1)。例えば、双極型の静電チャックは、セラミック基板の内部に、対をなす電極(静電電極)が形成されており、その電極間に電圧を印加することで発生する静電気力で半導体ウエハ等の被吸着部材(以下、単にウエハともいう)を吸着、固定するように構成されている。そして、この静電チャックは、通常、アルミニウム又はアルミニウム合金などの金属からなる金属製ベース部材の表面(上面)に、シリコン樹脂などの接着手段を介して接合して静電チャック装置を構成しており、半導体ウエハの処理目的に応じた処理装置に取り付けられてその使用に供される。   In a semiconductor manufacturing process, in order to perform processing (processing) such as film formation and dry etching with high accuracy on a semiconductor wafer (for example, a silicon wafer), the processing apparatus maintains the flatness of the semiconductor wafer. It is necessary to fix (hold) it. A typical example of such fixing means is an electrostatic chuck that chucks a semiconductor wafer by electrostatic force (Patent Document 1). For example, in a bipolar electrostatic chuck, a pair of electrodes (electrostatic electrodes) are formed inside a ceramic substrate, and a semiconductor wafer or the like is generated by electrostatic force generated by applying a voltage between the electrodes. A member to be attracted (hereinafter also simply referred to as a wafer) is configured to be attracted and fixed. This electrostatic chuck is usually joined to the surface (upper surface) of a metal base member made of a metal such as aluminum or aluminum alloy via an adhesive means such as silicon resin to constitute an electrostatic chuck device. The semiconductor wafer is attached to a processing apparatus according to the processing purpose of the semiconductor wafer and used for the use.

このような静電チャック装置をなす静電チャックには、その裏面に、静電電極に印加するための端子(チャック端子用のメタライズ層)、さらには基板に抵抗発熱ヒーターが内蔵されたものではそのヒーターに印加するための端子(ヒーター端子用のメタライズ層)がそれぞれ複数、焼成により形成されている。そして、その各端子(メタライズ層)には、通常、1本の軸材(ピン材)からなるチャック側端子(給電端子)がその基端部を介してロウ付け(又はハンダ付け)により接合され、静電チャックの裏面に突出状に設けられている(特許文献2)。このような静電チャックは、そのチャック側端子の配置に対応して形成された貫通孔を有する金属製ベース部材に接合されて静電チャック装置をなし、各チャック側端子はその貫通孔内において絶縁を保持して配置される。   An electrostatic chuck constituting such an electrostatic chuck device has a terminal (metallized layer for the chuck terminal) applied to the electrostatic electrode on the back surface, and a resistance heating heater built in the substrate. A plurality of terminals (metallized layers for heater terminals) to be applied to the heater are formed by firing. Each of the terminals (metallized layer) is usually joined by a brazing (or soldering) via a base end portion of a chuck side terminal (feeding terminal) made of one shaft material (pin material). The protrusion is provided on the back surface of the electrostatic chuck (Patent Document 2). Such an electrostatic chuck is joined to a metal base member having a through-hole formed corresponding to the arrangement of the chuck-side terminal to form an electrostatic chuck device, and each chuck-side terminal is placed in the through-hole. Arranged to retain insulation.

このような各チャック側端子は、従来、静電チャック装置を半導体ウエハの各処理装置に取り付ける際において、その処理装置側の静電チャック装置取付け部に設けられた相手側の処理装置側の端子(相手側端子)にそれぞれ電気的に接合される。そして、このチャック側端子と処理装置側の相手側端子との端子相互の接合は、従来は、静電チャック装置側のチャック側端子の先端面が処理装置の相手側の端子の先端面に、単に先端面同士が突合せ状をなして押付けられる形態の当接ないし圧接による接合とされていた。このため、その電気的な接合は、実質的には点ないし微小面積での接触となるものが普通であった。   Conventionally, each chuck side terminal is a terminal on the counterpart processing apparatus side provided in the electrostatic chuck apparatus mounting portion on the processing apparatus side when the electrostatic chuck apparatus is attached to each processing apparatus of the semiconductor wafer. It is electrically joined to each (mating terminal). Then, the mutual connection between the chuck-side terminal and the mating terminal on the processing apparatus side has conventionally been such that the tip surface of the chuck-side terminal on the electrostatic chuck apparatus side is the tip surface of the mating terminal on the processing apparatus, The tip surfaces are simply joined by contact or pressure contact in a form in which the end surfaces are pressed in a butting manner. For this reason, the electrical connection is usually a point or contact in a very small area.

ところが、このような両端子による端子接合構造では、両端子間の接触面積が十分に確保されないことがある。このため、静電チャック装置に内蔵された抵抗発熱体からなるヒーターへの電圧印加用のヒーター端子のように、比較的大電流を要する場合には、接触抵抗が増大し、接合の信頼性が得られないことがあるといった指摘があった。この対策としては、図7に示したように、静電チャック装置1のチャック側端子31をベース部材21の貫通孔内において突出状にし、処理装置側の相手側端子をソケット端子131とし、チャック側端子31がソケット端子131内に深く圧入されるように、両端子間の接触を多面接触として接触面積を大きく確保するようにした端子接合構造が採用されてきている。
特開2004−6505号公報 特開2004−31599号公報
However, in such a terminal joint structure using both terminals, a sufficient contact area between the two terminals may not be ensured. For this reason, when a relatively large current is required, such as a heater terminal for applying a voltage to a heater composed of a resistance heating element built in the electrostatic chuck device, the contact resistance is increased, and the reliability of bonding is increased. There was an indication that there were things that could not be obtained. As measures against this, as shown in FIG. 7, the chuck side terminal 31 of the electrostatic chuck device 1 is projected in the through hole of the base member 21, and the mating terminal on the processing device side is used as the socket terminal 131. A terminal joining structure has been adopted in which the contact between both terminals is multifaceted so as to ensure a large contact area so that the side terminal 31 is deeply press-fitted into the socket terminal 131.
JP 2004-6505 A JP 2004-31599 A

ところで、静電チャック装置側のチャック側端子を処理装置側の相手側端子をなすソケット端子(内)に圧入して接合する端子接合構造においては、静電チャック装置側の複数のチャック側端子の配置と、処理装置側の複数のソケット端子の配置とが、平面上、高精度で対応していることが要請される。しかし、チャック側端子の配置と、ソケット端子の配置とは、双方の端子相互間の寸法精度に付与されている許容誤差により、対応する両端子間には平面的な不一致(位置ずれ)が存在することがある。また、チャック側端子はセラミック基板の裏面(の端子)に垂直に接合されるべきであるが、誤差により微小な傾斜が発生していることもある。   By the way, in the terminal joining structure in which the chuck side terminal on the electrostatic chuck device side is press-fitted into the socket terminal (inside) that forms the mating terminal on the processing device side, the plurality of chuck side terminals on the electrostatic chuck device side are connected. The arrangement and the arrangement of the plurality of socket terminals on the processing apparatus side are required to correspond with high precision on a plane. However, due to the tolerance given to the dimensional accuracy between both terminals, there is a planar mismatch (positional deviation) between the corresponding terminals between the chuck-side terminals and the socket terminals. There are things to do. Further, the chuck-side terminal should be bonded perpendicularly to the back surface (terminal thereof) of the ceramic substrate, but a slight inclination may occur due to an error.

こうしたことから、静電チャック装置を処理装置側の静電チャック装置取付け部に取り付ける際において、処理装置側のソケット端子に静電チャック装置側のチャック側端子が圧入されるときには、チャック側端子が正規の深さまで円滑に挿入できない場合があった。すなわち、両端子間の挿入接合に際しては、対応する両端子の平面上の配置の不一致による位置ずれにより、ソケット端子の中央に各チャック側端子が圧入されることはないことから、チャック側端子にはその圧入方向とは異なる方向の横荷重がかかることがあった。より具体的には、両端子間の平面上の誤差(心ずれ)や、チャック側端子の傾斜の存在により、静電チャック装置を処理装置側の取付け部に取り付ける際において、複数のチャック側端子を対応するソケット端子に圧入するとき、静電チャックの裏面から突出しているチャック側端子に横方向の力が作用するためである。チャック側端子にこのような横方向の力が作用するときには、チャック側端子の根元に大な曲げモーメントがかかるなどより、その根元端面のロウ付け箇所がセラミック基板の端子(メタライズ層)から引き剥がされる形で分離したり、そのロウに破断やクラックが発生するなどの問題があった。   For this reason, when the electrostatic chuck device is attached to the electrostatic chuck device mounting portion on the processing device side, when the chuck side terminal on the electrostatic chuck device side is press-fitted into the socket terminal on the processing device side, the chuck side terminal is In some cases, it could not be smoothly inserted to the normal depth. That is, when inserting and joining between both terminals, each chuck side terminal is not press-fitted into the center of the socket terminal due to misalignment due to a mismatch in arrangement of the corresponding terminals on the plane. In some cases, a lateral load in a direction different from the press-fitting direction was applied. More specifically, when attaching the electrostatic chuck device to the processing device side mounting portion due to a planar error (center misalignment) between both terminals or the inclination of the chuck side terminal, a plurality of chuck side terminals This is because a lateral force acts on the chuck-side terminal protruding from the back surface of the electrostatic chuck when press-fitting into the corresponding socket terminal. When such a lateral force is applied to the chuck-side terminal, a large bending moment is applied to the base of the chuck-side terminal, and the brazed portion of the base end surface is peeled off from the terminal (metallized layer) on the ceramic substrate. There are problems such as separation in the form of cracks and breakage or cracks in the wax.

本発明は、こうした問題点に鑑みてなされたもので、その目的は、静電チャック装置のチャック側端子が処理装置側のソケット端子などの相手側端子に接合される際における前記問題点を発生させることのないチャック側端子を備えた静電チャック装置を提供することにある。   The present invention has been made in view of such problems, and the object thereof is to generate the above problems when the chuck side terminal of the electrostatic chuck apparatus is joined to a counterpart terminal such as a socket terminal on the processing apparatus side. It is an object of the present invention to provide an electrostatic chuck device having a chuck-side terminal that is not caused to occur.

上記課題を解決するための請求項1に記載の発明は、セラミック基板に静電電極が形成されてなる静電チャックと、この静電チャックの裏面に接合された金属製ベース部材とを含んでなる静電チャック装置であって、前記静電チャックの裏面から突出状に形成されたチャック側端子が、前記金属製ベース部材に形成された貫通孔内に絶縁を保持して配置されてなるものにおいて、
前記チャック側端子を、前記静電チャックの裏面に基端が接合された基端部材と、その基端部材の先端に接合された先端部材とで形成し、しかも、前記基端部材の先端と前記先端部材の基端のいずれか一方をソケット端子とすると共に他方をプラグ端子として両端子を嵌合して接合する端子構造とし、
前記ソケット端子と前記プラグ端子の内外周面間に、弾性変形可能の金属製中継接合部材を介在させ、この金属製中継接合部材の変形によって前記先端部材を前記基端部材に対して偏心及び傾斜の少なくともいずれかを可能に接合してなることを特徴とする。
The invention described in claim 1 for solving the above-described problems includes an electrostatic chuck in which an electrostatic electrode is formed on a ceramic substrate, and a metal base member bonded to the back surface of the electrostatic chuck. An electrostatic chuck device comprising a chuck-side terminal formed so as to protrude from the back surface of the electrostatic chuck, with insulation being provided in a through-hole formed in the metal base member In
The chuck-side terminal is formed by a base end member having a base end bonded to the back surface of the electrostatic chuck, and a tip member bonded to the tip of the base end member, and the tip end of the base end member A terminal structure in which either one of the proximal ends of the distal end member is a socket terminal and the other is a plug terminal to fit and join both terminals,
An elastically deformable metal relay joining member is interposed between the inner and outer peripheral surfaces of the socket terminal and the plug terminal, and the distal end member is eccentric and inclined with respect to the base end member by deformation of the metal relay joining member. It is characterized in that at least one of the above is joined.

請求項2に記載の発明は、セラミック基板に静電電極が形成されてなる静電チャックと、この静電チャックの裏面に接合された金属製ベース部材とを含んでなる静電チャック装置であって、前記静電チャックの裏面から突出状に形成されたチャック側端子が、前記金属製ベース部材に形成された貫通孔の内周面に固定された環状をなす絶縁部材の内側に配置されてなるものにおいて、
前記チャック側端子を、前記静電チャックの裏面に基端が接合された基端部材と、その基端部材の先端に接合された先端部材とで形成し、しかも前記基端部材の先端をプラグ端子とすると共に前記先端部材の基端をソケット端子として両端子を嵌合して接合する端子構造とし、
前記ソケット端子と前記プラグ端子の内外周面間に、弾性変形可能の金属製中継接合部材を介在させ、この金属製中継接合部材の変形によって前記先端部材を前記基端部材に対して偏心及び傾斜の少なくともいずれかを可能に接合してなると共に、
該先端部材を、そのソケット端子又はソケット端子寄り部位の外周面を介して、前記金属製ベース部材の貫通孔の内周面に固定された前記絶縁部材の内周面に固定してなることを特徴とする。
The invention according to claim 2 is an electrostatic chuck device comprising an electrostatic chuck having an electrostatic electrode formed on a ceramic substrate and a metal base member bonded to the back surface of the electrostatic chuck. A chuck-side terminal projecting from the back surface of the electrostatic chuck is disposed inside an annular insulating member fixed to an inner peripheral surface of a through-hole formed in the metal base member. In what
The chuck side terminal is formed by a base end member whose base end is joined to the back surface of the electrostatic chuck and a tip member joined to the tip of the base end member, and the tip of the base end member is plugged. A terminal structure in which both terminals are fitted and joined as a terminal with the base end of the tip member as a terminal,
An elastically deformable metal relay joining member is interposed between the inner and outer peripheral surfaces of the socket terminal and the plug terminal, and the distal end member is eccentric and inclined with respect to the base end member by deformation of the metal relay joining member. It is possible to join at least one of
The tip member is fixed to the inner peripheral surface of the insulating member fixed to the inner peripheral surface of the through hole of the metal base member via the outer peripheral surface of the socket terminal or the portion near the socket terminal. Features.

請求項3に記載の発明は、前記絶縁部材が、前記貫通孔の内周面に接着により固定されていることを特徴とする請求項2に記載の静電チャック装置である。そして、請求項4に記載の発明は、前記絶縁部材はその内周面にメスねじを備える一方、前記先端部材のソケット端子又はソケット端子寄り部位の外周面にはこのメスねじに螺合するオスねじを備えており、これらのねじにより、前記絶縁部材に前記先端部材をねじ込むことで固定すると共に、該先端部材を前記基端部材に接合してなることを特徴とする請求項2又は3に記載の静電チャック装置である。   The invention according to claim 3 is the electrostatic chuck device according to claim 2, wherein the insulating member is fixed to the inner peripheral surface of the through-hole by adhesion. According to a fourth aspect of the present invention, the insulating member has a female screw on its inner peripheral surface, while the outer peripheral surface of the socket member or the portion near the socket terminal of the tip member is screwed into the female screw. A screw is provided, and the tip member is fixed by screwing into the insulating member with these screws, and the tip member is joined to the base end member. It is an electrostatic chuck apparatus of description.

請求項5に記載の発明は、前記先端部材は、そのソケット端子又はソケット端子寄り部位の外周面を介して、前記絶縁部材の内周面に接着により固定されていることを特徴とする請求項2〜4のいずれか1項に記載の静電チャック装置である。そして、請求項6に記載の発明は、前記先端部材の先端をオス端子形状とした請求項1〜5のいずれか1項に記載の静電チャック装置である。さらに、請求項7に記載の発明は、前記静電チャックはその内部に抵抗発熱体からなるヒーターが設けられており、前記チャック側端子が、そのヒーターへの給電用のものであることを特徴とする請求項1〜6のいずれか1項に記載の静電チャック装置である。   The invention according to claim 5 is characterized in that the tip member is fixed to the inner peripheral surface of the insulating member by adhesion via the outer peripheral surface of the socket terminal or a portion near the socket terminal. It is an electrostatic chuck apparatus of any one of 2-4. And the invention of Claim 6 is an electrostatic chuck apparatus of any one of Claims 1-5 which made the front-end | tip of the said front-end | tip member the male terminal shape. Furthermore, the invention described in claim 7 is characterized in that the electrostatic chuck is provided with a heater made of a resistance heating element, and the chuck side terminal is for supplying power to the heater. It is an electrostatic chuck apparatus of any one of Claims 1-6.

本発明の静電チャック装置においては、チャック側端子は、従来のように金属製の1本の軸材(ピン材)からなるのではなく、上記した基端部材と先端部材との接合構造からなるものとされている。したがって、このような先端部材を有する静電チャック装置を処理装置側の取付け部に取り付ける際においては、次のような作用効果が得られる。すなわち、この取付けにおいて、本願発明の静電チャック装置におけるチャック側端子をなす先端部材と、処理装置側の相手側端子とが嵌合で接合される際には、両端子間に平面的な誤差(位置ずれ)があったとしても、前記先端部材が前記金属製中継接合部材の変形(潰され)により、前記基端部材に対して偏心及び傾斜の少なくともいずれかを可能に接合されていることから、その誤差を吸収して接合される。すなわち、相手側端子との間に、平面上の誤差があると、チャック側端子の先端部材には相手側端子から横方向の力を受けるが、発明の静電チャック装置においては、そのような力が作用しても、先端部材は基端部材に対して金属製中継接合部材が変形することで、その分、偏心及び傾斜が許容されるため、相手側端子との間の平面上等の誤差を吸収して接合することができる。したがって、先端部材が相手側端子と深く嵌合されるような場合でも、静電チャックの裏面の端子に接合されている基端部材の基端(根元部位)には、従来のような金属製の1本の軸材からなるチャック側端子による場合に比べると、大きな力や曲げモーメントが作用することがない。よって、基端部材の基端がロウ付け等の接合手段によって静電チャックの裏面の端子に接合されている部位であっても、その接合が破断する等の問題の発生を有効に防止できる。   In the electrostatic chuck device of the present invention, the chuck-side terminal is not made of a single metal shaft member (pin material) as in the prior art, but is based on the above-described joining structure of the base end member and the tip end member. It is supposed to be. Therefore, when the electrostatic chuck apparatus having such a tip member is attached to the attachment portion on the processing apparatus side, the following operational effects can be obtained. That is, in this mounting, when the tip member forming the chuck side terminal in the electrostatic chuck apparatus of the present invention and the mating terminal on the processing apparatus side are joined by fitting, a planar error is generated between both terminals. Even if there is (position shift), the tip member is joined to the base end member so as to be at least one of eccentric and inclined by deformation (crushed) of the metal relay joining member. Therefore, it is joined by absorbing the error. That is, if there is an error in the plane with the counterpart terminal, the tip member of the chuck side terminal receives a lateral force from the counterpart terminal, but in the electrostatic chuck device of the invention, Even if a force is applied, the distal end member is deformed by the metal relay joining member relative to the proximal end member, and accordingly, eccentricity and inclination are allowed. It can be joined by absorbing errors. Therefore, even when the tip member is deeply fitted to the mating terminal, the base end (root portion) of the base end member joined to the terminal on the back surface of the electrostatic chuck is made of a conventional metal. Compared with the case of using a chuck-side terminal made of a single shaft member, a large force or bending moment does not act. Therefore, even if the base end of the base end member is joined to the terminal on the back surface of the electrostatic chuck by joining means such as brazing, it is possible to effectively prevent the occurrence of problems such as breakage of the joint.

請求項2に記載の本発明によれば、先端部材が貫通孔の内周面に固定された絶縁部材の内周面に固定されているため、先端部材自身の安定性の向上が図られる。一方、先端部材に上記のような横方向の力が作用した場合でも、先端部材は基端部材に対して金属製中継接合部材が変形することで、偏心及び傾斜の少なくともいずれか許容されているため、基端部材の基端に大きな力や曲げモーメントを作用させることなく、相手側端子との間の平面上等の誤差を吸収して接合することができる。なお、絶縁部材としては、電気的絶縁性があるものであればよいが、先端部材が基端部材に対して偏心及び傾斜ができるように、ある程度の弾性ないし柔軟性のある素材(例えば樹脂)で形成するのが好ましい。   According to the second aspect of the present invention, since the tip member is fixed to the inner peripheral surface of the insulating member fixed to the inner peripheral surface of the through hole, the stability of the tip member itself can be improved. On the other hand, even when a lateral force as described above acts on the distal end member, the distal end member is allowed to be at least one of eccentricity and inclination by deforming the metal relay joining member relative to the proximal end member. Therefore, it is possible to join by absorbing an error such as a flat surface with the counterpart terminal without applying a large force or bending moment to the base end of the base end member. The insulating member may be any material that has electrical insulation, but a material having a certain degree of elasticity or flexibility (for example, resin) so that the distal end member can be eccentric and inclined with respect to the proximal end member. It is preferable to form by.

絶縁部材は、金属製ベース部材の貫通孔内から脱落ないし分離しないように取付けられていればよく、その手段としては、貫通孔の内周面にシリコン樹脂等で接着するか、圧入して固定してもよい。また、貫通孔の内周面にねじを形成するとともに、絶縁部材の外周面にねじを形成して、ねじ込み方式とすることもできる。ただし、請求項3に記載の本発明のように接着によることで、静電チャック装置の組立ての簡易、迅速化が図られる。   The insulating member only needs to be attached so as not to drop or separate from the through hole of the metal base member. As a means for this, the insulating member may be adhered to the inner peripheral surface of the through hole with silicon resin or the like, or fixed by press-fitting. May be. Moreover, while forming a screw in the inner peripheral surface of a through-hole, a screw can also be formed by forming a screw in the outer peripheral surface of an insulating member. However, by bonding as in the third aspect of the present invention, the assembly of the electrostatic chuck device can be simplified and speeded up.

請求項4に記載のように、絶縁部材の内周面に対する先端部材の固定をねじ込み構造としたものでは、その構成が容易であり、しかも、先端部材の基端部材に対する取付けの確実性と簡易性が得られる。もっとも、絶縁部材の内周面に対する先端部材の固定は、先端部材が基端部材から分離する危険性がなければ、なくともよい。また、請求項5に記載のように、絶縁部材の内周面に対する先端部材の固定手段は接着としてもよい。なお、請求項6に記載のように、前記先端部材の先端をオス端子形状としたものでは、処理装置側の相手側端子にメス端子形状のものに対して対応できる。   According to the fourth aspect of the present invention, when the distal end member is fixed to the inner peripheral surface of the insulating member with a screwed structure, the configuration is easy, and the mounting reliability of the distal end member to the proximal end member is simple and simple. Sex is obtained. However, the distal end member may be fixed to the inner peripheral surface of the insulating member as long as there is no risk that the distal end member is separated from the proximal end member. Further, as described in claim 5, the fixing means of the tip member with respect to the inner peripheral surface of the insulating member may be bonded. In addition, when the tip of the tip member has a male terminal shape as described in claim 6, the counterpart terminal on the processing apparatus side can cope with a female terminal shape.

本願発明における静電チャック装置のチャック側端子については、静電チャックに対する給電用のものだけではない。請求項7に記載の本発明のように、ヒーターへの給電用のものにも適用できる。抵抗発熱体からなるヒーターのように、大電流を流す場合には、チャック側端子をなす先端部材と、処理装置側の相手側端子とで十分な接触面積が確保される必要があるため、両端子間の接合における圧入力が大きくなる。したがって、このようなものにおいては、チャック側端子に過大な横荷重がかかりやすく、その根元に大きな曲げモーメントがかかるが、本発明では基端部材の基端には大きな力がかからないので、効果的である。   The chuck side terminal of the electrostatic chuck device according to the present invention is not limited to a power supply for the electrostatic chuck. As in the seventh aspect of the present invention, the present invention can also be applied to a power supply to a heater. When a large current flows, such as a heater made of a resistance heating element, it is necessary to ensure a sufficient contact area between the tip member forming the chuck side terminal and the counterpart terminal on the processing apparatus side. The pressure input at the junction between the children increases. Therefore, in such a case, an excessive lateral load is likely to be applied to the chuck side terminal, and a large bending moment is applied to the base of the chuck side terminal. However, in the present invention, since a large force is not applied to the proximal end of the proximal end member, it is effective. It is.

本発明を実施するための最良の形態について、図1〜図6に基いて詳細に説明する。図1は、本発明に係る静電チャック1aを含む静電チャック装置1の中央縦破断面図及びその要部拡大図であり、図2は要部の更なる拡大図である。以下、図面を参照して、とくに図1及び図2を中心として説明する。本形態における静電チャック装置1は、静電チャック1aをなすセラミック基板2をアルミニウム合金製のベース部材21に、図示しない接着剤(例えばシリコン樹脂)層によって接着して構成されている。   The best mode for carrying out the present invention will be described in detail with reference to FIGS. FIG. 1 is a central longitudinal sectional view of an electrostatic chuck device 1 including an electrostatic chuck 1a according to the present invention and an enlarged view of a main part thereof, and FIG. 2 is a further enlarged view of the main part. Hereinafter, with reference to drawings, it demonstrates centering around FIG.1 and FIG.2. The electrostatic chuck device 1 in this embodiment is configured by adhering a ceramic substrate 2 forming an electrostatic chuck 1a to an aluminum alloy base member 21 with an adhesive (for example, silicon resin) layer (not shown).

このような静電チャック装置1をなす静電チャック1aは、一定厚さで略円形の平板形状を呈するセラミック基板2から形成されており、本例ではアルミナ(Al)を主成分とするセラミック多層(積層)構造の焼結体であり、例えば、厚さが5mmで、直径が、300mm、200mm又は150mmとされる。このセラミック基板2は、表面(上面)3が図示しない半導体ウエハ等の被吸着部材を吸着、保持する平面からなる吸着面とされ、裏面(下面)4がベース部材21の平面からなる表面(上面)23に接合される接着面とされている。このセラミック基板2は、その内部に静電力によって被吸着部材を吸着するための静電電極5,5が対をなすように埋設状に設けられている。この静電電極5,5は電極間に電圧を印加することで靜電力を発生させる双極型のものが例示されている。また、本形態の静電チャック装置1においては、セラミック基板2の内部に、電圧を印加することで発熱する抵抗発熱体からなるヒーター15が埋設状に設けられており、静電チャック1aを温度制御するように設定されている。 The electrostatic chuck 1a constituting the electrostatic chuck device 1 is formed of a ceramic substrate 2 having a constant thickness and a substantially circular flat plate shape. In this example, alumina (Al 2 O 3 ) is a main component. The sintered body has a ceramic multilayer (laminated) structure. For example, the thickness is 5 mm and the diameter is 300 mm, 200 mm, or 150 mm. The ceramic substrate 2 has a surface (upper surface) 3 that is a suction surface made of a flat surface that sucks and holds a member to be sucked such as a semiconductor wafer (not shown), and a back surface (lower surface) 4 that is a surface (upper surface) that is a plane of the base member 21 ) 23 to be bonded to 23. The ceramic substrate 2 is embedded in the ceramic substrate 2 so that electrostatic electrodes 5 and 5 for attracting the member to be attracted by electrostatic force form a pair. The electrostatic electrodes 5 and 5 are illustrated as bipolar types that generate negative power by applying a voltage between the electrodes. Further, in the electrostatic chuck device 1 of this embodiment, a heater 15 made of a resistance heating element that generates heat when a voltage is applied is embedded inside the ceramic substrate 2, and the electrostatic chuck 1 a is heated to a temperature. It is set to control.

このような静電チャック1a(セラミック基板2)の裏面4の適所には、裏面4に開口する凹部6が静電電極5及びヒーター15に対応して形成されている。そして、各凹部6内の底面にはメタライズ層からなる電極端子7がセラミック基板2と同時焼成で形成されており、それぞれビア8を介して各静電電極5,5又は抵抗発熱体15に電気的に接合されている。なお、凹部6は、その径(内径)がφ10mmで、深さが4mmとされている。また、セラミック基板2は、焼成後、その表裏両面3,4を平面研磨し、その後において各端子7を含む露出するメタライズ層にNiメッキがかけられている。この各端子(電極端子)7には、裏面4から突出する状態でチャック側端子31を構成する基端部材32が、例えば銀ロウ(図示せず)によって、その基端面(根元の端面)34を介してロウ付けされている(図3、図4参照)。なお、静電電極5,5用又は抵抗発熱体15用の各チャック側端子31は、基板2の裏面4において、詳しくは図示しないが所定の配置でそれぞれ複数設けられている。ただし、本形態ではいずれのチャック側端子31及びその周囲の構成も同様のため、以下、そのうちの1つに基づいて説明する。   At an appropriate position on the back surface 4 of the electrostatic chuck 1 a (ceramic substrate 2), a recess 6 opening in the back surface 4 is formed corresponding to the electrostatic electrode 5 and the heater 15. An electrode terminal 7 made of a metallized layer is formed on the bottom surface in each recess 6 by simultaneous firing with the ceramic substrate 2, and is electrically connected to each electrostatic electrode 5, 5 or resistance heating element 15 through a via 8. Are joined together. The recess 6 has a diameter (inner diameter) of φ10 mm and a depth of 4 mm. In addition, after firing, the front and back surfaces 3 and 4 of the ceramic substrate 2 are planarly polished, and thereafter, the exposed metallized layer including the terminals 7 is plated with Ni. In each terminal (electrode terminal) 7, a base end member 32 constituting the chuck side terminal 31 in a state of projecting from the back surface 4 is, for example, a base end face (base end face) 34 by silver brazing (not shown). (See FIGS. 3 and 4). A plurality of chuck-side terminals 31 for the electrostatic electrodes 5 and 5 or the resistance heating element 15 are provided in a predetermined arrangement on the back surface 4 of the substrate 2 although not shown in detail. However, in this embodiment, since any chuck-side terminal 31 and the surrounding configuration are the same, description will be made based on one of them.

本形態において、チャック側端子31を構成する基端部材32は、例えば鉄コバルト合金(その他、42アロイ又は銅)からなる一定太さ(例えばφ3mm)の丸棒(円軸材)とされており、その先端35寄り部位がプラグ端子32bをなしている。この基端部材32の先端(図1、図2下端)35は、図1、図2に示したように、ベース部材21の貫通孔26の中間部位に位置するように設定されている。そして、この基端部材32の先端(図1、図2下端)35を含むプラグ端子32bには、先端部材36がその基端36b側(図1上端側)を介して嵌合されて接合されており、チャック側端子31を構成している。先端部材36の構造及びこれが基端部材32に接合されている構造の詳細については後述する。なお、先端部材36は、導電性を有する金属(例えば銅又は銅合金)からなっている。また、セラミック基板2の内部には、図示はなしないが、ベース部材21に形成されたガス流路に送り込まれたHeガスが、セラミック基板2の表面3であるウエハの吸着面に供給されるように、ガス流路が設けられている。   In this embodiment, the base end member 32 constituting the chuck side terminal 31 is a round bar (circular shaft member) having a constant thickness (for example, φ3 mm) made of, for example, iron cobalt alloy (other than 42 alloy or copper). The portion closer to the tip 35 forms a plug terminal 32b. The distal end (lower end in FIGS. 1 and 2) 35 of the base end member 32 is set so as to be positioned at an intermediate portion of the through hole 26 of the base member 21 as shown in FIGS. The distal end member 36 is fitted and joined to the plug terminal 32b including the distal end (lower end in FIGS. 1 and 2) 35 of the proximal end member 32 via the proximal end 36b side (upper end side in FIG. 1). The chuck side terminal 31 is configured. Details of the structure of the distal end member 36 and the structure in which it is joined to the proximal end member 32 will be described later. The tip member 36 is made of a conductive metal (for example, copper or copper alloy). In addition, although not shown, the He gas fed into the gas flow path formed in the base member 21 is supplied to the suction surface of the wafer, which is the surface 3 of the ceramic substrate 2, inside the ceramic substrate 2. In addition, a gas flow path is provided.

上記した基端部材32がロウ付けされた静電チャック1a(セラミック基板2)は、その裏面4を、ベース部材21の表面(上面)23に、接着剤層(例えば、シリコーン樹脂からなる接着剤)を介して接着されている。このベース部材21は、本例ではアルミニウム製で、セラミック基板2より大径をなし、一定厚さの円板形状を呈しており、その表面23にセラミック基板2を同心状に配置して接合している。このベース部材21には、静電チャック1aの基端部材32の配置に対応する位置で、その厚み方向に貫通する貫通孔26が適数設けられている(図3参照)。そして、基端部材32は、この各貫通孔26の中央に同心状に位置されている(図4参照)。なお、貫通孔26は、横断面が円形の円柱状を成している。ただし、セラミック基板2寄り部位が小径をなす径違い状に形成されている。   The electrostatic chuck 1a (ceramic substrate 2) to which the above-mentioned base end member 32 is brazed has its back surface 4 on the surface (upper surface) 23 of the base member 21 and an adhesive layer (for example, an adhesive made of silicone resin). ) Is glued through. In this example, the base member 21 is made of aluminum, has a larger diameter than the ceramic substrate 2 and has a disk shape with a constant thickness. The ceramic substrate 2 is concentrically arranged on the surface 23 and bonded. ing. The base member 21 is provided with an appropriate number of through holes 26 penetrating in the thickness direction at positions corresponding to the arrangement of the base end members 32 of the electrostatic chuck 1a (see FIG. 3). And the base end member 32 is located concentrically in the center of each through hole 26 (see FIG. 4). The through hole 26 has a circular columnar cross section. However, the portion close to the ceramic substrate 2 is formed in a different diameter shape having a small diameter.

ベース部材21におけるこのような貫通孔26の内側には、合成樹脂などの絶縁材からなり、円筒状をなす絶縁部材51がチャック側端子31を包囲する配置で嵌入され、貫通孔26の内周面に接着等によって固定されている。この絶縁部材51は、外周面が貫通孔26の内周面に沿う径違いの円筒形状を呈している。そして、その内周面は、それぞれ同心で、セラミック基板2の裏面4から基端部材32の中間部位までが基端部材32の外周面に外接する小径孔53で、基端部材32の長さ方向の中間部位から基端部材32の先端35を超えた部位までが基端部材32の外径より大きい中径孔54とされ、残りのベース部材21の裏面24側までが大径孔55をなしている。なお、中径孔54の内周面には、次に述べる先端部材36をなすソケット端子37が嵌入されるように形成されているが、その中径孔54の内周面の大径孔55寄り部位にはメスねじ56が形成されており、ソケット端子37の外周面に形成されたオスねじ38を介して先端部材36が螺合されるように形成されている。   Inside the through hole 26 in the base member 21, a cylindrical insulating member 51 made of an insulating material such as a synthetic resin is fitted to surround the chuck-side terminal 31. It is fixed to the surface by bonding or the like. The insulating member 51 has a cylindrical shape whose outer peripheral surface is different in diameter along the inner peripheral surface of the through hole 26. The inner peripheral surfaces thereof are concentric, and are the small diameter holes 53 that circumscribe the outer peripheral surface of the base end member 32 from the back surface 4 of the ceramic substrate 2 to the intermediate portion of the base end member 32, and the length of the base end member 32. A medium diameter hole 54 larger than the outer diameter of the base end member 32 is formed from the intermediate part in the direction to a part beyond the distal end 35 of the base end member 32, and the large diameter hole 55 is formed to the back surface 24 side of the remaining base member 21. There is no. Note that a socket terminal 37 forming the tip member 36 described below is formed on the inner peripheral surface of the medium diameter hole 54, but a large diameter hole 55 on the inner peripheral surface of the medium diameter hole 54. A female screw 56 is formed at the side portion, and the tip member 36 is screwed through a male screw 38 formed on the outer peripheral surface of the socket terminal 37.

さて、次に本発明の要部をなすところのチャック側端子31を構成する先端部材36の構造及びこれが基端部材32に嵌合されている構造の詳細について説明する。すなわち、本形態における先端部材36は、その基端36bが、基端部材32の先端35寄り部位(プラグ端子32b)に外嵌状に嵌合する円筒状のソケット端子37をなしている。別の言い方をすると、先端部材36の基端36bには、基端36b側に向けて開口するように穿孔された円柱状の空孔39を有している。ただし、この空孔39の内周面には、バネ性を有して弾性変形可能の金属製中継接合部材61を備えている。この金属製中継接合部材61の詳細は後述する。   Next, the details of the structure of the distal end member 36 constituting the chuck-side terminal 31 constituting the main part of the present invention and the structure in which it is fitted to the proximal end member 32 will be described. That is, the distal end member 36 in this embodiment forms a cylindrical socket terminal 37 whose base end 36b is fitted in a portion close to the distal end 35 of the base end member 32 (plug terminal 32b). In other words, the proximal end 36b of the distal end member 36 has a columnar hole 39 that is perforated so as to open toward the proximal end 36b. However, the inner peripheral surface of the hole 39 is provided with a metal relay joining member 61 having a spring property and elastically deformable. The details of the metal relay joining member 61 will be described later.

ソケット端子37の先端側には同心で先端に向けて延びる円柱軸部42を一体で備えている。ソケット端子37の外周面のうちの先端寄り部位には、上記もしたが、絶縁部材51の中径孔54の内周面に形成されたメスねじ56に螺合するオスねじ38が形成されており、このオスねじ38をメスねじ56に螺合することで、先端部材36のソケット端子37の空孔39内に基端部材32の先端35寄り部位であるプラグ端子32bが嵌合し、先端部材36が絶縁部材51の内周面に固定されるように取り付けられている。この取り付け状態においては、ソケット端子37の先端側に延びる円柱軸部42は、絶縁部材51の大径孔55内において周囲に空隙Kを保持して配置されている。なお円柱軸部42が、ウエハの処理装置の静電チャック装置取付け部に設けられた相手側端子に接合される端子をなすところであり、メス端子でもよいが本形態ではオス端子をなしている(図2参照)。このオス端子の先端は半球面状に形成されている。   A cylindrical shaft portion 42 that extends concentrically toward the distal end is integrally provided on the distal end side of the socket terminal 37. As described above, a male screw 38 that is screwed into a female screw 56 formed on the inner peripheral surface of the medium diameter hole 54 of the insulating member 51 is formed at a position near the tip of the outer peripheral surface of the socket terminal 37. The male screw 38 is screwed into the female screw 56, so that the plug terminal 32b, which is a portion closer to the distal end 35 of the base end member 32, is fitted into the hole 39 of the socket terminal 37 of the distal end member 36. The member 36 is attached so as to be fixed to the inner peripheral surface of the insulating member 51. In this attached state, the columnar shaft portion 42 extending to the tip end side of the socket terminal 37 is arranged with a gap K around the large-diameter hole 55 of the insulating member 51. The cylindrical shaft portion 42 forms a terminal to be joined to a mating terminal provided in the electrostatic chuck device mounting portion of the wafer processing apparatus, and may be a female terminal, but in this embodiment, it forms a male terminal ( (See FIG. 2). The tip of this male terminal is formed in a hemispherical shape.

一方、先端部材36をなすソケット端子37の空孔39の内周面(内壁面)には、上記もしたように、弾性変形可能の金属製中継接合部材61を備えている。この金属製中継接合部材61は、本形態ではバネ性を有する金属板を筒状に曲げてなると共に、その筒壁面には内側に円弧状に膨出する形の凸部63を周方向に多数有している。この金属製中継接合部材61は、空孔39の内周面41にその周方向に沿って凹設された凹部43に、自身のバネ性により抜け止状に嵌着されている(図2、図6参照)。そして、金属製中継接合部材61の凸部63は、その嵌着状態において、空孔39内に基端部材32のプラグ端子32bが挿入される前は図6に示したように大きく膨出しているが、挿入、嵌合されることで、基端部材32の外周面にて、自身のバネ性により径方向外側に潰されるように変形させられている。すなわち、本形態では金属製中継接合部材61は予め先端部材36をなすソケット端子37の空孔39内に配置されており、その空孔39内に基端部材32のプラグ端子32bを圧入することで、両端子37,32bの内外周面間に、金属製中継接合部材61を介在させるように構成されている。そして、この圧入状態において、ソケット端子37の空孔39の内周面41と、基端部材32のプラグ端子32bの外周面の間には、適度の空隙(例えば直径で1mm)が発生するように設定されている。これにより、この圧入状態において、金属製中継接合部材61における凸部63の変形によって先端部材36を基端部材32に対して、適量、偏心又は傾斜可能に接合している。   On the other hand, the inner peripheral surface (inner wall surface) of the hole 39 of the socket terminal 37 constituting the tip member 36 is provided with the metal relay joining member 61 that can be elastically deformed as described above. In this embodiment, the metal relay joining member 61 is formed by bending a metal plate having a spring property into a cylindrical shape, and on the cylindrical wall surface, a large number of convex portions 63 bulging inwardly in an arc shape are formed in the circumferential direction. Have. This metal relay joining member 61 is fitted in a recess 43 formed in the inner peripheral surface 41 of the hole 39 along the circumferential direction in a retaining manner by its own spring property (FIG. 2, (See FIG. 6). And the convex part 63 of the metal relay joining member 61 bulges greatly as shown in FIG. 6 before the plug terminal 32b of the base end member 32 is inserted into the hole 39 in the fitted state. However, by being inserted and fitted, the outer peripheral surface of the base end member 32 is deformed so as to be crushed radially outward by its own spring property. That is, in this embodiment, the metal relay joining member 61 is disposed in advance in the hole 39 of the socket terminal 37 forming the distal end member 36, and the plug terminal 32 b of the base end member 32 is press-fitted into the hole 39. Thus, a metal relay joining member 61 is interposed between the inner and outer peripheral surfaces of both terminals 37 and 32b. In this press-fitted state, an appropriate gap (for example, 1 mm in diameter) is generated between the inner peripheral surface 41 of the hole 39 of the socket terminal 37 and the outer peripheral surface of the plug terminal 32b of the base end member 32. Is set to Thus, in this press-fitted state, the distal end member 36 is joined to the base end member 32 by an appropriate amount, eccentricity, or inclination by deformation of the convex portion 63 in the metal relay joining member 61.

なお、本形態では、ベース部材21に形成された貫通孔26の内周面に絶縁部材51が固定されており、先端部材36を、そのソケット端子37の外周面に形成されたオスねじ38を介して、絶縁部材51の内周面に形成されたメスねじ56にねじ込むことで、先端部材36を固定している。そして、同時に、ソケット端子37の空孔39内に基端部材32を圧入される構成とされている。したがって、先端部材36の基端部材32に対する取り付けは、その軸線回りに回転させながら挿入されている。   In this embodiment, the insulating member 51 is fixed to the inner peripheral surface of the through hole 26 formed in the base member 21, and the tip member 36 is connected to the male screw 38 formed on the outer peripheral surface of the socket terminal 37. Then, the tip member 36 is fixed by screwing into a female screw 56 formed on the inner peripheral surface of the insulating member 51. At the same time, the base end member 32 is press-fitted into the hole 39 of the socket terminal 37. Therefore, the attachment of the distal end member 36 to the proximal end member 32 is inserted while rotating around its axis.

上記したように本形態ではソケット端子37の空孔39内に基端部材32が圧入されるとき、その空39孔の内周面41と、基端部材32の先端寄り部位(プラグ端子)の外周面との間に、金属製中継接合部材61が介在されるように構成されている。そして、この中継接合部材51は、その周壁面に多数の凸部63を有しており、この多数の凸部63が基端部材32の先端寄り部位(プラグ端子)の外周面に押し潰される形で接している。このように本形態では、中継接合部材51における多数の凸部63を介して、基端部材32の先端寄り部位の外周面と、ソケット端子37の空孔39の内周面とが多面(多点)接触状態で電気的に接合されている。なお、先端部材36の先端の円柱軸部42の先端は、基端部材32に先端部材36が接合された状態において、ベース部材21の裏面24より若干突出するように設定されている。   As described above, in the present embodiment, when the base end member 32 is press-fitted into the hole 39 of the socket terminal 37, the inner peripheral surface 41 of the hole 39 hole and the portion near the tip of the base end member 32 (plug terminal). A metal relay joining member 61 is interposed between the outer peripheral surface and the outer peripheral surface. The relay joining member 51 has a large number of convex portions 63 on the peripheral wall surface, and the large number of convex portions 63 are crushed by the outer peripheral surface of the proximal end portion 32 (plug terminal). It touches in form. As described above, in this embodiment, the outer peripheral surface near the tip of the base end member 32 and the inner peripheral surface of the hole 39 of the socket terminal 37 are multifaceted (many surfaces) via the numerous protrusions 63 in the relay joining member 51. Point) Electrically joined in contact. The distal end of the cylindrical shaft portion 42 at the distal end of the distal end member 36 is set to slightly protrude from the back surface 24 of the base member 21 in a state where the distal end member 36 is joined to the proximal end member 32.

しかして、このような本形態の静電チャック装置1においては、チャック側端子31は、従来のように金属製の1本の軸材からなるのではなく、基端部材32と先端部材36との上記したような接合構造からなり、したがって、先端部材36に横方向の力(せん断力)がかかったり、先端部材36の先端に横方向の力がかかって曲げモーメントが作用するように場合でも、先端部材36は基端部材32に対して金属製中継接合部材61における凸部63が変形することで、図2中に2点鎖線で示したように、適量の偏心又は傾斜(又は偏心及び傾斜)が許容される。これにより、このような静電チャック装置1におけるチャック側端子31をなす先端部材36と、処理装置側の相手側端子131とが嵌合で接合される際において、両端子間に平面的な誤差があったとしても、金属製中継接合部材の凸部63が変形できるため、その誤差を吸収して接合される。   Thus, in the electrostatic chuck device 1 of this embodiment, the chuck-side terminal 31 is not made of a single shaft made of metal as in the prior art, but the proximal end member 32, the distal end member 36, and the like. Therefore, even when a lateral force (shearing force) is applied to the tip member 36 or a lateral force is applied to the tip of the tip member 36, a bending moment is applied. The distal end member 36 is deformed by the convex portion 63 of the metal relay joining member 61 with respect to the proximal end member 32, so that an appropriate amount of eccentricity or inclination (or eccentricity and inclination) as shown by a two-dot chain line in FIG. (Tilt) is allowed. Accordingly, when the tip member 36 forming the chuck side terminal 31 in the electrostatic chuck apparatus 1 and the mating terminal 131 on the processing apparatus side are joined by fitting, a planar error is generated between both terminals. Even if there exists, since the convex part 63 of a metal relay joining member can deform | transform, it will join, absorbing the error.

これにより、本形態では、チャック側端子31が従来のように1本の軸体からなるピンがその基端面でセラミック基板2の裏面の端子にロウ付けされてなるものでないことから、チャック側端子31の根元のロウ付け部に作用する横方向の力や曲げモーメントを低減できる。したがって、その分、ロウ付けしているロウの破断やロウ付け部の引き剥がされ等の発生を抑えることができる。とくに、本形態では、先端部材36がベース部材21の貫通孔26の内周面に固定された絶縁部材51の内周面に固定されているため、先端部材36自体が基端部材32に対して安定している。   As a result, in this embodiment, the chuck side terminal 31 is not formed by brazing a pin made of one shaft body to the terminal on the back surface of the ceramic substrate 2 at the base end face unlike the conventional case. The lateral force and bending moment acting on the brazing portion at the base 31 can be reduced. Accordingly, it is possible to suppress the occurrence of breakage of the brazed brazing or peeling of the brazed portion. In particular, in this embodiment, since the distal end member 36 is fixed to the inner peripheral surface of the insulating member 51 fixed to the inner peripheral surface of the through hole 26 of the base member 21, the distal end member 36 itself is relative to the proximal end member 32. And stable.

上記形態では、チャック側端子31をなす先端部材36を、そのソケット端子37又はソケット端子寄り部位の外周面に形成したオスねじを介して、金属製ベース部材21の貫通孔26の内周面に固定された絶縁部材51の内周面に形成したメスねじに螺合して固定した場合を例示したが、この固定は、上記もしたように接着により固定してもよい。もっとも、チャック側端子31をなす先端部材36が基端部材32に対して抜け止状にして接合されており、しかも、その接合において先端部材36自身が静電チャック1aの裏面に対して鉛直性が安定して保持されている場合には、先端部材36は絶縁部材51の内周面に固定されていなくともよい。   In the said form, the front-end | tip member 36 which makes the chuck | zipper side terminal 31 is formed in the inner peripheral surface of the through-hole 26 of the metal base member 21 through the male screw formed in the outer peripheral surface of the socket terminal 37 or the socket terminal side part. Although the case where it screwed and fixed to the female screw formed in the inner peripheral surface of the fixed insulating member 51 was illustrated, this fixation may be fixed by adhesion as described above. However, the distal end member 36 constituting the chuck side terminal 31 is joined to the proximal end member 32 in a retaining manner, and the distal end member 36 itself is perpendicular to the back surface of the electrostatic chuck 1a in the joining. Is stably held, the tip member 36 may not be fixed to the inner peripheral surface of the insulating member 51.

また、上記形態では、チャック側端子31をなす、基端部材32の先端をプラグ端子とし、先端部材36の基端をソケット端子としたものとして、両端子を嵌合した端子構造のものにおいて具体化したが、本発明ではこれを逆にしてもよい。すなわち、基端部材32の先端をソケット端子とし、先端部材36の基端をプラグ端子としたものとしても具体化できる。さらに、上記形態では、チャック側端子31をなす先端部材36の先端をオス端子形状のものとして具体化したが、本発明においては、これに限定されるものではない。静電チャック装置が取り付けられる処理装置側の相手側端子に対応する端子形状(構造)とすればよい。   Further, in the above-described embodiment, in the terminal structure in which both terminals are fitted, the chuck-side terminal 31 is configured such that the distal end of the proximal end member 32 is a plug terminal and the proximal end of the distal end member 36 is a socket terminal. However, this may be reversed in the present invention. That is, the embodiment can be embodied in which the distal end of the proximal end member 32 is a socket terminal and the proximal end of the distal end member 36 is a plug terminal. Further, in the above embodiment, the tip of the tip member 36 that forms the chuck side terminal 31 is embodied as a male terminal shape, but the present invention is not limited to this. What is necessary is just to set it as the terminal shape (structure) corresponding to the other party terminal by the side of the processing apparatus to which an electrostatic chuck apparatus is attached.

さらに、上記形態では、金属製中継接合部材61は予め先端部材36をなすソケット端子37の空孔39内に配置されており、その空孔39内に基端部材32を圧入することで、両端子37,32bの内外周面間に、金属製中継接合部材61を介在させる構成のものとて具体化した。しかし、本発明では、ソケット端子とプラグ端子の内外周面間に、弾性変形可能の金属製中継接合部材を介在させ、この金属製中継接合部材の変形によって先端部材を基端部材に対して偏心及び傾斜の少なくともいずれかを可能に接合してなることでよく、したがって、金属製中継接合部材は、予めプラグ端子の外周面に設けられているものであってもよい。   Further, in the above embodiment, the metal relay joining member 61 is disposed in advance in the hole 39 of the socket terminal 37 that forms the tip member 36, and the base end member 32 is press-fitted into the hole 39, thereby It is embodied as a configuration in which a metal relay joining member 61 is interposed between the inner and outer peripheral surfaces of the children 37 and 32b. However, in the present invention, an elastically deformable metal relay joining member is interposed between the inner and outer peripheral surfaces of the socket terminal and the plug terminal, and the distal end member is eccentric with respect to the base end member due to the deformation of the metal relay joining member. In addition, at least one of the inclination and the inclination may be joined, and therefore the metal relay joining member may be provided in advance on the outer peripheral surface of the plug terminal.

本発明の静電チャック装置の中央縦破断面図及びその要部拡大図。The center longitudinal cross-sectional view of the electrostatic chuck apparatus of this invention and its principal part enlarged view. 図1の要部拡大図のさらなる拡大図。The further enlarged view of the principal part enlarged view of FIG. 図1の静電チャック装置の分解図(断面図)と、先端部材の拡大断面図。The exploded view (sectional drawing) of the electrostatic chuck apparatus of FIG. 1 and the expanded sectional view of a front-end | tip member. 図1の静電チャック装置の製造途中を説明する図であって、基端部材をセラミック基板にロウ付けしたものに、ベース部材を接着した段階の断面図、その要部拡大図。It is a figure explaining the manufacture middle of the electrostatic chuck apparatus of FIG. 1, Comprising: Sectional drawing of the stage which bonded the base member to what brazed the base end member to the ceramic substrate, and the principal part enlarged view. 図4において、絶縁部材をベース部材の貫通孔に固定した段階の断面図、その要部拡大図。In FIG. 4, sectional drawing of the step which fixed the insulating member to the through-hole of the base member, and the principal part enlarged view. 図5において、チャック側端子をなす基端部材に先端部材を接合する状態を説明する部分拡大断面図、及びその一部の更なる拡大図。In FIG. 5, the partial expanded sectional view explaining the state which joins a front-end | tip member to the base end member which makes a chuck | zipper side terminal, and the further further enlarged view of the part. 処理装置側の相手側端子をソケット端子とし、静電チャック装置のチャック側端子を貫通孔内において突出状のものとした説明図。Explanatory drawing which made the other party terminal by the side of a processing apparatus a socket terminal, and made the chuck | zipper side terminal of an electrostatic chuck apparatus the thing of a projection shape in a through-hole.

符号の説明Explanation of symbols

1 静電チャック装置
1a 静電チャック
2 セラミック基板
4 静電チャックの裏面
5 静電電極
15 ヒーター
21 金属製ベース部材
26 ベース部材の貫通孔
31 チャック側端子
32 基端部材
32b プラグ端子
34 基端部材の基端
35 基端部材の先端
36 先端部材
36b 先端部材の基端
37 ソケット端子
38 先端部材のソケット端子の外周面のオスねじ
51 絶縁部材
56 絶縁部材の内周面のメスねじ
61 金属製中継接合部材
DESCRIPTION OF SYMBOLS 1 Electrostatic chuck apparatus 1a Electrostatic chuck 2 Ceramic substrate 4 Back surface of electrostatic chuck 5 Electrostatic electrode 15 Heater 21 Metal base member 26 Base member through hole 31 Chuck side terminal 32 Base end member 32b Plug terminal 34 Base end member The proximal end 35 of the proximal end member 36 The distal end member 36b The proximal end 37 of the distal end member Socket terminal 38 The male screw 51 on the outer peripheral surface of the socket terminal of the distal end member Insulating member 56 The female screw 61 on the inner peripheral surface of the insulating member 61 Metal relay Joining member

Claims (7)

セラミック基板に静電電極が形成されてなる静電チャックと、この静電チャックの裏面に接合された金属製ベース部材とを含んでなる静電チャック装置であって、前記静電チャックの裏面から突出状に形成されたチャック側端子が、前記金属製ベース部材に形成された貫通孔内に絶縁を保持して配置されてなるものにおいて、
前記チャック側端子を、前記静電チャックの裏面に基端が接合された基端部材と、その基端部材の先端に接合された先端部材とで形成し、しかも、前記基端部材の先端と前記先端部材の基端のいずれか一方をソケット端子とすると共に他方をプラグ端子として両端子を嵌合して接合する端子構造とし、
前記ソケット端子と前記プラグ端子の内外周面間に、弾性変形可能の金属製中継接合部材を介在させ、この金属製中継接合部材の変形によって前記先端部材を前記基端部材に対して偏心及び傾斜の少なくともいずれかを可能に接合してなることを特徴とする静電チャック装置。
An electrostatic chuck device comprising: an electrostatic chuck having an electrostatic electrode formed on a ceramic substrate; and a metal base member joined to the back surface of the electrostatic chuck. In the case where the chuck-side terminal formed in a protruding shape is disposed while maintaining insulation in the through-hole formed in the metal base member,
The chuck-side terminal is formed by a base end member having a base end bonded to the back surface of the electrostatic chuck, and a tip member bonded to the tip of the base end member, and the tip end of the base end member A terminal structure in which either one of the proximal ends of the distal end member is a socket terminal and the other is a plug terminal to fit and join both terminals,
An elastically deformable metal relay joining member is interposed between the inner and outer peripheral surfaces of the socket terminal and the plug terminal, and the distal end member is eccentric and inclined with respect to the base end member by deformation of the metal relay joining member. An electrostatic chuck device characterized in that at least one of the above can be joined.
セラミック基板に静電電極が形成されてなる静電チャックと、この静電チャックの裏面に接合された金属製ベース部材とを含んでなる静電チャック装置であって、前記静電チャックの裏面から突出状に形成されたチャック側端子が、前記金属製ベース部材に形成された貫通孔の内周面に固定された環状をなす絶縁部材の内側に配置されてなるものにおいて、
前記チャック側端子を、前記静電チャックの裏面に基端が接合された基端部材と、その基端部材の先端に接合された先端部材とで形成し、しかも前記基端部材の先端をプラグ端子とすると共に前記先端部材の基端をソケット端子として両端子を嵌合して接合する端子構造とし、
前記ソケット端子と前記プラグ端子の内外周面間に、弾性変形可能の金属製中継接合部材を介在させ、この金属製中継接合部材の変形によって前記先端部材を前記基端部材に対して偏心及び傾斜の少なくともいずれかを可能に接合してなると共に、
該先端部材を、そのソケット端子又はソケット端子寄り部位の外周面を介して、前記金属製ベース部材の貫通孔の内周面に固定された前記絶縁部材の内周面に固定してなることを特徴とする静電チャック装置。
An electrostatic chuck device comprising: an electrostatic chuck having an electrostatic electrode formed on a ceramic substrate; and a metal base member joined to the back surface of the electrostatic chuck. The chuck-side terminal formed in a protruding shape is arranged inside an insulating member that forms an annular shape fixed to the inner peripheral surface of the through hole formed in the metal base member.
The chuck side terminal is formed by a base end member whose base end is joined to the back surface of the electrostatic chuck and a tip member joined to the tip of the base end member, and the tip of the base end member is plugged. A terminal structure in which both terminals are fitted and joined as a terminal with the base end of the tip member as a terminal,
An elastically deformable metal relay joining member is interposed between the inner and outer peripheral surfaces of the socket terminal and the plug terminal, and the distal end member is eccentric and inclined with respect to the base end member by deformation of the metal relay joining member. It is possible to join at least one of
The tip member is fixed to the inner peripheral surface of the insulating member fixed to the inner peripheral surface of the through hole of the metal base member via the outer peripheral surface of the socket terminal or the portion near the socket terminal. An electrostatic chuck device.
前記絶縁部材が、前記貫通孔の内周面に接着により固定されていることを特徴とする請求項2に記載の静電チャック装置。   The electrostatic chuck apparatus according to claim 2, wherein the insulating member is fixed to an inner peripheral surface of the through hole by adhesion. 前記絶縁部材はその内周面にメスねじを備える一方、前記先端部材のソケット端子又はソケット端子寄り部位の外周面にはこのメスねじに螺合するオスねじを備えており、これらのねじにより、前記絶縁部材に前記先端部材をねじ込むことで固定すると共に、該先端部材を前記基端部材に接合してなることを特徴とする請求項2又は3に記載の静電チャック装置。   The insulating member is provided with a female screw on the inner peripheral surface thereof, while the outer peripheral surface of the tip terminal member near the socket terminal or the socket terminal is provided with a male screw that is screwed into the female screw. 4. The electrostatic chuck device according to claim 2, wherein the distal end member is fixed by screwing into the insulating member, and the distal end member is joined to the base end member. 前記先端部材は、そのソケット端子又はソケット端子寄り部位の外周面を介して、前記絶縁部材の内周面に接着により固定されていることを特徴とする請求項2〜4のいずれか1項に記載の静電チャック装置。   The said front end member is being fixed to the inner peripheral surface of the said insulating member by adhesion | attachment via the outer peripheral surface of the socket terminal or the part near a socket terminal. The electrostatic chuck apparatus described. 前記先端部材の先端をオス端子形状とした請求項1〜5のいずれか1項に記載の静電チャック装置。   The electrostatic chuck device according to claim 1, wherein the tip of the tip member has a male terminal shape. 前記静電チャックはその内部に抵抗発熱体からなるヒーターが設けられており、前記チャック側端子が、そのヒーターへの給電用のものであることを特徴とする請求項1〜6のいずれか1項に記載の静電チャック装置。   The electrostatic chuck is provided with a heater made of a resistance heating element, and the chuck-side terminal is for supplying power to the heater. The electrostatic chuck device according to the item.
JP2006220786A 2006-08-12 2006-08-12 Electrostatic chuck device Active JP4767788B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006220786A JP4767788B2 (en) 2006-08-12 2006-08-12 Electrostatic chuck device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2006220786A JP4767788B2 (en) 2006-08-12 2006-08-12 Electrostatic chuck device

Publications (2)

Publication Number Publication Date
JP2008047657A true JP2008047657A (en) 2008-02-28
JP4767788B2 JP4767788B2 (en) 2011-09-07

Family

ID=39181116

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006220786A Active JP4767788B2 (en) 2006-08-12 2006-08-12 Electrostatic chuck device

Country Status (1)

Country Link
JP (1) JP4767788B2 (en)

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010103321A (en) * 2008-10-24 2010-05-06 Ngk Spark Plug Co Ltd Electrostatic chuck device
JP2010123862A (en) * 2008-11-21 2010-06-03 Ngk Spark Plug Co Ltd Connection part for semiconductor manufacturing apparatus, and method of forming connection part for semiconductor manufacturing apparatus
KR101101746B1 (en) 2009-10-23 2012-01-05 주성엔지니어링(주) Electrostatic chucking apparatus and method for manufacturing thereof
JP2012099856A (en) * 2012-02-06 2012-05-24 Ngk Spark Plug Co Ltd Connection for semiconductor manufacturing apparatus and method of forming connection for semiconductor manufacturing apparatus
KR101214796B1 (en) 2010-10-26 2012-12-24 주성엔지니어링(주) Electrostatic chucking apparatus, substrate processing apparatus compirsing the same, and method for manufacturing of electrostatic chucking apparatus
JP2015142042A (en) * 2014-01-29 2015-08-03 東京エレクトロン株式会社 Feeding part cover structure and semiconductor manufacturing device
US20150340261A1 (en) * 2014-05-22 2015-11-26 Shinko Electric Industries Co., Ltd. Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
KR20150136998A (en) 2014-05-28 2015-12-08 신꼬오덴기 고교 가부시키가이샤 Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
JP2015228398A (en) * 2014-05-30 2015-12-17 日本特殊陶業株式会社 Component for semiconductor production apparatus
JP2016051783A (en) * 2014-08-29 2016-04-11 住友大阪セメント株式会社 Electrostatic chuck device and manufacturing method for the same
JP2016076646A (en) * 2014-10-08 2016-05-12 日本特殊陶業株式会社 Electrostatic chuck
JP2017084884A (en) * 2015-10-23 2017-05-18 日本特殊陶業株式会社 Substrate holding device
US10037909B2 (en) * 2014-09-12 2018-07-31 Hitachi High-Technologies Corporation Plasma processing apparatus
CN110556316A (en) * 2018-06-04 2019-12-10 应用材料公司 Substrate supporting base
JP2020004809A (en) * 2018-06-27 2020-01-09 日本特殊陶業株式会社 Holding device
JP2021064661A (en) * 2019-10-11 2021-04-22 日本特殊陶業株式会社 Holding device

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11233602A (en) * 1998-02-12 1999-08-27 Hitachi Ltd Electrostatic chucking apparatus and apparatus for processing sample using the same
JP2000188321A (en) * 1998-12-14 2000-07-04 Applied Materials Inc Electrostatic chuck connector and its combination
JP2003059789A (en) * 2001-08-09 2003-02-28 Ibiden Co Ltd Connection structure and semiconductor manufacturing and inspecting apparatus
JP2003524865A (en) * 1999-08-06 2003-08-19 アプライド マテリアルズ インコーポレイテッド Improved connector for electrostatic chuck

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11233602A (en) * 1998-02-12 1999-08-27 Hitachi Ltd Electrostatic chucking apparatus and apparatus for processing sample using the same
JP2000188321A (en) * 1998-12-14 2000-07-04 Applied Materials Inc Electrostatic chuck connector and its combination
JP2003524865A (en) * 1999-08-06 2003-08-19 アプライド マテリアルズ インコーポレイテッド Improved connector for electrostatic chuck
JP2003059789A (en) * 2001-08-09 2003-02-28 Ibiden Co Ltd Connection structure and semiconductor manufacturing and inspecting apparatus

Cited By (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010103321A (en) * 2008-10-24 2010-05-06 Ngk Spark Plug Co Ltd Electrostatic chuck device
JP2010123862A (en) * 2008-11-21 2010-06-03 Ngk Spark Plug Co Ltd Connection part for semiconductor manufacturing apparatus, and method of forming connection part for semiconductor manufacturing apparatus
KR101101746B1 (en) 2009-10-23 2012-01-05 주성엔지니어링(주) Electrostatic chucking apparatus and method for manufacturing thereof
KR101214796B1 (en) 2010-10-26 2012-12-24 주성엔지니어링(주) Electrostatic chucking apparatus, substrate processing apparatus compirsing the same, and method for manufacturing of electrostatic chucking apparatus
JP2012099856A (en) * 2012-02-06 2012-05-24 Ngk Spark Plug Co Ltd Connection for semiconductor manufacturing apparatus and method of forming connection for semiconductor manufacturing apparatus
JP2015142042A (en) * 2014-01-29 2015-08-03 東京エレクトロン株式会社 Feeding part cover structure and semiconductor manufacturing device
KR20150090844A (en) * 2014-01-29 2015-08-06 도쿄엘렉트론가부시키가이샤 Power supply cover structure and semiconductor manufacturing apparatus
US10374358B2 (en) 2014-01-29 2019-08-06 Tokyo Electron Limited Feeder-cover structure and semiconductor production apparatus
KR102334484B1 (en) * 2014-01-29 2021-12-02 도쿄엘렉트론가부시키가이샤 Power supply cover structure and semiconductor manufacturing apparatus
US9887117B2 (en) * 2014-05-22 2018-02-06 Shinko Electric Industries Co., Ltd. Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
US20150340261A1 (en) * 2014-05-22 2015-11-26 Shinko Electric Industries Co., Ltd. Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
KR20150136998A (en) 2014-05-28 2015-12-08 신꼬오덴기 고교 가부시키가이샤 Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
US10147628B2 (en) 2014-05-28 2018-12-04 Shinko Electric Industries Co., Ltd. Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
JP2015228398A (en) * 2014-05-30 2015-12-17 日本特殊陶業株式会社 Component for semiconductor production apparatus
JP2016051783A (en) * 2014-08-29 2016-04-11 住友大阪セメント株式会社 Electrostatic chuck device and manufacturing method for the same
US10037909B2 (en) * 2014-09-12 2018-07-31 Hitachi High-Technologies Corporation Plasma processing apparatus
JP2016076646A (en) * 2014-10-08 2016-05-12 日本特殊陶業株式会社 Electrostatic chuck
US10354904B2 (en) 2014-10-08 2019-07-16 Ngk Spark Plug Co., Ltd. Electrostatic chuck
JP2017084884A (en) * 2015-10-23 2017-05-18 日本特殊陶業株式会社 Substrate holding device
CN110556316A (en) * 2018-06-04 2019-12-10 应用材料公司 Substrate supporting base
JP2020004809A (en) * 2018-06-27 2020-01-09 日本特殊陶業株式会社 Holding device
JP7139165B2 (en) 2018-06-27 2022-09-20 日本特殊陶業株式会社 holding device
JP2021064661A (en) * 2019-10-11 2021-04-22 日本特殊陶業株式会社 Holding device
JP7313254B2 (en) 2019-10-11 2023-07-24 日本特殊陶業株式会社 holding device

Also Published As

Publication number Publication date
JP4767788B2 (en) 2011-09-07

Similar Documents

Publication Publication Date Title
JP4767788B2 (en) Electrostatic chuck device
JP4909704B2 (en) Electrostatic chuck device
JP4908021B2 (en) Electrostatic chuck, electrostatic chuck apparatus, electrostatic chuck manufacturing method, vacuum chuck, vacuum chuck apparatus, vacuum chuck manufacturing method, ceramic heater, ceramic heater apparatus, and ceramic heater manufacturing method
JP7098886B2 (en) Contact terminals, inspection jigs, and inspection equipment
US10147628B2 (en) Electrostatic chuck and semiconductor-liquid crystal manufacturing apparatus
JP6317183B2 (en) Parts for semiconductor manufacturing equipment
TWI333304B (en) Ic socket
JP2010103321A (en) Electrostatic chuck device
TWI820147B (en) Electrostatic chuck and manufacturing method thereof
JP6464071B2 (en) Substrate holding device
US11961754B2 (en) Substrate fixing device
TWI601961B (en) Method of manufacturing current sensing resistor
JP6586345B2 (en) Substrate holding device
WO2021186860A1 (en) Actuator, fluid control device, and actuator manufacturing method
JP7139165B2 (en) holding device
JP7349855B2 (en) holding device
JP6464072B2 (en) Substrate holding device
JP7101058B2 (en) Holding device
WO2017020295A1 (en) Surface mount contact, electronic device assembly, and test probe pin tool
JP5451655B2 (en) Terminal connection structure and semiconductor device having the terminal connection structure
JP2019062072A (en) Holding device and manufacturing method thereof
JP6841085B2 (en) Coiled electronic components
JP2021111662A (en) Holding device
TW202324667A (en) Electrostatic chuck
JP2009164058A (en) Electric conduction plug

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20081222

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20100913

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20100921

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20101118

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20110517

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20110615

R150 Certificate of patent or registration of utility model

Ref document number: 4767788

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140624

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140624

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250