JP2007531244A - ネスト化電圧アイランド・アーキテクチャ - Google Patents
ネスト化電圧アイランド・アーキテクチャ Download PDFInfo
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- JP2007531244A JP2007531244A JP2006518914A JP2006518914A JP2007531244A JP 2007531244 A JP2007531244 A JP 2007531244A JP 2006518914 A JP2006518914 A JP 2006518914A JP 2006518914 A JP2006518914 A JP 2006518914A JP 2007531244 A JP2007531244 A JP 2007531244A
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- voltage
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- vddi
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- 238000009826 distribution Methods 0.000 claims abstract description 15
- 208000035795 Hypocalcemic vitamin D-dependent rickets Diseases 0.000 claims description 55
- 208000033584 type 1 vitamin D-dependent rickets Diseases 0.000 claims description 55
- 238000000926 separation method Methods 0.000 claims description 11
- 238000002955 isolation Methods 0.000 claims description 10
- 238000003860 storage Methods 0.000 claims description 10
- 238000004891 communication Methods 0.000 claims description 6
- 230000003139 buffering effect Effects 0.000 claims description 2
- 230000008878 coupling Effects 0.000 claims 1
- 238000010168 coupling process Methods 0.000 claims 1
- 238000005859 coupling reaction Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 7
- 239000000872 buffer Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 230000005669 field effect Effects 0.000 description 2
- 230000010354 integration Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 238000003491 array Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000009792 diffusion process Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/52—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
- H01L23/522—Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including external interconnections consisting of a multilayer structure of conductive and insulating layers inseparably formed on the semiconductor body
- H01L23/528—Geometry or layout of the interconnection structure
- H01L23/5286—Arrangements of power or ground buses
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
- H01L27/0203—Particular design considerations for integrated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/0001—Technical content checked by a classifier
- H01L2924/0002—Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
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- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Geometry (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
- Design And Manufacture Of Integrated Circuits (AREA)
Abstract
【解決手段】 親領域(20)と、この親領域内のネスト化電圧アイランド(22)の階層オーダと、を有する集積回路。上位電圧アイランドの各々(例えば24)は、下位電圧アイランド(例えば22))内にネスト化され、同じ階層構造を有する。
【選択図】 図6
Description
Claims (9)
- 集積回路であって、
階層構造を有する第1の電圧アイランドと、
前記第1の電圧アイランド内にネスト化され、前記第1の電圧アイランドと同じ階層構造を有する第2の電圧アイランドと、
を含む、集積回路。 - 各電圧アイランドが1つ以上の電圧源を含み、各電圧源が、VDDI電源、VDDSS電源、およびVDDN電源から成る群から選択される、請求項1に記載の集積回路。
- 前記第2の電圧アイランドのVDDI、VDDSS、およびVDDN電源が、前記第1の電圧アイランドのVDDI、VDDSS、およびVDDN電源に別個に結合するか、前記集積回路の非電圧アイランド部分のVDDO電源に別個に結合するか、または、1つ以上の外部電源に別個に結合するかのいずれか1つから選択される、請求項2に記載の集積回路。
- 前記階層構造が、VDDN電源および電圧シフト手段、前記VDDN電源および分離手段、または前記VDDN電源および前記電圧シフト手段および前記分離手段のいずれか1つから選択される、請求項1に記載の集積回路。
- 前記通信手段が論理ラッチを含む、請求項4に記載の集積回路。
- 前記階層構造が、更に、VDDI電力分配ネットワーク、状態保存手段、前記VDDN電源と前記VDDI電力分配ネットワークとの間に結合された1つ以上のスイッチング要素、VDDSS電源、および1つ以上の電圧バッファリング回路から成る群から選択された1つ以上のサブ構造を含む、請求項4に記載の集積回路。
- 前記1つ以上のスイッチング要素が、電圧レギュレータ、ヘッダ、およびフッタから成る群から選択される、請求項6に記載の集積回路。
- 前記状態保存手段が少なくとも1つの状態保存ラッチを含む、請求項6に記載の集積回路。
- 電力管理状態デバイスを更に含み、前記電力管理状態デバイスが、前記集積回路の非電圧アイランド部分に配置され、前記第1の電圧アイランドまたは前記第2の電圧アイランドまたは前記第1および前記第2の電圧アイランドの双方において前記分離手段を制御する、請求項1に記載の集積回路。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/604,277 | 2003-07-08 | ||
US10/604,277 US7131074B2 (en) | 2003-07-08 | 2003-07-08 | Nested voltage island architecture |
PCT/US2004/021943 WO2005008725A2 (en) | 2003-07-08 | 2004-07-08 | Nested voltage island architecture |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2007531244A true JP2007531244A (ja) | 2007-11-01 |
JP5296313B2 JP5296313B2 (ja) | 2013-09-25 |
Family
ID=33564147
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006518914A Expired - Fee Related JP5296313B2 (ja) | 2003-07-08 | 2004-07-08 | 集積回路 |
Country Status (6)
Country | Link |
---|---|
US (1) | US7131074B2 (ja) |
EP (1) | EP1649493B1 (ja) |
JP (1) | JP5296313B2 (ja) |
KR (1) | KR100827056B1 (ja) |
CN (1) | CN100592302C (ja) |
WO (1) | WO2005008725A2 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006344640A (ja) * | 2005-06-07 | 2006-12-21 | Renesas Technology Corp | 半導体集積回路装置 |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7000214B2 (en) * | 2003-11-19 | 2006-02-14 | International Business Machines Corporation | Method for designing an integrated circuit having multiple voltage domains |
US7589584B1 (en) * | 2005-04-01 | 2009-09-15 | Altera Corporation | Programmable voltage regulator with dynamic recovery circuits |
JP4621113B2 (ja) * | 2005-10-28 | 2011-01-26 | ルネサスエレクトロニクス株式会社 | 半導体集積回路装置 |
US7705626B2 (en) * | 2006-08-02 | 2010-04-27 | International Business Machines Corporation | Design structure to eliminate step response power supply perturbation |
US7511528B2 (en) * | 2006-08-02 | 2009-03-31 | International Business Machines Corporation | Device and method to eliminate step response power supply perturbation |
CN101593741A (zh) * | 2009-04-22 | 2009-12-02 | 上海宏力半导体制造有限公司 | 片上系统芯片 |
EP2293330B1 (en) * | 2009-09-08 | 2017-06-07 | OCT Circuit Technologies International Limited | On-chip power switches implementation. |
US8502590B2 (en) * | 2009-12-14 | 2013-08-06 | The Boeing Company | System and method of controlling devices operating within different voltage ranges |
US8810224B2 (en) * | 2011-10-21 | 2014-08-19 | Qualcomm Incorporated | System and method to regulate voltage |
US9172373B2 (en) * | 2013-09-06 | 2015-10-27 | Globalfoundries U.S. 2 Llc | Verifying partial good voltage island structures |
US9570374B2 (en) * | 2014-01-03 | 2017-02-14 | Rockwell Automation Technologies, Inc. | Systems and methods for coupling a semiconductor device of an automation device to a heat sink |
KR101538458B1 (ko) | 2014-01-03 | 2015-07-23 | 연세대학교 산학협력단 | 3차원 매니코어 프로세서를 위한 전압섬 형성 방법 |
US10812081B1 (en) * | 2019-09-27 | 2020-10-20 | Apple Inc. | Output signal control during retention mode operation |
CN115004366A (zh) * | 2020-01-23 | 2022-09-02 | 华为技术有限公司 | 一种芯片装置和无线通信装置 |
Family Cites Families (23)
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US3021842A (en) * | 1958-11-05 | 1962-02-20 | John F Flood | Hypodermic needle guide |
US3582214A (en) * | 1969-10-31 | 1971-06-01 | James W Loomis | Tool alignment apparatus and method |
US4000948A (en) * | 1975-07-14 | 1977-01-04 | Miller C Frederick | Target method and systems for bonding machines |
US4651732A (en) * | 1983-03-17 | 1987-03-24 | Frederick Philip R | Three-dimensional light guidance system for invasive procedures |
US4571243A (en) * | 1983-05-18 | 1986-02-18 | Edward C. Froning | Needle guidance system |
US5300080A (en) * | 1991-11-01 | 1994-04-05 | David Clayman | Stereotactic instrument guided placement |
NO301999B1 (no) * | 1995-10-12 | 1998-01-05 | Metronor As | Kombinasjon av laser tracker og kamerabasert koordinatmåling |
US5792044A (en) * | 1996-03-22 | 1998-08-11 | Danek Medical, Inc. | Devices and methods for percutaneous surgery |
US5638208A (en) * | 1996-07-23 | 1997-06-10 | Evans & Sutherland Computer Corporation | Projection screen with retro-reflective calibration points, placement tool and method |
US5838882A (en) * | 1996-10-31 | 1998-11-17 | Combustion Engineering, Inc. | Dynamic position tracking and control of robots |
US5810841A (en) * | 1997-01-22 | 1998-09-22 | Minrad Inc. | Energy guided apparatus and method with indication of alignment |
US6041249A (en) * | 1997-03-13 | 2000-03-21 | Siemens Aktiengesellschaft | Device for making a guide path for an instrument on a patient |
US6021343A (en) * | 1997-11-20 | 2000-02-01 | Surgical Navigation Technologies | Image guided awl/tap/screwdriver |
US6308307B1 (en) * | 1998-01-29 | 2001-10-23 | Texas Instruments Incorporated | Method for power routing and distribution in an integrated circuit with multiple interconnect layers |
US6480989B2 (en) * | 1998-06-29 | 2002-11-12 | Lsi Logic Corporation | Integrated circuit design incorporating a power mesh |
US6096049A (en) * | 1998-07-27 | 2000-08-01 | Minrad Inc. | Light guiding device and method |
JP2001110184A (ja) * | 1999-10-14 | 2001-04-20 | Hitachi Ltd | 半導体装置 |
US6615395B1 (en) * | 1999-12-20 | 2003-09-02 | International Business Machines Corporation | Method for handling coupling effects in static timing analysis |
US6720673B2 (en) * | 2001-04-11 | 2004-04-13 | International Business Machines Corporation | Voltage island fencing |
US6584596B2 (en) * | 2001-09-24 | 2003-06-24 | International Business Machines Corporation | Method of designing a voltage partitioned solder-bump package |
US6631502B2 (en) * | 2002-01-16 | 2003-10-07 | International Business Machines Corporation | Method of analyzing integrated circuit power distribution in chips containing voltage islands |
US6820240B2 (en) * | 2002-09-25 | 2004-11-16 | International Business Machines Corporation | Voltage island chip implementation |
AU2003291737A1 (en) * | 2003-11-05 | 2004-06-06 | International Business Machines Corporation | Hot switchable voltage bus for iddq current measurements |
-
2003
- 2003-07-08 US US10/604,277 patent/US7131074B2/en not_active Expired - Lifetime
-
2004
- 2004-07-08 JP JP2006518914A patent/JP5296313B2/ja not_active Expired - Fee Related
- 2004-07-08 KR KR1020067000054A patent/KR100827056B1/ko not_active IP Right Cessation
- 2004-07-08 EP EP04777801.4A patent/EP1649493B1/en not_active Expired - Lifetime
- 2004-07-08 WO PCT/US2004/021943 patent/WO2005008725A2/en active Application Filing
- 2004-07-08 CN CN200480019236A patent/CN100592302C/zh not_active Expired - Fee Related
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2006344640A (ja) * | 2005-06-07 | 2006-12-21 | Renesas Technology Corp | 半導体集積回路装置 |
Also Published As
Publication number | Publication date |
---|---|
EP1649493B1 (en) | 2016-03-16 |
EP1649493A4 (en) | 2010-04-14 |
KR20060034270A (ko) | 2006-04-21 |
KR100827056B1 (ko) | 2008-05-02 |
WO2005008725A3 (en) | 2006-11-23 |
JP5296313B2 (ja) | 2013-09-25 |
US7131074B2 (en) | 2006-10-31 |
CN101142576A (zh) | 2008-03-12 |
WO2005008725A2 (en) | 2005-01-27 |
CN100592302C (zh) | 2010-02-24 |
EP1649493A2 (en) | 2006-04-26 |
US20050010887A1 (en) | 2005-01-13 |
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