JP2007523810A - ウェブに基づく物品の在庫管理 - Google Patents
ウェブに基づく物品の在庫管理 Download PDFInfo
- Publication number
- JP2007523810A JP2007523810A JP2006547467A JP2006547467A JP2007523810A JP 2007523810 A JP2007523810 A JP 2007523810A JP 2006547467 A JP2006547467 A JP 2006547467A JP 2006547467 A JP2006547467 A JP 2006547467A JP 2007523810 A JP2007523810 A JP 2007523810A
- Authority
- JP
- Japan
- Prior art keywords
- processing
- web
- product
- sites
- bases
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T11/00—2D [Two Dimensional] image generation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20016—Hierarchical, coarse-to-fine, multiscale or multiresolution image processing; Pyramid transform
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30124—Fabrics; Textile; Paper
-
- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30136—Metal
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Quality & Reliability (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Textile Engineering (AREA)
- General Factory Administration (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
- Image Analysis (AREA)
- Controlling Rewinding, Feeding, Winding, Or Abnormalities Of Webs (AREA)
- Image Processing (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US53359603P | 2003-12-31 | 2003-12-31 | |
| PCT/US2004/043623 WO2005065305A2 (en) | 2003-12-31 | 2004-12-29 | Inventory control for web-based articles |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2007523810A true JP2007523810A (ja) | 2007-08-23 |
| JP2007523810A5 JP2007523810A5 (enExample) | 2007-12-27 |
Family
ID=34748924
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2006547467A Pending JP2007523810A (ja) | 2003-12-31 | 2004-12-29 | ウェブに基づく物品の在庫管理 |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US7120515B2 (enExample) |
| EP (1) | EP1702299A4 (enExample) |
| JP (1) | JP2007523810A (enExample) |
| KR (1) | KR101203325B1 (enExample) |
| BR (1) | BRPI0418285A (enExample) |
| WO (1) | WO2005065305A2 (enExample) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014044739A (ja) * | 2007-07-26 | 2014-03-13 | 3M Innovative Properties Co | ウェブ材料の自動検査のための方法及びシステム |
| KR101555082B1 (ko) | 2008-09-10 | 2015-09-22 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 웨브 공정 라인의 다중-롤러 정합된 반복 결함 검출 |
| JP2025513711A (ja) * | 2022-09-15 | 2025-04-30 | エルジー エナジー ソリューション リミテッド | ロールマップ作成装置および作成方法、ロールマップ、ロールマップを用いたバッテリー製造システムおよびバッテリー製造方法 |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7623699B2 (en) | 2004-04-19 | 2009-11-24 | 3M Innovative Properties Company | Apparatus and method for the automated marking of defects on webs of material |
| US20060090319A1 (en) * | 2004-11-01 | 2006-05-04 | Howe Major K | Defect locating system for moving web |
| US7545971B2 (en) * | 2005-08-22 | 2009-06-09 | Honeywell International Inc. | Method and apparatus for measuring the crepe of a moving sheet |
| EP1987349A4 (en) * | 2006-02-22 | 2013-12-18 | Metso Automation Oy | METHOD FOR OBSERVING A FASTLY MOVING PAPER TRACK AND CORRESPONDING SYSTEM |
| EP1953616B1 (en) * | 2007-02-01 | 2009-10-14 | ABB Oy | A method for creating an optimal cutting plan for a strip-like material |
| US20090028417A1 (en) * | 2007-07-26 | 2009-01-29 | 3M Innovative Properties Company | Fiducial marking for multi-unit process spatial synchronization |
| US7542821B2 (en) * | 2007-07-26 | 2009-06-02 | 3M Innovative Properties Company | Multi-unit process spatial synchronization of image inspection systems |
| US7937233B2 (en) | 2008-04-17 | 2011-05-03 | 3M Innovative Properties Company | Preferential defect marking on a web |
| US8270701B2 (en) | 2010-01-08 | 2012-09-18 | 3M Innovative Properties Company | Optical web-based defect detection using intrasensor uniformity correction |
| CN102339296A (zh) * | 2010-07-26 | 2012-02-01 | 阿里巴巴集团控股有限公司 | 一种查询结果的排序方法和装置 |
| US9845574B2 (en) | 2014-04-15 | 2017-12-19 | Gpcp Ip Holdings Llc | Method of marking a paper web for controlling a manufacturing line used to convert the paper web into paper products by reading marks on the paper web |
| JP2018036890A (ja) * | 2016-08-31 | 2018-03-08 | 富士通株式会社 | 情報処理装置、情報処理システムおよび情報処理方法 |
| DE102017108496B4 (de) | 2017-04-21 | 2023-06-29 | Windmöller & Hölscher Kg | Verfahren und Vorrichtungen sowie System zum Auf- und Abwickeln eines Wickels |
| US11120213B2 (en) * | 2018-01-25 | 2021-09-14 | Vmware, Inc. | Intelligent verification of presentation of a user interface |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08189904A (ja) * | 1995-01-06 | 1996-07-23 | Kawasaki Steel Corp | 表面欠陥検出装置 |
| JP2000241358A (ja) * | 1998-07-03 | 2000-09-08 | Nkk Corp | 欠陥マーキング方法及び欠陥マーキングしたコイルの作業方法 |
| WO2002021105A1 (en) * | 2000-09-10 | 2002-03-14 | Orbotech, Ltd. | Reduction of false alarms in pcb inspection |
| WO2002065106A1 (en) * | 2001-02-12 | 2002-08-22 | 3M Innovative Properties Company | Web inspection method and device |
Family Cites Families (45)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3759620A (en) * | 1972-05-30 | 1973-09-18 | Philco Ford Corp | Flaw detection and marking apparatus |
| US4173441A (en) * | 1977-03-28 | 1979-11-06 | E. I. Du Pont De Nemours And Company | Web inspection system and method therefor |
| DE3325125C1 (de) * | 1983-07-12 | 1985-02-14 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Anordnung zur Markierung von Fehlstellen an schnell laufenden Materialbahnen |
| JP2602201B2 (ja) * | 1985-04-12 | 1997-04-23 | 株式会社日立製作所 | 被検査パターンの欠陥検査方法 |
| JPS6293637A (ja) | 1985-10-21 | 1987-04-30 | Hitachi Ltd | 自動検反システム |
| US4752897A (en) * | 1987-05-01 | 1988-06-21 | Eastman Kodak Co. | System for monitoring and analysis of a continuous process |
| IL99823A0 (en) * | 1990-11-16 | 1992-08-18 | Orbot Instr Ltd | Optical inspection method and apparatus |
| US5440648A (en) * | 1991-11-19 | 1995-08-08 | Dalsa, Inc. | High speed defect detection apparatus having defect detection circuits mounted in the camera housing |
| JP3200237B2 (ja) * | 1992-06-09 | 2001-08-20 | イーストマン コダック カンパニー | 欠陥ドナー検出方法 |
| DK0656938T3 (da) * | 1992-07-13 | 1998-07-20 | Minnesota Mining & Mfg | Teknik til at tælle objekter i et skanderet billede |
| US5365596A (en) * | 1992-12-17 | 1994-11-15 | Philip Morris Incorporated | Methods and apparatus for automatic image inspection of continuously moving objects |
| US5305392A (en) * | 1993-01-11 | 1994-04-19 | Philip Morris Incorporated | High speed, high resolution web inspection system |
| US5544256A (en) * | 1993-10-22 | 1996-08-06 | International Business Machines Corporation | Automated defect classification system |
| US5434629A (en) * | 1993-12-20 | 1995-07-18 | Focus Automation Systems Inc. | Real-time line scan processor |
| US5563809A (en) | 1994-04-06 | 1996-10-08 | Abb Industrial Systems, Inc. | Measurement/control of sheet material using at least one sensor array |
| US6031931A (en) * | 1996-03-15 | 2000-02-29 | Sony Corporation | Automated visual inspection apparatus |
| EP0920617A1 (de) * | 1996-08-20 | 1999-06-09 | Zellweger Luwa Ag | Verfahren und vorrichtung zur erkennung von fehlern in textilen flächengebilden |
| US5774177A (en) * | 1996-09-11 | 1998-06-30 | Milliken Research Corporation | Textile fabric inspection system |
| US6092059A (en) * | 1996-12-27 | 2000-07-18 | Cognex Corporation | Automatic classifier for real time inspection and classification |
| FR2761475B1 (fr) * | 1997-03-28 | 1999-06-11 | Lorraine Laminage | Procede d'inspection de surface d'une bande en defilement par segmentation d'image en zones suspectes |
| KR100303608B1 (ko) * | 1997-05-22 | 2001-11-22 | 박호군 | 혈구세포자동인식방법및장치 |
| TW331650B (en) * | 1997-05-26 | 1998-05-11 | Taiwan Semiconductor Mfg Co Ltd | Integrated defect yield management system for semiconductor manufacturing |
| US6014209A (en) * | 1997-06-23 | 2000-01-11 | Beltronics, Inc. | Method of optically inspecting multi-layered electronic parts and the like with fluorescent scattering top layer discrimination and apparatus therefor |
| US6246472B1 (en) * | 1997-07-04 | 2001-06-12 | Hitachi, Ltd. | Pattern inspecting system and pattern inspecting method |
| EP0898163B1 (en) | 1997-08-22 | 2000-11-08 | Fraunhofer-Gesellschaft Zur Förderung Der Angewandten Forschung E.V. | Method and apparatus for automatic inspection of moving surfaces |
| AU8916498A (en) * | 1997-08-27 | 1999-03-16 | Datacube, Inc. | Web inspection system for analysis of moving webs |
| JPH11248641A (ja) | 1998-03-03 | 1999-09-17 | Sumitomo Metal Ind Ltd | 表面欠陥検査装置及び表面欠陥検査方法 |
| US6272437B1 (en) * | 1998-04-17 | 2001-08-07 | Cae Inc. | Method and apparatus for improved inspection and classification of attributes of a workpiece |
| JP2000009447A (ja) | 1998-06-25 | 2000-01-14 | Nippon Inter Connection Systems Kk | テープキャリアの欠陥検出装置および欠陥検出方法 |
| US6252237B1 (en) * | 1998-07-15 | 2001-06-26 | 3M Innovation Properties Company | Low cost thickness measurement method and apparatus for thin coatings |
| CN1212523C (zh) | 1998-07-28 | 2005-07-27 | 松下电工株式会社 | 用于检测柔性材料连续基片上分离布线图形的检测系统 |
| US6404910B1 (en) * | 1998-12-31 | 2002-06-11 | Kimberly-Clark Worldwide, Inc. | Making absorbent articles using vision imaging system |
| US6266436B1 (en) * | 1999-04-09 | 2001-07-24 | Kimberly-Clark Worldwide, Inc. | Process control using multiple detections |
| FI106086B (fi) | 1999-01-22 | 2000-11-15 | Hildeco Oy Ltd | Järjestelmä prosessin tarkkailemiseksi |
| US6496596B1 (en) * | 1999-03-23 | 2002-12-17 | Advanced Micro Devices, Inc. | Method for detecting and categorizing defects |
| US6407373B1 (en) * | 1999-06-15 | 2002-06-18 | Applied Materials, Inc. | Apparatus and method for reviewing defects on an object |
| US6470228B1 (en) * | 1999-06-23 | 2002-10-22 | Vought Aircraft Industries, Inc. | Material management system and method |
| DE19930173A1 (de) | 1999-06-30 | 2001-01-04 | Parsytec Comp Gmbh | Verfahren und Vorrichtung zur prozeßoptimierenden Einstellung von Parametern eines Produktionsprozesses |
| US6484306B1 (en) * | 1999-12-17 | 2002-11-19 | The Regents Of The University Of California | Multi-level scanning method for defect inspection |
| JP2001261191A (ja) | 2000-03-21 | 2001-09-26 | Dainippon Printing Co Ltd | 情報記憶可能な不良位置指示テープを用いた不良情報付加装置と不良情報書換え装置および不良位置指示テープ |
| EP1148332B1 (en) * | 2000-04-18 | 2005-11-30 | The University of Hong Kong | Method of inspecting images to detect defects |
| US6750466B2 (en) | 2001-02-09 | 2004-06-15 | Wintriss Engineering Corporation | Web inspection system |
| US7082347B2 (en) * | 2002-08-07 | 2006-07-25 | Kimberly-Clark Worldwide, Inc. | Autosetpoint registration control system and method associated with a web converting manufacturing process |
| US6845278B2 (en) * | 2002-08-07 | 2005-01-18 | Kimberly-Clark Worldwide, Inc. | Product attribute data mining in connection with a web converting manufacturing process |
| US7027934B2 (en) * | 2003-09-24 | 2006-04-11 | 3M Innovative Properties Company | Apparatus and method for automated web inspection |
-
2004
- 2004-12-29 WO PCT/US2004/043623 patent/WO2005065305A2/en not_active Ceased
- 2004-12-29 EP EP04815647A patent/EP1702299A4/en not_active Withdrawn
- 2004-12-29 KR KR1020067015524A patent/KR101203325B1/ko not_active Expired - Fee Related
- 2004-12-29 BR BRPI0418285-5A patent/BRPI0418285A/pt not_active IP Right Cessation
- 2004-12-29 JP JP2006547467A patent/JP2007523810A/ja active Pending
- 2004-12-29 US US11/024,894 patent/US7120515B2/en not_active Expired - Lifetime
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH08189904A (ja) * | 1995-01-06 | 1996-07-23 | Kawasaki Steel Corp | 表面欠陥検出装置 |
| JP2000241358A (ja) * | 1998-07-03 | 2000-09-08 | Nkk Corp | 欠陥マーキング方法及び欠陥マーキングしたコイルの作業方法 |
| WO2002021105A1 (en) * | 2000-09-10 | 2002-03-14 | Orbotech, Ltd. | Reduction of false alarms in pcb inspection |
| WO2002065106A1 (en) * | 2001-02-12 | 2002-08-22 | 3M Innovative Properties Company | Web inspection method and device |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2014044739A (ja) * | 2007-07-26 | 2014-03-13 | 3M Innovative Properties Co | ウェブ材料の自動検査のための方法及びシステム |
| KR101555082B1 (ko) | 2008-09-10 | 2015-09-22 | 쓰리엠 이노베이티브 프로퍼티즈 컴파니 | 웨브 공정 라인의 다중-롤러 정합된 반복 결함 검출 |
| JP2025513711A (ja) * | 2022-09-15 | 2025-04-30 | エルジー エナジー ソリューション リミテッド | ロールマップ作成装置および作成方法、ロールマップ、ロールマップを用いたバッテリー製造システムおよびバッテリー製造方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101203325B1 (ko) | 2012-11-20 |
| WO2005065305A3 (en) | 2008-04-24 |
| EP1702299A2 (en) | 2006-09-20 |
| KR20060127959A (ko) | 2006-12-13 |
| US7120515B2 (en) | 2006-10-10 |
| EP1702299A4 (en) | 2011-11-23 |
| US20050144094A1 (en) | 2005-06-30 |
| WO2005065305A2 (en) | 2005-07-21 |
| BRPI0418285A (pt) | 2007-05-02 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20071107 |
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| A621 | Written request for application examination |
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| A977 | Report on retrieval |
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| A131 | Notification of reasons for refusal |
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| A521 | Request for written amendment filed |
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| A02 | Decision of refusal |
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