JP2007502412A - 多段アナライザ・システムにおける自動品質管理プロトコル - Google Patents

多段アナライザ・システムにおける自動品質管理プロトコル Download PDF

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Publication number
JP2007502412A
JP2007502412A JP2006523232A JP2006523232A JP2007502412A JP 2007502412 A JP2007502412 A JP 2007502412A JP 2006523232 A JP2006523232 A JP 2006523232A JP 2006523232 A JP2006523232 A JP 2006523232A JP 2007502412 A JP2007502412 A JP 2007502412A
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Japan
Prior art keywords
analyzer
sample
evaluation analysis
precision
analysis
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Pending
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JP2006523232A
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Japanese (ja)
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JP2007502412A5 (enExample
Inventor
ケリー・リン・ミラー
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Dade Behring Inc
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Dade Behring Inc
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Publication of JP2007502412A publication Critical patent/JP2007502412A/ja
Publication of JP2007502412A5 publication Critical patent/JP2007502412A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00613—Quality control
    • G01N35/00623—Quality control of instruments
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00693—Calibration
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/00594—Quality control, including calibration or testing of components of the analyser
    • G01N35/00712—Automatic status testing, e.g. at start-up or periodic
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/00584—Control arrangements for automatic analysers
    • G01N35/0092—Scheduling
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N35/00—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor
    • G01N35/02—Automatic analysis not limited to methods or materials provided for in any single one of groups G01N1/00 - G01N33/00; Handling materials therefor using a plurality of sample containers moved by a conveyor system past one or more treatment or analysis stations
    • G01N35/04—Details of the conveyor system
    • G01N2035/046—General conveyor features
    • G01N2035/0467—Switching points ("aiguillages")
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/113332—Automated chemical analysis with conveyance of sample along a test line in a container or rack
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/113332—Automated chemical analysis with conveyance of sample along a test line in a container or rack
    • Y10T436/114165—Automated chemical analysis with conveyance of sample along a test line in a container or rack with step of insertion or removal from test line
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/113332—Automated chemical analysis with conveyance of sample along a test line in a container or rack
    • Y10T436/114998—Automated chemical analysis with conveyance of sample along a test line in a container or rack with treatment or replacement of aspirator element [e.g., cleaning, etc.]
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/11—Automated chemical analysis
    • Y10T436/115831—Condition or time responsive
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T436/00—Chemistry: analytical and immunological testing
    • Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
    • Y10T436/2575—Volumetric liquid transfer

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
  • Investigating Or Analysing Biological Materials (AREA)
JP2006523232A 2003-08-11 2004-08-04 多段アナライザ・システムにおける自動品質管理プロトコル Pending JP2007502412A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/638,874 US6984527B2 (en) 2003-08-11 2003-08-11 Automated quality control protocols in a multi-analyzer system
PCT/US2004/025202 WO2005018418A2 (en) 2003-08-11 2004-08-04 Automated quality control protocols in a multi-analyser system

Publications (2)

Publication Number Publication Date
JP2007502412A true JP2007502412A (ja) 2007-02-08
JP2007502412A5 JP2007502412A5 (enExample) 2007-09-13

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JP2006523232A Pending JP2007502412A (ja) 2003-08-11 2004-08-04 多段アナライザ・システムにおける自動品質管理プロトコル

Country Status (4)

Country Link
US (1) US6984527B2 (enExample)
EP (1) EP1656548A4 (enExample)
JP (1) JP2007502412A (enExample)
WO (1) WO2005018418A2 (enExample)

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JP2009515140A (ja) * 2005-07-20 2009-04-09 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレイテッド 検査室作業セルで化学検査サンプルおよび凝固検査サンプルを処理する方法
JP2009168730A (ja) * 2008-01-18 2009-07-30 Hitachi High-Technologies Corp 自動分析装置
WO2016135799A1 (ja) * 2015-02-23 2016-09-01 株式会社 日立ハイテクノロジーズ コントロール運用方法、および自動分析装置
JP2017523873A (ja) * 2014-08-14 2017-08-24 ジェン−プローブ・インコーポレーテッド 所定の配向に伸長物体を取り外し可能に保持するためのデバイスおよび所定の配向に配置された伸長物体を輸送するためのシステム
JPWO2021153028A1 (enExample) * 2020-01-30 2021-08-05

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JP4576307B2 (ja) * 2005-09-12 2010-11-04 株式会社日立ハイテクノロジーズ 自動分析装置
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JP2008209338A (ja) * 2007-02-28 2008-09-11 Hitachi High-Technologies Corp 自動分析装置
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JP6824945B2 (ja) * 2018-11-30 2021-02-03 シスメックス株式会社 検体分析装置および検体分析方法
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Cited By (12)

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Publication number Priority date Publication date Assignee Title
JP2009515140A (ja) * 2005-07-20 2009-04-09 シーメンス・ヘルスケア・ダイアグノスティックス・インコーポレイテッド 検査室作業セルで化学検査サンプルおよび凝固検査サンプルを処理する方法
JP2009168730A (ja) * 2008-01-18 2009-07-30 Hitachi High-Technologies Corp 自動分析装置
JP2017523873A (ja) * 2014-08-14 2017-08-24 ジェン−プローブ・インコーポレーテッド 所定の配向に伸長物体を取り外し可能に保持するためのデバイスおよび所定の配向に配置された伸長物体を輸送するためのシステム
WO2016135799A1 (ja) * 2015-02-23 2016-09-01 株式会社 日立ハイテクノロジーズ コントロール運用方法、および自動分析装置
JPWO2016135799A1 (ja) * 2015-02-23 2017-11-24 株式会社日立ハイテクノロジーズ コントロール運用方法、および自動分析装置
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GB2552268B (en) * 2015-02-23 2020-09-02 Hitachi High-Tech Corp Operation method for control materials and automated analyzer
US10781440B2 (en) 2015-02-23 2020-09-22 Hitachi High-Tech Corporation Operation method for control materials and automated analyzer
JPWO2021153028A1 (enExample) * 2020-01-30 2021-08-05
JP7555171B2 (ja) 2020-01-30 2024-09-24 株式会社日立ハイテク 自動分析システム
JP2024170565A (ja) * 2020-01-30 2024-12-10 株式会社日立ハイテク 自動分析システム
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EP1656548A4 (en) 2012-02-15
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