JP2007287643A5 - - Google Patents

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Publication number
JP2007287643A5
JP2007287643A5 JP2006160780A JP2006160780A JP2007287643A5 JP 2007287643 A5 JP2007287643 A5 JP 2007287643A5 JP 2006160780 A JP2006160780 A JP 2006160780A JP 2006160780 A JP2006160780 A JP 2006160780A JP 2007287643 A5 JP2007287643 A5 JP 2007287643A5
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JP
Japan
Prior art keywords
ray
rays
crystal plate
generation method
generating
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Application number
JP2006160780A
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English (en)
Japanese (ja)
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JP5426810B2 (ja
JP2007287643A (ja
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Priority to JP2006160780A priority Critical patent/JP5426810B2/ja
Priority claimed from JP2006160780A external-priority patent/JP5426810B2/ja
Priority to US11/657,557 priority patent/US7460644B2/en
Priority to EP07001876A priority patent/EP1837883A3/en
Priority to CN200710103508.4A priority patent/CN101042975B/zh
Publication of JP2007287643A publication Critical patent/JP2007287643A/ja
Publication of JP2007287643A5 publication Critical patent/JP2007287643A5/ja
Application granted granted Critical
Publication of JP5426810B2 publication Critical patent/JP5426810B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006160780A 2006-03-22 2006-06-09 Ｘ線発生方法及びｘ線発生装置 Expired - Fee Related JP5426810B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2006160780A JP5426810B2 (ja) 2006-03-22 2006-06-09 Ｘ線発生方法及びｘ線発生装置
US11/657,557 US7460644B2 (en) 2006-03-22 2007-01-25 X-ray generating method and x-ray generating apparatus
EP07001876A EP1837883A3 (en) 2006-03-22 2007-01-29 X-ray generating method and x-ray generating apparatus
CN200710103508.4A CN101042975B (zh) 2006-03-22 2007-01-31 X射线发生方法和x射线发生装置

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2006078890 2006-03-22
JP2006078890 2006-03-22
JP2006160780A JP5426810B2 (ja) 2006-03-22 2006-06-09 Ｘ線発生方法及びｘ線発生装置

Publications (3)

Publication Number Publication Date
JP2007287643A JP2007287643A (ja) 2007-11-01
JP2007287643A5 true JP2007287643A5 (enExample) 2009-07-23
JP5426810B2 JP5426810B2 (ja) 2014-02-26

Family

ID=38057558

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006160780A Expired - Fee Related JP5426810B2 (ja) 2006-03-22 2006-06-09 Ｘ線発生方法及びｘ線発生装置

Country Status (4)

Country Link
US (1) US7460644B2 (enExample)
EP (1) EP1837883A3 (enExample)
JP (1) JP5426810B2 (enExample)
CN (1) CN101042975B (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008122101A (ja) * 2006-11-08 2008-05-29 Tomohei Sakabe 画像測定方法及び画像測定装置
JP5022124B2 (ja) * 2007-07-11 2012-09-12 知平 坂部 回転対陰極ｘ線発生装置及びｘ線発生方法
US20100128848A1 (en) * 2008-11-21 2010-05-27 General Electric Company X-ray tube having liquid lubricated bearings and liquid cooled target
JP2012084383A (ja) * 2010-10-12 2012-04-26 Tomohei Sakabe Ｘ線発生方法及びｘ線発生装置
KR101205603B1 (ko) * 2011-04-12 2012-11-27 경희대학교 산학협력단 멀티빔 엑스레이 장치
CN103861541B (zh) * 2012-12-07 2015-07-08 汇佳生物仪器（上海）有限公司 提高射线处理设备照射剂量均一性的方法及其设备
CN105702544A (zh) * 2016-01-21 2016-06-22 中国电子科技集团公司第三十八研究所 一种金刚石射线靶、制备方法及应用
CN106139276B (zh) * 2016-07-28 2019-04-02 江苏摩科特医疗科技有限公司 X射线血液辐照仪装置
CN107197586B (zh) * 2017-06-30 2019-11-22 中国科学院理化技术研究所 一种氚靶装置
US10748736B2 (en) * 2017-10-18 2020-08-18 Kla-Tencor Corporation Liquid metal rotating anode X-ray source for semiconductor metrology
CN111146058B (zh) * 2020-01-16 2024-07-02 麦默真空技术无锡有限公司 一种磁流体密封多臂阴极x射线管
CN111642053B (zh) * 2020-05-26 2021-06-29 中国原子能科学研究院 一种用于中子发生器高压单元的紧凑型导流结构

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JPS57182953A (en) * 1981-05-06 1982-11-11 Esu Retsudorei Robaato Microminiature focus x-ray tube
GB2147780B (en) * 1983-09-14 1988-06-08 Philips Nv Two-crystal x-ray spectrometer
US4625323A (en) * 1983-09-19 1986-11-25 Yoshiharu Okaya Equipment for spectral radiology
JPS60216249A (ja) * 1984-04-12 1985-10-29 Nippon Atom Ind Group Co Ltd 螢光ｘ線分析装置
DE3702804C2 (de) * 1987-01-28 1994-03-10 Bradaczek Hans Prof Dr Vorrichtung zur Divergenzänderung von Röntgen- oder Neutronenstrahlenbündeln
JPH01190337A (ja) * 1988-01-22 1989-07-31 Hitachi Ltd Ｘ線エネルギー差分像撮影装置
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US5268951A (en) * 1992-12-22 1993-12-07 International Business Machines Corporation X-ray beam scanning method for producing low distortion or constant distortion in x-ray proximity printing
JPH06235703A (ja) * 1993-02-09 1994-08-23 Nippon Steel Corp Ｘ線ｃｔ装置
JP3085070B2 (ja) * 1993-12-27 2000-09-04 松下電器産業株式会社 Ｘ線照射装置
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JPH09180661A (ja) * 1995-12-27 1997-07-11 Toyota Motor Corp Ｘ線管
JP3627381B2 (ja) * 1996-05-23 2005-03-09 住友電気工業株式会社 単結晶薄膜の評価方法
JPH11144653A (ja) * 1997-11-06 1999-05-28 Mitsubishi Heavy Ind Ltd Ｘ線発生装置
JPH11339704A (ja) * 1998-05-29 1999-12-10 Tomohei Sakabe 回転対陰極ｘ線発生装置
JP3944330B2 (ja) * 1999-04-12 2007-07-11 株式会社リガク Ｘ線回折装置及びｘ線ロッキングカーブの測定方法
JP2001033406A (ja) * 1999-07-16 2001-02-09 Nec Corp Ｘ線位相差撮像方法及びｘ線位相差撮像装置
JP2001224582A (ja) * 2000-02-14 2001-08-21 Toshiba Corp Ｘ線ｃｔ装置
JP2002162499A (ja) * 2000-11-27 2002-06-07 Technos Kenkyusho:Kk Ｘ線反射素子およびその製造方法、装置ならびにｘ線分析装置
NL1018139C2 (nl) * 2001-05-23 2002-11-26 Stichting Fund Ond Material Meerlagenspiegel voor straling in het XUV-golflengtegebied en werkwijze voor de vervaardiging daarvan.
JP2003107021A (ja) * 2001-09-28 2003-04-09 Ours Tex Kk 蛍光ｘ線分析装置
JP4019029B2 (ja) * 2002-09-03 2007-12-05 株式会社リガク 平行ｘ線ビームの取り出し方法及び装置並びにｘ線回折装置
AU2003270505A1 (en) * 2002-09-10 2004-04-30 Newton Scientific, Inc. X-ray feedback stabilization of an x-ray tube
DE10304852B4 (de) * 2003-02-06 2007-10-11 Siemens Ag Röntgen-Monochromator für eine Röntgeneinrichtung
DE10337935A1 (de) * 2003-08-18 2005-03-17 Siemens Ag Vorrichtung für die Aufnahme von Strukturdaten eines Objekts

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