JP2007132932A5 - - Google Patents

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Publication number
JP2007132932A5
JP2007132932A5 JP2006293620A JP2006293620A JP2007132932A5 JP 2007132932 A5 JP2007132932 A5 JP 2007132932A5 JP 2006293620 A JP2006293620 A JP 2006293620A JP 2006293620 A JP2006293620 A JP 2006293620A JP 2007132932 A5 JP2007132932 A5 JP 2007132932A5
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JP
Japan
Prior art keywords
measuring device
wavelength
position measuring
scanning
light source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006293620A
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English (en)
Japanese (ja)
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JP2007132932A (ja
JP5128108B2 (ja
Filing date
Publication date
Priority claimed from DE102006041357A external-priority patent/DE102006041357A1/de
Application filed filed Critical
Publication of JP2007132932A publication Critical patent/JP2007132932A/ja
Publication of JP2007132932A5 publication Critical patent/JP2007132932A5/ja
Application granted granted Critical
Publication of JP5128108B2 publication Critical patent/JP5128108B2/ja
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006293620A 2005-11-09 2006-10-30 位置測定装置及び位置測定装置を作動させる方法 Active JP5128108B2 (ja)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
DE102005053789.8 2005-11-09
DE102005053789 2005-11-09
DE102006041357.1 2006-09-01
DE102006041357A DE102006041357A1 (de) 2005-11-09 2006-09-01 Positionsmesseinrichtung und Verfahren zum Betrieb einer Positionsmesseinrichtung

Publications (3)

Publication Number Publication Date
JP2007132932A JP2007132932A (ja) 2007-05-31
JP2007132932A5 true JP2007132932A5 (enExample) 2009-11-12
JP5128108B2 JP5128108B2 (ja) 2013-01-23

Family

ID=37745911

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2006293620A Active JP5128108B2 (ja) 2005-11-09 2006-10-30 位置測定装置及び位置測定装置を作動させる方法
JP2008539306A Active JP4999856B2 (ja) 2005-11-09 2006-11-02 位置測定システム

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2008539306A Active JP4999856B2 (ja) 2005-11-09 2006-11-02 位置測定システム

Country Status (4)

Country Link
EP (2) EP1785698B1 (enExample)
JP (2) JP5128108B2 (enExample)
DE (1) DE102006041357A1 (enExample)
WO (1) WO2007054234A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7389595B2 (en) * 2005-11-09 2008-06-24 Dr. Johannes Heidenhain Gmbh Position-measuring device and method for operating a position-measuring device
DE102008007319A1 (de) * 2008-02-02 2009-08-06 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
DE102009054592A1 (de) * 2009-12-14 2011-06-16 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102011076178B4 (de) * 2011-05-20 2022-03-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
JP6849371B2 (ja) 2015-10-08 2021-03-24 三星電子株式会社Ｓａｍｓｕｎｇ Ｅｌｅｃｔｒｏｎｉｃｓ Ｃｏ．，Ｌｔｄ． 側面発光レーザ光源、及びそれを含む三次元映像取得装置
CN109752033B (zh) * 2019-02-22 2024-01-30 上海交通大学 高精度光纤光栅应变测量系统

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5918412A (ja) * 1982-07-22 1984-01-30 Fanuc Ltd 位置検出方式
EP1019669B1 (de) * 1997-09-29 2002-07-24 Dr. Johannes Heidenhain GmbH Vorrichtung zur erfassung der position von zwei körpern
DE19843176C1 (de) 1998-09-21 2000-10-19 Siemens Ag Optischer Encoder zur Erfassung von Dreh- und Linearbewegungen
JP2000304507A (ja) * 1999-04-21 2000-11-02 Citizen Watch Co Ltd 回折格子の回折光干渉を用いた寸法測定装置
DE19941318A1 (de) * 1999-08-31 2001-03-15 Heidenhain Gmbh Dr Johannes Optische Positionsmeßeinrichtung
US6494616B1 (en) * 2000-08-04 2002-12-17 Regents Of The University Of Minnesota Multiplexed sensor array
WO2002033358A1 (en) * 2000-10-22 2002-04-25 Stridsberg Innovation Ab Position transducer
DE10054062A1 (de) * 2000-10-31 2002-05-16 Heidenhain Gmbh Dr Johannes Verfahren zur Positionsbestimmung und Positionsmesseinrichtung zur Ausführung des Verfahrens
DE10158223B4 (de) * 2001-11-16 2017-10-05 Dr. Johannes Heidenhain Gmbh Drehwinkel-Messgerät
DE10235669B4 (de) * 2002-08-03 2016-11-17 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
JP4381671B2 (ja) * 2002-10-23 2009-12-09 ソニーマニュファクチュアリングシステムズ株式会社 変位検出装置
DE102004011698B4 (de) * 2004-03-10 2007-12-13 Siemens Ag Verfahren zum Erkennen eines Sensortyps
DE102004053082A1 (de) 2004-11-03 2006-05-04 Dr. Johannes Heidenhain Gmbh Positionsmesssystem
DE102005043569A1 (de) * 2005-09-12 2007-03-22 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung

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