JP2007123444A - Package for housing optical element, optical device, and its manufacturing method - Google Patents

Package for housing optical element, optical device, and its manufacturing method Download PDF

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Publication number
JP2007123444A
JP2007123444A JP2005311762A JP2005311762A JP2007123444A JP 2007123444 A JP2007123444 A JP 2007123444A JP 2005311762 A JP2005311762 A JP 2005311762A JP 2005311762 A JP2005311762 A JP 2005311762A JP 2007123444 A JP2007123444 A JP 2007123444A
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optical element
light
mounting
light receiving
hole
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Takeshi Hasegawa
剛 長谷川
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Kyocera Corp
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Kyocera Corp
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/30107Inductance
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/30Technical effects
    • H01L2924/301Electrical effects
    • H01L2924/3025Electromagnetic shielding

Abstract

<P>PROBLEM TO BE SOLVED: To provide a package for housing an optical element applicable to the manufacture of an optical device more superior in the light reception accuracy, and to provide the optical device manufactured by using the package for housing the optical element, and to provide its manufacturing method. <P>SOLUTION: The package X for housing an optical element comprises an insulating substrate 10, including a mounting part 11a for mounting an optical element D comprising a light emitter (or a light-receiving part) Da; and a cover 30 comprising a transparent light transmitter 31 and a through-hole 32 that are opened to face the mounting part 11a at its one end, and opened to an external space at the other end for specifying a housing space S for housing the optical element D, together with the insulating substrate 10. <P>COPYRIGHT: (C)2007,JPO&INPIT

Description

本発明は、発光ダイオードおよび半導体レーザ素子などの発光部やフォトダイオードおよびフォトトランジスタなどの受光部を含む光素子を収納するための光素子収納用パッケージ、この光素子収納用パッケージを使用した光装置およびその製造方法に関する。   The present invention relates to an optical element storage package for storing an optical element including a light emitting portion such as a light emitting diode and a semiconductor laser element, and a light receiving portion such as a photodiode and a phototransistor, and an optical device using the optical element storage package And a manufacturing method thereof.

フォトダイオードなどの受光部を含んでなる光素子を収納する光素子収納用パッケージとしては、光素子を搭載するための搭載部を凹部底面に有する絶縁基体と、この絶縁基体の凹部の内側から外側にかけて延びる配線導体と、透光性を有する透光部を中央部に含んでなる蓋体とを備えて構成されるものがある。光素子は、通常、上面中央部に位置する受光部および外周部に位置する電極を有しており、搭載部に搭載され且つボンディングワイヤを介して配線導体と電気的に接続される。   An optical element storage package for storing an optical element including a light receiving portion such as a photodiode includes an insulating base having a mounting portion for mounting the optical element on the bottom surface of the concave portion, and an outside from the inside of the concave portion of the insulating base. In some cases, a wiring conductor extending between and a lid body including a translucent portion having translucency at the center is provided. The optical element usually has a light receiving portion located at the center of the upper surface and an electrode located at the outer peripheral portion, and is mounted on the mounting portion and electrically connected to the wiring conductor via a bonding wire.

このような構成の光素子収納用パッケージを使用する光装置は、絶縁基体の搭載部に光素子を搭載し、光素子の電極と配線導体との電機的接続を図ったうえで、絶縁基体の上面に凹部を塞ぐように接合材を介して蓋体を接合させることにより、作製される。このようにして作製された光装置では、蓋体を介して光素子に到達する外光が受光部において受光され、外光が電気信号に変換される。この変換により生じた電気信号は、配線導体を介して光装置の外部に配置された各種機器などに伝搬される。   The optical device using the optical element storage package having such a configuration has the optical element mounted on the insulating base mounting portion, and after the electrical connection between the electrode of the optical element and the wiring conductor is achieved, It is manufactured by bonding a lid through a bonding material so as to close the concave portion on the upper surface. In the optical device thus manufactured, external light reaching the optical element through the lid is received by the light receiving unit, and the external light is converted into an electrical signal. The electrical signal generated by this conversion is propagated to various devices arranged outside the optical device via the wiring conductor.

以下に、上述した従来の光素子収納用パッケージを使用した光装置の製造方法について説明する。まず、絶縁基体の搭載部に光素子を搭載した後、光素子の電極と絶縁基体の配線導体とをボンディングワイヤにより結線する。次に、目視による内観の検査を行い(内観検査工程)、光素子の上面(特に受光部)に付着した微細異物の確認および除去を行う。次に、搭載部を覆うように絶縁基体の上面に蓋体を取り付け、光素子を気密封止する。この気密封止は、絶縁基体の上面の外周部に接合材(例えば未硬化の樹脂接着剤)を塗布したうえで、その上方より蓋体を搭載し、接合材を硬化させることにより行う。
特開2005−159277号公報
A method for manufacturing an optical device using the above-described conventional optical element storage package will be described below. First, after mounting the optical element on the mounting portion of the insulating base, the electrode of the optical element and the wiring conductor of the insulating base are connected by a bonding wire. Next, a visual inspection of the interior is performed (internal inspection process), and fine foreign substances adhering to the upper surface (particularly the light receiving portion) of the optical element are confirmed and removed. Next, a lid is attached to the upper surface of the insulating base so as to cover the mounting portion, and the optical element is hermetically sealed. This hermetic sealing is performed by applying a bonding material (for example, an uncured resin adhesive) to the outer peripheral portion of the upper surface of the insulating base, mounting a lid from above, and curing the bonding material.
JP 2005-159277 A

しかしながら、上述の製造方法では、上記内観検査工程後から蓋体を取り付けるまでのハンドリングや蓋体封止装置内作業中に、外気や搭載部周辺に存在している微細異物などが光素子の上面に付着してしまう場合がある。このような異物の付着が発生すると、受光部における外光の受光が適切に行われなく可能性があるため、上述の製造方法により製造された光装置では、充分な受光精度を確保することができない場合があった。特に、近年、フォトダイオードなどの受光部を含んでなる光素子は、画像の精細化や、センサとしての検知精度の高精度化などの要求により、受光部が非常に精細に形成されているため、受光部における微細異物の付着がわずかなものであっても、光装置において充分な受光精度を確保できない場合があった。   However, in the above-described manufacturing method, during the handling from the inside inspection process until the lid is attached and the work inside the lid sealing device, the outside air and fine foreign matters existing around the mounting portion are exposed to the upper surface of the optical element. May adhere to the surface. If such foreign matter adheres, external light may not be properly received by the light receiving unit, so that the optical device manufactured by the above-described manufacturing method can ensure sufficient light receiving accuracy. There were cases where it was not possible. In particular, in recent years, an optical element including a light receiving portion such as a photodiode is formed with a very fine light receiving portion due to demands for finer images and higher detection accuracy as a sensor. In some cases, even if a minute foreign matter is slightly attached to the light receiving portion, sufficient light receiving accuracy cannot be ensured in the optical device.

本発明は、このような事情のもとで考え出されたものであって、より受光精度に優れた光装置を製造するのに適用される光素子収納用パッケージ、並びに、該光素子収納用パッケージを使用して製造される光装置およびその製造方法を提供することを、目的とする。   The present invention has been conceived under such circumstances, and is an optical element storage package that is applied to manufacture an optical device with higher light receiving accuracy, and the optical element storage An object of the present invention is to provide an optical device manufactured using a package and a method for manufacturing the same.

本発明の第1の側面に係る光素子収納用パッケージは、発光部および/または受光部を含んでなる光素子を搭載するための搭載部を有する絶縁基体と、透光性を有する透光部、および、一端が前記搭載部を臨むように開放し且つ他端が外部空間に開放する貫通孔を有し、前記絶縁基体とともに前記光素子を収納するための収納空間を規定する蓋体と、を備えることを特徴とする。ここで、発光部および/または受光部とは、発光部および受光部と、発光部または受光部とを含む意味の記載であり、以下においても同様である。   An optical element storage package according to a first aspect of the present invention includes an insulating substrate having a mounting part for mounting an optical element including a light emitting part and / or a light receiving part, and a translucent part having translucency. And a lid body that has a through-hole that opens so that one end faces the mounting portion and the other end opens to the external space, and that defines a storage space for storing the optical element together with the insulating base; It is characterized by providing. Here, the light emitting part and / or the light receiving part is a description of the meaning including the light emitting part and the light receiving part and the light emitting part or the light receiving part, and the same applies to the following.

本発明の第1の側面に係る光素子収納用パッケージにおいては、前記透光部が、前記絶縁基体の前記搭載部に搭載されている前記光素子の前記発光部および/または前記受光部に対向する部位に形成されているのが好ましい。ここで、前記発光部および/または前記受光部とは、前記発光部および前記受光部と、前記発光部または前記受光部とを含む意味の記載であり、以下においても同様である。   In the optical element storage package according to the first aspect of the present invention, the light transmitting portion faces the light emitting portion and / or the light receiving portion of the optical element mounted on the mounting portion of the insulating base. It is preferable that it is formed in the site to be. Here, the light emitting unit and / or the light receiving unit is a description that includes the light emitting unit, the light receiving unit, and the light emitting unit or the light receiving unit, and the same applies to the following.

本発明の第1の側面に係る光素子収納用パッケージにおいては、前記貫通孔が、前記絶縁基体の前記搭載部に搭載されている前記光素子の前記発光部および/または前記受光部に対向する部位以外の部位に形成されているのが好ましい。   In the optical element storage package according to the first aspect of the present invention, the through hole faces the light emitting part and / or the light receiving part of the optical element mounted on the mounting part of the insulating base. It is preferably formed at a site other than the site.

本発明の第2の側面に係る光装置は、本発明の第1の側面に係る光素子収納用パッケージと、前記絶縁基体の前記搭載部に搭載される光素子と、前記貫通孔を封止するための封止材と、を備えることを特徴とする。   An optical device according to a second aspect of the present invention seals an optical element storage package according to the first aspect of the present invention, an optical element mounted on the mounting portion of the insulating base, and the through hole. And a sealing material.

本発明の第3の側面に係る光装置の製造方法は、発光部および/または受光部を含んでなる光素子を搭載するための搭載部を有する絶縁基体の該搭載部に搭載された該光素子の発光部および/または受光部の表面に存在する異物を除去する第1除去工程と、透光性を有する透光部、および、一端が前記搭載部を臨むように開放し且つ他端が外部空間に開放する貫通孔を有し、前記絶縁基体とともに前記光素子を収納するための収納空間を規定する蓋体を接合材により該絶縁基体に取り付ける取付け工程と、前記取付け工程を経た光素子の発光部および/または受光部の表面に存在する異物を、前記貫通孔を介して挿入される除去具により除去する第2除去工程と、前記貫通孔を封止材により封止する封止工程と、を含むことを特徴とする。   The manufacturing method of the optical device according to the third aspect of the present invention includes the light mounted on the mounting portion of the insulating substrate having the mounting portion for mounting the optical element including the light emitting portion and / or the light receiving portion. A first removal step of removing foreign matter present on the surface of the light emitting part and / or the light receiving part of the element; a translucent part having translucency; and one end opened to face the mounting part and the other end An attaching step of attaching a lid body, which has a through-hole opened in an external space, and defining a storage space for storing the optical element together with the insulating base to the insulating base, and an optical element that has undergone the mounting step A second removing step of removing foreign matter present on the surface of the light emitting portion and / or the light receiving portion with a removing tool inserted through the through hole, and a sealing step of sealing the through hole with a sealing material It is characterized by including these.

本発明の第3の側面に係る光装置の製造方法は、前記取付け工程後で且つ前記第2除去工程前に、前記光素子の発光部および/または受光部の表面における異物の存在の程度による選別を行う選別工程を更に含むのが好ましい。   The method for manufacturing an optical device according to the third aspect of the present invention depends on the degree of the presence of foreign matter on the surface of the light emitting portion and / or the light receiving portion of the optical element after the attaching step and before the second removing step. It is preferable to further include a sorting step for performing sorting.

本発明の第1の側面に係る光素子収納用パッケージは、一端が前記搭載部を臨むように開放し且つ他端が外部に開放する貫通孔を有し、前記絶縁基体とともに前記光素子を収納するための収納空間を規定する蓋体とを備えている。そのため、本光素子収納用パッケージでは、絶縁基体の搭載部に搭載した光素子を収納するように、接合材により絶縁基体に蓋体を取り付けた後でも、蓋体の貫通孔を介して除去具(例えば、プラスチック製の棒状部材の先端に、ビニールレジンやメチルイソブチルケトン(MIBK)などの混合物を含んでなる粘着部を有するもの)を挿入して光素子の発光部や受光部の表面に存在する異物を除去することができる。したがって、本光素子収納用パッケージでは、蓋体を取り付けるまでのハンドリングや蓋体封止作業中に、外気や搭載部周辺に存在している微細異物などが光素子における上記表面に付着したとしても、蓋体搭載後に微細異物などを適切に除去することができるため、より優れた発光精度や受光精度などを得ることができるのである。ここで、発光精度とは、例えば発光部から外部に光信号を適切に送信することができる精細化の程度を表す指標であり、受光精度とは、例えば外部からの光信号を受光部において適切に受信することができる精細化の程度を表す指標である。   The optical element storage package according to the first aspect of the present invention has a through hole having one end opened so as to face the mounting portion and the other end opened to the outside, and stores the optical element together with the insulating base. And a lid that defines a storage space for the purpose. Therefore, in this optical element storage package, even after the lid is attached to the insulating base with a bonding material so as to store the optical element mounted on the mounting portion of the insulating base, the removal tool is inserted through the through hole of the lid. (For example, one having a sticky part containing a mixture of vinyl resin or methyl isobutyl ketone (MIBK) at the tip of a plastic rod-like member) is present on the surface of the light emitting part or light receiving part of the optical element. It is possible to remove foreign matter. Therefore, in this optical element storage package, even if the outer surface of the optical element or fine foreign matter existing around the mounting part adheres to the surface of the optical element during handling until the lid is attached or during the lid sealing operation. In addition, since fine foreign matters and the like can be appropriately removed after the lid is mounted, more excellent light emission accuracy and light reception accuracy can be obtained. Here, the light emission accuracy is an index representing the degree of refinement that can appropriately transmit an optical signal from the light emitting unit to the outside, for example, and the light receiving accuracy is an appropriate value of the optical signal from the outside at the light receiving unit, for example. This is an index representing the degree of refinement that can be received.

本光素子収納用パッケージは、透光部が絶縁基体の搭載部に搭載されている光素子の発光部および/または受光部に対向する部位に形成されているのが好ましい。このような構成では、光素子の発光部からの発光(光の放出)や、光素子の受光部における受光を行ううえで、その特性上、最も重要な光素子の発光部や受光部との対向部位を含んで透光部が形成されている。したがって、本構成の光素子収納用パッケージは、光素子の発光精度や受光精度、信頼性をより向上させるうえで好適である。   In this optical element storage package, it is preferable that the translucent part is formed at a part facing the light emitting part and / or the light receiving part of the optical element mounted on the mounting part of the insulating base. In such a configuration, when light is emitted from the light emitting part of the optical element (light emission) and light is received at the light receiving part of the optical element, the characteristics of the light emitting part and the light receiving part of the optical element that are the most important are the characteristics. The translucent part is formed including the opposing part. Therefore, the optical element storage package of this configuration is suitable for further improving the light emission accuracy, light reception accuracy, and reliability of the optical element.

本光素子収納用パッケージは、貫通孔が絶縁基体の搭載部に搭載されている光素子の発光部および/または受光部に対向する部位以外の部位に形成されているのが好ましい。このような構成では、光素子の発光部からの発光(光の放出)や、光素子の受光部における受光を行ううえで、その特性上、最も重要な光素子の発光部や受光部との対向部位に貫通孔が存在することに起因して、発光または受光される光が歪んだり、乱反射したりすることを効果的に防ぐことができる。したがって、本構成の光素子収納用パッケージは、光素子の発光精度や受光精度、信頼性をより向上させるうえで好適である。   In this optical element storage package, it is preferable that the through hole is formed in a portion other than the portion facing the light emitting portion and / or the light receiving portion of the optical element mounted on the mounting portion of the insulating base. In such a configuration, when light is emitted from the light emitting part of the optical element (light emission) and light is received at the light receiving part of the optical element, the characteristics of the light emitting part and the light receiving part of the optical element that are the most important are the characteristics. It is possible to effectively prevent the light emitted or received from being distorted or irregularly reflected due to the presence of the through hole in the facing portion. Therefore, the optical element storage package of this configuration is suitable for further improving the light emission accuracy, light reception accuracy, and reliability of the optical element.

本発明の第2の側面に係る光装置は、本発明の第1の側面に係る光素子収納用パッケージと、前記絶縁基体の前記搭載部に搭載される光素子と、前記貫通孔を封止するための封止材とを備えている。そのため、本光装置では、上述のようにして、蓋体搭載後に微細異物などを除去したうえで、蓋体の貫通孔を封止材により封止することができる。したがって、本光装置は、発光精度や受光精度などにおいて、より優れているのである。   An optical device according to a second aspect of the present invention seals an optical element storage package according to the first aspect of the present invention, an optical element mounted on the mounting portion of the insulating base, and the through hole. And a sealing material. Therefore, in the present optical device, as described above, the fine foreign matter and the like can be removed after mounting the lid, and the through hole of the lid can be sealed with the sealing material. Therefore, this optical device is superior in light emission accuracy, light reception accuracy, and the like.

本発明の第3の側面に係る光装置の製造方法は、取付け工程を経た光素子の発光部および/または受光部の表面に存在する異物を、貫通孔を介して挿入される除去具により除去する第2除去工程を含んでいる。そのため、本方法では、蓋体の貫通孔を介して除去具を挿入して光素子の発光部や受光部の表面に存在する異物を除去したうえで、光装置を製造することができる。したがって、本方法では、取付け工程の完了時までに、外気や搭載部周辺に存在している微細異物などが光素子における上記表面に付着したとしても、第2除去工程において微細異物などを適切に除去することができるため、より発光精度や受光精度などに優れた光装置を製造することができるのである。   The method for manufacturing an optical device according to the third aspect of the present invention removes foreign matter present on the surface of the light emitting portion and / or the light receiving portion of the optical element that has undergone the attachment process by a removal tool inserted through the through hole. A second removal step. Therefore, in this method, an optical device can be manufactured after inserting a removal tool through the through-hole of the lid to remove foreign substances present on the surface of the light emitting part and the light receiving part of the optical element. Therefore, in this method, even if fine foreign matter or the like existing around the outside air or the mounting portion adheres to the surface of the optical element by the time when the mounting process is completed, the fine foreign matter or the like is appropriately removed in the second removal step. Since it can be removed, it is possible to manufacture an optical device with better light emission accuracy and light reception accuracy.

本製造方法は、取付け工程後で且つ第2除去工程前に、光素子の発光部および/または受光部の表面における異物の存在の程度による選別を行う選別工程を更に含むのが好ましい。このような方法によると、第2除去工程を経る必要があるもの(異物の存在程度が基準以上のもの)と、そうでないものとを選別したうえで、第2除去工程を経る必要があるもののみ、選択的に第2除去工程を経るようにすることができる。したがって、本方法は、より生産性を高めるうえで好適である。   Preferably, the manufacturing method further includes a selection step of performing selection based on the degree of the presence of foreign matter on the surface of the light emitting portion and / or the light receiving portion of the optical element after the attachment step and before the second removal step. According to such a method, what needs to go through the second removal step after sorting out those that need to go through the second removal step (the presence of foreign matter is above the standard) and those that don't. Only the second removal step can be selectively performed. Therefore, this method is suitable for improving productivity.

図1は、本発明の実施形態に係る光素子収納用パッケージXに光素子Dを収納してなる光装置Yを表す断面図である。図2は、図1に示す光装置Yを表す平面図である。   FIG. 1 is a cross-sectional view showing an optical device Y in which an optical element D is accommodated in an optical element accommodation package X according to an embodiment of the present invention. FIG. 2 is a plan view showing the optical device Y shown in FIG.

光素子収納用パッケージXは、絶縁基体10、配線導体20、蓋体30を有し、その内部に光素子Dを収納するためのものである。光素子Dは、発光する機能を有する発光素子または受光する機能(光を感知する機能)を有する受光素子であり、本実施形態では、外部へ向けて光を発するための発光部(または外部からの光を受けるための受光部)Da、および、上面に電源用や信号用などの電極Dbを有する。発光素子としては、発光ダイオード(LED)や半導体レーザ(LD)などが挙げられ、発光素子を有する半導体チップとしては、LEDチップおよびLDチップなどが挙げられる。また、受光素子としては、フォトダイオード(PD)やフォトトランジスタなどが挙げられ、受光素子を有する半導体チップとしては、ラインセンサ、イメージセンサ、電荷結合素子(CCD)、EPROM(Erasable and Programmable Read Only Memory)などが挙げられる。なお、光素子Dを収納するための収納空間Sは、主として絶縁基体10および蓋体30により規定される。   The optical element storage package X has an insulating base 10, a wiring conductor 20, and a lid 30 for storing the optical element D therein. The optical element D is a light emitting element having a function of emitting light or a light receiving element having a function of receiving light (function of sensing light). In the present embodiment, the light emitting unit (or from the outside) for emitting light toward the outside. Light receiving portion) Da for receiving the light, and electrodes Db for power supply and signals on the upper surface. Examples of the light emitting element include a light emitting diode (LED) and a semiconductor laser (LD). Examples of the semiconductor chip having the light emitting element include an LED chip and an LD chip. Examples of the light receiving element include a photodiode (PD) and a phototransistor. Semiconductor chips having the light receiving element include a line sensor, an image sensor, a charge coupled device (CCD), an EPROM (Erasable and Programmable Read Only Memory). ) And the like. The storage space S for storing the optical element D is mainly defined by the insulating base 10 and the lid 30.

絶縁基体10は、凹部11を有しており、平面視において例えば略正方形状や略長方形状である。絶縁基体10を構成する材料としては、セラミックスや樹脂、セラミックスと樹脂との複合材料などが挙げられる。ここで、セラミックスとは、酸化アルミニウム質焼結体(アルミナセラミックス)、窒化アルミニウム質焼結体(窒化アルミニウムセラミックス)、炭化珪素質焼結体(炭化珪素セラミックス)、窒化珪素質焼結体(窒化珪素セラミックス)、ガラス質焼結体(ガラスセラミックス)、ムライト質焼結体などであり、樹脂とは、エポキシ樹脂、ポリイミド樹脂、アクリル樹脂、フェノール樹脂、ポリエステル樹脂などの熱硬化型または紫外線硬化型の樹脂である。   The insulating base 10 has a recess 11 and has, for example, a substantially square shape or a substantially rectangular shape in plan view. Examples of the material constituting the insulating substrate 10 include ceramics, resins, and composite materials of ceramics and resins. Here, ceramics means an aluminum oxide sintered body (alumina ceramic), an aluminum nitride sintered body (aluminum nitride ceramic), a silicon carbide sintered body (silicon carbide ceramic), and a silicon nitride sintered body (nitriding). Silicon ceramics), glassy sintered bodies (glass ceramics), mullite sintered bodies, etc., and resins are thermosetting or ultraviolet curing types such as epoxy resins, polyimide resins, acrylic resins, phenolic resins, polyester resins, etc. Resin.

ここで、絶縁基体10を構成する材料としてアルミナ質焼結体を採用した場合における絶縁基体10の作製方法の一例について説明する。まず、酸化アルミニウム(アルミナ)や二酸化ケイ素(シリカ)などの原料粉末を有機溶剤やバインダなどとともにシート状に成形して複数のセラミックグリーンシートを作製する。次に、作製されたセラミックグリーンシートの一部を光素子Dが収納可能な所定寸法の長方形の板状に打ち抜く。次に、打ち抜かれたセラミックグリーンシートを光素子Dが収納可能な所定寸法まで積層するとともに、打ち抜かれていないセラミックグリーンシートを所定寸法まで積層し、それぞれの積層体を重ねたうえで所定の焼成温度(例えば1300〜1600℃)で焼成する。以上のようにして、絶縁基体10は作製される。なお、絶縁基体10の作製方法としては、上述の同時焼成による方法に限られず、板状の絶縁体の上面の外周部に、接合材(例えば、ろう材、ガラス、樹脂)を用いて枠状の絶縁体を接合する方法を採用してもよい。   Here, an example of a method for manufacturing the insulating substrate 10 in the case where an alumina sintered body is employed as the material constituting the insulating substrate 10 will be described. First, raw material powders such as aluminum oxide (alumina) and silicon dioxide (silica) are formed into a sheet shape together with an organic solvent and a binder to produce a plurality of ceramic green sheets. Next, a part of the produced ceramic green sheet is punched into a rectangular plate having a predetermined size that can accommodate the optical element D. Next, the punched ceramic green sheets are laminated to a predetermined dimension that can accommodate the optical element D, and the ceramic green sheets that are not punched are laminated to a predetermined dimension, and the respective laminates are stacked and then fired. Firing is performed at a temperature (for example, 1300 to 1600 ° C.). As described above, the insulating base 10 is manufactured. The method for manufacturing the insulating substrate 10 is not limited to the above-described method by simultaneous firing, and a frame shape is formed by using a bonding material (for example, brazing material, glass, resin) on the outer peripheral portion of the upper surface of the plate-like insulator. A method of joining the insulators may be adopted.

凹部11は、底面11aおよび底面11bを有しており、光素子Dを収納するための部位である。底面11aは、光素子Dの搭載面であり、例えば平坦面である。底面11bは、後述する配線導体20の一端部である配線パッド部21が位置する部位である。   The recess 11 has a bottom surface 11a and a bottom surface 11b, and is a part for housing the optical element D. The bottom surface 11a is a mounting surface of the optical element D and is, for example, a flat surface. The bottom surface 11b is a part where a wiring pad portion 21 which is one end portion of a wiring conductor 20 described later is located.

配線導体20は、配線パッド部21および端子電極部22を有しており、光素子収納用パッケージXの内外の電気的導通を得るための部材である。また、配線導体20の形態としては、メタライズ層状、メッキ層状、蒸着層状、金属箔層状などが挙げられる。配線パッド部21は、底面11bで露出しており、後述するボンディングワイヤ40を介して光素子Dの電極Dbに電気的接続される部位である。端子電極部22は、絶縁基体10の下面で露出しており、導電性接続材(例えば、はんだ)を介して外部電気回路(図示せず)に電気的接続される部位である。配線パッド部21および端子電極部22は、それらの間の部位より相対的に広面積に形成されている。このような構成によると、電気的接続をより確実且つ容易に行うことができる。配線導体20を構成する材料としては、タングステン、モリブデン、マンガン、銅、銀、パラジウム、白金、金などの金属材料が挙げられる。なお、電子部品収納用パッケージXの内外の電気的導通を得るための部材としては、配線導体20には限られず、例えば金属製リード端子(リードフレーム)などを採用してもよい。   The wiring conductor 20 has a wiring pad portion 21 and a terminal electrode portion 22 and is a member for obtaining electrical continuity inside and outside the optical element storage package X. Moreover, as a form of the wiring conductor 20, metallized layer shape, plating layer shape, vapor deposition layer shape, metal foil layer shape, etc. are mentioned. The wiring pad portion 21 is exposed at the bottom surface 11b and is a portion that is electrically connected to the electrode Db of the optical element D via a bonding wire 40 described later. The terminal electrode portion 22 is exposed on the lower surface of the insulating base 10 and is a portion that is electrically connected to an external electric circuit (not shown) via a conductive connecting material (for example, solder). The wiring pad part 21 and the terminal electrode part 22 are formed in a relatively larger area than the part between them. According to such a configuration, electrical connection can be more reliably and easily performed. Examples of the material constituting the wiring conductor 20 include metal materials such as tungsten, molybdenum, manganese, copper, silver, palladium, platinum, and gold. The member for obtaining electrical continuity inside and outside the electronic component storage package X is not limited to the wiring conductor 20, and for example, a metal lead terminal (lead frame) or the like may be adopted.

ここで、配線導体20を構成する材料としてタングステンを採用するとともに、配線導体20の形態をメタライズ層状にした場合における配線導体20の形成方法の一例について説明する。まず、タングステン粉末を有機溶剤やバインダなどとともに混練して金属ペーストを作製する。次に、作製された金属ペーストを所定の印刷方法(例えば、スクリーン印刷法)により絶縁基体10を構成するセラミックグリーンシートに対して印刷する。このとき、セラミックグリーンシートにスルーホールが設けられている場合は、そのスルーホール内にも金属ペーストが充填されるように印刷する。以上のようにして、配線導体20は形成される。なお、配線導体20における露出表面に対しては、さらにメッキ層(例えば、金メッキや錫メッキ)を形成してもよい。   Here, an example of a method of forming the wiring conductor 20 when tungsten is adopted as a material constituting the wiring conductor 20 and the wiring conductor 20 is formed in a metallized layer will be described. First, a tungsten paste is kneaded with an organic solvent, a binder, etc., and a metal paste is produced. Next, the produced metal paste is printed on the ceramic green sheet constituting the insulating substrate 10 by a predetermined printing method (for example, screen printing method). At this time, if a through hole is provided in the ceramic green sheet, printing is performed so that the metal paste is also filled in the through hole. The wiring conductor 20 is formed as described above. A plating layer (for example, gold plating or tin plating) may be further formed on the exposed surface of the wiring conductor 20.

蓋体30は、絶縁基体10の凹部11を塞ぐことが可能な形状や寸法で構成されており、例えば凹部11が平面視四角形状であれば、外径寸法が凹部11の平面視面積よりも若干大きい四角板状に構成される。また、本実施形態に係る蓋体30は、本体部31および貫通孔32を有しており、絶縁基体10とともに光素子Dを収納するための収納空間Sを規定するものである。   The lid body 30 is configured in a shape and dimensions capable of closing the concave portion 11 of the insulating base 10. For example, if the concave portion 11 has a quadrangular shape in plan view, the outer diameter dimension is larger than the planar view area of the concave portion 11. It is constructed in the shape of a slightly larger square plate. Further, the lid body 30 according to the present embodiment has a main body portion 31 and a through hole 32, and defines a storage space S for storing the optical element D together with the insulating base 10.

本体部31は、透光性を有する部位であり、絶縁基体10の底面11aに搭載された光素子Dの発光部(または受光部)Daに対向する部位を含んでいる。本体部31を構成する材料としては、ガラス、石英ガラス、水晶、サファイア、透明樹脂などの透光性材料が挙げられる。   The main body part 31 is a part having translucency, and includes a part facing the light emitting part (or light receiving part) Da of the optical element D mounted on the bottom surface 11 a of the insulating substrate 10. Examples of the material constituting the main body 31 include translucent materials such as glass, quartz glass, crystal, sapphire, and transparent resin.

貫通孔32は、絶縁基体10に蓋体30を取り付けた後でも、絶縁基体10の底面11aに搭載された光素子Dの発光部(または受光部)Daに存在する異物などを除去することを可能にするための部位であり、一端が絶縁基体10の底面(搭載面)11aを臨むように開放し且つ他端が外部空間(収容空間S外の空間)に開放するように形成されている。本実施形態における貫通孔32は、蓋体30の厚さ方向(矢印AB方向)に延び、且つ、発光部(または受光部)Daの対向部位以外の部位に該対向部位を基準として対称となる位置に4つ設けられているが、その形状や形成位置、形成箇所数は上述の目的を可能にする範囲内で適宜設定すればよい。なお、貫通孔32は、蓋体30の所定位置に対して、例えばドリルなどによる切削加工やレーザ加工によって形成することができる。   The through-hole 32 removes foreign matter or the like existing in the light emitting part (or light receiving part) Da of the optical element D mounted on the bottom surface 11a of the insulating base 10 even after the lid 30 is attached to the insulating base 10. It is a part for enabling, and is formed so that one end is opened to face the bottom surface (mounting surface) 11a of the insulating base 10 and the other end is opened to the external space (space outside the accommodation space S). . The through-hole 32 in the present embodiment extends in the thickness direction (arrow AB direction) of the lid 30 and is symmetric with respect to the facing portion other than the facing portion of the light emitting portion (or light receiving portion) Da. Four positions are provided, but the shape, formation position, and number of formation positions may be set as appropriate within a range that enables the above-described purpose. In addition, the through-hole 32 can be formed with respect to the predetermined position of the cover body 30 by cutting with a drill etc. or laser processing, for example.

本実施形態において貫通孔32の形状は円柱状である。このような形状とすると、貫通孔32への封止材の充填をディスペンス法により容易に行うことができる。また、貫通孔32の孔径(平面視における直径)は、例えば1〜5mmである。この孔径が1mm未満の場合、貫通孔32の孔径が小さすぎるため、貫通孔32への封止材の充填が困難となる場合があり、この孔径が5mmを超える場合、貫通孔32の孔径が大きすぎるため、充填する封止材の粘度を調整したとしても、封止材が凹部11内に垂れ込んでしまう場合がある。   In the present embodiment, the shape of the through hole 32 is a columnar shape. With such a shape, the through hole 32 can be easily filled with the sealing material by a dispensing method. Moreover, the hole diameter (diameter in planar view) of the through-hole 32 is 1-5 mm, for example. When the hole diameter is less than 1 mm, the hole diameter of the through hole 32 is too small, and therefore it may be difficult to fill the sealing material into the through hole 32. When the hole diameter exceeds 5 mm, the hole diameter of the through hole 32 is small. Since it is too large, even if the viscosity of the sealing material to be filled is adjusted, the sealing material may sag in the recess 11.

光素子収納用パッケージXでは、厚さ方向(矢印AB方向)に延びる貫通孔32を有し、絶縁基体10とともに光素子Dを収納するための収納空間Sを規定する蓋体30とを備えている。そのため、光素子収納用パッケージXでは、絶縁基体10の搭載部11bに搭載した光素子Dを収納するように、接合材により絶縁基体10に蓋体30を取り付けた後でも、蓋体30の貫通孔32を介して除去具(例えば、プラスチック製の棒状部材の先端に、ビニールレジンやメチルイソブチルケトン(MIBK)などの混合物を含んでなる粘着部を有するもの)を挿入して光素子Dの発光部(または受光部)Daの表面に存在する異物を除去することができる。したがって、光素子収納用パッケージXでは、蓋体30を取り付けるまでのハンドリングや蓋体封止作業中に、外気や搭載部周辺に存在している微細異物などが光素子Dにおける上記表面に付着したとしても、蓋体30の搭載後に微細異物などを適切に除去することができるため、より優れた発光精度や受光精度などを得ることができるのである。   The optical element storage package X includes a through-hole 32 extending in the thickness direction (arrow AB direction), and a lid 30 that defines the storage space S for storing the optical element D together with the insulating base 10. Yes. Therefore, in the optical element storage package X, even after the lid 30 is attached to the insulating base 10 with a bonding material so that the optical element D mounted on the mounting portion 11b of the insulating base 10 is stored, the penetration of the lid 30 is achieved. Light removal of the optical element D by inserting a removal tool (for example, one having a sticking portion containing a mixture of vinyl resin, methyl isobutyl ketone (MIBK), etc. at the tip of a plastic rod-like member) through the hole 32 Foreign matter present on the surface of the portion (or light receiving portion) Da can be removed. Therefore, in the optical element storage package X, the outside air and fine foreign matters existing around the mounting portion adhere to the surface of the optical element D during the handling until the lid 30 is attached and the lid sealing operation. However, since fine foreign matters and the like can be appropriately removed after the lid 30 is mounted, more excellent light emission accuracy and light reception accuracy can be obtained.

光素子収納用パッケージXは、本体部31が絶縁基体10の底面(搭載面)11bに搭載されている光素子Dの発光部(または受光部)Daに対向する部位に形成されている。この部位は、光素子Dの発光部(または受光部)Daからの発光(または受光)を行ううえで、その特性上、最も重要な部位である。したがって、光素子収納用パッケージXは、光素子Dの発光精度や受光精度、信頼性をより向上させるうえで好適なのである。   The optical element storage package X is formed in a portion where the main body portion 31 faces the light emitting portion (or light receiving portion) Da of the optical element D mounted on the bottom surface (mounting surface) 11b of the insulating base 10. This part is the most important part from the viewpoint of light emission (or light reception) from the light emitting part (or light receiving part) Da of the optical element D. Therefore, the optical element storage package X is suitable for further improving the light emission accuracy, light reception accuracy, and reliability of the optical element D.

光素子収納用パッケージXは、貫通孔32が絶縁基体10の底面(搭載面)11bに搭載されている光素Dの発光部(または受光部)Daに対向する部位以外の部位に形成されている。そのため、光素子収納用パッケージXは、光素子Dの発光部(または受光部)Daからの発光(受光)を行ううえで、その特性上、最も重要な光素子Dの発光部(または受光部)Daとの対向部位に貫通孔32が存在することに起因して、発光または受光される光が歪んだり、乱反射したりすることを効果的に防ぐことができる。したがって、光素子収納用パッケージXは、光素子Dの発光精度や受光精度、信頼性をより向上させるうえで好適なのである。   In the optical element storage package X, the through hole 32 is formed in a portion other than the portion facing the light emitting portion (or the light receiving portion) Da of the photoelement D mounted on the bottom surface (mounting surface) 11b of the insulating substrate 10. Yes. Therefore, the optical element storage package X emits light (receives light) from the light emitting part (or light receiving part) Da of the optical element D, and the light emitting part (or light receiving part) of the optical element D, which is the most important in terms of its characteristics. ) Due to the presence of the through-hole 32 at the site facing Da, it is possible to effectively prevent the light emitted or received from being distorted or irregularly reflected. Therefore, the optical element storage package X is suitable for further improving the light emission accuracy, light reception accuracy, and reliability of the optical element D.

図1に示すように、光装置Yは、光素子収納用パッケージX、光素子D、ボンディングワイヤ40、接着剤50、接合材60および封止材70を備える。   As shown in FIG. 1, the optical device Y includes an optical element storage package X, an optical element D, a bonding wire 40, an adhesive 50, a bonding material 60, and a sealing material 70.

ボンディングワイヤ40は、光素子Dの電極Dbと配線導体20の配線パッド部21とを電気的に接続するための部材であり、その一端部が光素子Dの電極Dbに対して電気的に接続され、その他端部が配線導体20の配線パッド部21に対して電気的に接続されている。ボンディングワイヤ40を構成する材料としては、金やアルミニウムなどの金属が挙げられる。ボンディングワイヤ40の長さは、例えば0.3mm〜3.0mmに設定される。ボンディングワイヤ40の長さが0.3mm未満では、ボンディングワイヤ40により充分なループを形成することが困難となる場合があるため、光素子Dの電極Dbと配線パッド部21との電気的接続が充分に図れない場合がある。また、ボンディングワイヤ40の長さが3.0mmを超えると、ボンディングワイヤ40によるループが必要以上に大きくなる場合があるため、不要なインダクタンスが発生して高周波信号の伝送特性が劣化してしまう場合がある。なお、本実施形態におけるボンディングワイヤ40に代えて、いわゆるボンディングリボンなどの帯状接続線や金属バンプなどを採用してもよい
接着剤50は、絶縁基体10の底面11bと光素子Dの底面とを接着するためのものであり、例えばエポキシ系樹脂、ポリイミド系樹脂、アクリル系樹脂、シリコーン系樹脂、ポリエーテルアミド系樹脂などの樹脂接着剤や、Au−Sn、Sn−Ag−Cu、Sn−Cu、Sn−Pbなどのはんだ材や、ガラスなどである。
The bonding wire 40 is a member for electrically connecting the electrode Db of the optical element D and the wiring pad portion 21 of the wiring conductor 20, and one end thereof is electrically connected to the electrode Db of the optical element D. The other end is electrically connected to the wiring pad portion 21 of the wiring conductor 20. Examples of the material constituting the bonding wire 40 include metals such as gold and aluminum. The length of the bonding wire 40 is set to 0.3 mm to 3.0 mm, for example. If the length of the bonding wire 40 is less than 0.3 mm, it may be difficult to form a sufficient loop with the bonding wire 40, so that the electrical connection between the electrode Db of the optical element D and the wiring pad portion 21 is difficult. There are cases where it cannot be achieved sufficiently. Also, if the length of the bonding wire 40 exceeds 3.0 mm, the loop due to the bonding wire 40 may become unnecessarily large, causing unnecessary inductance to occur and the high-frequency signal transmission characteristics to deteriorate. There is. In addition, it replaces with the bonding wire 40 in this embodiment, and may employ | adopt strip | belt-shaped connection wires, such as what is called a bonding ribbon, a metal bump, etc. The adhesive agent 50 has the bottom face 11b of the insulating base | substrate 10, and the bottom face of the optical element D. For bonding, for example, resin adhesive such as epoxy resin, polyimide resin, acrylic resin, silicone resin, polyether amide resin, Au-Sn, Sn-Ag-Cu, Sn-Cu , Sn-Pb and other solder materials, glass and the like.

接合材60は、絶縁基体10と蓋体30とを接合するためのものであり、例えば樹脂接着剤(アクリル系樹脂、エポキシ系樹脂、フェノール系樹脂、クレゾール系樹脂、ポリイミド系樹脂、シリコン系樹脂、ポリエーテルアミド系樹脂など)やガラスなどの無機材料である。なお、接合材60は、暗色(黒色、茶褐色、暗褐色、暗緑色、濃青色など)系の顔料や染料を含んでいてもよい。このような構成によると、接合材60を介して凹部11内に余計な外光が入射するのを抑制することができる。また、接合材60は、ガラスやセラミックスなどの無機材料からなるフィラーを含んでいてもよい。このような構成によると、接合材60自体の強度の向上と接合状態での吸湿リフロー時の強度向上、熱膨張・収縮による接合部の信頼性向上を実現できる。さらに、接合材60は、絶縁基体10と蓋体30との間から光素子収納用パッケージXの内外に、はみ出さないように設定される。このような構成によると、蓋体30の外周面(側面)を接合材60が這い上がり、蓋体30の上面中央部や下面中央部に広がってしまうのを防ぐことができるため、光が主に通過する蓋体30の中央部を接合材60で覆われることに起因する透光性能の低下などの発生を適切に防止することができる。   The bonding material 60 is for bonding the insulating substrate 10 and the lid body 30. For example, a resin adhesive (acrylic resin, epoxy resin, phenol resin, cresol resin, polyimide resin, silicon resin) is used. , Polyetheramide resins, etc.) and glass. Note that the bonding material 60 may include a dark color (black, brown, dark brown, dark green, dark blue, etc.) pigment or dye. According to such a configuration, it is possible to suppress extraneous external light from entering the recess 11 through the bonding material 60. Further, the bonding material 60 may include a filler made of an inorganic material such as glass or ceramics. According to such a configuration, it is possible to improve the strength of the bonding material 60 itself, improve the strength during moisture absorption reflow in the bonded state, and improve the reliability of the bonded portion by thermal expansion / contraction. Further, the bonding material 60 is set so as not to protrude from between the insulating base 10 and the lid 30 into and out of the optical element storage package X. According to such a configuration, it is possible to prevent the bonding material 60 from creeping up on the outer peripheral surface (side surface) of the lid body 30 and spreading to the upper surface central portion and the lower surface central portion of the lid body 30. Generation | occurrence | production of the fall of the light transmission performance etc. resulting from being covered with the bonding | jointing material 60 can be prevented appropriately.

封止材70は、貫通孔32を封止するためのものであり、アクリル系樹脂、メタクリル系樹脂、エポキシ系樹脂、フェノール系樹脂、クレゾール系樹脂、ポリイミド系樹脂、シリコン系樹脂、ポリエーテルアミド系樹脂などの樹脂材料、ホウ珪酸ガラスなどのガラス材料、酸化アルミニウム質焼結体などのセラミック材料、鉄−ニッケル−コバルト合金などの金属材料などである。   The sealing material 70 is for sealing the through hole 32, and is an acrylic resin, methacrylic resin, epoxy resin, phenol resin, cresol resin, polyimide resin, silicon resin, polyether amide. Resin materials such as resin, glass materials such as borosilicate glass, ceramic materials such as aluminum oxide sintered body, metal materials such as iron-nickel-cobalt alloy, and the like.

本実施形態に係る光装置Yは、光素子収納用パッケージXおよび封止材70を備えている。そのため、光装置Yでは、蓋体30を絶縁基体10に取り付けた後に微細異物などを除去したうえで、蓋体30の貫通孔32を封止材70により封止することができる。したがって、光装置Yは、発光精度や受光精度などにおいて、より優れているのである。   The optical device Y according to this embodiment includes an optical element storage package X and a sealing material 70. Therefore, in the optical device Y, the fine foreign matter and the like are removed after the lid 30 is attached to the insulating base 10, and the through hole 32 of the lid 30 can be sealed with the sealing material 70. Therefore, the optical device Y is more excellent in light emission accuracy and light reception accuracy.

以下に、光装置Yの製造方法について説明する。   Below, the manufacturing method of the optical apparatus Y is demonstrated.

まず、絶縁基体10の底面11bにおける所定の搭載領域に、接着剤50を用いて光素子Dを接着(搭載)する。具体的には、絶縁基体10の底面11bにおける所定の搭載領域に、未硬化の樹脂からなる接着剤50を塗布し、画像認識装置により位置合わせしつつ移送装置(例えば、バキューム吸着によるピックアップ・アンド・プレース機能を有する)により接着剤50上に光素子Dを載置した後、上記未硬化の樹脂を熱や紫外線などにより硬化させる。   First, the optical element D is bonded (mounted) to the predetermined mounting region on the bottom surface 11 b of the insulating base 10 using the adhesive 50. Specifically, an adhesive 50 made of an uncured resin is applied to a predetermined mounting region on the bottom surface 11b of the insulating base 10, and a transfer device (for example, pickup and pickup by vacuum suction is performed while being aligned by an image recognition device. After having placed the optical element D on the adhesive 50 by (having a place function), the uncured resin is cured by heat or ultraviolet rays.

次に、光素子Dの電極Dbと配線導体20の配線パッド部21とをボンディングワイヤ40を用いて電気的に接続する。具体的には、超音波接合や熱圧着接合あるいはこれらの併用によりボンディングワイヤ40の一端部を電極Dbに接合するとともに、超音波接合や熱圧着接合あるいはこれらの併用によりボンディングワイヤ40の他端部を配線パッド部21に接合する。   Next, the electrode Db of the optical element D and the wiring pad portion 21 of the wiring conductor 20 are electrically connected using the bonding wire 40. Specifically, one end of the bonding wire 40 is bonded to the electrode Db by ultrasonic bonding, thermocompression bonding, or a combination thereof, and the other end of the bonding wire 40 is bonded by ultrasonic bonding, thermocompression bonding, or a combination thereof. Is bonded to the wiring pad portion 21.

次に、光素子Dの発光部(または受光部)Daの表面に存在する異物を除去する(第1除去工程)。具体的には、目視で異物の位置を確認しながら、除去具により異物を除去する。除去具としては、例えば棒状の本体部(例えばプラスチック製)の先端に、少なくとも一時的に異物を取着、吸着あるいは保持するための粘着材や真空吸引機構を備えるものが挙げられる。粘着材としては、例えばビニールレジンやメチルイソブチルケトン(MIBK)などの混合物などが挙げられる。また、真空吸引機構としては、例えば本体部の先端にシリコン製の穴あきチューブを備えるものなどが挙げられる。   Next, the foreign matter existing on the surface of the light emitting part (or light receiving part) Da of the optical element D is removed (first removal step). Specifically, the foreign matter is removed by the removing tool while visually confirming the position of the foreign matter. Examples of the removing tool include a stick-like main body (for example, made of plastic) having a sticking material or a vacuum suction mechanism at least temporarily for attaching, adsorbing or holding a foreign substance. Examples of the adhesive material include a mixture of vinyl resin and methyl isobutyl ketone (MIBK). Moreover, as a vacuum suction mechanism, what equips the front-end | tip of a main-body part with a silicon | silicone perforated tube, etc. are mentioned, for example.

次に、接合材60を用いて絶縁基体10に蓋体30を取り付ける(取付け工程)。具体的には、未硬化の樹脂材料を、蓋体30の下面における所定位置(例えば外周)に、接合材60として未硬化の樹脂材料(例えばエポキシ樹脂)を塗布した後、この塗布した樹脂材料が絶縁基体10の底面(搭載面)11aを取り囲むように絶縁基体10の上面に位置決め載置し、熱や光(紫外線)などのエネルギによって未硬化の樹脂材料を硬化させることにより、絶縁基体10に蓋体30を取り付ける。   Next, the lid 30 is attached to the insulating base 10 using the bonding material 60 (attachment process). Specifically, an uncured resin material is applied to a predetermined position (for example, the outer periphery) on the lower surface of the lid 30 as an uncured resin material (for example, an epoxy resin) as the bonding material 60, and then the applied resin material is applied. Is positioned and mounted on the upper surface of the insulating substrate 10 so as to surround the bottom surface (mounting surface) 11a of the insulating substrate 10, and the uncured resin material is cured by energy such as heat or light (ultraviolet light), thereby A lid 30 is attached to the body.

次に、光素子Dの発光部(または受光部)Daの表面に存在する異物を、蓋体30の貫通孔32を介して挿入される除去具により除去する(第2除去工程)。具体的には、双眼顕微鏡を用いて異物の位置を確認しながら、除去具により異物を除去する。除去具としては、第1除去工程において使用されるものと同様のものが挙げられる。   Next, the foreign matter existing on the surface of the light emitting part (or light receiving part) Da of the optical element D is removed by a removing tool inserted through the through hole 32 of the lid 30 (second removing step). Specifically, the foreign matter is removed by the removal tool while confirming the position of the foreign matter using a binocular microscope. As a removal tool, the thing similar to what is used in a 1st removal process is mentioned.

次に、蓋体30の貫通孔32を封止材70により封止する(封止工程)。具体的には、未硬化の樹脂材料(例えばアクリル系樹脂やシリコーン樹脂)を所定の充填手段により充填し、熱や光(紫外線)などのエネルギによって未硬化の樹脂材料を硬化させることにより、貫通孔32を封止する。充填手段としては、スクリーン印刷法、ディスペンス法、手作業などが挙げられる。   Next, the through hole 32 of the lid 30 is sealed with the sealing material 70 (sealing step). Specifically, an uncured resin material (for example, acrylic resin or silicone resin) is filled with a predetermined filling means, and the uncured resin material is cured by energy such as heat or light (ultraviolet light), thereby penetrating. The hole 32 is sealed. Examples of the filling means include screen printing, dispensing, and manual work.

本製造方法は、取付け工程を経た光素子Dの発光部(または受光部)Daの表面に存在する異物を、蓋体30の貫通孔32を介して挿入される除去具により除去する第2除去工程を含んでいる。そのため、本製造方法では、蓋体30の貫通孔32を介して除去具を挿入して光素子Dの発光部(または受光部)Daの表面に存在する異物を除去したうえで、光装置Yを製造することができる。したがって、本製造方法では、取付け工程の完了時までに、外気や底面(搭載面)11a周辺に存在している微細異物などが光素子Dにおける上記表面に付着したとしても、第2除去工程において微細異物などを適切に除去することができるため、より発光精度や受光精度などに優れた光装置Yを製造することができるのである。   In the present manufacturing method, the second removal is performed by removing the foreign matter existing on the surface of the light emitting part (or light receiving part) Da of the optical element D that has undergone the attachment process with a removing tool inserted through the through hole 32 of the lid 30. It includes a process. Therefore, in this manufacturing method, after removing a foreign substance existing on the surface of the light emitting part (or light receiving part) Da of the optical element D by inserting a removal tool through the through hole 32 of the lid 30, the optical device Y Can be manufactured. Therefore, in the present manufacturing method, even if fine foreign matter or the like existing around the outside air or the bottom surface (mounting surface) 11a adheres to the surface of the optical element D by the time when the mounting process is completed, Since fine foreign matters and the like can be appropriately removed, it is possible to manufacture the optical device Y that is more excellent in light emission accuracy and light reception accuracy.

以上、本発明の具体的な実施形態を示したが、本発明はこれに限定されるものではなく、発明の思想から逸脱しない範囲内で種々の変更が可能である。   Although specific embodiments of the present invention have been described above, the present invention is not limited to these embodiments, and various modifications can be made without departing from the spirit of the invention.

光素子収納用パッケージXの蓋体30は、本体部31における全ての部位が透光性材料で構成されていなくてもよく、例えば図3に示すように、発光や受光を適切に行える範囲で必要充分な部位(透光部80)のみ透光性材料により構成するようにしてもよい。透光部80を構成する透光性材料としては、本体部31を構成する透光材料と同様のものが挙げられる。このような構造によると、蓋体30における透光部80以外の部位をセラミックス材料や金属材料により構成することによって、蓋体30の機械的強度を高めたり、絶縁基体10と蓋体30との取付け強度を高めたりすることができる。   The lid 30 of the optical element storage package X does not have to be formed of a translucent material in all parts of the main body 31. For example, as shown in FIG. Only a necessary and sufficient part (translucent part 80) may be made of a translucent material. Examples of the translucent material constituting the translucent portion 80 include the same materials as the translucent material constituting the main body portion 31. According to such a structure, the mechanical strength of the lid body 30 can be increased by configuring the portion other than the light transmitting portion 80 in the lid body 30 with a ceramic material or a metal material, or between the insulating base 10 and the lid body 30. The mounting strength can be increased.

光素子収納用パッケージXの蓋体30は、その上下面の少なくとも一方に紫外線を遮断するための光学膜を有する構成としてもよい。このような構成によると、例えば光素子Dの特性に応じて必要な波長の光の発光(あるいは受光)を選択的に行うことが可能となる。   The lid 30 of the optical element storage package X may have an optical film for blocking ultraviolet rays on at least one of the upper and lower surfaces thereof. According to such a configuration, it is possible to selectively perform light emission (or light reception) of light having a necessary wavelength according to the characteristics of the optical element D, for example.

光素子収納用パッケージXの蓋体30は、その外周部に光を遮るための遮光性樹脂膜を有する構成としてもよい。このような構成によると、余計な光が凹部11内に入り込んだり、凹部11内で光が乱反射したりするのを防ぐことができる。したがって、本構成の光素子収納用パッケージXは、発光部Daから発せられる光が部分的に劣化したり、余計な光が受光部Daで受光されたりするのを抑制することができるため、発光精度や受光精度を高めるうえで好適である。   The lid 30 of the optical element storage package X may have a configuration having a light-blocking resin film for blocking light on the outer periphery thereof. According to such a configuration, it is possible to prevent extra light from entering the recess 11 and light from being irregularly reflected in the recess 11. Therefore, the optical element storage package X of this configuration can suppress the light emitted from the light emitting portion Da from being partially deteriorated or the extra light from being received by the light receiving portion Da. It is suitable for improving accuracy and light receiving accuracy.

光装置Yにおける貫通孔32の封止は、封止材70のみにより行うものには限られず、例えば図4に示すように、貫通孔32の形状に応じた封止体81と封止材70との組み合わせにより行うようにしてもよい。封止体81を構成する材料としては、封止材70と同様のものが挙げられる。   The sealing of the through hole 32 in the optical device Y is not limited to the sealing material 70 alone. For example, as illustrated in FIG. 4, the sealing body 81 and the sealing material 70 according to the shape of the through hole 32. You may make it carry out by the combination. As a material constituting the sealing body 81, the same material as the sealing material 70 can be used.

光装置Yにおける貫通孔32の形状は、円柱状のものには限られず、例えば円錐状や円錐台状のものでもよい。このような構成によると、封止材70の充填容易性や上記除去具の挿入容易性の観点から好適である。   The shape of the through hole 32 in the optical device Y is not limited to a cylindrical shape, and may be, for example, a conical shape or a truncated cone shape. Such a configuration is preferable from the viewpoint of easy filling of the sealing material 70 and ease of insertion of the removal tool.

光装置Yの製造方法においては、上記取付け工程後で且つ上記第2除去工程前に、光素子Dの発光部(または受光部)Daの表面における異物の存在の程度による選別を行う選別工程を更に含むようにしてもよい。このような方法によると、第2除去工程を経る必要があるもの(異物の存在程度が基準以上のもの)と、そうでないものとを選別したうえで、第2除去工程を経る必要があるもののみ、選択的に第2除去工程を経るようにすることができるので、より生産性を高めるうえで好適である。   In the manufacturing method of the optical device Y, a sorting step is performed after the mounting step and before the second removal step, for sorting according to the degree of the presence of foreign matter on the surface of the light emitting part (or light receiving part) Da of the optical element D. Further, it may be included. According to such a method, what needs to go through the second removal step after sorting out those that need to go through the second removal step (the presence of foreign matter is above the standard) and those that don't. However, since the second removal step can be selectively performed, it is preferable for improving productivity.

本発明の実施形態に係る光素子収納用パッケージに光素子を収納してなる光装置を表す断面図である。It is sectional drawing showing the optical apparatus formed by accommodating an optical element in the optical element storage package which concerns on embodiment of this invention. 図1に示す光装置を表す図であり、(a)は平面図、(b)は蓋体を省略した平面図である。It is a figure showing the optical apparatus shown in FIG. 1, (a) is a top view, (b) is the top view which abbreviate | omitted the cover body. 本発明の実施形態に係る光素子収納用パッケージの第1変形例を表す断面図である。It is sectional drawing showing the 1st modification of the optical element storage package which concerns on embodiment of this invention. 本発明の実施形態に係る光素子収納用パッケージの第2変形例を表す断面図である。It is sectional drawing showing the 2nd modification of the optical element storage package which concerns on embodiment of this invention.

符号の説明Explanation of symbols

X 光素子収納用パッケージ
Y 光装置
D 光素子
Da 発光部(または受光部)
Db 電極
S 収納空間
10 絶縁基体
11 凹部
11a 底面(搭載面)
11b 底面
20 配線導体
30 蓋体
31 本体部
32 貫通孔
40 ボンディングワイヤ
50 接着剤
60 接合材
70 封止材
X Optical element storage package Y Optical device D Optical element Da Light emitting part (or light receiving part)
Db electrode S storage space 10 insulating base 11 recess 11a bottom surface (mounting surface)
11b Bottom surface 20 Wiring conductor 30 Lid 31 Body portion 32 Through hole 40 Bonding wire 50 Adhesive 60 Bonding material 70 Sealing material

Claims (6)

発光部および/または受光部を含んでなる光素子を搭載するための搭載部を有する絶縁基体と、
透光性を有する透光部、および、一端が前記搭載部を臨むように開放し且つ他端が外部空間に開放する貫通孔を有し、前記絶縁基体とともに前記光素子を収納するための収納空間を規定する蓋体と、を備えることを特徴とする、光素子収納用パッケージ。
An insulating substrate having a mounting portion for mounting an optical element comprising a light emitting portion and / or a light receiving portion;
A translucent part having translucency, and a storage for storing the optical element together with the insulating base, having a through hole having one end opened to face the mounting part and the other end opened to the external space An optical element storage package comprising: a lid that defines a space.
前記透光部は、前記絶縁基体の前記搭載部に搭載されている前記光素子の前記発光部および/または前記受光部に対向する部位に形成されている、請求項1に記載の光素子収納用パッケージ。 2. The optical element housing according to claim 1, wherein the translucent part is formed at a portion facing the light emitting part and / or the light receiving part of the optical element mounted on the mounting part of the insulating base. For package. 前記貫通孔は、前記絶縁基体の前記搭載部に搭載されている前記光素子の前記発光部および/または前記受光部に対向する部位以外の部位に形成されている、請求項1または2に記載の光素子収納用パッケージ。 The said through-hole is formed in site | parts other than the site | part facing the said light emission part and / or the said light-receiving part of the said optical element mounted in the said mounting part of the said insulation base | substrate. Optical element storage package. 請求項1〜3のいずれかに記載の光素子収納用パッケージと、前記絶縁基体の前記搭載部に搭載される光素子と、前記貫通孔を封止するための封止材と、を備えることを特徴とする、光装置。 An optical element storage package according to any one of claims 1 to 3, an optical element mounted on the mounting portion of the insulating base, and a sealing material for sealing the through hole. An optical device. 発光部および/または受光部を含んでなる光素子を搭載するための搭載部を有する絶縁基体の該搭載部に搭載された該光素子の発光部および/または受光部の表面に存在する異物を除去する第1除去工程と、
透光性を有する透光部、および、一端が前記搭載部を臨むように開放し且つ他端が外部空間に開放する貫通孔を有し、前記絶縁基体とともに前記光素子を収納するための収納空間を規定する蓋体を接合材により該絶縁基体に取り付ける取付け工程と、
前記取付け工程を経た光素子の発光部および/または受光部の表面に存在する異物を、前記貫通孔を介して挿入される除去具により除去する第2除去工程と、
前記貫通孔を封止材により封止する封止工程と、を含むことを特徴とする、光装置の製造方法。
Foreign matter present on the surface of the light emitting portion and / or the light receiving portion of the optical element mounted on the mounting portion of the insulating substrate having the mounting portion for mounting the optical element including the light emitting portion and / or the light receiving portion. A first removal step to be removed;
A translucent part having translucency, and a storage for storing the optical element together with the insulating base, having a through hole having one end opened to face the mounting part and the other end opened to the external space An attachment step of attaching a lid defining the space to the insulating base with a bonding material;
A second removal step of removing foreign matter present on the surface of the light emitting portion and / or the light receiving portion of the optical element that has undergone the attachment step with a removal tool inserted through the through hole;
And a sealing step of sealing the through hole with a sealing material.
前記取付け工程後で且つ前記第2除去工程前に、前記光素子の発光部および/または受光部の表面における異物の存在の程度による選別を行う選別工程を更に含む、請求項5に記載の光装置の製造方法。 6. The light according to claim 5, further comprising a sorting step of performing sorting based on a degree of presence of foreign matters on a light emitting portion and / or a light receiving portion of the optical element after the attaching step and before the second removing step. Device manufacturing method.
JP2005311762A 2005-10-26 2005-10-26 Package for housing optical element, optical device, and its manufacturing method Pending JP2007123444A (en)

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