JP2007024889A5 - - Google Patents

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Publication number
JP2007024889A5
JP2007024889A5 JP2006191936A JP2006191936A JP2007024889A5 JP 2007024889 A5 JP2007024889 A5 JP 2007024889A5 JP 2006191936 A JP2006191936 A JP 2006191936A JP 2006191936 A JP2006191936 A JP 2006191936A JP 2007024889 A5 JP2007024889 A5 JP 2007024889A5
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JP
Japan
Prior art keywords
test pattern
lens system
test
imaging
characteristic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Application number
JP2006191936A
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English (en)
Japanese (ja)
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JP2007024889A (ja
JP5006589B2 (ja
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Publication date
Priority claimed from AU2005203031A external-priority patent/AU2005203031A1/en
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Publication of JP2007024889A publication Critical patent/JP2007024889A/ja
Publication of JP2007024889A5 publication Critical patent/JP2007024889A5/ja
Application granted granted Critical
Publication of JP5006589B2 publication Critical patent/JP5006589B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2006191936A 2005-07-12 2006-07-12 光学的伝達関数の測定方法及び測定装置並びにテストチャート Expired - Fee Related JP5006589B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AU2005203031A AU2005203031A1 (en) 2005-07-12 2005-07-12 Optical transfer function measurement system
AU2005203031 2005-07-12

Publications (3)

Publication Number Publication Date
JP2007024889A JP2007024889A (ja) 2007-02-01
JP2007024889A5 true JP2007024889A5 (enrdf_load_stackoverflow) 2009-08-27
JP5006589B2 JP5006589B2 (ja) 2012-08-22

Family

ID=37734104

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006191936A Expired - Fee Related JP5006589B2 (ja) 2005-07-12 2006-07-12 光学的伝達関数の測定方法及び測定装置並びにテストチャート

Country Status (2)

Country Link
JP (1) JP5006589B2 (enrdf_load_stackoverflow)
AU (1) AU2005203031A1 (enrdf_load_stackoverflow)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5380802B2 (ja) * 2007-07-26 2014-01-08 株式会社ニコン 検査システム
AU2007254627B2 (en) 2007-12-21 2010-07-08 Canon Kabushiki Kaisha Geometric parameter measurement of an imaging device
AU2008261138B2 (en) * 2008-12-19 2011-08-18 Canon Kabushiki Kaisha Measure display SFR using a camera and phase shifting
JP5376049B2 (ja) * 2010-04-16 2013-12-25 コニカミノルタ株式会社 イントラ予測処理方法、及びイントラ予測処理プログラム
JP5743990B2 (ja) * 2012-09-24 2015-07-01 富士フイルム株式会社 吐出条件決定方法、その方法を用いた画像形成方法及び画像形成装置

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS562523A (en) * 1979-06-20 1981-01-12 Ricoh Co Ltd Frequency chart for mtf measurement
JPH0462449A (ja) * 1990-06-29 1992-02-27 Minolta Camera Co Ltd 光学性能測定装置
JP3019431B2 (ja) * 1991-01-22 2000-03-13 株式会社ニコン Ｏｔｆ測定装置
JPH075075A (ja) * 1993-06-15 1995-01-10 Canon Inc 光学性能評価測定装置
JP2000287227A (ja) * 1999-03-31 2000-10-13 Fuji Photo Film Co Ltd 表示装置の鮮鋭度測定方法
JP2000298076A (ja) * 1999-04-15 2000-10-24 Fuji Photo Film Co Ltd 鮮鋭度評価方法およびこれを用いる鮮鋭度評価装置

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