JP2007024889A5 - - Google Patents

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JP2007024889A5
JP2007024889A5 JP2006191936A JP2006191936A JP2007024889A5 JP 2007024889 A5 JP2007024889 A5 JP 2007024889A5 JP 2006191936 A JP2006191936 A JP 2006191936A JP 2006191936 A JP2006191936 A JP 2006191936A JP 2007024889 A5 JP2007024889 A5 JP 2007024889A5
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JP
Japan
Prior art keywords
test pattern
lens system
test
imaging
characteristic
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JP2006191936A
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Japanese (ja)
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JP5006589B2 (en
JP2007024889A (en
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Priority claimed from AU2005203031A external-priority patent/AU2005203031A1/en
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Claims (5)

レンズ系の光学的伝達関数（ＯＴＦ）を決定する方法であって、
複数の離散的な方向をもつ、複数の重畳した正弦波形状パターンを有し、かつ、複数の階調を持ち、各測定位置で１つのテストパターンを有するテストチャートを、前記レンズ系を備えた装置を用いて撮像して撮像テストパターンを生成するステップと、
前記撮像テストパターンの少なくとも１つの特性を前記テストチャートの前記テストパターンの対応する特性と比較して前記レンズ系の前記光学的伝達関数（ＯＴＦ）を決定するステップと、
を含むことを特徴とする方法。 A method for determining an optical transfer function (OTF) of a lens system, comprising:
A test chart having a plurality of superimposed sinusoidal patterns having a plurality of discrete directions, a plurality of gradations, and one test pattern at each measurement position is provided with the lens system. Generating an imaging test pattern by imaging using an apparatus;
Comparing at least one characteristic of the imaging test pattern with a corresponding characteristic of the test pattern of the test chart to determine the optical transfer function (OTF) of the lens system;
A method comprising the steps of: 前記複数の正弦波形状パターンは複数の離散的な空間周波数を持つことを特徴とする請求項１記載の方法。   The method of claim 1, wherein the plurality of sinusoidal patterns have a plurality of discrete spatial frequencies. 前記正弦波形状パターンのそれぞれの振幅は前記テストチャートを形成するときに独立して調整されることを特徴とする請求項１記載の方法。   The method of claim 1, wherein the amplitude of each sinusoidal pattern is independently adjusted when forming the test chart. 前記特性が測定される前記レンズ系の領域に対応する前記テストチャートの領域を前記テストパターンが埋めていることを特徴とする請求項１記載の方法。 2. The method of claim 1, wherein the test pattern fills a region of the test chart corresponding to a region of the lens system in which the characteristic is measured. 前記決定するステップが前記撮像テストパターンの離散フーリエ変換を含むことを特徴とする請求項１記載の方法。 The method of claim 1, wherein said determining step is characterized in that it comprises a discrete Fourier transform of the captured test pattern.
JP2006191936A 2005-07-12 2006-07-12 Optical transfer function measuring method, measuring apparatus and test chart Expired - Fee Related JP5006589B2 (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AU2005203031 2005-07-12
AU2005203031A AU2005203031A1 (en) 2005-07-12 2005-07-12 Optical transfer function measurement system

Publications (3)

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JP2007024889A JP2007024889A (en) 2007-02-01
JP2007024889A5 true JP2007024889A5 (en) 2009-08-27
JP5006589B2 JP5006589B2 (en) 2012-08-22

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JP2006191936A Expired - Fee Related JP5006589B2 (en) 2005-07-12 2006-07-12 Optical transfer function measuring method, measuring apparatus and test chart

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JP (1) JP5006589B2 (en)
AU (1) AU2005203031A1 (en)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5380802B2 (en) * 2007-07-26 2014-01-08 株式会社ニコン Inspection system
AU2007254627B2 (en) 2007-12-21 2010-07-08 Canon Kabushiki Kaisha Geometric parameter measurement of an imaging device
AU2008261138B2 (en) 2008-12-19 2011-08-18 Canon Kabushiki Kaisha Measure display SFR using a camera and phase shifting
WO2011129163A1 (en) * 2010-04-16 2011-10-20 コニカミノルタホールディングス株式会社 Intra prediction processing method and intra prediction processing program
JP5743990B2 (en) * 2012-09-24 2015-07-01 富士フイルム株式会社 Discharge condition determining method, image forming method and image forming apparatus using the method

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS562523A (en) * 1979-06-20 1981-01-12 Ricoh Co Ltd Frequency chart for mtf measurement
JPH0462449A (en) * 1990-06-29 1992-02-27 Minolta Camera Co Ltd Optical performance measuring instrument
JP3019431B2 (en) * 1991-01-22 2000-03-13 株式会社ニコン OTF measurement device
JPH075075A (en) * 1993-06-15 1995-01-10 Canon Inc Optical performance evaluation and measuring instrument
JP2000287227A (en) * 1999-03-31 2000-10-13 Fuji Photo Film Co Ltd Method for measuring sharpness of display device
JP2000298076A (en) * 1999-04-15 2000-10-24 Fuji Photo Film Co Ltd Method and device for evaluating clearness

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