JP2007013119A5 - - Google Patents

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Publication number
JP2007013119A5
JP2007013119A5 JP2006147590A JP2006147590A JP2007013119A5 JP 2007013119 A5 JP2007013119 A5 JP 2007013119A5 JP 2006147590 A JP2006147590 A JP 2006147590A JP 2006147590 A JP2006147590 A JP 2006147590A JP 2007013119 A5 JP2007013119 A5 JP 2007013119A5
Authority
JP
Japan
Prior art keywords
transistors
evaluation
oscillation circuit
measurement terminal
evaluation oscillation
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2006147590A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007013119A (ja
JP5147196B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2006147590A priority Critical patent/JP5147196B2/ja
Priority claimed from JP2006147590A external-priority patent/JP5147196B2/ja
Publication of JP2007013119A publication Critical patent/JP2007013119A/ja
Publication of JP2007013119A5 publication Critical patent/JP2007013119A5/ja
Application granted granted Critical
Publication of JP5147196B2 publication Critical patent/JP5147196B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

JP2006147590A 2005-06-01 2006-05-29 素子基板 Expired - Fee Related JP5147196B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2006147590A JP5147196B2 (ja) 2005-06-01 2006-05-29 素子基板

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2005160947 2005-06-01
JP2005160947 2005-06-01
JP2006147590A JP5147196B2 (ja) 2005-06-01 2006-05-29 素子基板

Publications (3)

Publication Number Publication Date
JP2007013119A JP2007013119A (ja) 2007-01-18
JP2007013119A5 true JP2007013119A5 (enrdf_load_stackoverflow) 2009-07-09
JP5147196B2 JP5147196B2 (ja) 2013-02-20

Family

ID=37751148

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2006147590A Expired - Fee Related JP5147196B2 (ja) 2005-06-01 2006-05-29 素子基板

Country Status (1)

Country Link
JP (1) JP5147196B2 (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9252793B2 (en) 2010-11-29 2016-02-02 Renesas Electronics Corporation Semiconductor device
TWI563640B (en) * 2014-08-22 2016-12-21 Innolux Corp Array substrate of display panel
TWI567950B (zh) * 2015-01-08 2017-01-21 群創光電股份有限公司 顯示面板

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63186461A (ja) * 1987-01-29 1988-08-02 Nec Corp 大規模集積回路
JPS63314859A (ja) * 1987-06-17 1988-12-22 Mitsubishi Electric Corp 半導体装置
JPH05133926A (ja) * 1991-07-03 1993-05-28 Nippondenso Co Ltd 液体混合比率検出装置
JPH0629478A (ja) * 1992-07-08 1994-02-04 Nec Corp 半導体集積回路装置
JP3123454B2 (ja) * 1997-02-25 2001-01-09 日本電気株式会社 半導体集積回路
JPH118196A (ja) * 1997-06-13 1999-01-12 Semiconductor Energy Lab Co Ltd 半導体薄膜および半導体装置
JP2001053282A (ja) * 1999-08-11 2001-02-23 Matsushita Electric Ind Co Ltd 薄膜トランジスタアレイ基板及びその検査方法
JP2005057256A (ja) * 2003-08-04 2005-03-03 Samsung Electronics Co Ltd 漏洩電流を利用した半導体検査装置および漏洩電流補償システム

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