JP2006527664A - 光透過領域を有する研磨パッドを製造するための超音波溶接法 - Google Patents
光透過領域を有する研磨パッドを製造するための超音波溶接法 Download PDFInfo
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- JP2006527664A JP2006527664A JP2006517168A JP2006517168A JP2006527664A JP 2006527664 A JP2006527664 A JP 2006527664A JP 2006517168 A JP2006517168 A JP 2006517168A JP 2006517168 A JP2006517168 A JP 2006517168A JP 2006527664 A JP2006527664 A JP 2006527664A
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Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
- B24D7/12—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with apertures for inspecting the surface to be abraded
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Lining Or Joining Of Plastics Or The Like (AREA)
- Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
- Pressure Welding/Diffusion-Bonding (AREA)
- Polishing Bodies And Polishing Tools (AREA)
Abstract
Description
Claims (19)
- 少なくとも1つの光透過領域を有する化学-機械研磨パッドを形成する方法であって、
(i)開口部を有する本体を持つ研磨パッドを用意し、
(ii)その研磨パッドの本体の開口部に光透過ウインドウを挿入し、
(iii)その光透過ウインドウを研磨パッドの本体に超音波溶接で接合することにより、光透過ウインドウを有する研磨パッドを形成すること
を含む方法。 - 研磨パッドの本体と光透過ウインドウがそれぞれポリマー樹脂を含んでいる、請求項1に記載の方法。
- 前記ポリマー樹脂が、熱可塑性エラストマー、熱硬化性ポリマー、ポリウレタン、ポリオレフィン、ポリカーボネート、ポリビニルアルコール、ナイロン、弾性ゴム、弾性ポリエチレン、ポリテトラフルオロエチレン、ポリエチレンテレフタレート、ポリイミド、ポリアラミド、ポリアリーレン、そのコポリマー及びその混合物からなる群から選ばれる、請求項2に記載の方法。
- 光透過ウインドウが熱可塑性ポリウレタンを含んでいる、請求項3に記載の方法。
- 研磨パッドの本体が、焼結研磨パッド、固体研磨パッド、多孔性フォーム製研磨パッドのいずれかである、請求項2に記載の方法。
- 研磨パッドの本体と光透過ウインドウがそれぞれ異なるポリマー樹脂を含んでいる、請求項2に記載の方法。
- 研磨パッドの本体が熱硬化性ポリマー樹脂を含んでおり、光透過ウインドウが熱可塑性ポリマー樹脂を含んでいる、請求項6に記載の方法。
- 研磨パッドの本体が熱硬化性ポリウレタン樹脂を含んでおり、光透過ウインドウが熱可塑性ポリウレタン樹脂を含んでいる、請求項7に記載の方法。
- 研磨パッドの本体が多孔性であり、光透過ウインドウが固体である、請求項8に記載の方法。
- 研磨パッドの本体が熱可塑性ポリマー樹脂を含んでおり、光透過ウインドウが熱硬化性ポリマー樹脂を含んでいる、請求項6に記載の方法。
- 研磨パッドの本体が、最上部のパッドと最下部のパッドを含む多層体である、請求項1に記載の方法。
- 研磨パッドの多層体の最上部のパッドに光透過ウインドウを溶接する、請求項11に記載の方法。
- 光透過ウインドウが楕円形または円形の形状を有している、請求項1に記載の方法。
- 接合工程における溶接時間が1秒以下である、請求項1に記載の方法。
- 接合工程が、0.2MPa〜0.45MPaであるアクチュエータ圧力を使用することを含む、請求項1に記載の方法。
- 光透過ウインドウが、張出部と非張出部を有する、請求項1に記載の方法。
- 光透過ウインドウが、エネルギー誘導部をさらに備えている、請求項16に記載の方法。
- 請求項1に記載の方法によって作られた、少なくとも1つの光透過領域を有する化学-機械研磨パッド。
- 請求項9に記載の方法によって作られた、少なくとも1つの光透過領域を有する化学-機械研磨パッド。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/463,721 | 2003-06-17 | ||
US10/463,721 US6997777B2 (en) | 2003-06-17 | 2003-06-17 | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
PCT/US2004/017289 WO2005000528A1 (en) | 2003-06-17 | 2004-06-03 | Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010229045A Division JP2011031392A (ja) | 2003-06-17 | 2010-10-08 | 光透過領域を有する研磨パッドを製造するための超音波溶接法 |
Publications (2)
Publication Number | Publication Date |
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JP2006527664A true JP2006527664A (ja) | 2006-12-07 |
JP4908207B2 JP4908207B2 (ja) | 2012-04-04 |
Family
ID=33517134
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
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JP2006517168A Expired - Fee Related JP4908207B2 (ja) | 2003-06-17 | 2004-06-03 | 光透過領域を有する研磨パッドを製造するための超音波溶接法 |
JP2010229045A Pending JP2011031392A (ja) | 2003-06-17 | 2010-10-08 | 光透過領域を有する研磨パッドを製造するための超音波溶接法 |
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JP2010229045A Pending JP2011031392A (ja) | 2003-06-17 | 2010-10-08 | 光透過領域を有する研磨パッドを製造するための超音波溶接法 |
Country Status (10)
Country | Link |
---|---|
US (1) | US6997777B2 (ja) |
EP (1) | EP1638735B1 (ja) |
JP (2) | JP4908207B2 (ja) |
KR (1) | KR100913282B1 (ja) |
CN (1) | CN100467228C (ja) |
AT (1) | ATE474692T1 (ja) |
DE (1) | DE602004028245D1 (ja) |
MY (1) | MY132430A (ja) |
TW (1) | TWI286957B (ja) |
WO (1) | WO2005000528A1 (ja) |
Cited By (5)
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JP2009542451A (ja) * | 2006-07-03 | 2009-12-03 | アプライド マテリアルズ インコーポレイテッド | 複数の部分を有する窓をもつ研磨パッド |
JP2010069789A (ja) * | 2008-09-19 | 2010-04-02 | Ibiden Co Ltd | 基材の被覆方法 |
JP2010130009A (ja) * | 2008-11-26 | 2010-06-10 | Siltronic Ag | 歪み緩和Si1−xGex層を有する半導体ウェハをポリシングする方法 |
JP2010223891A (ja) * | 2009-03-25 | 2010-10-07 | Citizen Holdings Co Ltd | 時計用指針の製造方法 |
JP2015512799A (ja) * | 2012-04-11 | 2015-04-30 | キャボット マイクロエレクトロニクス コーポレイション | 光に安定な光透過領域を有する研磨パッド |
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JP4620501B2 (ja) * | 2005-03-04 | 2011-01-26 | ニッタ・ハース株式会社 | 研磨パッド |
JP2007118106A (ja) * | 2005-10-26 | 2007-05-17 | Toyo Tire & Rubber Co Ltd | 研磨パッド及びその製造方法 |
EP2244642A4 (en) * | 2008-02-20 | 2011-07-20 | Mayo Foundation | SYSTEMS, APPARATUS AND METHOD FOR ACCESSING BODY TISSUE |
AU2009215404B2 (en) * | 2008-02-20 | 2014-09-18 | Mayo Foundation For Medical Education And Research | Ultrasound guided systems and methods |
US8129220B2 (en) | 2009-08-24 | 2012-03-06 | Hong Kong Polytechnic University | Method and system for bonding electrical devices using an electrically conductive adhesive |
US9795404B2 (en) | 2009-12-31 | 2017-10-24 | Tenex Health, Inc. | System and method for minimally invasive ultrasonic musculoskeletal tissue treatment |
US9017140B2 (en) | 2010-01-13 | 2015-04-28 | Nexplanar Corporation | CMP pad with local area transparency |
KR101942100B1 (ko) * | 2010-07-07 | 2019-01-24 | 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 | 저결함성 창을 갖는 화학 기계 연마 패드 |
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US8876983B2 (en) * | 2011-09-01 | 2014-11-04 | Ford Global Technologies, Llc | In-line cleaning method for ultrasonic welding tools |
US11406415B2 (en) | 2012-06-11 | 2022-08-09 | Tenex Health, Inc. | Systems and methods for tissue treatment |
US9149291B2 (en) | 2012-06-11 | 2015-10-06 | Tenex Health, Inc. | Systems and methods for tissue treatment |
US9962181B2 (en) | 2014-09-02 | 2018-05-08 | Tenex Health, Inc. | Subcutaneous wound debridement |
US9763689B2 (en) | 2015-05-12 | 2017-09-19 | Tenex Health, Inc. | Elongated needles for ultrasonic applications |
US9868185B2 (en) * | 2015-11-03 | 2018-01-16 | Cabot Microelectronics Corporation | Polishing pad with foundation layer and window attached thereto |
KR101945878B1 (ko) * | 2017-07-11 | 2019-02-11 | 에스케이씨 주식회사 | 연마층과 유사 경도를 갖는 윈도우를 포함하는 연마패드 |
DE102017214778A1 (de) * | 2017-08-23 | 2019-02-28 | Sgl Carbon Se | Alternatives Fügeverfahren |
US20230009737A1 (en) * | 2021-07-06 | 2023-01-12 | Applied Materials, Inc. | Acoustic window in pad backing layer for chemical mechanical polishing |
CN114196327A (zh) * | 2022-01-28 | 2022-03-18 | 淄博海泰新光光学技术有限公司 | 一种用于光学零件抛光的复合材料及制备方法 |
Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001274120A (ja) * | 1999-12-30 | 2001-10-05 | Lam Res Corp | 研磨パッド及びその製造方法 |
JP2001291686A (ja) * | 1999-09-14 | 2001-10-19 | Applied Materials Inc | 窓漏れの少ない透明窓を有するケミカルメカニカルポリシング装置用ポリシングパッド |
JP2002144220A (ja) * | 2000-09-19 | 2002-05-21 | Rodel Holdings Inc | ミクロ−テクスチャーを備えた研磨パッド |
WO2002062527A1 (en) * | 2001-02-07 | 2002-08-15 | 3M Innovative Properties Company | Abrasive article suitable for modifying a semiconductor wafer |
WO2002074490A1 (en) * | 2001-02-15 | 2002-09-26 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
JP2003068686A (ja) * | 2001-06-15 | 2003-03-07 | Ebara Corp | ポリッシング装置及び研磨パッド並びにその製造方法 |
JP2003133270A (ja) * | 2001-10-26 | 2003-05-09 | Jsr Corp | 化学機械研磨用窓材及び研磨パッド |
JP2003163191A (ja) * | 2001-11-28 | 2003-06-06 | Tokyo Seimitsu Co Ltd | 機械化学的研磨装置用の研磨パッド |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5658408A (en) * | 1992-04-21 | 1997-08-19 | Branson Ultrasonics Corporation | Method for processing workpieces by ultrasonic energy |
US5855706A (en) * | 1992-04-21 | 1999-01-05 | Branson Ultrasonics Corporation | Simultaneous amplitude and force profiling during ultrasonic welding of thermoplastic workpieces |
US6106754A (en) * | 1994-11-23 | 2000-08-22 | Rodel Holdings, Inc. | Method of making polishing pads |
US5893796A (en) * | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
US5605760A (en) * | 1995-08-21 | 1997-02-25 | Rodel, Inc. | Polishing pads |
EP1038637B1 (en) | 1996-09-11 | 2008-01-23 | Minnesota Mining And Manufacturing Company | Abrasive articles |
US6120352A (en) * | 1997-03-06 | 2000-09-19 | Keltech Engineering | Lapping apparatus and lapping method using abrasive sheets |
US6068539A (en) * | 1998-03-10 | 2000-05-30 | Lam Research Corporation | Wafer polishing device with movable window |
JP3367496B2 (ja) * | 2000-01-20 | 2003-01-14 | 株式会社ニコン | 研磨体、平坦化装置、半導体デバイス製造方法、および半導体デバイス |
US6171181B1 (en) * | 1999-08-17 | 2001-01-09 | Rodel Holdings, Inc. | Molded polishing pad having integral window |
JP3259225B2 (ja) | 1999-12-27 | 2002-02-25 | 株式会社ニコン | 研磨状況モニタ方法及びその装置、研磨装置、プロセスウエハ、半導体デバイス製造方法、並びに半導体デバイス |
US6685537B1 (en) * | 2000-06-05 | 2004-02-03 | Speedfam-Ipec Corporation | Polishing pad window for a chemical mechanical polishing tool |
GB0024070D0 (en) | 2000-10-02 | 2000-11-15 | Innavisions Ltd | Mpulding apparatus and method |
JP2002170799A (ja) * | 2000-11-30 | 2002-06-14 | Nikon Corp | 測定装置、研磨状況モニタ装置、研磨装置、半導体デバイス製造方法、並びに半導体デバイス |
US6884146B2 (en) * | 2002-02-04 | 2005-04-26 | Kla-Tencor Technologies Corp. | Systems and methods for characterizing a polishing process |
DE10302320A1 (de) * | 2003-01-20 | 2004-07-29 | Wipak Walsrode Gmbh & Co.Kg | Wiederverschließbare Verpackung |
JP2004327974A (ja) * | 2003-04-09 | 2004-11-18 | Jsr Corp | 研磨パッド、その製造法と製造用金型および半導体ウエハの研磨方法 |
-
2003
- 2003-06-17 US US10/463,721 patent/US6997777B2/en not_active Expired - Lifetime
-
2004
- 2004-06-03 DE DE602004028245T patent/DE602004028245D1/de not_active Expired - Lifetime
- 2004-06-03 EP EP04753997A patent/EP1638735B1/en not_active Expired - Lifetime
- 2004-06-03 KR KR1020057024180A patent/KR100913282B1/ko active IP Right Grant
- 2004-06-03 CN CNB2004800167080A patent/CN100467228C/zh not_active Expired - Lifetime
- 2004-06-03 JP JP2006517168A patent/JP4908207B2/ja not_active Expired - Fee Related
- 2004-06-03 WO PCT/US2004/017289 patent/WO2005000528A1/en active Application Filing
- 2004-06-03 AT AT04753997T patent/ATE474692T1/de not_active IP Right Cessation
- 2004-06-04 TW TW093116248A patent/TWI286957B/zh not_active IP Right Cessation
- 2004-06-15 MY MYPI20042301A patent/MY132430A/en unknown
-
2010
- 2010-10-08 JP JP2010229045A patent/JP2011031392A/ja active Pending
Patent Citations (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2001291686A (ja) * | 1999-09-14 | 2001-10-19 | Applied Materials Inc | 窓漏れの少ない透明窓を有するケミカルメカニカルポリシング装置用ポリシングパッド |
JP2001274120A (ja) * | 1999-12-30 | 2001-10-05 | Lam Res Corp | 研磨パッド及びその製造方法 |
JP2002144220A (ja) * | 2000-09-19 | 2002-05-21 | Rodel Holdings Inc | ミクロ−テクスチャーを備えた研磨パッド |
WO2002062527A1 (en) * | 2001-02-07 | 2002-08-15 | 3M Innovative Properties Company | Abrasive article suitable for modifying a semiconductor wafer |
WO2002074490A1 (en) * | 2001-02-15 | 2002-09-26 | 3M Innovative Properties Company | Fixed abrasive article for use in modifying a semiconductor wafer |
JP2003068686A (ja) * | 2001-06-15 | 2003-03-07 | Ebara Corp | ポリッシング装置及び研磨パッド並びにその製造方法 |
JP2003133270A (ja) * | 2001-10-26 | 2003-05-09 | Jsr Corp | 化学機械研磨用窓材及び研磨パッド |
JP2003163191A (ja) * | 2001-11-28 | 2003-06-06 | Tokyo Seimitsu Co Ltd | 機械化学的研磨装置用の研磨パッド |
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009542451A (ja) * | 2006-07-03 | 2009-12-03 | アプライド マテリアルズ インコーポレイテッド | 複数の部分を有する窓をもつ研磨パッド |
JP2010069789A (ja) * | 2008-09-19 | 2010-04-02 | Ibiden Co Ltd | 基材の被覆方法 |
JP2010130009A (ja) * | 2008-11-26 | 2010-06-10 | Siltronic Ag | 歪み緩和Si1−xGex層を有する半導体ウェハをポリシングする方法 |
US8338302B2 (en) | 2008-11-26 | 2012-12-25 | Siltronic Ag | Method for polishing a semiconductor wafer with a strained-relaxed Si1−xGex layer |
JP2010223891A (ja) * | 2009-03-25 | 2010-10-07 | Citizen Holdings Co Ltd | 時計用指針の製造方法 |
JP2015512799A (ja) * | 2012-04-11 | 2015-04-30 | キャボット マイクロエレクトロニクス コーポレイション | 光に安定な光透過領域を有する研磨パッド |
Also Published As
Publication number | Publication date |
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MY132430A (en) | 2007-10-31 |
CN1805828A (zh) | 2006-07-19 |
KR20060010843A (ko) | 2006-02-02 |
TW200526355A (en) | 2005-08-16 |
TWI286957B (en) | 2007-09-21 |
US6997777B2 (en) | 2006-02-14 |
US20040259483A1 (en) | 2004-12-23 |
WO2005000528A1 (en) | 2005-01-06 |
ATE474692T1 (de) | 2010-08-15 |
CN100467228C (zh) | 2009-03-11 |
EP1638735A1 (en) | 2006-03-29 |
KR100913282B1 (ko) | 2009-08-21 |
EP1638735B1 (en) | 2010-07-21 |
JP2011031392A (ja) | 2011-02-17 |
JP4908207B2 (ja) | 2012-04-04 |
DE602004028245D1 (de) | 2010-09-02 |
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