DE602004028245D1 - Polierkissens mit einem optisch transmissiven bereich - Google Patents

Polierkissens mit einem optisch transmissiven bereich

Info

Publication number
DE602004028245D1
DE602004028245D1 DE602004028245T DE602004028245T DE602004028245D1 DE 602004028245 D1 DE602004028245 D1 DE 602004028245D1 DE 602004028245 T DE602004028245 T DE 602004028245T DE 602004028245 T DE602004028245 T DE 602004028245T DE 602004028245 D1 DE602004028245 D1 DE 602004028245D1
Authority
DE
Germany
Prior art keywords
polishing pad
optically transmissive
transmissive area
aperture
transmissive window
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE602004028245T
Other languages
English (en)
Inventor
Kelly J Newell
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
CMC Materials LLC
Original Assignee
Cabot Microelectronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cabot Microelectronics Corp filed Critical Cabot Microelectronics Corp
Publication of DE602004028245D1 publication Critical patent/DE602004028245D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D7/00—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor
    • B24D7/12—Bonded abrasive wheels, or wheels with inserted abrasive blocks, designed for acting otherwise than only by their periphery, e.g. by the front face; Bushings or mountings therefor with apertures for inspecting the surface to be abraded
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00—Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Lining Or Joining Of Plastics Or The Like (AREA)
  • Grinding And Polishing Of Tertiary Curved Surfaces And Surfaces With Complex Shapes (AREA)
  • Pressure Welding/Diffusion-Bonding (AREA)
  • Polishing Bodies And Polishing Tools (AREA)
DE602004028245T 2003-06-17 2004-06-03 Polierkissens mit einem optisch transmissiven bereich Expired - Lifetime DE602004028245D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/463,721 US6997777B2 (en) 2003-06-17 2003-06-17 Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region
PCT/US2004/017289 WO2005000528A1 (en) 2003-06-17 2004-06-03 Ultrasonic welding method for the manufacture of a polishing pad comprising an optically transmissive region

Publications (1)

Publication Number Publication Date
DE602004028245D1 true DE602004028245D1 (de) 2010-09-02

Family

ID=33517134

Family Applications (1)

Application Number Title Priority Date Filing Date
DE602004028245T Expired - Lifetime DE602004028245D1 (de) 2003-06-17 2004-06-03 Polierkissens mit einem optisch transmissiven bereich

Country Status (10)

Country Link
US (1) US6997777B2 (de)
EP (1) EP1638735B1 (de)
JP (2) JP4908207B2 (de)
KR (1) KR100913282B1 (de)
CN (1) CN100467228C (de)
AT (1) ATE474692T1 (de)
DE (1) DE602004028245D1 (de)
MY (1) MY132430A (de)
TW (1) TWI286957B (de)
WO (1) WO2005000528A1 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4620501B2 (ja) * 2005-03-04 2011-01-26 ニッタ・ハース株式会社 研磨パッド
JP2007118106A (ja) * 2005-10-26 2007-05-17 Toyo Tire & Rubber Co Ltd 研磨パッド及びその製造方法
US7942724B2 (en) * 2006-07-03 2011-05-17 Applied Materials, Inc. Polishing pad with window having multiple portions
CA2722370A1 (en) * 2008-02-20 2009-08-27 Mayo Foundation For Medical Education And Research Systems, devices and methods for accessing body tissue
CA2715895A1 (en) * 2008-02-20 2009-08-27 Mayo Foundation For Medical Education And Research Ultrasound guided systems and methods
JP5133830B2 (ja) * 2008-09-19 2013-01-30 イビデン株式会社 基材の被覆方法
DE102008059044B4 (de) * 2008-11-26 2013-08-22 Siltronic Ag Verfahren zum Polieren einer Halbleiterscheibe mit einer verspannt-relaxierten Si1-xGex-Schicht
JP5366606B2 (ja) * 2009-03-25 2013-12-11 シチズンホールディングス株式会社 時計用指針の製造方法
US8129220B2 (en) 2009-08-24 2012-03-06 Hong Kong Polytechnic University Method and system for bonding electrical devices using an electrically conductive adhesive
US9795404B2 (en) * 2009-12-31 2017-10-24 Tenex Health, Inc. System and method for minimally invasive ultrasonic musculoskeletal tissue treatment
US9017140B2 (en) 2010-01-13 2015-04-28 Nexplanar Corporation CMP pad with local area transparency
KR101942100B1 (ko) * 2010-07-07 2019-01-24 롬 앤드 하스 일렉트로닉 머티리얼스 씨엠피 홀딩스, 인코포레이티드 저결함성 창을 갖는 화학 기계 연마 패드
US9156124B2 (en) 2010-07-08 2015-10-13 Nexplanar Corporation Soft polishing pad for polishing a semiconductor substrate
CN101957491A (zh) * 2010-08-24 2011-01-26 亚泰影像科技股份有限公司 透镜组的固定方法
US8876983B2 (en) * 2011-09-01 2014-11-04 Ford Global Technologies, Llc In-line cleaning method for ultrasonic welding tools
US9156125B2 (en) * 2012-04-11 2015-10-13 Cabot Microelectronics Corporation Polishing pad with light-stable light-transmitting region
US11406415B2 (en) 2012-06-11 2022-08-09 Tenex Health, Inc. Systems and methods for tissue treatment
US9149291B2 (en) 2012-06-11 2015-10-06 Tenex Health, Inc. Systems and methods for tissue treatment
US9962181B2 (en) 2014-09-02 2018-05-08 Tenex Health, Inc. Subcutaneous wound debridement
US9763689B2 (en) 2015-05-12 2017-09-19 Tenex Health, Inc. Elongated needles for ultrasonic applications
US9868185B2 (en) 2015-11-03 2018-01-16 Cabot Microelectronics Corporation Polishing pad with foundation layer and window attached thereto
KR101945878B1 (ko) 2017-07-11 2019-02-11 에스케이씨 주식회사 연마층과 유사 경도를 갖는 윈도우를 포함하는 연마패드
DE102017214778A1 (de) * 2017-08-23 2019-02-28 Sgl Carbon Se Alternatives Fügeverfahren
CN114196327A (zh) * 2022-01-28 2022-03-18 淄博海泰新光光学技术有限公司 一种用于光学零件抛光的复合材料及制备方法

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5658408A (en) * 1992-04-21 1997-08-19 Branson Ultrasonics Corporation Method for processing workpieces by ultrasonic energy
US5855706A (en) * 1992-04-21 1999-01-05 Branson Ultrasonics Corporation Simultaneous amplitude and force profiling during ultrasonic welding of thermoplastic workpieces
US6106754A (en) * 1994-11-23 2000-08-22 Rodel Holdings, Inc. Method of making polishing pads
US5893796A (en) * 1995-03-28 1999-04-13 Applied Materials, Inc. Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus
US5605760A (en) * 1995-08-21 1997-02-25 Rodel, Inc. Polishing pads
EP1038637B1 (de) 1996-09-11 2008-01-23 Minnesota Mining And Manufacturing Company Schleifgegenstände
US6120352A (en) * 1997-03-06 2000-09-19 Keltech Engineering Lapping apparatus and lapping method using abrasive sheets
US6068539A (en) * 1998-03-10 2000-05-30 Lam Research Corporation Wafer polishing device with movable window
JP3367496B2 (ja) * 2000-01-20 2003-01-14 株式会社ニコン 研磨体、平坦化装置、半導体デバイス製造方法、および半導体デバイス
US6171181B1 (en) * 1999-08-17 2001-01-09 Rodel Holdings, Inc. Molded polishing pad having integral window
US6524164B1 (en) * 1999-09-14 2003-02-25 Applied Materials, Inc. Polishing pad with transparent window having reduced window leakage for a chemical mechanical polishing apparatus
JP3259225B2 (ja) 1999-12-27 2002-02-25 株式会社ニコン 研磨状況モニタ方法及びその装置、研磨装置、プロセスウエハ、半導体デバイス製造方法、並びに半導体デバイス
US6569004B1 (en) * 1999-12-30 2003-05-27 Lam Research Polishing pad and method of manufacture
US6685537B1 (en) * 2000-06-05 2004-02-03 Speedfam-Ipec Corporation Polishing pad window for a chemical mechanical polishing tool
US6641471B1 (en) * 2000-09-19 2003-11-04 Rodel Holdings, Inc Polishing pad having an advantageous micro-texture and methods relating thereto
GB0024070D0 (en) 2000-10-02 2000-11-15 Innavisions Ltd Mpulding apparatus and method
JP2002170799A (ja) * 2000-11-30 2002-06-14 Nikon Corp 測定装置、研磨状況モニタ装置、研磨装置、半導体デバイス製造方法、並びに半導体デバイス
US6612917B2 (en) * 2001-02-07 2003-09-02 3M Innovative Properties Company Abrasive article suitable for modifying a semiconductor wafer
US6632129B2 (en) * 2001-02-15 2003-10-14 3M Innovative Properties Company Fixed abrasive article for use in modifying a semiconductor wafer
JP4131632B2 (ja) * 2001-06-15 2008-08-13 株式会社荏原製作所 ポリッシング装置及び研磨パッド
JP2003133270A (ja) * 2001-10-26 2003-05-09 Jsr Corp 化学機械研磨用窓材及び研磨パッド
JP2003163191A (ja) * 2001-11-28 2003-06-06 Tokyo Seimitsu Co Ltd 機械化学的研磨装置用の研磨パッド
US6935922B2 (en) * 2002-02-04 2005-08-30 Kla-Tencor Technologies Corp. Methods and systems for generating a two-dimensional map of a characteristic at relative or absolute locations of measurement spots on a specimen during polishing
DE10302320A1 (de) * 2003-01-20 2004-07-29 Wipak Walsrode Gmbh & Co.Kg Wiederverschließbare Verpackung
JP2004327974A (ja) * 2003-04-09 2004-11-18 Jsr Corp 研磨パッド、その製造法と製造用金型および半導体ウエハの研磨方法

Also Published As

Publication number Publication date
CN100467228C (zh) 2009-03-11
EP1638735A1 (de) 2006-03-29
TWI286957B (en) 2007-09-21
JP2011031392A (ja) 2011-02-17
KR20060010843A (ko) 2006-02-02
WO2005000528A1 (en) 2005-01-06
CN1805828A (zh) 2006-07-19
JP4908207B2 (ja) 2012-04-04
JP2006527664A (ja) 2006-12-07
ATE474692T1 (de) 2010-08-15
EP1638735B1 (de) 2010-07-21
KR100913282B1 (ko) 2009-08-21
TW200526355A (en) 2005-08-16
US6997777B2 (en) 2006-02-14
MY132430A (en) 2007-10-31
US20040259483A1 (en) 2004-12-23

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