JP2006525520A - マトリックス支援レーザ脱離およびイオン化質量分光分析を使用して電気伝導性領域に隣接する領域のサンプルプレート表面マスクをスキャンする方法 - Google Patents
マトリックス支援レーザ脱離およびイオン化質量分光分析を使用して電気伝導性領域に隣接する領域のサンプルプレート表面マスクをスキャンする方法 Download PDFInfo
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- H—ELECTRICITY
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- H01J49/02—Details
- H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
- H01J49/0409—Sample holders or containers
- H01J49/0418—Sample holders or containers for laser desorption, e.g. matrix-assisted laser desorption/ionisation [MALDI] plates or surface enhanced laser desorption/ionisation [SELDI] plates
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
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- B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
- B01L3/508—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above
- B01L3/5085—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above for multiple samples, e.g. microtitration plates
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L3/00—Containers or dishes for laboratory use, e.g. laboratory glassware; Droppers
- B01L3/50—Containers for the purpose of retaining a material to be analysed, e.g. test tubes
- B01L3/508—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above
- B01L3/5088—Containers for the purpose of retaining a material to be analysed, e.g. test tubes rigid containers not provided for above confining liquids at a location by surface tension, e.g. virtual wells on plates, wires
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J49/00—Particle spectrometers or separator tubes
- H01J49/02—Details
- H01J49/10—Ion sources; Ion guns
- H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
- H01J49/161—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
- H01J49/164—Laser desorption/ionisation, e.g. matrix-assisted laser desorption/ionisation [MALDI]
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2300/00—Additional constructional details
- B01L2300/08—Geometry, shape and general structure
- B01L2300/0809—Geometry, shape and general structure rectangular shaped
- B01L2300/0829—Multi-well plates; Microtitration plates
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01L—CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE
- B01L2300/00—Additional constructional details
- B01L2300/16—Surface properties and coatings
- B01L2300/161—Control and use of surface tension forces, e.g. hydrophobic, hydrophilic
- B01L2300/165—Specific details about hydrophobic, oleophobic surfaces
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/02—Devices for withdrawing samples
- G01N1/04—Devices for withdrawing samples in the solid state, e.g. by cutting
- G01N2001/045—Laser ablation; Microwave vaporisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/40—Concentrating samples
- G01N1/4022—Concentrating samples by thermal techniques; Phase changes
- G01N2001/4027—Concentrating samples by thermal techniques; Phase changes evaporation leaving a concentrated sample
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/24—Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T436/00—Chemistry: analytical and immunological testing
- Y10T436/25—Chemistry: analytical and immunological testing including sample preparation
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Abstract
Description
生物分子、特にタンパク質、ペプチド、およびDNAやRNAなどの核酸の研究や識別のための重要な分析ツールである。
図3aおよび図4aと、図3bおよび図4bは、本発明の1つ以上の実施形態によるサンプルプレートの一切断面であって、それぞれ、図2aおよび図2bのB−Bで切断した断面図である。
図6cは、本発明の一実施形態によるチャンネル・サンプルプレートの一切断面である図5bのD−Dで切断した断面図であって、サンプルサイトに標本が塗布された状態を示す。
12 基板
14 マスク
16 被覆
20 サンプルサイト
22 マージン
24 目標領域
40 標本
42 結晶
48 レーザ光線
50 スキャンパターン
52a 境界
52b 境界
Claims (14)
- 電気伝導性の表面に粗い表面を用いて塗布されたマスクを含むサンプルプレートを提供し、電気伝導性の表面からなる中央部分とマスクのマージン部分とを有するサンプルサイトを提供するステップと、
少なくとも1つの検体と少なくとも1つのマトリクスを接触させる段階を備え、標本を準備するステップと、
前記サンプルサイトに標本を塗布するステップと、
前記検体の少なくとも1つの結晶を前記電気伝導性領域に隣接するマスクの一領域に形成するステップと、
レーザビームを用いて前記電気伝導性領域に隣接するマスク上の領域をスキャンするステップと、
を有することを特徴とする、質量分光分析を使用して電気伝導性領域に隣接するサンプルプレート表面マスクをスキャンする方法。 - レーザビームを用いて前記電気伝導性領域に隣接するマスク上の領域をスキャンする前記ステップは、パターンにおいてスキャンする段階をさらに含むことを特徴とする請求項1に記載の方法。
- 信頼水準を持ったアルゴリズムに基づいてスキャンパターンを決定するステップをさらに有することを特徴とする請求項2に記載の方法。
- 標本を準備する前記ステップは、α−シアノ−4−ヒドロキシ桂皮酸および3,5−ジメトキシ−4−ヒドロキシ桂皮酸のグループから選択されたマトリクスを提供する段階をさらに備えることを特徴とする請求項1に記載の方法。
- 標本を準備する前記ステップは、有機溶媒を供給する段階をさらに有することを特徴とする請求項1に記載の方法。
- 標本を準備する前記ステップは、水溶液を供給する段階をさらに有することを特徴とする請求項1に記載の方法。
- 標本を準備する前記ステップは、少なくとも1つの生物分子である検体を提供する段階をさらに有することを特徴とする請求項1に記載の方法。
- 標本を準備する前記ステップは、オリゴヌクレオチド、DNA、RNA、ペプチド、ポリペプチド、オリゴペプチド、タンパク質、糖たん白質、リポタンパク質、炭水化物、単糖類、二糖類、多糖類、および、それらの混合物から成るグループから選択された検体を提供する段階をさらに有することを特徴とする請求項1に記載の方法。
- 電気伝導性の表面に粗い表面を用いて塗布されたマスクを含むサンプルプレートを提供し、電気伝導性の表面からなる中央部分とマスクのマージン部分とを有するサンプルサイトを提供するステップと、
有機溶媒、水溶液、およびマトリクスによって生物分子を溶離する段階と、標本を塗布する段階とを含み、標本を準備するための液体クロマトグラフ・システムを提供するステップと、
前記液体クロマトグラフ・システムと協調的に前記サンプルプレートを移動させるステップと、
前記サンプルサイトに標本を塗布するステップと、
を含むことを特徴とする、電気伝導性領域に隣接する領域におけるサンプルプレート表面マスクに標本を塗布する方法。 - 前記マトリクスは、α−シアノ−4−ヒドロキシ桂皮酸および3,5−ジメトキシ−4−ヒドロキシ桂皮酸のグループから選択されることを特徴とする請求項9に記載の方法。
- 標本を塗布する前記ステップは、1mm当たり少なくとも1μlの比率で前記標本を塗布するステップをさらに有することを特徴とする請求項9に記載の方法。
- 標本を塗布する前記ステップは、前記マスク上の電気伝導性の表面の周辺部の少なくとも0.2mm以内に標本を塗布するステップをさらに有することを特徴とする請求項9に記載の方法。
- 生物分子を溶離する段階を含み標本を準備するための液体クロマトグラフ・システムを提供するステップは、
オリゴヌクレオチド、DNA、RNA、ペプチド、ポリペプチド、オリゴペプチド、タンパク質、糖タンパク質、リポタンパク質、炭水化物、単糖類、二糖類、多糖類、および、それらの混合物から成るグループから選択された生物分子を溶離する段階をさらに有することを特徴とする請求項9に記載の方法。 - 電気伝導性の表面に粗い表面を用いて塗布されたマスクを含むサンプルプレートを提供する前記ステップは、合成ポリマーからなるマスクを選択する段階をさらに有することを特徴とする請求項1に記載の方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/426,226 US7858387B2 (en) | 2003-04-30 | 2003-04-30 | Method of scanning a sample plate surface mask in an area adjacent to a conductive area using matrix-assisted laser desorption and ionization mass spectrometry |
PCT/US2004/013440 WO2004100207A2 (en) | 2003-04-30 | 2004-04-30 | Method of scanning a sample plate surface mask in an area adjacent to a conductive area using matrix-assisted laser desorption and ionization mass spectrometry |
Publications (2)
Publication Number | Publication Date |
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JP2006525520A true JP2006525520A (ja) | 2006-11-09 |
JP4414429B2 JP4414429B2 (ja) | 2010-02-10 |
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Application Number | Title | Priority Date | Filing Date |
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JP2006514178A Expired - Lifetime JP4414429B2 (ja) | 2003-04-30 | 2004-04-30 | マトリックス支援レーザ脱離およびイオン化質量分光分析を使用して電気伝導性領域に隣接する領域のサンプルプレート表面マスクをスキャンする方法 |
Country Status (5)
Country | Link |
---|---|
US (2) | US7858387B2 (ja) |
EP (1) | EP1618591A2 (ja) |
JP (1) | JP4414429B2 (ja) |
CA (1) | CA2524249C (ja) |
WO (1) | WO2004100207A2 (ja) |
Cited By (5)
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JP2009244267A (ja) * | 2008-03-31 | 2009-10-22 | Sony Dadc Austria Ag | 基材及びターゲットプレート(substrateandtargetplate) |
WO2011027819A1 (ja) * | 2009-09-02 | 2011-03-10 | 公益財団法人野口研究所 | 質量分析法 |
WO2012029900A1 (ja) * | 2010-09-02 | 2012-03-08 | 学校法人立教学院 | Lc-maldiで得られたデータの比較解析方法 |
JP2016145746A (ja) * | 2015-02-06 | 2016-08-12 | シチズンファインデバイス株式会社 | 試料積載プレート |
JP2021513731A (ja) * | 2018-02-13 | 2021-05-27 | ビオメリュー・インコーポレイテッド | 試料取扱いシステム、質量分析計および関連方法 |
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US20060183238A1 (en) * | 2005-02-09 | 2006-08-17 | Applera Corporation | Amine-containing compound analysis methods |
JP2007108015A (ja) * | 2005-10-13 | 2007-04-26 | Biologica:Kk | 分析用の保持体及びその利用 |
WO2008009121A1 (en) * | 2006-07-19 | 2008-01-24 | Mds Analytical Technologies, A Business Unit Of Mds Inc., Doing Business Through Its Sciex Division | Dynamic pixel scanning for use with maldi-ms |
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WO2013004523A1 (de) * | 2011-07-07 | 2013-01-10 | Holger Behnk | Küvettenmodul mit elektrisch leitfähigem küvettenträger |
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2003
- 2003-04-30 US US10/426,226 patent/US7858387B2/en not_active Expired - Fee Related
-
2004
- 2004-04-30 WO PCT/US2004/013440 patent/WO2004100207A2/en active Application Filing
- 2004-04-30 CA CA002524249A patent/CA2524249C/en not_active Expired - Fee Related
- 2004-04-30 EP EP04751035A patent/EP1618591A2/en not_active Withdrawn
- 2004-04-30 JP JP2006514178A patent/JP4414429B2/ja not_active Expired - Lifetime
-
2010
- 2010-11-09 US US12/942,816 patent/US20110056311A1/en not_active Abandoned
Cited By (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009244267A (ja) * | 2008-03-31 | 2009-10-22 | Sony Dadc Austria Ag | 基材及びターゲットプレート(substrateandtargetplate) |
US9176030B2 (en) | 2008-03-31 | 2015-11-03 | Sony Dadc Austria Ag | Substrate and target plate |
WO2011027819A1 (ja) * | 2009-09-02 | 2011-03-10 | 公益財団法人野口研究所 | 質量分析法 |
JPWO2011027819A1 (ja) * | 2009-09-02 | 2013-02-04 | 公益財団法人野口研究所 | 質量分析法 |
WO2012029900A1 (ja) * | 2010-09-02 | 2012-03-08 | 学校法人立教学院 | Lc-maldiで得られたデータの比較解析方法 |
JP2016145746A (ja) * | 2015-02-06 | 2016-08-12 | シチズンファインデバイス株式会社 | 試料積載プレート |
JP2021513731A (ja) * | 2018-02-13 | 2021-05-27 | ビオメリュー・インコーポレイテッド | 試料取扱いシステム、質量分析計および関連方法 |
JP7449872B2 (ja) | 2018-02-13 | 2024-03-14 | ビオメリュー・インコーポレイテッド | 試料取扱いシステム、質量分析計および関連方法 |
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US20110056311A1 (en) | 2011-03-10 |
EP1618591A2 (en) | 2006-01-25 |
US7858387B2 (en) | 2010-12-28 |
WO2004100207A3 (en) | 2005-01-27 |
JP4414429B2 (ja) | 2010-02-10 |
US20040219531A1 (en) | 2004-11-04 |
CA2524249C (en) | 2010-01-19 |
CA2524249A1 (en) | 2004-11-18 |
WO2004100207A2 (en) | 2004-11-18 |
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