JP2006521212A - スマート材料：ナノチューブ検知システム、ナノチューブ検知複合材料、およびナノチューブ検知デバイスによる歪みの検知と応力の測定 - Google Patents

スマート材料：ナノチューブ検知システム、ナノチューブ検知複合材料、およびナノチューブ検知デバイスによる歪みの検知と応力の測定 Download PDF

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Publication number
JP2006521212A
JP2006521212A JP2006501099A JP2006501099A JP2006521212A JP 2006521212 A JP2006521212 A JP 2006521212A JP 2006501099 A JP2006501099 A JP 2006501099A JP 2006501099 A JP2006501099 A JP 2006501099A JP 2006521212 A JP2006521212 A JP 2006521212A
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Prior art keywords
carbon nanotubes
combinations
group
mechanical
carbon
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JP2006501099A
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English (en)
Japanese (ja)
Inventor
バーレラ，エンリケ・ヴイ
ナガラジャイア，サティシュ
ドハラップ，プラサド
ズィーリング，リ
キム，ヨン・デ
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William Marsh Rice University
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William Marsh Rice University
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
    • G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B82—NANOTECHNOLOGY
    • B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
    • B82Y15/00—Nanotechnology for interacting, sensing or actuating, e.g. quantum dots as markers in protein assays or molecular motors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
    • G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
    • G01K11/20—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using thermoluminescent materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/005—Measuring force or stress, in general by electrical means and not provided for in G01L1/06 - G01L1/22
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/20—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress
    • G01L1/22—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges
    • G01L1/2287—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges
    • G01L1/2293—Measuring force or stress, in general by measuring variations in ohmic resistance of solid materials or of electrically-conductive fluids; by making use of electrokinetic cells, i.e. liquid-containing cells wherein an electrical potential is produced or varied upon the application of stress using resistance strain gauges constructional details of the strain gauges of the semi-conductor type
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01L—MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00—Measuring force or stress, in general
    • G01L1/24—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
    • G01L1/241—Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet by photoelastic stress analysis

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  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nanotechnology (AREA)
  • Engineering & Computer Science (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Molecular Biology (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Carbon And Carbon Compounds (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Measurement Of Force In General (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP2006501099A 2003-01-23 2004-01-23 スマート材料：ナノチューブ検知システム、ナノチューブ検知複合材料、およびナノチューブ検知デバイスによる歪みの検知と応力の測定 Withdrawn JP2006521212A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US44213403P 2003-01-23 2003-01-23
PCT/US2004/001708 WO2004065926A1 (en) 2003-01-23 2004-01-23 Smart materials: strain sensing and stress determination by means of nanotube sensing systems, composites, and devices

Related Child Applications (1)

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JP2010151091A Division JP2010281824A (ja) 2003-01-23 2010-07-01 スマート材料：ナノチューブ検知システム、ナノチューブ検知複合材料、およびナノチューブ検知デバイスによる歪みの検知と応力の測定

Publications (1)

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JP2006521212A true JP2006521212A (ja) 2006-09-21

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JP2010151091A Pending JP2010281824A (ja) 2003-01-23 2010-07-01 スマート材料：ナノチューブ検知システム、ナノチューブ検知複合材料、およびナノチューブ検知デバイスによる歪みの検知と応力の測定

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US (1) US7730547B2 (enExample)
EP (1) EP1595123A1 (enExample)
JP (2) JP2006521212A (enExample)
CA (1) CA2514496C (enExample)
WO (1) WO2004065926A1 (enExample)

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JP2006242819A (ja) * 2005-03-04 2006-09-14 National Institute For Materials Science 物体の歪を検出する方法およびその装置
JP2006292478A (ja) * 2005-04-07 2006-10-26 Matsushita Electric Works Ltd 物理量センサ
JP2010522443A (ja) * 2007-03-21 2010-07-01 ローズマウント インコーポレイテッド カーボン・ナノチューブ又は半導体ナノワイヤを包含する複合ダイアフラムを用いたセンサ
JP2010251327A (ja) * 2009-04-20 2010-11-04 Qinghua Univ 線熱源
WO2011024539A1 (ja) * 2009-08-25 2011-03-03 独立行政法人産業技術総合研究所 カーボンナノチューブを用いた伸縮装置とその製造方法
JP2011117965A (ja) * 2009-12-04 2011-06-16 Qinghua Univ ひずみ測定装置及びそれを利用したひずみの測定方法
JP2011517834A (ja) * 2008-03-18 2011-06-16 ラム リサーチ コーポレーション 電極アセンブリ及び熱伝導ガスケットを用いるプラズマ処理チャンバ
JP2013504442A (ja) * 2009-09-11 2013-02-07 ジェイピー ラボラトリーズ インコーポレイテッド ナノ構造の変形、破壊、および変換に基づくモニタリング装置およびモニタリング方法
TWI416086B (zh) * 2010-01-22 2013-11-21 Hon Hai Prec Ind Co Ltd 應變測量裝置及測量方法
JP2015087125A (ja) * 2013-10-28 2015-05-07 三菱日立パワーシステムズ株式会社 損傷判定装置、および損傷判定方法
KR20170085100A (ko) * 2014-11-20 2017-07-21 젯트에프 프리드리히스하펜 아게 힘 센서를 갖는 기계 부품
KR20170087909A (ko) * 2014-11-20 2017-07-31 젯트에프 프리드리히스하펜 아게 힘 센서를 갖는 기계 부품
JP2018151403A (ja) * 2004-11-09 2018-09-27 ボード・オブ・リージエンツ，ザ・ユニバーシテイ・オブ・テキサス・システム ナノファイバーのリボンおよびシートならびにナノファイバーの撚り糸および無撚り糸の製造および適用
KR20180122425A (ko) * 2016-03-18 2018-11-12 젯트에프 프리드리히스하펜 아게 부품의 순간 변형을 검출하기 위한 센서 장치, 측정 장치 및 방법, 그리고 자동차
JP2023030199A (ja) * 2017-03-23 2023-03-07 ザ ジェネラル ホスピタル コーポレイション 管腔構造のインサイチュ３次元再構成のための装置、方法、及びコンピュータのアクセス可能な媒体

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