JP2006351968A5 - - Google Patents

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Publication number
JP2006351968A5
JP2006351968A5 JP2005178534A JP2005178534A JP2006351968A5 JP 2006351968 A5 JP2006351968 A5 JP 2006351968A5 JP 2005178534 A JP2005178534 A JP 2005178534A JP 2005178534 A JP2005178534 A JP 2005178534A JP 2006351968 A5 JP2006351968 A5 JP 2006351968A5
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JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2005178534A
Other languages
Japanese (ja)
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JP2006351968A (ja
JP4698296B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2005178534A external-priority patent/JP4698296B2/ja
Priority to JP2005178534A priority Critical patent/JP4698296B2/ja
Priority to US11/424,385 priority patent/US7524753B2/en
Priority to CNA200610086505XA priority patent/CN1881535A/zh
Priority to KR1020060054365A priority patent/KR20060132490A/ko
Priority to TW095121568A priority patent/TW200707643A/zh
Priority to EP06012546A priority patent/EP1734576A1/en
Publication of JP2006351968A publication Critical patent/JP2006351968A/ja
Publication of JP2006351968A5 publication Critical patent/JP2006351968A5/ja
Publication of JP4698296B2 publication Critical patent/JP4698296B2/ja
Application granted granted Critical
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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JP2005178534A 2005-06-17 2005-06-17 貫通電極を有する半導体装置の製造方法 Active JP4698296B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2005178534A JP4698296B2 (ja) 2005-06-17 2005-06-17 貫通電極を有する半導体装置の製造方法
US11/424,385 US7524753B2 (en) 2005-06-17 2006-06-15 Semiconductor device having through electrode and method of manufacturing the same
TW095121568A TW200707643A (en) 2005-06-17 2006-06-16 Semiconductor device having through electrode and method of manufacturing the same
KR1020060054365A KR20060132490A (ko) 2005-06-17 2006-06-16 관통 전극을 갖는 반도체 장치 및 그 제조 방법
CNA200610086505XA CN1881535A (zh) 2005-06-17 2006-06-16 具有穿透电极的半导体器件及其制造方法
EP06012546A EP1734576A1 (en) 2005-06-17 2006-06-19 Semiconductor device having through electrode and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005178534A JP4698296B2 (ja) 2005-06-17 2005-06-17 貫通電極を有する半導体装置の製造方法

Publications (3)

Publication Number Publication Date
JP2006351968A JP2006351968A (ja) 2006-12-28
JP2006351968A5 true JP2006351968A5 (zh) 2008-03-27
JP4698296B2 JP4698296B2 (ja) 2011-06-08

Family

ID=36940439

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005178534A Active JP4698296B2 (ja) 2005-06-17 2005-06-17 貫通電極を有する半導体装置の製造方法

Country Status (6)

Country Link
US (1) US7524753B2 (zh)
EP (1) EP1734576A1 (zh)
JP (1) JP4698296B2 (zh)
KR (1) KR20060132490A (zh)
CN (1) CN1881535A (zh)
TW (1) TW200707643A (zh)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
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US7199439B2 (en) * 2004-06-14 2007-04-03 Micron Technology, Inc. Microelectronic imagers and methods of packaging microelectronic imagers
US7083425B2 (en) 2004-08-27 2006-08-01 Micron Technology, Inc. Slanted vias for electrical circuits on circuit boards and other substrates
US8278738B2 (en) * 2005-02-17 2012-10-02 Sharp Kabushiki Kaisha Method of producing semiconductor device and semiconductor device
JP4552770B2 (ja) * 2005-06-21 2010-09-29 パナソニック電工株式会社 半導体基板への貫通配線の形成方法
JP4533283B2 (ja) * 2005-08-29 2010-09-01 新光電気工業株式会社 半導体装置の製造方法
DE102006060205B3 (de) * 2006-12-18 2008-04-17 Forschungszentrum Jülich GmbH Verfahren zur Herstellung von Durchkontaktierungen und Leiterbahnen
JP2008305938A (ja) * 2007-06-07 2008-12-18 Toshiba Corp 半導体装置および半導体装置の製造方法
JP5248084B2 (ja) 2007-10-26 2013-07-31 新光電気工業株式会社 シリコンインターポーザとこれを用いた半導体装置用パッケージおよび半導体装置
JP5311609B2 (ja) 2007-10-30 2013-10-09 新光電気工業株式会社 シリコンインターポーザの製造方法およびシリコンインターポーザと、これを用いた半導体装置用パッケージおよび半導体装置
JP2009224492A (ja) * 2008-03-14 2009-10-01 Oki Semiconductor Co Ltd 半導体装置及びその製造方法
TWI389291B (zh) * 2008-05-13 2013-03-11 Ind Tech Res Inst 三維堆疊晶粒封裝結構
US7928534B2 (en) 2008-10-09 2011-04-19 Taiwan Semiconductor Manufacturing Company, Ltd. Bond pad connection to redistribution lines having tapered profiles
US8455357B2 (en) * 2008-10-10 2013-06-04 Taiwan Semiconductor Manufacturing Co., Ltd. Method of plating through wafer vias in a wafer for 3D packaging
US8030780B2 (en) * 2008-10-16 2011-10-04 Micron Technology, Inc. Semiconductor substrates with unitary vias and via terminals, and associated systems and methods
US8736050B2 (en) 2009-09-03 2014-05-27 Taiwan Semiconductor Manufacturing Company, Ltd. Front side copper post joint structure for temporary bond in TSV application
US8399354B2 (en) 2009-01-13 2013-03-19 Taiwan Semiconductor Manufacturing Company, Ltd. Through-silicon via with low-K dielectric liner
DE102009005458B4 (de) * 2009-01-21 2010-09-30 Austriamicrosystems Ag Halbleiterbauelement mit Durchkontaktierung und Verfahren zu dessen Herstellung
JP5367616B2 (ja) * 2009-02-23 2013-12-11 新光電気工業株式会社 配線基板及びその製造方法
JP4833307B2 (ja) * 2009-02-24 2011-12-07 インターナショナル・ビジネス・マシーンズ・コーポレーション 半導体モジュール、端子板、端子板の製造方法および半導体モジュールの製造方法
US8759949B2 (en) * 2009-04-30 2014-06-24 Taiwan Semiconductor Manufacturing Company, Ltd. Wafer backside structures having copper pillars
US8754507B2 (en) * 2011-01-18 2014-06-17 Hong Kong Applied Science and Technology Research Institute Company Limited Forming through-silicon-vias for multi-wafer integrated circuits
JP6033130B2 (ja) * 2013-03-13 2016-11-30 新光電気工業株式会社 プローブガイド板及びその製造方法
KR102222485B1 (ko) * 2014-09-18 2021-03-04 에스케이하이닉스 주식회사 관통 전극을 갖는 반도체 소자, 이를 구비하는 반도체 패키지 및 반도체 소자의 제조방법
KR102039887B1 (ko) * 2017-12-13 2019-12-05 엘비세미콘 주식회사 양면 도금 공정을 이용한 반도체 패키지의 제조방법

Family Cites Families (17)

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Publication number Priority date Publication date Assignee Title
US5933712A (en) * 1997-03-19 1999-08-03 The Regents Of The University Of California Attachment method for stacked integrated circuit (IC) chips
JP4296609B2 (ja) * 1998-04-10 2009-07-15 凸版印刷株式会社 半導体検査治具の製造方法
US6114098A (en) * 1998-09-17 2000-09-05 International Business Machines Corporation Method of filling an aperture in a substrate
US6039889A (en) 1999-01-12 2000-03-21 Fujitsu Limited Process flows for formation of fine structure layer pairs on flexible films
JP3918350B2 (ja) * 1999-03-05 2007-05-23 セイコーエプソン株式会社 半導体装置の製造方法
JP4053257B2 (ja) 2001-06-14 2008-02-27 新光電気工業株式会社 半導体装置の製造方法
US6495912B1 (en) * 2001-09-17 2002-12-17 Megic Corporation Structure of ceramic package with integrated passive devices
JP4017382B2 (ja) 2001-11-30 2007-12-05 新光電気工業株式会社 撮像装置
JP2003318178A (ja) * 2002-04-24 2003-11-07 Seiko Epson Corp 半導体装置及びその製造方法、回路基板並びに電子機器
JP3910493B2 (ja) * 2002-06-14 2007-04-25 新光電気工業株式会社 半導体装置及びその製造方法
JP3904484B2 (ja) 2002-06-19 2007-04-11 新光電気工業株式会社 シリコン基板のスルーホールプラギング方法
DE10244077B4 (de) 2002-09-06 2007-03-15 INSTITUT FüR MIKROTECHNIK MAINZ GMBH Verfahren zur Herstellung von Halbleiterbauteilen mit Durchkontaktierung
JP2004146742A (ja) * 2002-10-28 2004-05-20 Shinko Electric Ind Co Ltd 配線基板の製造方法
JP4213478B2 (ja) 2003-01-14 2009-01-21 株式会社ルネサステクノロジ 半導体装置の製造方法
TWI239629B (en) * 2003-03-17 2005-09-11 Seiko Epson Corp Method of manufacturing semiconductor device, semiconductor device, circuit substrate and electronic apparatus
JP2004327910A (ja) * 2003-04-28 2004-11-18 Sharp Corp 半導体装置およびその製造方法
JP3891292B2 (ja) * 2003-05-19 2007-03-14 セイコーエプソン株式会社 半導体装置及びその製造方法、回路基板並びに電子機器

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