JP2006048748A - 半導体記憶装置 - Google Patents

半導体記憶装置 Download PDF

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Publication number
JP2006048748A
JP2006048748A JP2004224116A JP2004224116A JP2006048748A JP 2006048748 A JP2006048748 A JP 2006048748A JP 2004224116 A JP2004224116 A JP 2004224116A JP 2004224116 A JP2004224116 A JP 2004224116A JP 2006048748 A JP2006048748 A JP 2006048748A
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Japan
Prior art keywords
control signal
output
timing
data
internal control
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Pending
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JP2004224116A
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Japanese (ja)
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JP2006048748A5 (https=
Inventor
Takahiko Fukiage
貴彦 吹上
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Renesas Technology Corp
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Renesas Technology Corp
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Priority to JP2004224116A priority Critical patent/JP2006048748A/ja
Publication of JP2006048748A publication Critical patent/JP2006048748A/ja
Publication of JP2006048748A5 publication Critical patent/JP2006048748A5/ja
Pending legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Dram (AREA)
JP2004224116A 2004-07-30 2004-07-30 半導体記憶装置 Pending JP2006048748A (ja)

Priority Applications (1)

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JP2004224116A JP2006048748A (ja) 2004-07-30 2004-07-30 半導体記憶装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004224116A JP2006048748A (ja) 2004-07-30 2004-07-30 半導体記憶装置

Publications (2)

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JP2006048748A true JP2006048748A (ja) 2006-02-16
JP2006048748A5 JP2006048748A5 (https=) 2007-08-02

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JP2004224116A Pending JP2006048748A (ja) 2004-07-30 2004-07-30 半導体記憶装置

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016157495A (ja) * 2015-02-24 2016-09-01 株式会社東芝 半導体記憶装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06295599A (ja) * 1993-04-09 1994-10-21 Nec Corp 半導体記憶装置
JPH07140207A (ja) * 1993-11-15 1995-06-02 Hitachi Ltd 半導体装置及びその試験方法
JPH08255499A (ja) * 1995-03-15 1996-10-01 Fujitsu Ltd データ圧縮試験機能を備えた半導体記憶装置及びその試験方法
JP2000207900A (ja) * 1999-01-12 2000-07-28 Mitsubishi Electric Corp 同期型半導体記憶装置
JP2002203400A (ja) * 2000-11-06 2002-07-19 Mitsubishi Electric Corp テスト容易化回路および当該回路を含む半導体記憶装置

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06295599A (ja) * 1993-04-09 1994-10-21 Nec Corp 半導体記憶装置
JPH07140207A (ja) * 1993-11-15 1995-06-02 Hitachi Ltd 半導体装置及びその試験方法
JPH08255499A (ja) * 1995-03-15 1996-10-01 Fujitsu Ltd データ圧縮試験機能を備えた半導体記憶装置及びその試験方法
JP2000207900A (ja) * 1999-01-12 2000-07-28 Mitsubishi Electric Corp 同期型半導体記憶装置
JP2002203400A (ja) * 2000-11-06 2002-07-19 Mitsubishi Electric Corp テスト容易化回路および当該回路を含む半導体記憶装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016157495A (ja) * 2015-02-24 2016-09-01 株式会社東芝 半導体記憶装置

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