JP2005534921A5 - - Google Patents

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Publication number
JP2005534921A5
JP2005534921A5 JP2004526172A JP2004526172A JP2005534921A5 JP 2005534921 A5 JP2005534921 A5 JP 2005534921A5 JP 2004526172 A JP2004526172 A JP 2004526172A JP 2004526172 A JP2004526172 A JP 2004526172A JP 2005534921 A5 JP2005534921 A5 JP 2005534921A5
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JP
Japan
Prior art keywords
crystal
curved
optical
crystals
ray source
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004526172A
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English (en)
Japanese (ja)
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JP2005534921A (ja
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Publication date
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Priority claimed from PCT/US2003/023412 external-priority patent/WO2004013867A2/en
Publication of JP2005534921A publication Critical patent/JP2005534921A/ja
Publication of JP2005534921A5 publication Critical patent/JP2005534921A5/ja
Pending legal-status Critical Current

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JP2004526172A 2002-08-02 2003-07-25 Ｘ線を方向付けるための光学デバイス及びその方法 Pending JP2005534921A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40080902P 2002-08-02 2002-08-02
PCT/US2003/023412 WO2004013867A2 (en) 2002-08-02 2003-07-25 An optical device for directing x-rays having a plurality of optical crystals

Publications (2)

Publication Number Publication Date
JP2005534921A JP2005534921A (ja) 2005-11-17
JP2005534921A5 true JP2005534921A5 (enExample) 2006-08-31

Family

ID=31495884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004526172A Pending JP2005534921A (ja) 2002-08-02 2003-07-25 Ｘ線を方向付けるための光学デバイス及びその方法

Country Status (7)

Country Link
US (1) US7035374B2 (enExample)
EP (1) EP1527461B1 (enExample)
JP (1) JP2005534921A (enExample)
AT (1) ATE488011T1 (enExample)
AU (1) AU2003256831A1 (enExample)
DE (1) DE60334910D1 (enExample)
WO (1) WO2004013867A2 (enExample)

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JP4121146B2 (ja) * 2005-06-24 2008-07-23 株式会社リガク 双晶解析装置
JP4994375B2 (ja) * 2005-08-01 2012-08-08 ザ リサーチ ファウンデーション オブ ステート ユニバーシティ オブ ニューヨーク 点焦点湾曲モノクロメータ光学体を使用するｘ線結像系
JP5315251B2 (ja) * 2006-11-16 2013-10-16 エックス−レイ オプティカル システムズ インコーポレーテッド それぞれの結晶方位を持つ多層を有するｘ線集束光学系及びこの光学系を形成する方法
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US20090041198A1 (en) * 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
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US8130904B2 (en) * 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8130908B2 (en) * 2009-02-23 2012-03-06 X-Ray Optical Systems, Inc. X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
CN102460135A (zh) * 2009-06-03 2012-05-16 特莫尼托恩分析仪器股份有限公司 检测器位于聚焦元件内部的x射线系统和方法
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US8058621B2 (en) * 2009-10-26 2011-11-15 General Electric Company Elemental composition detection system and method
US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
EP2745101B1 (en) 2011-08-15 2019-11-06 X-Ray Optical Systems, Inc. X-ray analysis apparatus
CN103946693B (zh) 2011-10-06 2017-05-03 X射线光学系统公司 可移除式x‑射线分析仪用的可移动型运输及屏蔽装置
CN107731337B (zh) * 2011-10-26 2019-11-19 X射线光学系统公司 X射线分析引擎和分析仪的支撑结构及高度对准的单色x射线光学器件
EP2820666A4 (en) * 2012-02-28 2016-02-17 X Ray Optical Sys Inc DEVICE FOR ANALYSIS BY X-RAYS WITH MULTIPLE EXTRACTION ENERGY TAPES, PRODUCED BY X-RAY TUBE ANODES MADE OF SEVERAL MATERIALS AND MONOCHROMATIC OPTICS
KR101316794B1 (ko) 2012-06-25 2013-10-11 한국과학기술연구원 극소각 중성자 산란 장치의 중성자 집속 장치
WO2015027225A1 (en) 2013-08-23 2015-02-26 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
WO2016108235A1 (en) * 2014-12-30 2016-07-07 Convergent R.N.R Ltd New constructions of x-ray lenses for converging x-rays
US11250968B2 (en) 2014-12-30 2022-02-15 Convergent R.N.R. Ltd. Constructions of x-ray lenses for converging x-rays
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
US11054375B2 (en) * 2016-09-15 2021-07-06 University Of Washington X-ray spectrometer and methods for use
FR3079035B1 (fr) * 2018-03-14 2022-10-28 Alpyx Dispositif optique pour rayons x
KR102718046B1 (ko) * 2018-07-04 2024-10-17 가부시키가이샤 리가쿠 형광 x선 분석 장치
EP4035186A4 (en) * 2019-09-24 2022-12-07 Convergent R.N.R Ltd X-RAY OPTICAL ARRANGEMENT
US11874239B2 (en) * 2022-03-11 2024-01-16 Uchicago Argonne, Llc Advanced X-ray emission spectrometers
US12247934B2 (en) 2022-07-29 2025-03-11 X-Ray Optical Systems, Inc. Polarized, energy dispersive x-ray fluorescence system and method
CN115791855B (zh) * 2022-11-14 2025-03-18 中国科学院上海光学精密机械研究所 基于弯晶耦合的背光x射线衍射成像装置

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US6625250B2 (en) * 1999-12-20 2003-09-23 Agere Systems Inc. Optical structures and methods for x-ray applications

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