DE60334910D1 - Optische Vorrichtung aus einer Vielzahl von gekrümmten optischen Kristallen zum Fokussieren von Röntgenstrahlen - Google Patents

Optische Vorrichtung aus einer Vielzahl von gekrümmten optischen Kristallen zum Fokussieren von Röntgenstrahlen

Info

Publication number
DE60334910D1
DE60334910D1 DE60334910T DE60334910T DE60334910D1 DE 60334910 D1 DE60334910 D1 DE 60334910D1 DE 60334910 T DE60334910 T DE 60334910T DE 60334910 T DE60334910 T DE 60334910T DE 60334910 D1 DE60334910 D1 DE 60334910D1
Authority
DE
Germany
Prior art keywords
rays
crystals
capture
divergent
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60334910T
Other languages
German (de)
English (en)
Inventor
Zewu Chen
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
X Ray Optical Systems Inc
Original Assignee
X Ray Optical Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by X Ray Optical Systems Inc filed Critical X Ray Optical Systems Inc
Application granted granted Critical
Publication of DE60334910D1 publication Critical patent/DE60334910D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21K—TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOT OTHERWISE PROVIDED FOR; IRRADIATION DEVICES; GAMMA RAY OR X-RAY MICROSCOPES
    • G21K1/00—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating
    • G21K1/06—Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using diffraction, refraction or reflection, e.g. monochromators

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Particle Accelerators (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
DE60334910T 2002-08-02 2003-07-25 Optische Vorrichtung aus einer Vielzahl von gekrümmten optischen Kristallen zum Fokussieren von Röntgenstrahlen Expired - Lifetime DE60334910D1 (de)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US40080902P 2002-08-02 2002-08-02
PCT/US2003/023412 WO2004013867A2 (en) 2002-08-02 2003-07-25 An optical device for directing x-rays having a plurality of optical crystals

Publications (1)

Publication Number Publication Date
DE60334910D1 true DE60334910D1 (de) 2010-12-23

Family

ID=31495884

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60334910T Expired - Lifetime DE60334910D1 (de) 2002-08-02 2003-07-25 Optische Vorrichtung aus einer Vielzahl von gekrümmten optischen Kristallen zum Fokussieren von Röntgenstrahlen

Country Status (7)

Country Link
US (1) US7035374B2 (enExample)
EP (1) EP1527461B1 (enExample)
JP (1) JP2005534921A (enExample)
AT (1) ATE488011T1 (enExample)
AU (1) AU2003256831A1 (enExample)
DE (1) DE60334910D1 (enExample)
WO (1) WO2004013867A2 (enExample)

Families Citing this family (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3729203B2 (ja) * 2003-03-27 2005-12-21 理学電機工業株式会社 蛍光ｘ線分析装置
KR101231731B1 (ko) * 2004-09-21 2013-02-08 조르단 밸리 세미컨덕터즈 리미티드 다기능 ｘ-선 분석 시스템
JP4121146B2 (ja) * 2005-06-24 2008-07-23 株式会社リガク 双晶解析装置
WO2007016484A2 (en) 2005-08-01 2007-02-08 The Research Foundation Of State University Of New York X-ray imaging systems employing point-focusing, curved monochromating optics
US7738629B2 (en) * 2006-11-16 2010-06-15 X-Ray Optical Systems, Inc. X-ray focusing optic having multiple layers with respective crystal orientations
JP2008191547A (ja) * 2007-02-07 2008-08-21 Japan Atomic Energy Agency 多層膜不等間隔溝凹面回折格子及び同分光装置
US20090041198A1 (en) * 2007-08-07 2009-02-12 General Electric Company Highly collimated and temporally variable x-ray beams
JP2010014418A (ja) * 2008-07-01 2010-01-21 Japan Atomic Energy Agency 多層膜回折格子分光装置
JP5344123B2 (ja) * 2008-07-18 2013-11-20 独立行政法人 宇宙航空研究開発機構 Ｘ線反射体、ｘ線反射装置およびｘ線反射鏡作成方法
US8130904B2 (en) * 2009-01-29 2012-03-06 The Invention Science Fund I, Llc Diagnostic delivery service
US8116429B2 (en) * 2009-01-29 2012-02-14 The Invention Science Fund I, Llc Diagnostic delivery service
US8130908B2 (en) * 2009-02-23 2012-03-06 X-Ray Optical Systems, Inc. X-ray diffraction apparatus and technique for measuring grain orientation using x-ray focusing optic
US20100310041A1 (en) * 2009-06-03 2010-12-09 Adams William L X-Ray System and Methods with Detector Interior to Focusing Element
US8537967B2 (en) * 2009-09-10 2013-09-17 University Of Washington Short working distance spectrometer and associated devices, systems, and methods
US8058621B2 (en) * 2009-10-26 2011-11-15 General Electric Company Elemental composition detection system and method
US8243878B2 (en) 2010-01-07 2012-08-14 Jordan Valley Semiconductors Ltd. High-resolution X-ray diffraction measurement with enhanced sensitivity
US8687766B2 (en) 2010-07-13 2014-04-01 Jordan Valley Semiconductors Ltd. Enhancing accuracy of fast high-resolution X-ray diffractometry
US8437450B2 (en) 2010-12-02 2013-05-07 Jordan Valley Semiconductors Ltd. Fast measurement of X-ray diffraction from tilted layers
US8781070B2 (en) 2011-08-11 2014-07-15 Jordan Valley Semiconductors Ltd. Detection of wafer-edge defects
US9057685B2 (en) 2011-08-15 2015-06-16 X-Ray Optical Systems, Inc. Sample viscosity and flow control for heavy samples, and X-ray analysis applications thereof
WO2013052556A2 (en) 2011-10-06 2013-04-11 X-Ray Optical Systems, Inc. Mobile transport and shielding apparatus for removable x-ray analyzer
JP6139543B2 (ja) * 2011-10-26 2017-05-31 エックス−レイ オプティカル システムズ インコーポレーテッド Ｘ線分析エンジンおよび分析器のために高度に位置合わせされた単色化ｘ線光学素子および支持構造体
CN107424889A (zh) * 2012-02-28 2017-12-01 X射线光学系统公司 具有使用多材料x射线管阳极和单色光学装置产生的多激励能带的x射线分析器
KR101316794B1 (ko) 2012-06-25 2013-10-11 한국과학기술연구원 극소각 중성자 산란 장치의 중성자 집속 장치
US9883793B2 (en) 2013-08-23 2018-02-06 The Schepens Eye Research Institute, Inc. Spatial modeling of visual fields
US9726624B2 (en) 2014-06-18 2017-08-08 Bruker Jv Israel Ltd. Using multiple sources/detectors for high-throughput X-ray topography measurement
US11250968B2 (en) 2014-12-30 2022-02-15 Convergent R.N.R. Ltd. Constructions of x-ray lenses for converging x-rays
WO2016108235A1 (en) * 2014-12-30 2016-07-07 Convergent R.N.R Ltd New constructions of x-ray lenses for converging x-rays
JP6069609B2 (ja) * 2015-03-26 2017-02-01 株式会社リガク 二重湾曲ｘ線集光素子およびその構成体、二重湾曲ｘ線分光素子およびその構成体の製造方法
US10677744B1 (en) * 2016-06-03 2020-06-09 U.S. Department Of Energy Multi-cone x-ray imaging Bragg crystal spectrometer
US11054375B2 (en) * 2016-09-15 2021-07-06 University Of Washington X-ray spectrometer and methods for use
FR3079035B1 (fr) * 2018-03-14 2022-10-28 Alpyx Dispositif optique pour rayons x
WO2020008727A1 (ja) * 2018-07-04 2020-01-09 株式会社リガク 蛍光ｘ線分析装置
WO2021059271A1 (en) * 2019-09-24 2021-04-01 Convergent R.N.R Ltd X-ray optical arrangement
US11874239B2 (en) * 2022-03-11 2024-01-16 Uchicago Argonne, Llc Advanced X-ray emission spectrometers
US12247934B2 (en) 2022-07-29 2025-03-11 X-Ray Optical Systems, Inc. Polarized, energy dispersive x-ray fluorescence system and method
CN115791855B (zh) * 2022-11-14 2025-03-18 中国科学院上海光学精密机械研究所 基于弯晶耦合的背光x射线衍射成像装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3927319A (en) * 1974-06-28 1975-12-16 Univ Southern California Crystal for X-ray crystal spectrometer
NL8302263A (nl) * 1983-06-27 1985-01-16 Philips Nv Roentgen analyse apparaat met dubbel gebogen monochromator kristal.
JPH02257100A (ja) * 1989-03-29 1990-10-17 Shimadzu Corp ヨハンソン型湾曲結晶の製作方法
US5127028A (en) * 1990-08-01 1992-06-30 Wittry David B Diffractord with doubly curved surface steps
DE4027285A1 (de) * 1990-08-29 1992-03-05 Zeiss Carl Fa Roentgenmikroskop
US5315113A (en) * 1992-09-29 1994-05-24 The Perkin-Elmer Corporation Scanning and high resolution x-ray photoelectron spectroscopy and imaging
JP2922758B2 (ja) * 1993-08-27 1999-07-26 理学電機工業株式会社 Ｘ線分光器
JPH09166488A (ja) * 1995-12-13 1997-06-24 Shimadzu Corp Ｘ線分光器
US5787146A (en) * 1996-10-18 1998-07-28 Spad Technologies, Inc. X-ray imaging system using diffractive x-ray optics for high definition low dosage three dimensional imaging of soft tissue
EP0884736B1 (en) * 1997-06-11 2004-01-28 Istituto Nazionale Di Fisica Nucleare Multi-stepped diffractor constructed with constant step width angle (multi-stepped monochromator)
US6285506B1 (en) * 1999-01-21 2001-09-04 X-Ray Optical Systems, Inc. Curved optical device and method of fabrication
US6317483B1 (en) * 1999-11-29 2001-11-13 X-Ray Optical Systems, Inc. Doubly curved optical device with graded atomic planes
US6606371B2 (en) * 1999-12-20 2003-08-12 Agere Systems Inc. X-ray system

Also Published As

Publication number Publication date
US7035374B2 (en) 2006-04-25
JP2005534921A (ja) 2005-11-17
US20050201517A1 (en) 2005-09-15
WO2004013867A3 (en) 2004-08-05
AU2003256831A8 (en) 2004-02-23
AU2003256831A1 (en) 2004-02-23
ATE488011T1 (de) 2010-11-15
EP1527461A2 (en) 2005-05-04
WO2004013867A2 (en) 2004-02-12
EP1527461B1 (en) 2010-11-10

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