JP2005524927A - 高速点火フラッシュランプ放電回路 - Google Patents

高速点火フラッシュランプ放電回路 Download PDF

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Publication number
JP2005524927A
JP2005524927A JP2003537379A JP2003537379A JP2005524927A JP 2005524927 A JP2005524927 A JP 2005524927A JP 2003537379 A JP2003537379 A JP 2003537379A JP 2003537379 A JP2003537379 A JP 2003537379A JP 2005524927 A JP2005524927 A JP 2005524927A
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JP
Japan
Prior art keywords
discharge
flash lamp
circuit
reservoir
capacitors
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2003537379A
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English (en)
Japanese (ja)
Other versions
JP2005524927A5 (enExample
Inventor
ラド，エリック，ピー．
ホーガン，カール，イー．
Original Assignee
サイバーオプティクス コーポレーション
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Application filed by サイバーオプティクス コーポレーション filed Critical サイバーオプティクス コーポレーション
Publication of JP2005524927A publication Critical patent/JP2005524927A/ja
Publication of JP2005524927A5 publication Critical patent/JP2005524927A5/ja
Withdrawn legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2518—Projection by scanning of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/30—Measuring arrangements characterised by the use of optical techniques for measuring roughness or irregularity of surfaces
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T1/00—General purpose image data processing
    • G06T1/0007—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
    • H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
    • H03K3/53—Generators characterised by the type of circuit or by the means used for producing pulses by the use of an energy-accumulating element discharged through the load by a switching device controlled by an external signal and not incorporating positive feedback
    • H03K3/57—Generators characterised by the type of circuit or by the means used for producing pulses by the use of an energy-accumulating element discharged through the load by a switching device controlled by an external signal and not incorporating positive feedback the switching device being a semiconductor device
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B41/00—Circuit arrangements or apparatus for igniting or operating discharge lamps
    • H05B41/14—Circuit arrangements
    • H05B41/30—Circuit arrangements in which the lamp is fed by pulses, e.g. flash lamp
    • H05B41/34—Circuit arrangements in which the lamp is fed by pulses, e.g. flash lamp to provide a sequence of flashes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30152—Solder

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Discharge-Lamp Control Circuits And Pulse- Feed Circuits (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Circuit Arrangements For Discharge Lamps (AREA)
  • Stroboscope Apparatuses (AREA)
JP2003537379A 2001-10-12 2002-08-08 高速点火フラッシュランプ放電回路 Withdrawn JP2005524927A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/977,006 US6593705B1 (en) 2000-01-07 2001-10-12 Rapid-firing flashlamp discharge circuit
PCT/US2002/024959 WO2003034796A1 (en) 2001-10-12 2002-08-08 Rapid-firing flashlamp discharge circuit

Publications (2)

Publication Number Publication Date
JP2005524927A true JP2005524927A (ja) 2005-08-18
JP2005524927A5 JP2005524927A5 (enExample) 2006-01-05

Family

ID=25524719

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003537379A Withdrawn JP2005524927A (ja) 2001-10-12 2002-08-08 高速点火フラッシュランプ放電回路

Country Status (5)

Country Link
US (1) US6593705B1 (enExample)
JP (1) JP2005524927A (enExample)
KR (1) KR100881652B1 (enExample)
DE (1) DE10297317T5 (enExample)
WO (1) WO2003034796A1 (enExample)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8059280B2 (en) 2008-01-31 2011-11-15 Cyberoptics Corporation Method for three-dimensional imaging using multi-phase structured light
US8692887B2 (en) * 2010-08-27 2014-04-08 General Electric Company Thermal imaging method and apparatus for evaluating coatings
WO2012079596A1 (de) * 2010-12-14 2012-06-21 Harzim Gmbh Dissoziation und separation von wassermolekülen in einem elektrischen feld
EP4555471A1 (en) * 2022-07-14 2025-05-21 Bloomfield Robotics, Inc. Devices, systems, and methods for monitoring crops and estimating crop yield

Family Cites Families (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2625856A (en) 1949-09-03 1953-01-20 American Optical Corp Telecentric objective
US3678362A (en) 1970-09-17 1972-07-18 Us Army Solid state pulser using parallel storage capacitors
US3648181A (en) 1970-10-22 1972-03-07 Spacetac Inc Pulse generating circuit for producing pulses of amplitude which is a multiple of the amplitude of the source voltage
JPS57702B2 (enExample) 1971-10-15 1982-01-07
US3792309A (en) 1972-08-30 1974-02-12 Multi Electric Mfg Inc Strobe light intensity control
US3930184A (en) 1973-12-20 1975-12-30 Polaroid Corp Electronic flash coupling system for sequential flashbulb firing circuit
US3995107A (en) 1974-05-08 1976-11-30 Rca Corporation Charge coupled parallel-to-serial converter for scene scanning and display
US3953763A (en) 1975-04-23 1976-04-27 General Electric Company Pulsed xenon arc lamp operating circuit
US4007399A (en) 1975-06-05 1977-02-08 W. H. Brady Co. Flashing circuitry
US3973168A (en) 1975-06-16 1976-08-03 Flash Technology Corporation Of America Wiring circuits and method for multiple flash-beacons
FR2407637A1 (fr) 1977-10-27 1979-05-25 Midland Ross Corp Circuit d'alimentation pour une lampe de stroboscope
US4139805A (en) 1977-12-29 1979-02-13 Gte Sylvania Incorporated Multiflash system
US4185232A (en) 1978-08-28 1980-01-22 Gte Sylvania Incorporated Multiple flashlamp operating circuit
US4255046A (en) 1979-09-19 1981-03-10 Xerox Corporation Variable output power supply for flash unit
US4467248A (en) 1980-04-09 1984-08-21 Konishiroku Photo Industry Co., Ltd. Variable electronic flash light equipment
US4477796A (en) 1982-09-29 1984-10-16 Kearsley Wayne A Spatial acquisition flash beacon
JPS606813A (ja) 1983-06-24 1985-01-14 Gokou Eizou Kagaku Kenkyusho:Kk 高速印刷物の監視装置
US4598321A (en) 1983-12-19 1986-07-01 Rca Corporation CCD imagers with registers partitioned for simultaneous charge transfers in opposing directions
US4641972A (en) 1984-09-14 1987-02-10 New York Institute Of Technology Method and apparatus for surface profilometry
US4782394A (en) 1985-06-03 1988-11-01 Canon Kabushiki Kaisha Image pickup apparatus having saturation prevention control modes
JPS61293657A (ja) 1985-06-21 1986-12-24 Matsushita Electric Works Ltd 半田付け外観検査方法
JPS6334897A (ja) 1986-07-29 1988-02-15 東芝ライテック株式会社 キセノンランプ点灯方法
GB2196811B (en) 1986-10-25 1990-05-09 English Electric Valve Co Ltd Image sensors
US4900990A (en) 1987-10-06 1990-02-13 Sikora Scott T Method and apparatus for energizing a gaseous discharge lamp using switched energy storage capacitors
US5091963A (en) 1988-05-02 1992-02-25 The Standard Oil Company Method and apparatus for inspecting surfaces for contrast variations
US4963024A (en) 1988-07-07 1990-10-16 Kaman Aerospace Corporation Method and apparatus for determining K factor
US4949172A (en) 1988-09-26 1990-08-14 Picker International, Inc. Dual-mode TDI/raster-scan television camera system
US5039868A (en) 1988-11-24 1991-08-13 Omron Corporation Method of and apparatus for inspecting printed circuit boards and the like
US5103105A (en) 1989-11-02 1992-04-07 Matsushita Electric Industrial Co., Ltd. Apparatus for inspecting solder portion of a circuit board
US4984893A (en) 1989-12-01 1991-01-15 Wyko Corporation Phase shifting device and method
US5386180A (en) 1990-01-17 1995-01-31 Olympus Optical Co., Ltd. Strobo apparatus
US5140228A (en) 1990-02-23 1992-08-18 Stocker & Yale, Inc. Apparatus for regulating the intensity of light emitted by a lamp
DE4007502A1 (de) 1990-03-09 1991-09-12 Zeiss Carl Fa Verfahren und vorrichtung zur beruehrungslosen vermessung von objektoberflaechen
DE4011407A1 (de) 1990-04-09 1991-10-10 Steinbichler Hans Vorrichtung zur quantitativen absolutvermessung der dreidimensionalen koordinaten eines pruefobjekts
DE4013309A1 (de) 1990-04-26 1991-10-31 Zeiss Carl Fa Verfahren und anordnung zur optischen untersuchung von prueflingen
US5051665A (en) 1990-06-21 1991-09-24 Gte Products Corporation Fast warm-up ballast for arc discharge lamp
US5069548A (en) 1990-08-08 1991-12-03 Industrial Technology Institute Field shift moire system
US5121033A (en) 1990-12-28 1992-06-09 Wheelock Inc. Strobe circuit utilizing optocoupler in DC-to-DC converter
US5278634A (en) 1991-02-22 1994-01-11 Cyberoptics Corporation High precision component alignment sensor system
US5424552A (en) 1991-07-09 1995-06-13 Nikon Corporation Projection exposing apparatus
US5196766A (en) 1991-09-04 1993-03-23 Beggs William C Discharge circuit for flash lamps including a non-reactive current shunt
DE4202836A1 (de) 1992-01-29 1993-08-05 Ekkehard Dr Sc T Stuerzebecher Schaltungsanordnung zur bereitstellung der blitzenergie fuer stroboskope mit grossem blitzfolgefrequenzbereich, insbesondere fuer laryngostroboskope
JPH05236359A (ja) 1992-02-18 1993-09-10 Sony Corp 固体撮像装置
EP0561633B1 (en) 1992-03-18 1998-05-13 Sony Corporation Solid-state imaging apparatus
JP2711042B2 (ja) 1992-03-30 1998-02-10 シャープ株式会社 クリーム半田の印刷状態検査装置
US5636025A (en) 1992-04-23 1997-06-03 Medar, Inc. System for optically measuring the surface contour of a part using more fringe techniques
US5216534A (en) 1992-04-24 1993-06-01 E-Systems, Inc. Read-write head for an optical tape recorder
US5307152A (en) 1992-09-29 1994-04-26 Industrial Technology Institute Moire inspection system
US5461417A (en) 1993-02-16 1995-10-24 Northeast Robotics, Inc. Continuous diffuse illumination method and apparatus
US5347200A (en) 1993-02-26 1994-09-13 Multi Electric Mfg. Inc. Strobe light switching arrangement with reduced transient currents
US5406372A (en) 1993-04-16 1995-04-11 Modular Vision Systems Inc. QFP lead quality inspection system and method
JP3051279B2 (ja) 1993-05-13 2000-06-12 シャープ株式会社 バンプ外観検査方法およびバンプ外観検査装置
JP3189500B2 (ja) 1993-06-25 2001-07-16 松下電器産業株式会社 電子部品の外観検査装置および外観検査方法
DE4342830C1 (de) 1993-12-15 1995-04-20 Haeusler Gerd Vorrichtung zur Erzeugung streifenartiger Lichtmuster
JPH0817587A (ja) * 1994-07-04 1996-01-19 Canon Inc ストロボ装置
DE19511160A1 (de) 1995-03-27 1996-10-02 Ralf Lampalzer Vorrichtung zur Erzeugung von streifenförmigen Intensitätsverteilungen
US5617209A (en) 1995-04-27 1997-04-01 View Engineering, Inc. Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy
EP0747743B1 (de) 1995-06-03 1997-08-27 Jos. Schneider Optische Werke Kreuznach GmbH & Co. KG Beidseitig telezentrisches Messobjektiv
US5668665A (en) 1995-07-10 1997-09-16 Optical Gaging Products, Inc. Telecentric, parfocal, multiple magnification optical system for videoinspection apparatus
US5867604A (en) 1995-08-03 1999-02-02 Ben-Levy; Meir Imaging measurement system
US5646733A (en) 1996-01-29 1997-07-08 Medar, Inc. Scanning phase measuring method and system for an object at a vision station
US5953448A (en) 1996-03-01 1999-09-14 Textile/Clothing Technology Corporation Contour measurement of an object having a discontinuous surface using block point identification techniques
US5774221A (en) 1996-08-21 1998-06-30 Polaroid Corporation Apparatus and methods for providing phase controlled evanescent illumination
JP3995030B2 (ja) 1996-09-17 2007-10-24 コグネックス・テクノロジー・アンド・インベストメント・コーポレーション 半導体パッケージの検査装置
JP4067602B2 (ja) 1996-12-09 2008-03-26 富士通株式会社 高さ検査方法、それを実施する高さ検査装置
US5912984A (en) 1996-12-19 1999-06-15 Cognex Corporation Method and apparatus for in-line solder paste inspection
US5982927A (en) 1996-12-19 1999-11-09 Cognex Corporation Methods and apparatuses for in-line solder paste inspection
US5991461A (en) 1996-12-20 1999-11-23 Veeco Corporation Selection process for sequentially combining multiple sets of overlapping surface-profile interferometric data to produce a continuous composite map
KR100571503B1 (ko) 1997-06-05 2006-04-14 아크로메트릭스 엘엘씨 새도우 므와르 기법과 상 스테핑 영상처리를 사용하는 표면 평탄도 정량화 방법
US6608647B1 (en) 1997-06-24 2003-08-19 Cognex Corporation Methods and apparatus for charge coupled device image acquisition with independent integration and readout
US6219461B1 (en) 1997-07-29 2001-04-17 Cognex Corporation Determining a depth
US6335757B1 (en) 1997-09-02 2002-01-01 Bojko Vodanovic CCD imaging device for high speed profiling
US6573998B2 (en) 1997-11-06 2003-06-03 Cynovad, Inc. Optoelectronic system using spatiochromatic triangulation
US6061476A (en) 1997-11-24 2000-05-09 Cognex Corporation Method and apparatus using image subtraction and dynamic thresholding
JPH11188914A (ja) 1997-12-25 1999-07-13 Hitachi Cable Ltd 発光ダイオードアレイ装置
US6011359A (en) 1998-01-16 2000-01-04 Acushnet Company Multiple flash/single lamp circuit for fast sequential strobing
US6180935B1 (en) 1999-01-25 2001-01-30 Lockheed Martin Corporation Dynamic range extension of CCD imagers
US6084712A (en) 1998-11-03 2000-07-04 Dynamic Measurement And Inspection,Llc Three dimensional imaging using a refractive optic design
CA2277855A1 (fr) 1999-07-14 2001-01-14 Solvision Methode et systeme de mesure de la hauteur des billes de soudure d'un circuit imprime
US6268923B1 (en) 1999-10-07 2001-07-31 Integral Vision, Inc. Optical method and system for measuring three-dimensional surface topography of an object having a surface contour
US6750899B1 (en) 2000-01-07 2004-06-15 Cyberoptics Corporation Solder paste inspection system
CA2296143A1 (fr) 2000-01-18 2001-07-18 9071 9410 Quebec Inc. Systeme d'inspection optique
US6760471B1 (en) 2000-06-23 2004-07-06 Teradyne, Inc. Compensation system and related techniques for use in a printed circuit board inspection system
US6850637B1 (en) 2000-06-28 2005-02-01 Teradyne, Inc. Lighting arrangement for automated optical inspection system

Also Published As

Publication number Publication date
US6593705B1 (en) 2003-07-15
KR100881652B1 (ko) 2009-02-06
KR20050018628A (ko) 2005-02-23
WO2003034796A1 (en) 2003-04-24
DE10297317T5 (de) 2004-12-09

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