JP2005514780A5 - - Google Patents
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- Publication number
- JP2005514780A5 JP2005514780A5 JP2003557747A JP2003557747A JP2005514780A5 JP 2005514780 A5 JP2005514780 A5 JP 2005514780A5 JP 2003557747 A JP2003557747 A JP 2003557747A JP 2003557747 A JP2003557747 A JP 2003557747A JP 2005514780 A5 JP2005514780 A5 JP 2005514780A5
- Authority
- JP
- Japan
- Prior art keywords
- force
- spindle
- load cell
- wafer
- air
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000000034 method Methods 0.000 claims 16
- 210000004712 air sac Anatomy 0.000 claims 11
- 238000005498 polishing Methods 0.000 claims 8
- 238000012544 monitoring process Methods 0.000 claims 5
- 230000003321 amplification Effects 0.000 claims 3
- 238000003199 nucleic acid amplification method Methods 0.000 claims 3
- 238000007599 discharging Methods 0.000 claims 1
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/033,671 US6712670B2 (en) | 2001-12-27 | 2001-12-27 | Method and apparatus for applying downward force on wafer during CMP |
| PCT/US2002/040942 WO2003057404A2 (en) | 2001-12-27 | 2002-12-20 | Method and apparatus for applying downward force on wafer during cmp |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2005514780A JP2005514780A (ja) | 2005-05-19 |
| JP2005514780A5 true JP2005514780A5 (enExample) | 2006-01-05 |
Family
ID=21871758
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003557747A Pending JP2005514780A (ja) | 2001-12-27 | 2002-12-20 | Cmp中にウエハに下降力を印加する方法及び装置 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US6712670B2 (enExample) |
| EP (1) | EP1467839A4 (enExample) |
| JP (1) | JP2005514780A (enExample) |
| KR (1) | KR20040066195A (enExample) |
| CN (1) | CN1607994A (enExample) |
| AU (1) | AU2002358257A1 (enExample) |
| TW (1) | TWI226083B (enExample) |
| WO (1) | WO2003057404A2 (enExample) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2869604B1 (fr) * | 2004-04-28 | 2006-06-23 | Saint Gobain | Activation d'une surface de verre |
| EP1628202A1 (de) * | 2004-08-19 | 2006-02-22 | Ubs Ag | Daten-Ausgabe-System und Daten-Ausgabe-Verfahren mit Daten-Ausgabe-Überwachung |
| KR100796466B1 (ko) * | 2006-08-31 | 2008-01-21 | 인하대학교 산학협력단 | 반도체 웨이퍼 폴리싱 장치의 유동헤드장치 |
| JP5365243B2 (ja) * | 2009-02-19 | 2013-12-11 | 凸版印刷株式会社 | ベルト搬送研磨機 |
| FR2980386B1 (fr) * | 2011-09-27 | 2014-09-12 | Visioptimum Internat | Dispositif de polissage de lentilles optiques |
| JP5973883B2 (ja) * | 2012-11-15 | 2016-08-23 | 株式会社荏原製作所 | 基板保持装置および研磨装置 |
| US9662761B2 (en) * | 2013-12-02 | 2017-05-30 | Ebara Corporation | Polishing apparatus |
| US10350722B2 (en) | 2016-02-05 | 2019-07-16 | Toshiba Kikai Kabushiki Kaisha | Polishing apparatus |
| US10363647B2 (en) | 2016-02-05 | 2019-07-30 | Toshiba Kikai Kabushiki Kaisha | Grinding tool |
| JP7638815B2 (ja) * | 2021-07-21 | 2025-03-04 | 株式会社荏原製作所 | ブレークイン処理装置、およびブレークイン処理方法 |
| CN117381656B (zh) * | 2023-11-27 | 2025-08-26 | 北京晶亦精微科技股份有限公司 | 一种晶圆加载状态检测装置及抛光装置 |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5498199A (en) * | 1992-06-15 | 1996-03-12 | Speedfam Corporation | Wafer polishing method and apparatus |
| US5795215A (en) * | 1995-06-09 | 1998-08-18 | Applied Materials, Inc. | Method and apparatus for using a retaining ring to control the edge effect |
| GB9512262D0 (en) * | 1995-06-16 | 1995-08-16 | Bingham Richard G | Tool for computer-controlled machine for optical polishing and figuring |
| US5653622A (en) * | 1995-07-25 | 1997-08-05 | Vlsi Technology, Inc. | Chemical mechanical polishing system and method for optimization and control of film removal uniformity |
| DE29513946U1 (de) * | 1995-08-30 | 1997-01-09 | Weber, Georg, 96317 Kronach | Vorrichtung zum Andrücken eines umlaufenden Schleifbandes |
| US5762536A (en) * | 1996-04-26 | 1998-06-09 | Lam Research Corporation | Sensors for a linear polisher |
| JPH1071560A (ja) * | 1996-08-27 | 1998-03-17 | Speedfam Co Ltd | ウエハ加圧装置 |
| US5738568A (en) * | 1996-10-04 | 1998-04-14 | International Business Machines Corporation | Flexible tilted wafer carrier |
| JP3763975B2 (ja) * | 1998-07-21 | 2006-04-05 | 株式会社荏原製作所 | トップリング制御装置及びポリッシング装置 |
| US6352466B1 (en) * | 1998-08-31 | 2002-03-05 | Micron Technology, Inc. | Method and apparatus for wireless transfer of chemical-mechanical planarization measurements |
| US6241593B1 (en) * | 1999-07-09 | 2001-06-05 | Applied Materials, Inc. | Carrier head with pressurizable bladder |
| US6439978B1 (en) * | 2000-09-07 | 2002-08-27 | Oliver Design, Inc. | Substrate polishing system using roll-to-roll fixed abrasive |
-
2001
- 2001-12-27 US US10/033,671 patent/US6712670B2/en not_active Expired - Fee Related
-
2002
- 2002-12-20 WO PCT/US2002/040942 patent/WO2003057404A2/en not_active Ceased
- 2002-12-20 KR KR10-2004-7010047A patent/KR20040066195A/ko not_active Abandoned
- 2002-12-20 JP JP2003557747A patent/JP2005514780A/ja active Pending
- 2002-12-20 EP EP02792495A patent/EP1467839A4/en not_active Withdrawn
- 2002-12-20 CN CNA028262301A patent/CN1607994A/zh active Pending
- 2002-12-20 AU AU2002358257A patent/AU2002358257A1/en not_active Abandoned
- 2002-12-25 TW TW091137408A patent/TWI226083B/zh not_active IP Right Cessation
-
2004
- 2004-02-10 US US10/776,477 patent/US20040161939A1/en not_active Abandoned
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