JP2005509890A - 波形を測定するための方法および装置 - Google Patents

波形を測定するための方法および装置 Download PDF

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Publication number
JP2005509890A
JP2005509890A JP2003546119A JP2003546119A JP2005509890A JP 2005509890 A JP2005509890 A JP 2005509890A JP 2003546119 A JP2003546119 A JP 2003546119A JP 2003546119 A JP2003546119 A JP 2003546119A JP 2005509890 A JP2005509890 A JP 2005509890A
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Prior art keywords
waveform
frequency
gated
time point
signal
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Japanese (ja)
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JP2005509890A5 (enExample
Inventor
ジョン・デイビッド・ハマー
ジャン・ブライアン・ウィルストラップ
リ・ペン
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ウェイブクレスト・コーポレイション
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Publication of JP2005509890A publication Critical patent/JP2005509890A/ja
Publication of JP2005509890A5 publication Critical patent/JP2005509890A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J11/00—Measuring the characteristics of individual optical pulses or of optical pulse trains
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G01R23/165—Spectrum analysis; Fourier analysis using filters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Frequencies, Analyzing Spectra (AREA)
JP2003546119A 2001-08-22 2002-08-22 波形を測定するための方法および装置 Pending JP2005509890A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US31410801P 2001-08-22 2001-08-22
PCT/US2002/026996 WO2003044543A2 (en) 2001-08-22 2002-08-22 Method and apparatus for measuring a waveform

Publications (2)

Publication Number Publication Date
JP2005509890A true JP2005509890A (ja) 2005-04-14
JP2005509890A5 JP2005509890A5 (enExample) 2006-01-05

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ID=23218587

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JP2003546119A Pending JP2005509890A (ja) 2001-08-22 2002-08-22 波形を測定するための方法および装置

Country Status (5)

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US (1) US20030058970A1 (enExample)
EP (1) EP1421395A2 (enExample)
JP (1) JP2005509890A (enExample)
AU (1) AU2002329836A1 (enExample)
WO (1) WO2003044543A2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012021332A3 (en) * 2010-08-13 2012-04-12 Altera Corporation Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations

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DE60217649T2 (de) * 2002-05-29 2007-05-24 Agilent Technologies, Inc. - a Delaware Corporation -, Santa Clara Zittermessung in digitale Kommunikationssignale
US7590175B2 (en) 2003-05-20 2009-09-15 Rambus Inc. DFE margin test methods and circuits that decouple sample and feedback timing
US7627029B2 (en) 2003-05-20 2009-12-01 Rambus Inc. Margin test methods and circuits
DE10334963A1 (de) * 2003-07-31 2005-03-03 PARTEMA GmbH Parallele Technologie für Modul-Algorithmen Verfahren und Vorrichtung zur Analyse von Signalen
US7778315B2 (en) * 2004-04-14 2010-08-17 Tektronix, Inc. Measuring instantaneous signal dependent nonlinear distortion in response to varying frequency sinusoidal test signal
US7285946B2 (en) * 2005-02-07 2007-10-23 Lecroy Corporation Pattern trigger in a coherent timebase
US20080072130A1 (en) * 2006-05-31 2008-03-20 Stimple James R Pattern-triggered measurement system
US7881608B2 (en) * 2007-05-10 2011-02-01 Avago Technologies Fiber Ip (Singapore) Pte. Ltd Methods and apparatuses for measuring jitter in a transceiver module
WO2009026435A1 (en) * 2007-08-23 2009-02-26 Amherst Systems Associates, Inc. Waveform anomoly detection and notification systems and methods
CN101889402A (zh) * 2007-12-06 2010-11-17 拉姆伯斯公司 基于沿的信号损失检测
US8504882B2 (en) 2010-09-17 2013-08-06 Altera Corporation Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations
US8577307B1 (en) * 2010-09-21 2013-11-05 Rockwell Collins, Inc. Waveform scheduling on a common antenna
US8866468B2 (en) * 2011-01-27 2014-10-21 Tektronix, Inc. DF/dT trigger system and method
US9519015B2 (en) * 2014-01-29 2016-12-13 Taiwan Semiconductor Manufacturing Company Limited Rise time and fall time measurement
US10036769B2 (en) * 2015-06-12 2018-07-31 The United States Of America As Represented By The Secretary Of The Air Force Apparatus for efficient measurement of tone frequency, amplitude, and phase
CN114204989B (zh) * 2021-12-10 2023-06-16 中国电信股份有限公司 分光器数据的评估方法及装置、存储介质、电子设备
US20230251292A1 (en) * 2022-02-08 2023-08-10 Rohde & Schwarz Gmbh & Co. Kg Data analysis system, measurement device, and method

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012021332A3 (en) * 2010-08-13 2012-04-12 Altera Corporation Circuitry on an integrated circuit for performing or facilitating oscilloscope, jitter, and/or bit-error-rate tester operations

Also Published As

Publication number Publication date
EP1421395A2 (en) 2004-05-26
WO2003044543A3 (en) 2003-11-13
AU2002329836A8 (en) 2003-06-10
AU2002329836A1 (en) 2003-06-10
WO2003044543A2 (en) 2003-05-30
US20030058970A1 (en) 2003-03-27

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