JP2005500539A5 - - Google Patents

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Publication number
JP2005500539A5
JP2005500539A5 JP2003521426A JP2003521426A JP2005500539A5 JP 2005500539 A5 JP2005500539 A5 JP 2005500539A5 JP 2003521426 A JP2003521426 A JP 2003521426A JP 2003521426 A JP2003521426 A JP 2003521426A JP 2005500539 A5 JP2005500539 A5 JP 2005500539A5
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JP
Japan
Prior art keywords
light
optical system
measurement
optical
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2003521426A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005500539A (ja
JP4029406B2 (ja
Filing date
Publication date
Priority claimed from FI20011672A external-priority patent/FI20011672A0/fi
Application filed filed Critical
Publication of JP2005500539A publication Critical patent/JP2005500539A/ja
Publication of JP2005500539A5 publication Critical patent/JP2005500539A5/ja
Application granted granted Critical
Publication of JP4029406B2 publication Critical patent/JP4029406B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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JP2003521426A 2001-08-20 2002-08-20 光学分析器 Expired - Lifetime JP4029406B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
FI20011672A FI20011672A0 (fi) 2001-08-20 2001-08-20 Valon johtaminen
PCT/FI2002/000680 WO2003016979A1 (en) 2001-08-20 2002-08-20 Conduction and correction of a light beam

Publications (3)

Publication Number Publication Date
JP2005500539A JP2005500539A (ja) 2005-01-06
JP2005500539A5 true JP2005500539A5 (enExample) 2005-12-22
JP4029406B2 JP4029406B2 (ja) 2008-01-09

Family

ID=8561762

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003521426A Expired - Lifetime JP4029406B2 (ja) 2001-08-20 2002-08-20 光学分析器

Country Status (5)

Country Link
US (1) US20040218261A1 (enExample)
EP (1) EP1438626A1 (enExample)
JP (1) JP4029406B2 (enExample)
FI (1) FI20011672A0 (enExample)
WO (1) WO2003016979A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI20031294A0 (fi) 2003-09-10 2003-09-10 Thermo Labsystems Oy Fluorometrin kalibrointi
US8253940B1 (en) * 2009-08-24 2012-08-28 J. A. Woollam Co., Inc. UV-IR range variable angle spectroscopic ellipsometer
CN102967365B (zh) * 2012-10-08 2014-12-24 上海交通大学 扩展光谱仪光谱测量范围方法及系统
WO2019204928A1 (en) 2018-04-25 2019-10-31 National Research Council Of Canada High resolution and high throughput spectrometer
DE102018215587A1 (de) * 2018-09-13 2020-03-19 Osram Opto Semiconductors Gmbh Strahlleitende kavitätsstrukur, gassensor und verfahren zum herstellen der derselben

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2688094A (en) * 1952-05-09 1954-08-31 California Inst Res Found Point-focusing X-ray monochromator for low angle x-ray diffraction
US2941078A (en) * 1954-02-16 1960-06-14 Centre Nat Rech Scient Anastigmatic catoptric device
FR2125114B1 (enExample) * 1971-02-11 1973-12-07 Nal Etu Spatia Es Centre
FR2392376A1 (fr) * 1977-05-26 1978-12-22 Acec Sonde optique
DE3020342C2 (de) * 1980-05-29 1985-10-03 Elektro-Optik GmbH & Co KG, 2392 Glücksburg Optisch-mechanische Abtastvorrichtung
DD218791A3 (de) * 1982-06-29 1985-02-13 Akad Wissenschaften Ddr Circulardichroismus (cd)-messgeraet
GB2141554A (en) * 1983-06-15 1984-12-19 Philips Electronic Associated A slit imaging system using two concave mirrors
JPS628730A (ja) * 1985-07-03 1987-01-16 工業技術院長 眼球屈折力測定装置
US4921338A (en) * 1989-05-09 1990-05-01 Macken John A Corrective optics for rectangular laser beams
US5066127A (en) * 1989-08-29 1991-11-19 Hyperfine, Inc. Stigmatic imaging with spherical concave diffraction gratings
US5140459A (en) * 1989-08-29 1992-08-18 Texas Instruments Apparatus and method for optical relay and reimaging
US5018856A (en) * 1989-10-30 1991-05-28 The United States Of America As Represented By The Secretary Of Agriculture Continuum source atomic absorption spectrometry
WO1993016352A1 (en) * 1992-02-05 1993-08-19 Laser Machining, Inc. Reflective collimator
US5436723A (en) * 1993-03-05 1995-07-25 Thermo Jarrell Ash Corporation Spectroscopic analysis
US5506149A (en) * 1995-03-03 1996-04-09 Thermo Jarrell Ash Corporation Spectroanalytical system and method
FI954511A0 (fi) 1995-09-22 1995-09-22 Labsystems Oy Fluorometer
US6022114A (en) * 1998-05-01 2000-02-08 Nikon Corporation Anamorphic afocal beam shaping assembly
CN1357104A (zh) 1999-04-21 2002-07-03 克罗马根公司 用于高通量荧光探测的新型扫描光谱仪

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