FI20011672A0 - Valon johtaminen - Google Patents
Valon johtaminenInfo
- Publication number
- FI20011672A0 FI20011672A0 FI20011672A FI20011672A FI20011672A0 FI 20011672 A0 FI20011672 A0 FI 20011672A0 FI 20011672 A FI20011672 A FI 20011672A FI 20011672 A FI20011672 A FI 20011672A FI 20011672 A0 FI20011672 A0 FI 20011672A0
- Authority
- FI
- Finland
- Prior art keywords
- light management
- management
- light
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4233—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application
- G02B27/4244—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having a diffractive element [DOE] contributing to a non-imaging application in wavelength selecting devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B17/00—Systems with reflecting surfaces, with or without refracting elements
- G02B17/02—Catoptric systems, e.g. image erecting and reversing system
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/42—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect
- G02B27/4272—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path
- G02B27/4277—Diffraction optics, i.e. systems including a diffractive element being designed for providing a diffractive effect having plural diffractive elements positioned sequentially along the optical path being separated by an air space
Landscapes
- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Spectrometry And Color Measurement (AREA)
- Lenses (AREA)
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20011672A FI20011672A0 (fi) | 2001-08-20 | 2001-08-20 | Valon johtaminen |
| EP02753101A EP1438626A1 (en) | 2001-08-20 | 2002-08-20 | Conduction and correction of a light beam |
| US10/486,824 US20040218261A1 (en) | 2001-08-20 | 2002-08-20 | Conduction and correction of a light beam |
| PCT/FI2002/000680 WO2003016979A1 (en) | 2001-08-20 | 2002-08-20 | Conduction and correction of a light beam |
| JP2003521426A JP4029406B2 (ja) | 2001-08-20 | 2002-08-20 | 光学分析器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| FI20011672A FI20011672A0 (fi) | 2001-08-20 | 2001-08-20 | Valon johtaminen |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| FI20011672A0 true FI20011672A0 (fi) | 2001-08-20 |
Family
ID=8561762
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| FI20011672A FI20011672A0 (fi) | 2001-08-20 | 2001-08-20 | Valon johtaminen |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20040218261A1 (enExample) |
| EP (1) | EP1438626A1 (enExample) |
| JP (1) | JP4029406B2 (enExample) |
| FI (1) | FI20011672A0 (enExample) |
| WO (1) | WO2003016979A1 (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FI20031294A0 (fi) | 2003-09-10 | 2003-09-10 | Thermo Labsystems Oy | Fluorometrin kalibrointi |
| US8253940B1 (en) * | 2009-08-24 | 2012-08-28 | J. A. Woollam Co., Inc. | UV-IR range variable angle spectroscopic ellipsometer |
| CN102967365B (zh) * | 2012-10-08 | 2014-12-24 | 上海交通大学 | 扩展光谱仪光谱测量范围方法及系统 |
| WO2019204928A1 (en) | 2018-04-25 | 2019-10-31 | National Research Council Of Canada | High resolution and high throughput spectrometer |
| DE102018215587A1 (de) * | 2018-09-13 | 2020-03-19 | Osram Opto Semiconductors Gmbh | Strahlleitende kavitätsstrukur, gassensor und verfahren zum herstellen der derselben |
Family Cites Families (18)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2688094A (en) * | 1952-05-09 | 1954-08-31 | California Inst Res Found | Point-focusing X-ray monochromator for low angle x-ray diffraction |
| US2941078A (en) * | 1954-02-16 | 1960-06-14 | Centre Nat Rech Scient | Anastigmatic catoptric device |
| FR2125114B1 (enExample) * | 1971-02-11 | 1973-12-07 | Nal Etu Spatia Es Centre | |
| FR2392376A1 (fr) * | 1977-05-26 | 1978-12-22 | Acec | Sonde optique |
| DE3020342C2 (de) * | 1980-05-29 | 1985-10-03 | Elektro-Optik GmbH & Co KG, 2392 Glücksburg | Optisch-mechanische Abtastvorrichtung |
| DD218791A3 (de) * | 1982-06-29 | 1985-02-13 | Akad Wissenschaften Ddr | Circulardichroismus (cd)-messgeraet |
| GB2141554A (en) * | 1983-06-15 | 1984-12-19 | Philips Electronic Associated | A slit imaging system using two concave mirrors |
| JPS628730A (ja) * | 1985-07-03 | 1987-01-16 | 工業技術院長 | 眼球屈折力測定装置 |
| US4921338A (en) * | 1989-05-09 | 1990-05-01 | Macken John A | Corrective optics for rectangular laser beams |
| US5066127A (en) * | 1989-08-29 | 1991-11-19 | Hyperfine, Inc. | Stigmatic imaging with spherical concave diffraction gratings |
| US5140459A (en) * | 1989-08-29 | 1992-08-18 | Texas Instruments | Apparatus and method for optical relay and reimaging |
| US5018856A (en) * | 1989-10-30 | 1991-05-28 | The United States Of America As Represented By The Secretary Of Agriculture | Continuum source atomic absorption spectrometry |
| WO1993016352A1 (en) * | 1992-02-05 | 1993-08-19 | Laser Machining, Inc. | Reflective collimator |
| US5436723A (en) * | 1993-03-05 | 1995-07-25 | Thermo Jarrell Ash Corporation | Spectroscopic analysis |
| US5506149A (en) * | 1995-03-03 | 1996-04-09 | Thermo Jarrell Ash Corporation | Spectroanalytical system and method |
| FI954511A0 (fi) | 1995-09-22 | 1995-09-22 | Labsystems Oy | Fluorometer |
| US6022114A (en) * | 1998-05-01 | 2000-02-08 | Nikon Corporation | Anamorphic afocal beam shaping assembly |
| CN1357104A (zh) | 1999-04-21 | 2002-07-03 | 克罗马根公司 | 用于高通量荧光探测的新型扫描光谱仪 |
-
2001
- 2001-08-20 FI FI20011672A patent/FI20011672A0/fi unknown
-
2002
- 2002-08-20 US US10/486,824 patent/US20040218261A1/en not_active Abandoned
- 2002-08-20 JP JP2003521426A patent/JP4029406B2/ja not_active Expired - Lifetime
- 2002-08-20 EP EP02753101A patent/EP1438626A1/en not_active Ceased
- 2002-08-20 WO PCT/FI2002/000680 patent/WO2003016979A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| EP1438626A1 (en) | 2004-07-21 |
| JP2005500539A (ja) | 2005-01-06 |
| US20040218261A1 (en) | 2004-11-04 |
| WO2003016979A1 (en) | 2003-02-27 |
| JP4029406B2 (ja) | 2008-01-09 |
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