JP2005309415A5 - - Google Patents

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Publication number
JP2005309415A5
JP2005309415A5 JP2005086550A JP2005086550A JP2005309415A5 JP 2005309415 A5 JP2005309415 A5 JP 2005309415A5 JP 2005086550 A JP2005086550 A JP 2005086550A JP 2005086550 A JP2005086550 A JP 2005086550A JP 2005309415 A5 JP2005309415 A5 JP 2005309415A5
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JP
Japan
Prior art keywords
light
light beam
specimen
optical microscope
light source
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JP2005086550A
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English (en)
Japanese (ja)
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JP4819383B2 (ja
JP2005309415A (ja
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Priority to JP2005086550A priority Critical patent/JP4819383B2/ja
Priority claimed from JP2005086550A external-priority patent/JP4819383B2/ja
Publication of JP2005309415A publication Critical patent/JP2005309415A/ja
Publication of JP2005309415A5 publication Critical patent/JP2005309415A5/ja
Application granted granted Critical
Publication of JP4819383B2 publication Critical patent/JP4819383B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005086550A 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法 Expired - Fee Related JP4819383B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2005086550A JP4819383B2 (ja) 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2004093340 2004-03-26
JP2004093340 2004-03-26
JP2005086550A JP4819383B2 (ja) 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法

Publications (3)

Publication Number Publication Date
JP2005309415A JP2005309415A (ja) 2005-11-04
JP2005309415A5 true JP2005309415A5 (cg-RX-API-DMAC7.html) 2008-04-24
JP4819383B2 JP4819383B2 (ja) 2011-11-24

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ID=35438212

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005086550A Expired - Fee Related JP4819383B2 (ja) 2004-03-26 2005-03-24 光学顕微鏡と光学的観察方法

Country Status (1)

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JP (1) JP4819383B2 (cg-RX-API-DMAC7.html)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3992064B2 (ja) 2006-01-20 2007-10-17 住友電気工業株式会社 光学分析装置
JP5047669B2 (ja) * 2007-04-04 2012-10-10 オリンパス株式会社 走査型共焦点顕微鏡装置
EP2058643B1 (en) 2007-11-07 2018-12-26 Mitutoyo Corporation Noncontact measurement probe
JP5638793B2 (ja) * 2009-12-03 2014-12-10 オリンパス株式会社 顕微鏡装置
WO2015085316A1 (en) * 2013-12-07 2015-06-11 Bruker Nano, Inc. Force measurement with real-time baseline determination
CN110095464B (zh) * 2019-04-12 2022-01-28 武汉科技大学 一种复杂组成的烧结矿矿相精细化定量分析方法
CN111826422B (zh) * 2019-04-22 2024-03-26 康岭有限公司 检测荧光偏振的光学系统以及偏振度测量单元
KR102252427B1 (ko) * 2019-12-26 2021-05-14 조선대학교산학협력단 3d 형상 측정을 위한 편광 패턴 조사 현미경

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61260211A (ja) * 1985-05-15 1986-11-18 Hitachi Ltd 自動異物検出方法及びその装置
JPH0391709A (ja) * 1989-09-05 1991-04-17 Nikon Corp 走査型微分干渉顕微鏡
JPH0720382A (ja) * 1993-06-30 1995-01-24 Nikon Corp レ−ザ走査型顕微鏡
JP4673955B2 (ja) * 2000-03-24 2011-04-20 オリンパス株式会社 光学装置
DE20122782U1 (de) * 2000-06-17 2007-11-15 Leica Microsystems Cms Gmbh Beleuchtungseinrichtung
JP2002350117A (ja) * 2001-05-29 2002-12-04 Olympus Optical Co Ltd 形状計測装置及び形状計測方法
JP3581840B2 (ja) * 2001-07-13 2004-10-27 有限会社トッケン 顕微鏡観察用培養装置

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