JP2005283585A5 - - Google Patents

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Publication number
JP2005283585A5
JP2005283585A5 JP2005093388A JP2005093388A JP2005283585A5 JP 2005283585 A5 JP2005283585 A5 JP 2005283585A5 JP 2005093388 A JP2005093388 A JP 2005093388A JP 2005093388 A JP2005093388 A JP 2005093388A JP 2005283585 A5 JP2005283585 A5 JP 2005283585A5
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JP
Japan
Prior art keywords
light
polarization
splitter
intensity
output
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Application number
JP2005093388A
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English (en)
Japanese (ja)
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JP5113987B2 (ja
JP2005283585A (ja
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Priority claimed from US10/812,164 external-priority patent/US7206069B2/en
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Publication of JP2005283585A publication Critical patent/JP2005283585A/ja
Publication of JP2005283585A5 publication Critical patent/JP2005283585A5/ja
Application granted granted Critical
Publication of JP5113987B2 publication Critical patent/JP5113987B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2005093388A 2004-03-29 2005-03-29 偏光特性の光分析装置 Expired - Fee Related JP5113987B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/812164 2004-03-29
US10/812,164 US7206069B2 (en) 2004-03-29 2004-03-29 Optical analyzers of polarization properties

Publications (3)

Publication Number Publication Date
JP2005283585A JP2005283585A (ja) 2005-10-13
JP2005283585A5 true JP2005283585A5 (enExample) 2008-04-17
JP5113987B2 JP5113987B2 (ja) 2013-01-09

Family

ID=34989434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2005093388A Expired - Fee Related JP5113987B2 (ja) 2004-03-29 2005-03-29 偏光特性の光分析装置

Country Status (4)

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US (2) US7206069B2 (enExample)
JP (1) JP5113987B2 (enExample)
CN (1) CN1677164B (enExample)
CA (1) CA2497372A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102681096A (zh) * 2011-03-17 2012-09-19 昂纳信息技术（深圳）有限公司 一种偏振光干涉型的梳状滤波器
CN102353325B (zh) * 2011-07-22 2013-08-14 中国科学院上海光学精密机械研究所 四轴4细分干涉仪
KR20130072535A (ko) * 2011-12-22 2013-07-02 삼성전기주식회사 비파괴적 결함검사장치 및 이를 이용한 결함검사방법
US9749057B2 (en) * 2012-12-28 2017-08-29 Juniper Networks, Inc. Detection and alignment of XY skew
US20180045889A1 (en) * 2015-02-17 2018-02-15 President And Fellows Of Harvard College Method and system for polarization state generation
US9998232B2 (en) 2016-09-13 2018-06-12 Juniper Networks, Inc. Detection and compensation of power imbalances for a transmitter
CN106500844B (zh) * 2016-10-19 2017-12-15 武汉颐光科技有限公司 一种六通道分振幅高速斯托克斯偏振仪及其参数测量方法
KR102812104B1 (ko) * 2019-06-11 2025-05-23 유니버시티 라발 입사 광선의 편광 상태를 결정하는 편광계 및 방법

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4306809A (en) * 1979-03-26 1981-12-22 The Board Of Regents Of The University Of Nebraska Polarimeter
US4418981A (en) * 1982-01-19 1983-12-06 Gould Inc. Quadrature fiber-optic interferometer matrix
JPH0663867B2 (ja) * 1985-05-28 1994-08-22 キヤノン株式会社 波面状態検出用の干渉装置
US4681450A (en) * 1985-06-21 1987-07-21 Research Corporation Photodetector arrangement for measuring the state of polarization of light
JP3109900B2 (ja) * 1992-04-21 2000-11-20 キヤノン株式会社 測定装置
US5282188A (en) * 1992-02-18 1994-01-25 Eastman Kodak Company Apparatus and method for optimizing performance in read/write head of an optical storage system with a magneto-optical storage medium
US5337146A (en) * 1992-03-30 1994-08-09 University Of New Orleans Diffraction-grating photopolarimeters and spectrophotopolarimeters
JPH0618332A (ja) * 1992-07-01 1994-01-25 Kokusai Denshin Denwa Co Ltd <Kdd> ストークス・パラメータ測定方法及び装置
JP3103954B2 (ja) * 1992-07-13 2000-10-30 株式会社応用光電研究室 偏光解析器
JP3292314B2 (ja) * 1992-09-11 2002-06-17 キヤノン株式会社 光学的検出装置
JP3382644B2 (ja) * 1992-09-17 2003-03-04 アンリツ株式会社 直交偏光ヘテロダイン干渉計
US5719702A (en) * 1993-08-03 1998-02-17 The United States Of America As Represented By The United States Department Of Energy Polarization-balanced beamsplitter
US5663793A (en) * 1995-09-05 1997-09-02 Zygo Corporation Homodyne interferometric receiver and calibration method having improved accuracy and functionality
US5999261A (en) * 1998-02-10 1999-12-07 Seagate Technology, Inc. Split phase high performance, high frequency, high dynamic range interferometer
US6373614B1 (en) * 2000-08-31 2002-04-16 Cambridge Research Instrumentation Inc. High performance polarization controller and polarization sensor
US6687008B1 (en) * 2000-10-19 2004-02-03 Kla-Tencor Corporation Waveguide based parallel multi-phaseshift interferometry for high speed metrology, optical inspection, and non-contact sensing
JP3689681B2 (ja) * 2002-05-10 2005-08-31 キヤノン株式会社 測定装置及びそれを有する装置群
NL1021600C2 (nl) * 2002-10-08 2004-04-13 Tno Meten van een optisch weglengteverschil.
JP4072717B2 (ja) * 2002-11-12 2008-04-09 日本電気株式会社 光記録媒体および光学式情報記録再生装置
US7483145B2 (en) * 2002-11-27 2009-01-27 Trology, Llc Simultaneous phase shifting module for use in interferometry

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