CN1677164B - 偏振性质的光分析器 - Google Patents

偏振性质的光分析器 Download PDF

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Publication number
CN1677164B
CN1677164B CN2005100627428A CN200510062742A CN1677164B CN 1677164 B CN1677164 B CN 1677164B CN 2005100627428 A CN2005100627428 A CN 2005100627428A CN 200510062742 A CN200510062742 A CN 200510062742A CN 1677164 B CN1677164 B CN 1677164B
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CN
China
Prior art keywords
light
intensity
polarization
polarizing beam
beam splitter
Prior art date
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Expired - Fee Related
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CN2005100627428A
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English (en)
Chinese (zh)
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CN1677164A (zh
Inventor
克利斯托弗尔·A·弗奇
迈克尔·瓦瑟尔耶夫
博尔纳德·尤克
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Nokia of America Corp
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Lucent Technologies Inc
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Publication date
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Publication of CN1677164A publication Critical patent/CN1677164A/zh
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J4/00—Measuring polarisation of light
    • G01J4/04—Polarimeters using electric detection means
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/28—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00 for polarising
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/30—Polarising elements
    • G02B5/3025—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state
    • G02B5/3066—Polarisers, i.e. arrangements capable of producing a definite output polarisation state from an unpolarised input state involving the reflection of light at a particular angle of incidence, e.g. Brewster's angle

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Optical Communication System (AREA)
CN2005100627428A 2004-03-29 2005-03-28 偏振性质的光分析器 Expired - Fee Related CN1677164B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US10/812,164 US7206069B2 (en) 2004-03-29 2004-03-29 Optical analyzers of polarization properties
US10/812,164 2004-03-29

Publications (2)

Publication Number Publication Date
CN1677164A CN1677164A (zh) 2005-10-05
CN1677164B true CN1677164B (zh) 2010-04-28

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Family Applications (1)

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CN2005100627428A Expired - Fee Related CN1677164B (zh) 2004-03-29 2005-03-28 偏振性质的光分析器

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US (2) US7206069B2 (enExample)
JP (1) JP5113987B2 (enExample)
CN (1) CN1677164B (enExample)
CA (1) CA2497372A1 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102681096A (zh) * 2011-03-17 2012-09-19 昂纳信息技术（深圳）有限公司 一种偏振光干涉型的梳状滤波器
CN102353325B (zh) * 2011-07-22 2013-08-14 中国科学院上海光学精密机械研究所 四轴4细分干涉仪
KR20130072535A (ko) * 2011-12-22 2013-07-02 삼성전기주식회사 비파괴적 결함검사장치 및 이를 이용한 결함검사방법
US9749057B2 (en) * 2012-12-28 2017-08-29 Juniper Networks, Inc. Detection and alignment of XY skew
US20180045889A1 (en) * 2015-02-17 2018-02-15 President And Fellows Of Harvard College Method and system for polarization state generation
US9998232B2 (en) 2016-09-13 2018-06-12 Juniper Networks, Inc. Detection and compensation of power imbalances for a transmitter
CN106500844B (zh) * 2016-10-19 2017-12-15 武汉颐光科技有限公司 一种六通道分振幅高速斯托克斯偏振仪及其参数测量方法
KR102812104B1 (ko) * 2019-06-11 2025-05-23 유니버시티 라발 입사 광선의 편광 상태를 결정하는 편광계 및 방법

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4681450A (en) * 1985-06-21 1987-07-21 Research Corporation Photodetector arrangement for measuring the state of polarization of light
US4798468A (en) * 1985-05-28 1989-01-17 Canon Kabushiki Kaisha Interference apparatus for detecting state of wave surface
US5282188A (en) * 1992-02-18 1994-01-25 Eastman Kodak Company Apparatus and method for optimizing performance in read/write head of an optical storage system with a magneto-optical storage medium
US5337146A (en) * 1992-03-30 1994-08-09 University Of New Orleans Diffraction-grating photopolarimeters and spectrophotopolarimeters
US5663793A (en) * 1995-09-05 1997-09-02 Zygo Corporation Homodyne interferometric receiver and calibration method having improved accuracy and functionality
US5719702A (en) * 1993-08-03 1998-02-17 The United States Of America As Represented By The United States Department Of Energy Polarization-balanced beamsplitter
US6373614B1 (en) * 2000-08-31 2002-04-16 Cambridge Research Instrumentation Inc. High performance polarization controller and polarization sensor

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Publication number Priority date Publication date Assignee Title
US4306809A (en) * 1979-03-26 1981-12-22 The Board Of Regents Of The University Of Nebraska Polarimeter
US4418981A (en) * 1982-01-19 1983-12-06 Gould Inc. Quadrature fiber-optic interferometer matrix
JP3109900B2 (ja) * 1992-04-21 2000-11-20 キヤノン株式会社 測定装置
JPH0618332A (ja) * 1992-07-01 1994-01-25 Kokusai Denshin Denwa Co Ltd <Kdd> ストークス・パラメータ測定方法及び装置
JP3103954B2 (ja) * 1992-07-13 2000-10-30 株式会社応用光電研究室 偏光解析器
JP3292314B2 (ja) * 1992-09-11 2002-06-17 キヤノン株式会社 光学的検出装置
JP3382644B2 (ja) * 1992-09-17 2003-03-04 アンリツ株式会社 直交偏光ヘテロダイン干渉計
US5999261A (en) * 1998-02-10 1999-12-07 Seagate Technology, Inc. Split phase high performance, high frequency, high dynamic range interferometer
US6687008B1 (en) * 2000-10-19 2004-02-03 Kla-Tencor Corporation Waveguide based parallel multi-phaseshift interferometry for high speed metrology, optical inspection, and non-contact sensing
JP3689681B2 (ja) * 2002-05-10 2005-08-31 キヤノン株式会社 測定装置及びそれを有する装置群
NL1021600C2 (nl) * 2002-10-08 2004-04-13 Tno Meten van een optisch weglengteverschil.
JP4072717B2 (ja) * 2002-11-12 2008-04-09 日本電気株式会社 光記録媒体および光学式情報記録再生装置
US7483145B2 (en) * 2002-11-27 2009-01-27 Trology, Llc Simultaneous phase shifting module for use in interferometry

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4798468A (en) * 1985-05-28 1989-01-17 Canon Kabushiki Kaisha Interference apparatus for detecting state of wave surface
US4681450A (en) * 1985-06-21 1987-07-21 Research Corporation Photodetector arrangement for measuring the state of polarization of light
US5282188A (en) * 1992-02-18 1994-01-25 Eastman Kodak Company Apparatus and method for optimizing performance in read/write head of an optical storage system with a magneto-optical storage medium
US5337146A (en) * 1992-03-30 1994-08-09 University Of New Orleans Diffraction-grating photopolarimeters and spectrophotopolarimeters
US5719702A (en) * 1993-08-03 1998-02-17 The United States Of America As Represented By The United States Department Of Energy Polarization-balanced beamsplitter
US5663793A (en) * 1995-09-05 1997-09-02 Zygo Corporation Homodyne interferometric receiver and calibration method having improved accuracy and functionality
US6373614B1 (en) * 2000-08-31 2002-04-16 Cambridge Research Instrumentation Inc. High performance polarization controller and polarization sensor

Also Published As

Publication number Publication date
US7206069B2 (en) 2007-04-17
US20050213104A1 (en) 2005-09-29
US20070133005A1 (en) 2007-06-14
CA2497372A1 (en) 2005-09-29
JP5113987B2 (ja) 2013-01-09
US7463361B2 (en) 2008-12-09
JP2005283585A (ja) 2005-10-13
CN1677164A (zh) 2005-10-05

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