JP2005274145A - 測定方法、モジュールおよびシステム - Google Patents

測定方法、モジュールおよびシステム Download PDF

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Publication number
JP2005274145A
JP2005274145A JP2004083340A JP2004083340A JP2005274145A JP 2005274145 A JP2005274145 A JP 2005274145A JP 2004083340 A JP2004083340 A JP 2004083340A JP 2004083340 A JP2004083340 A JP 2004083340A JP 2005274145 A JP2005274145 A JP 2005274145A
Authority
JP
Japan
Prior art keywords
measurement
data
module
output
digital data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2004083340A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005274145A5 (cg-RX-API-DMAC7.html
Inventor
Takuya Otani
卓也 大谷
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Priority to JP2004083340A priority Critical patent/JP2005274145A/ja
Priority to TW093137459A priority patent/TW200534189A/zh
Priority to CNA2004101025248A priority patent/CN1674053A/zh
Priority to US11/076,734 priority patent/US7430488B2/en
Priority to KR1020050023284A priority patent/KR20060044487A/ko
Publication of JP2005274145A publication Critical patent/JP2005274145A/ja
Publication of JP2005274145A5 publication Critical patent/JP2005274145A5/ja
Pending legal-status Critical Current

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Classifications

    • EFIXED CONSTRUCTIONS
    • E05LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05DHINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00Hinges or pivots of special construction
    • E05D7/04Hinges adjustable relative to the wing or the frame
    • E05D7/0415Hinges adjustable relative to the wing or the frame with adjusting drive means
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317Testing of digital circuits
    • G01R31/3181Functional testing
    • G01R31/319Tester hardware, i.e. output processing circuits
    • G01R31/31903Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • EFIXED CONSTRUCTIONS
    • E05LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05DHINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D3/00Hinges with pins
    • E05D3/02Hinges with pins with one pin
    • EFIXED CONSTRUCTIONS
    • E05LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05DHINGES OR SUSPENSION DEVICES FOR DOORS, WINDOWS OR WINGS
    • E05D7/00Hinges or pivots of special construction
    • E05D7/08Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions
    • E05D7/081Hinges or pivots of special construction for use in suspensions comprising two spigots placed at opposite edges of the wing, especially at the top and the bottom, e.g. trunnions the pivot axis of the wing being situated near one edge of the wing, especially at the top and bottom, e.g. trunnions
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2834Automated test systems [ATE]; using microprocessors or computers
    • EFIXED CONSTRUCTIONS
    • E05LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05YINDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2600/00Mounting or coupling arrangements for elements provided for in this subclass
    • E05Y2600/60Mounting or coupling members; Accessories therefor
    • E05Y2600/626Plates or brackets
    • EFIXED CONSTRUCTIONS
    • E05LOCKS; KEYS; WINDOW OR DOOR FITTINGS; SAFES
    • E05YINDEXING SCHEME ASSOCIATED WITH SUBCLASSES E05D AND E05F, RELATING TO CONSTRUCTION ELEMENTS, ELECTRIC CONTROL, POWER SUPPLY, POWER SIGNAL OR TRANSMISSION, USER INTERFACES, MOUNTING OR COUPLING, DETAILS, ACCESSORIES, AUXILIARY OPERATIONS NOT OTHERWISE PROVIDED FOR, APPLICATION THEREOF
    • E05Y2900/00Application of doors, windows, wings or fittings thereof
    • E05Y2900/10Application of doors, windows, wings or fittings thereof for buildings or parts thereof
    • E05Y2900/13Type of wing
    • E05Y2900/132Doors
    • E05Y2900/134Fire doors

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mechanical Engineering (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Analogue/Digital Conversion (AREA)
JP2004083340A 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム Pending JP2005274145A (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP2004083340A JP2005274145A (ja) 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム
TW093137459A TW200534189A (en) 2004-03-22 2004-12-03 Method for controlling a measuring apparatus
CNA2004101025248A CN1674053A (zh) 2004-03-22 2004-12-24 测定方法、模块及系统
US11/076,734 US7430488B2 (en) 2004-03-22 2005-03-10 Method for controlling a measuring apparatus
KR1020050023284A KR20060044487A (ko) 2004-03-22 2005-03-21 측정 방법, 모듈 및 시스템

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004083340A JP2005274145A (ja) 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム

Publications (2)

Publication Number Publication Date
JP2005274145A true JP2005274145A (ja) 2005-10-06
JP2005274145A5 JP2005274145A5 (cg-RX-API-DMAC7.html) 2007-04-26

Family

ID=34987434

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004083340A Pending JP2005274145A (ja) 2004-03-22 2004-03-22 測定方法、モジュールおよびシステム

Country Status (5)

Country Link
US (1) US7430488B2 (cg-RX-API-DMAC7.html)
JP (1) JP2005274145A (cg-RX-API-DMAC7.html)
KR (1) KR20060044487A (cg-RX-API-DMAC7.html)
CN (1) CN1674053A (cg-RX-API-DMAC7.html)
TW (1) TW200534189A (cg-RX-API-DMAC7.html)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7847715B2 (en) * 2008-08-04 2010-12-07 Honeywell International Inc. Segmented optics circuit drive for closed loop fiber optic sensors

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105073A (ja) * 1990-08-24 1992-04-07 Yokogawa Electric Corp 実効値測定装置
JPH0572292A (ja) * 1991-09-12 1993-03-23 Toshiba Corp アナログ入力装置
JPH0854262A (ja) * 1994-08-11 1996-02-27 Honda Motor Co Ltd 異種信号同時測定装置

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH01196518A (ja) * 1988-01-30 1989-08-08 Dainippon Printing Co Ltd センサカード
JP3489488B2 (ja) * 1999-06-07 2004-01-19 ティアック株式会社 データレコード装置及びモジュール装置
WO2001013347A1 (en) * 1999-08-17 2001-02-22 Advantest Corporation Measuring instrument control adapter, measuring instrument, measuring instrument controller, measurement execution method, and recorded medium
US6621763B2 (en) * 2001-07-23 2003-09-16 Siemens Milltronics Process Instruments Inc. Power saving technique for pulse-echo acoustic ranging systems

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105073A (ja) * 1990-08-24 1992-04-07 Yokogawa Electric Corp 実効値測定装置
JPH0572292A (ja) * 1991-09-12 1993-03-23 Toshiba Corp アナログ入力装置
JPH0854262A (ja) * 1994-08-11 1996-02-27 Honda Motor Co Ltd 異種信号同時測定装置

Also Published As

Publication number Publication date
US20050209809A1 (en) 2005-09-22
KR20060044487A (ko) 2006-05-16
CN1674053A (zh) 2005-09-28
TW200534189A (en) 2005-10-16
US7430488B2 (en) 2008-09-30

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