JP2005223890A5 - - Google Patents
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- JP2005223890A5 JP2005223890A5 JP2004354175A JP2004354175A JP2005223890A5 JP 2005223890 A5 JP2005223890 A5 JP 2005223890A5 JP 2004354175 A JP2004354175 A JP 2004354175A JP 2004354175 A JP2004354175 A JP 2004354175A JP 2005223890 A5 JP2005223890 A5 JP 2005223890A5
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- JP
- Japan
- Prior art keywords
- data lines
- detector
- line
- pixels
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 238000001514 detection method Methods 0.000 claims 1
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/707,348 US7119341B2 (en) | 2003-12-08 | 2003-12-08 | Split scan line and combined data line x-ray detectors |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005223890A JP2005223890A (ja) | 2005-08-18 |
| JP2005223890A5 true JP2005223890A5 (enExample) | 2009-12-24 |
| JP4558468B2 JP4558468B2 (ja) | 2010-10-06 |
Family
ID=34590838
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004354175A Expired - Fee Related JP4558468B2 (ja) | 2003-12-08 | 2004-12-07 | 分割走査線及び結合データ線のx線検出器 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7119341B2 (enExample) |
| JP (1) | JP4558468B2 (enExample) |
| DE (1) | DE102004059247A1 (enExample) |
| FR (1) | FR2863435B1 (enExample) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7132667B2 (en) * | 2004-02-11 | 2006-11-07 | General Electric Company | Method and apparatus for improved data acquisition using a solid state digital X-ray detector |
| GB2425229B (en) * | 2005-04-14 | 2008-04-09 | Micron Technology Inc | Generation and storage of column offsets for a column parallel image sensor |
| WO2006114722A1 (en) * | 2005-04-27 | 2006-11-02 | Koninklijke Philips Electronics N.V. | Digital flat x-ray detector |
| JP4891096B2 (ja) * | 2006-01-30 | 2012-03-07 | キヤノン株式会社 | 放射線撮像装置 |
| JP4808557B2 (ja) * | 2006-07-04 | 2011-11-02 | 浜松ホトニクス株式会社 | 固体撮像装置 |
| JP4986771B2 (ja) * | 2006-08-31 | 2012-07-25 | キヤノン株式会社 | 撮像装置、その駆動方法及び放射線撮像システム |
| JP2008098391A (ja) * | 2006-10-12 | 2008-04-24 | Fujifilm Corp | 放射線画像検出器 |
| JP2008098390A (ja) * | 2006-10-12 | 2008-04-24 | Fujifilm Corp | 放射線画像検出器およびその駆動方法 |
| US7601962B2 (en) * | 2007-01-12 | 2009-10-13 | General Electric Company | Systems and methods for reading data |
| JP4949964B2 (ja) * | 2007-08-10 | 2012-06-13 | 富士フイルム株式会社 | 放射線画像検出器 |
| JP4991459B2 (ja) * | 2007-09-07 | 2012-08-01 | キヤノン株式会社 | 撮像装置及び放射線撮像システム |
| US20100264324A1 (en) * | 2007-11-19 | 2010-10-21 | Koninklijke Philips Electronics N.V. | radiation detector comprising an imaging radiation-collimating structure |
| JP5096946B2 (ja) | 2008-01-30 | 2012-12-12 | 浜松ホトニクス株式会社 | 固体撮像装置 |
| GB2457716A (en) * | 2008-02-22 | 2009-08-26 | Cmosis Nv | Active pixel sensor (APS) array with selective passive pixel (charge binning) mode |
| US7495228B1 (en) | 2008-03-31 | 2009-02-24 | General Electric Company | Dual function detector device |
| US8217358B2 (en) * | 2009-12-14 | 2012-07-10 | General Electric Company | System and method of eliminating image artifacts |
| KR101117736B1 (ko) * | 2010-02-05 | 2012-02-27 | 삼성모바일디스플레이주식회사 | 디스플레이 장치 |
| JP5625833B2 (ja) * | 2010-12-02 | 2014-11-19 | 株式会社島津製作所 | 放射線検出器および放射線撮影装置 |
| JP5730030B2 (ja) * | 2011-01-17 | 2015-06-03 | 浜松ホトニクス株式会社 | 固体撮像装置 |
| WO2017144474A1 (en) | 2016-02-23 | 2017-08-31 | Koninklijke Philips N.V. | Driving of an x-ray detector to compensate for cross scatter in an x-ray imaging apparatus |
| JP7067912B2 (ja) * | 2017-12-13 | 2022-05-16 | キヤノン株式会社 | 放射線撮像装置および放射線撮像システム |
| KR102755024B1 (ko) * | 2022-10-19 | 2025-01-21 | 주식회사 레이언스 | 엑스선 디텍터 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4996413A (en) * | 1990-02-27 | 1991-02-26 | General Electric Company | Apparatus and method for reading data from an image detector |
| JP2653550B2 (ja) * | 1990-11-14 | 1997-09-17 | 三菱電機株式会社 | 固体撮像素子 |
| JP3897389B2 (ja) | 1996-02-22 | 2007-03-22 | キヤノン株式会社 | 光電変換装置の駆動方法及び光電変換装置 |
| JP3697827B2 (ja) * | 1997-03-31 | 2005-09-21 | 株式会社島津製作所 | フラット・パネル形センサ |
| GB2323958A (en) * | 1997-04-04 | 1998-10-07 | Sharp Kk | Active matrix devices |
| US6426672B1 (en) * | 1997-08-28 | 2002-07-30 | General Electric Company | Means of selecting low noise performance or low power dissipation in the analog front end of a custom integrated circuit |
| JP2001024209A (ja) * | 1999-07-07 | 2001-01-26 | Toshiba Corp | 放射線撮像装置 |
| US6437338B1 (en) | 1999-09-29 | 2002-08-20 | General Electric Company | Method and apparatus for scanning a detector array in an x-ray imaging system |
| JP2001251557A (ja) * | 1999-12-27 | 2001-09-14 | Canon Inc | エリアセンサ、該エリアセンサを有する画像入力装置および該エリアセンサの駆動方法 |
| JP4389347B2 (ja) * | 2000-05-15 | 2009-12-24 | ソニー株式会社 | 演算機能付き撮像素子 |
| US6535576B2 (en) * | 2000-12-29 | 2003-03-18 | Ge Medical Systems Global Technology Company, Llc | Enhanced digital detector and system and method incorporating same |
| US6404852B1 (en) * | 2001-03-15 | 2002-06-11 | Ge Medical Systems Global Technology Company | Overhead reduction due to scrubbing or partial readout of x-ray detectors |
| US6895077B2 (en) * | 2001-11-21 | 2005-05-17 | University Of Massachusetts Medical Center | System and method for x-ray fluoroscopic imaging |
-
2003
- 2003-12-08 US US10/707,348 patent/US7119341B2/en not_active Expired - Lifetime
-
2004
- 2004-12-07 FR FR0413018A patent/FR2863435B1/fr not_active Expired - Fee Related
- 2004-12-07 JP JP2004354175A patent/JP4558468B2/ja not_active Expired - Fee Related
- 2004-12-08 DE DE102004059247A patent/DE102004059247A1/de not_active Withdrawn
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