JP2005127810A - ３次元座標測定方法及び装置 - Google Patents
３次元座標測定方法及び装置 Download PDFInfo
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- JP2005127810A JP2005127810A JP2003362473A JP2003362473A JP2005127810A JP 2005127810 A JP2005127810 A JP 2005127810A JP 2003362473 A JP2003362473 A JP 2003362473A JP 2003362473 A JP2003362473 A JP 2003362473A JP 2005127810 A JP2005127810 A JP 2005127810A
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- 238000000034 method Methods 0.000 title claims description 25
- 238000005259 measurement Methods 0.000 claims abstract description 79
- 239000000523 sample Substances 0.000 claims abstract description 45
- 230000007246 mechanism Effects 0.000 claims abstract description 20
- 230000002093 peripheral effect Effects 0.000 claims abstract description 12
- 238000012360 testing method Methods 0.000 claims description 33
- 238000001514 detection method Methods 0.000 claims description 12
- 238000000691 measurement method Methods 0.000 claims description 10
- 230000008569 process Effects 0.000 claims description 6
- 238000012545 processing Methods 0.000 claims description 6
- 238000004458 analytical method Methods 0.000 abstract description 8
- 238000007689 inspection Methods 0.000 abstract 1
- 238000013461 design Methods 0.000 description 18
- 230000003287 optical effect Effects 0.000 description 15
- 238000006073 displacement reaction Methods 0.000 description 9
- 238000006243 chemical reaction Methods 0.000 description 6
- 238000012937 correction Methods 0.000 description 3
- 238000011156 evaluation Methods 0.000 description 3
- 230000014509 gene expression Effects 0.000 description 3
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- 238000004364 calculation method Methods 0.000 description 1
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- 238000005516 engineering process Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
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Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003362473A JP2005127810A (ja) | 2003-10-22 | 2003-10-22 | ３次元座標測定方法及び装置 |
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| Application Number | Priority Date | Filing Date | Title |
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| JP2003362473A JP2005127810A (ja) | 2003-10-22 | 2003-10-22 | ３次元座標測定方法及び装置 |
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| Publication Number | Publication Date |
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| JP2005127810A true JP2005127810A (ja) | 2005-05-19 |
| JP2005127810A5 JP2005127810A5 (enExample) | 2006-11-30 |
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| JP2003362473A Pending JP2005127810A (ja) | 2003-10-22 | 2003-10-22 | ３次元座標測定方法及び装置 |
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| JP (1) | JP2005127810A (enExample) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119245896A (zh) * | 2024-09-29 | 2025-01-03 | 上海理工大学 | 适用于复杂曲面多方向残余应力测试方法及法线调整装置 |
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- 2003-10-22 JP JP2003362473A patent/JP2005127810A/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN119245896A (zh) * | 2024-09-29 | 2025-01-03 | 上海理工大学 | 适用于复杂曲面多方向残余应力测试方法及法线调整装置 |
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