JP2005127810A5 - - Google Patents

Download PDF

Info

Publication number
JP2005127810A5
JP2005127810A5 JP2003362473A JP2003362473A JP2005127810A5 JP 2005127810 A5 JP2005127810 A5 JP 2005127810A5 JP 2003362473 A JP2003362473 A JP 2003362473A JP 2003362473 A JP2003362473 A JP 2003362473A JP 2005127810 A5 JP2005127810 A5 JP 2005127810A5
Authority
JP
Japan
Prior art keywords
holding member
measurement
information
rotation
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2003362473A
Other languages
English (en)
Japanese (ja)
Other versions
JP2005127810A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2003362473A priority Critical patent/JP2005127810A/ja
Priority claimed from JP2003362473A external-priority patent/JP2005127810A/ja
Publication of JP2005127810A publication Critical patent/JP2005127810A/ja
Publication of JP2005127810A5 publication Critical patent/JP2005127810A5/ja
Pending legal-status Critical Current

Links

JP2003362473A 2003-10-22 2003-10-22 ３次元座標測定方法及び装置 Pending JP2005127810A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2003362473A JP2005127810A (ja) 2003-10-22 2003-10-22 ３次元座標測定方法及び装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003362473A JP2005127810A (ja) 2003-10-22 2003-10-22 ３次元座標測定方法及び装置

Publications (2)

Publication Number Publication Date
JP2005127810A JP2005127810A (ja) 2005-05-19
JP2005127810A5 true JP2005127810A5 (enExample) 2006-11-30

Family

ID=34642125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2003362473A Pending JP2005127810A (ja) 2003-10-22 2003-10-22 ３次元座標測定方法及び装置

Country Status (1)

Country Link
JP (1) JP2005127810A (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN119245896B (zh) * 2024-09-29 2025-07-04 上海理工大学 适用于复杂曲面多方向残余应力测试方法及法线调整装置

Similar Documents

Publication Publication Date Title
CN109141225B (zh) 基于圆光栅的轴系五、六自由度误差测量方法及测量系统
CN107063091A (zh) 用于大长径比管件内孔多参数测量设备及方法
WO2007099646A1 (ja) 円形状の測定方法、円筒形状の測定方法及び円筒形状の測定装置
RU2471145C1 (ru) Способ контроля параметров точности торцевых поверхностей деталей типа "тело вращения"
JP2007248295A (ja) ねじ測定方法、ねじ測定用プローブ及びそれを用いたねじ測定装置
CN110160464B (zh) 用于测量内孔圆柱度的装置及其使用方法
CN106289145A (zh) 一种圆柱度在机检测方法
JP2006153546A (ja) 接触式鋼管寸法測定装置
CN106940175A (zh) 用于内孔参数测量装置测头长度校准的球面环规及测头长度校准方法
JP2019090636A (ja) 真円度測定器
CN117260389A (zh) 多传感器融合驱动的大型深孔零件形状误差在位测量系统
CN106092014A (zh) 用于测量薄壁轴承径向尺寸的多点测量仪及测量方法
JP6765710B2 (ja) 全角度測定器
JP6205569B2 (ja) Ｘ線ｃｔ装置の校正器
CN103727918B (zh) 一种内角高精度检测和垂直度判定的方法
JP2009180700A (ja) 円筒形状測定装置および円筒の表面形状測定方法
JP2008196881A (ja) タイヤの断面の厚さ分布測定装置、及び、タイヤの断面の厚さ分布測定方法
CN107727023B (zh) 基于三点法的杂交四点法回转误差、圆度误差计算方法
CN107238364B (zh) 接触式测量测针球头半径精密补偿方法
JP2005127810A5 (enExample)
CN114777607B (zh) 一种回转体同轴度误差检测方法
RU2348006C1 (ru) Способ размерного контроля поверхностей деталей, имеющих круглые сечения
TWI633274B (zh) 光學式轉軸多自由度誤差檢測裝置與方法(一)
JP2009145152A (ja) 測定装置
Yoshizawa et al. Development of an inner profile measurement instrument using a ring beam device