JP2005110220A - アモルファス・シリコン・フラット・パネルｘ線検出器での読み出し時間を短縮して遅延を縮小するサンプリング方法及びシステム - Google Patents

アモルファス・シリコン・フラット・パネルｘ線検出器での読み出し時間を短縮して遅延を縮小するサンプリング方法及びシステム Download PDF

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Publication number
JP2005110220A
JP2005110220A JP2004240492A JP2004240492A JP2005110220A JP 2005110220 A JP2005110220 A JP 2005110220A JP 2004240492 A JP2004240492 A JP 2004240492A JP 2004240492 A JP2004240492 A JP 2004240492A JP 2005110220 A JP2005110220 A JP 2005110220A
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Japan
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time
fet
amorphous silicon
flat panel
ray detector
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JP2004240492A
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Japanese (ja)
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JP2005110220A5 (enExample
Inventor
Manat Maolinbay
マナト・マオリンベイ
Paul Granfors
ポール・グランフォース
Richard Aufrichtig
リチャード・アウフリヒティヒ
Richard Cronce
リチャード・クロンス
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GE Medical Systems Global Technology Co LLC
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GE Medical Systems Global Technology Co LLC
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Publication of JP2005110220A publication Critical patent/JP2005110220A/ja
Publication of JP2005110220A5 publication Critical patent/JP2005110220A5/ja
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/29—Measurement performed on radiation beams, e.g. position or section of the beam; Measurement of spatial distribution of radiation
    • G01T1/2914—Measurement of spatial distribution of radiation
    • G01T1/2921—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras
    • G01T1/2928—Static instruments for imaging the distribution of radioactivity in one or two dimensions; Radio-isotope cameras using solid state detectors

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2004240492A 2003-08-22 2004-08-20 アモルファス・シリコン・フラット・パネルｘ線検出器での読み出し時間を短縮して遅延を縮小するサンプリング方法及びシステム Pending JP2005110220A (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/646,107 US7005663B2 (en) 2003-08-22 2003-08-22 Sampling methods and systems that shorten readout time and reduce lag in amorphous silicon flat panel x-ray detectors

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JP2005110220A true JP2005110220A (ja) 2005-04-21
JP2005110220A5 JP2005110220A5 (enExample) 2007-09-27

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US (1) US7005663B2 (enExample)
JP (1) JP2005110220A (enExample)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012096080A1 (ja) 2011-01-12 2012-07-19 浜松ホトニクス株式会社 固体撮像装置および固体撮像装置の駆動方法
KR101836997B1 (ko) 2017-06-13 2018-03-12 한국지질자원연구원 섬광체 기반 감마선 검출 장치 및 그 방법

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8761340B2 (en) * 2008-09-29 2014-06-24 Carestream Health, Inc. Acquisition of high speed dual-energy images using a single pixilated digital detector
JP5583191B2 (ja) * 2011-11-25 2014-09-03 富士フイルム株式会社 放射線画像検出装置およびその作動方法
US10325131B2 (en) * 2015-06-30 2019-06-18 Synaptics Incorporated Active matrix capacitive fingerprint sensor for display integration based on charge sensing by a 2-TFT pixel architecture

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001285724A (ja) * 2000-03-30 2001-10-12 Sharp Corp 電荷量検出回路
JP2003265453A (ja) * 2001-12-26 2003-09-24 Sharp Corp 光電変換装置
JP2004147102A (ja) * 2002-10-24 2004-05-20 Sharp Corp 画像読み取り装置および画像読み取り方法

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US85667A (en) * 1869-01-05 Improved composition for artificial stone
US4996413A (en) * 1990-02-27 1991-02-26 General Electric Company Apparatus and method for reading data from an image detector
GB2289983B (en) * 1994-06-01 1996-10-16 Simage Oy Imaging devices,systems and methods
US6353654B1 (en) * 1999-12-30 2002-03-05 General Electric Company Method and apparatus for compensating for image retention in an amorphous silicon imaging detector
US20020085667A1 (en) 2000-12-28 2002-07-04 Christopher Miller Method and apparatus for automatic offset correction in digital flouroscopic X-ray imaging systems

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001285724A (ja) * 2000-03-30 2001-10-12 Sharp Corp 電荷量検出回路
JP2003265453A (ja) * 2001-12-26 2003-09-24 Sharp Corp 光電変換装置
JP2004147102A (ja) * 2002-10-24 2004-05-20 Sharp Corp 画像読み取り装置および画像読み取り方法

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2012096080A1 (ja) 2011-01-12 2012-07-19 浜松ホトニクス株式会社 固体撮像装置および固体撮像装置の駆動方法
US9225924B2 (en) 2011-01-12 2015-12-29 Hamamatsu Photonics K.K. Solid-state imaging device including signal connecting section and solid-state imaging device driving method
KR101836997B1 (ko) 2017-06-13 2018-03-12 한국지질자원연구원 섬광체 기반 감마선 검출 장치 및 그 방법

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US20050040352A1 (en) 2005-02-24
US7005663B2 (en) 2006-02-28

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