JP2005024312A5 - - Google Patents
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- Publication number
- JP2005024312A5 JP2005024312A5 JP2003187854A JP2003187854A JP2005024312A5 JP 2005024312 A5 JP2005024312 A5 JP 2005024312A5 JP 2003187854 A JP2003187854 A JP 2003187854A JP 2003187854 A JP2003187854 A JP 2003187854A JP 2005024312 A5 JP2005024312 A5 JP 2005024312A5
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- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Priority Applications (5)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003187854A JP4079841B2 (en) | 2003-06-30 | 2003-06-30 | Defect display device |
| CNB2004800185074A CN100476416C (en) | 2003-06-30 | 2004-06-28 | Defect dispay unit |
| KR1020057024959A KR100791195B1 (en) | 2003-06-30 | 2004-06-28 | Defect display unit |
| PCT/JP2004/009467 WO2005001455A1 (en) | 2003-06-30 | 2004-06-28 | Defect dispay unit |
| TW093119098A TWI340356B (en) | 2003-06-30 | 2004-06-29 | Defect display apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003187854A JP4079841B2 (en) | 2003-06-30 | 2003-06-30 | Defect display device |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005024312A JP2005024312A (en) | 2005-01-27 |
| JP2005024312A5 true JP2005024312A5 (en) | 2006-08-10 |
| JP4079841B2 JP4079841B2 (en) | 2008-04-23 |
Family
ID=33549735
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2003187854A Expired - Fee Related JP4079841B2 (en) | 2003-06-30 | 2003-06-30 | Defect display device |
Country Status (5)
| Country | Link |
|---|---|
| JP (1) | JP4079841B2 (en) |
| KR (1) | KR100791195B1 (en) |
| CN (1) | CN100476416C (en) |
| TW (1) | TWI340356B (en) |
| WO (1) | WO2005001455A1 (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007071678A (en) * | 2005-09-07 | 2007-03-22 | Hitachi High-Technologies Corp | Inspection system |
| JP2008033306A (en) * | 2006-07-03 | 2008-02-14 | Olympus Corp | Defect correcting device |
| JP4956077B2 (en) * | 2006-07-19 | 2012-06-20 | 株式会社メック | Defect inspection apparatus and defect inspection method |
| JP4843399B2 (en) * | 2006-07-31 | 2011-12-21 | 株式会社日立ハイテクノロジーズ | Inspection apparatus and inspection method |
| JP4913838B2 (en) * | 2008-04-14 | 2012-04-11 | 日東電工株式会社 | Optical display device manufacturing system and optical display device manufacturing method |
| CN102937594B (en) * | 2012-11-02 | 2015-01-21 | 上海华力微电子有限公司 | Defect detecting system and method |
| CN103489817B (en) * | 2013-09-30 | 2016-01-27 | 上海华力微电子有限公司 | defect detecting system and method |
| CN103809309B (en) * | 2014-01-22 | 2016-07-06 | 北京京东方显示技术有限公司 | Substrate detection equipment and method |
| CN103792705B (en) * | 2014-01-28 | 2017-02-01 | 北京京东方显示技术有限公司 | Detecting method and detecting device for detecting substrate defects |
| KR20180052246A (en) * | 2016-11-10 | 2018-05-18 | (주) 지펙케이앤디 | Manually or automatically brightness controlling display device by sensor value setting of illuminance sensor |
| CN107040725B (en) * | 2017-05-15 | 2021-04-30 | 惠科股份有限公司 | Coordinate correction method of image acquisition device and image acquisition device |
| CN110132979A (en) * | 2019-05-05 | 2019-08-16 | 东方电气集团东方锅炉股份有限公司 | A kind of analysis method of metal material microscopic defect |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59192943A (en) * | 1983-04-15 | 1984-11-01 | Hitachi Ltd | Defect inspecting device repetitive pattern |
| JPH07119704B2 (en) * | 1986-03-18 | 1995-12-20 | オムロン株式会社 | Board inspection equipment |
| JP2647502B2 (en) * | 1989-06-30 | 1997-08-27 | 株式会社日立製作所 | Pattern comparison inspection method and apparatus |
| JPH0357241A (en) * | 1989-07-26 | 1991-03-12 | Hitachi Ltd | Automatic external-appearance inspection apparatus |
| JPH0776757B2 (en) * | 1990-12-14 | 1995-08-16 | インターナショナル・ビジネス・マシーンズ・コーポレイション | Optical inspection device |
| JPH05172548A (en) * | 1991-12-25 | 1993-07-09 | Honda Motor Co Ltd | Data output method and work surface inspection device |
| JPH0614959U (en) * | 1992-06-01 | 1994-02-25 | エヌオーケー株式会社 | Image processing device |
| JP2710527B2 (en) * | 1992-10-21 | 1998-02-10 | 大日本スクリーン製造株式会社 | Inspection equipment for periodic patterns |
| JPH08219721A (en) * | 1995-02-14 | 1996-08-30 | Sony Corp | Image processor |
| JP2981434B2 (en) * | 1997-01-27 | 1999-11-22 | 株式会社日立製作所 | Pattern defect detection method and apparatus |
| JP3288613B2 (en) * | 1997-09-25 | 2002-06-04 | 株式会社クボタ | Defect detection device and defect removal device |
| JPH11346308A (en) * | 1998-06-02 | 1999-12-14 | Olympus Optical Co Ltd | Image reader for transparent original |
| JP2000193594A (en) * | 1998-12-24 | 2000-07-14 | Hitachi Ltd | Circuit pattern inspecting method and its device |
| JP2000188075A (en) * | 1998-12-22 | 2000-07-04 | Hitachi Ltd | Inspection method and inspection device for circuit pattern |
| JP4588138B2 (en) * | 1999-07-23 | 2010-11-24 | 株式会社日立製作所 | Circuit pattern inspection device |
| JP3869588B2 (en) * | 1999-09-01 | 2007-01-17 | 株式会社日立製作所 | Circuit pattern inspection device |
| JP2001141601A (en) * | 1999-11-11 | 2001-05-25 | Sony Corp | Method and system for evaluating/sorting display or imaging device |
| JP2001156135A (en) * | 1999-11-29 | 2001-06-08 | Hitachi Ltd | Method and device for sorting defective image and manufacturing method of semiconductor device using them |
| JP2001256480A (en) * | 2000-03-09 | 2001-09-21 | Hitachi Ltd | Automatic picture classifying method and its device |
| JP2002228606A (en) * | 2001-01-31 | 2002-08-14 | Hitachi Ltd | Electron beam circuit pattern inspecting method and apparatus therefor |
-
2003
- 2003-06-30 JP JP2003187854A patent/JP4079841B2/en not_active Expired - Fee Related
-
2004
- 2004-06-28 WO PCT/JP2004/009467 patent/WO2005001455A1/en active Application Filing
- 2004-06-28 KR KR1020057024959A patent/KR100791195B1/en not_active IP Right Cessation
- 2004-06-28 CN CNB2004800185074A patent/CN100476416C/en not_active Expired - Fee Related
- 2004-06-29 TW TW093119098A patent/TWI340356B/en not_active IP Right Cessation