CN103792705B - Detecting method and detecting device for detecting substrate defects - Google Patents
Detecting method and detecting device for detecting substrate defects Download PDFInfo
- Publication number
- CN103792705B CN103792705B CN201410041819.2A CN201410041819A CN103792705B CN 103792705 B CN103792705 B CN 103792705B CN 201410041819 A CN201410041819 A CN 201410041819A CN 103792705 B CN103792705 B CN 103792705B
- Authority
- CN
- China
- Prior art keywords
- image
- value
- pixel
- gray
- defect area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Abstract
The invention provides a detecting method for detecting substrate defects. The detecting method comprises the step that 1 an image of a substrate to be detected is obtained, and the detecting method further comprises a fine detection step that 2 whether a first defective area exists in the image of the substrate to be detected or nor is judged and when the first defective area exists in the image of the substrate to be detected, fine detection further comprises the step that 3 the color of pixels in the first defective area is converted into a first pure color and the color of pixels in a normal area in the image is converted into a second pure color. The invention further provides a detecting device. By means of the detecting method, the contrast ratio between the first defective area and the normal area is improved, an inspector can distinguish the first detective area from the normal area conveniently and detection missing satiations are reduced.
Description
Technical field
The present invention relates to the detection field of substrate, in particular it relates to a kind of detection method of detection base board defect and one kind
Implement the detection means of above-mentioned detection method.
Background technology
Produce at present crystal liquid substrate color membrane substrates when, generally will using on detection means device detection color membrane substrates whether
There is the bad of color uneven (mura).
Detection means includes image acquisition units, gathers the image of color membrane substrates using image acquisition units, and by this figure
Be converted to gray-scale maps as processing, subsequently gray level image carried out observe judgement by operator, see with the presence or absence of gray scale and Zhou Bianqu
The region that domain changes greatly.If existing, this region is defect area.
Current detection means can be only generated gray level image, when defect area area is larger and larger with Zhou Bianqu gray difference
When, then easily it is found.In the detection method adopting in the prior art, the image obtaining substrate to be detected is gray-scale maps, inspection
The person of testing judges to whether there is defect area and normal area on the image of detection substrate with naked eyes.Sometimes defect area and surrounding normal area pair
Less than degree (or aberration is less), coroner is then difficult to judge this defect area, thus leading to detection leakage phenomenon.
Therefore, the situation how avoiding the occurrence of missing inspection becomes this area technical problem urgently to be resolved hurrily.
Content of the invention
It is an object of the invention to provide a kind of detection method of detection base board defect and detection means, using described detection
The occurrence of described detection method of device execution can reduce missing inspection.
To achieve these goals, as one aspect of the present invention, provide a kind of detection method of detection base board defect,
This detection method includes:
S1, the image of acquisition substrate to be detected；Wherein,
Described detection method also includes essence inspection step, and this essence inspection step includes:
S2, judge upper in the image of described substrate to be detected to whether there is the first defect area；
When there is described first defect area in the image of described substrate to be detected, described essence inspection step includes:
S3, the color of the pixel in described first defect area is converted to the first pure color, by the normal area in described image
The color of interior pixel is converted to the second pure color.
Preferably, the image of the substrate described to be detected obtaining in described step s1 is gray-scale maps, described step s1 bag
Include:
The gray value of each pixel in s11, acquisition described image；
The absolute value of the difference of the gray value of each pixel and standard gray angle value in s12, calculating described image；
In described step s2, the absolute value of gray value and the difference of described standard gray angle value is exceeded the pixel pair of predetermined value
The regional determination answered is described first defect area, by the absolute value of gray value and the difference of described standard gray angle value less than predetermined
The corresponding regional determination of pixel of value is described normal area.
Preferably, include between described step s11 and described step s12:
In s115, calculating described image, the average gray value of the gray value of each pixel, this average gray value is set to
Described standard gray angle value.
Preferably, the short transverse of the image along described substrate to be detected for described first defect area extends.
Preferably, include Rough Inspection step between described step s1 and described step s2, this Rough Inspection step includes:
S15, judge whether to deposit the second defect area on the image of described substrate to be detected, the area of described second defect area is big
In the area of described first defect area, and/or the width of the image along described substrate to be detected for described second defect area prolongs
Stretch,
When there is not described second defect area on the image of described substrate to be detected, then execute described step s2.
As another aspect of the present invention, provide a kind of detection means of detection base board defect, this detection means includes
Image acquisition units, this image acquisition units can gather the image of substrate to be detected, and wherein, described detection means includes processing
Device and color conversion cell, described image collecting unit is connected with described processor and described color conversion cell respectively, with energy
Enough described image is sent respectively to described processor and described color conversion cell, described processor can determine that described image
In the first defect area and normal area, and result of determination is sent to described color conversion cell, described color conversion cell energy
Enough the color of the pixel in described first defect area is converted to by the first pure color according to described judged result, by described normal area
The color of pixel be converted to the second pure color.
Preferably, described image is gray-scale maps, described processor can obtain the gray value of each pixel in described image with
And in described image the difference of the gray value of each pixel and standard gray angle value absolute value, and described processor can by gray value with
The corresponding regional determination of pixel that the absolute value of the difference of described standard gray angle value exceedes predetermined value is described first defect area, by ash
Angle value is being described normal with the absolute value of the difference of described standard gray angle value less than the corresponding regional determination of the pixel of predetermined value
Area.
Preferably, described processor can calculate the average gray value of the gray value of each pixel in described image, and energy
Enough this average gray value is set to described standard gray angle value.
Preferably, described first defect area extends along the short transverse of described substrate.
In detection method provided by the present invention, calculate first and in the image of substrate to be detected, whether there is the first defect
Area.When there is described first defect area in the image of described substrate to be detected, by the color of the pixel of described first defect area
Be converted to the first pure color, the color of the pixel in described normal area is converted to the second pure color, thus improve described first defect
Area and the contrast in described normal area, are easy to coroner and distinguish the first defect area and normal area, reduce the appearance of missing inspection situation.
Brief description
Accompanying drawing is used to provide a further understanding of the present invention, and constitutes the part of description, with following tool
Body embodiment is used for explaining the present invention together, but is not construed as limiting the invention.In the accompanying drawings:
Fig. 1 is the flow chart of detection method provided by the present invention；
Fig. 2 is the flow chart of step s1 in the inspection method shown in Fig. 1；
Fig. 3 is the schematic diagram of detection means provided by the present invention.
Description of reference numerals
100: image acquisition units 200: processor
300: color conversion cell 400: display unit
Specific embodiment
Below in conjunction with accompanying drawing, the specific embodiment of the present invention is described in detail.It should be appreciated that this place is retouched
The specific embodiment stated is merely to illustrate and explains the present invention, is not limited to the present invention.
As one aspect of the present invention, provide a kind of detection method of detection base board defect, this detection method includes:
S1, the image of acquisition substrate to be detected；Wherein, described detection method also includes essence inspection step, and this essence examines step bag
Include:
S2, judge upper in the image of described substrate to be detected to whether there is the first defect area；
When there is described first defect area in the image of described substrate to be detected, described essence inspection step also includes:
S3, the color of the pixel in described first defect area is converted to the first pure color, by described substrate to be detected just
Often the color of the pixel in area is converted to the second pure color.
In detection method provided by the present invention, calculate first and in the image of substrate to be detected, whether there is the first defect
Area.When there is described first defect area in the image of described substrate to be detected, by the color of the pixel of described first defect area
Be converted to the first pure color, the color of the pixel in described normal area is converted to the second pure color, thus improve described first defect
Area and the contrast in described normal area, are easy to coroner and distinguish the first defect area and normal area, reduce the appearance of missing inspection situation.
In the present invention, do not have special regulation to the concrete color of the first pure color and the second pure color, as long as first is pure
Between color and the second pure color, there is larger contrast, be easy to coroner and distinguish.For example, the first pure color can be black,
Second pure color can be white；Or the first pure color can be redness, the second pure color can be white etc..
Due to having larger contrast, detection method therefore provided by the present invention between the first pure color and the second pure color
It is particularly suited for that area of detection is less, be difficult the defect that is found.Substrate to be detected can be the color film for display floater
Substrate.
As shown in fig. 1, when there is not the first defect area in the image of substrate to be detected, then can be directly entered next
Procedure.
Lack with the presence or absence of first in the image that described substrate to be detected can be judged by being introduced into the method for standard gray angle value
Sunken area.If in the gray-scale maps of substrate, the gray value of pixel is equal to described standard gray angle value, then illustrate that this pixel is normal, i.e. should
The corresponding region of pixel is normal region.It is therefore preferred that as shown in Fig. 2 obtain in described step s1 is described to be detected
The image of substrate is gray-scale maps, and described step s1 includes:
In s11, acquisition described image, the gray value xi(i of each pixel is natural number, and i is less than the pixel in described image
Sum)；
Absolute value | the δ x | of the difference of the gray value xn of each pixel and standard gray angle value xs in s12, calculating described image；
In described step s2, the absolute value of gray value and the difference of described standard gray angle value is exceeded the picture of predetermined value spec
The corresponding regional determination of element is described first defect area, and the absolute value of gray value and the difference of described standard gray angle value is being less than
The corresponding regional determination of pixel of predetermined value spec is described normal area.
For example, when whether ith pixel is located in the first defect area on calculating image, obtain in described image the first
The gray value xi of i pixel, then calculate absolute value | the δ x | of the difference of gray value xi and standard gray angle value xs of ith pixel=
|xi-xs|.When | δ x | is during ＞ spec, then judge in described image the corresponding region of ith pixel as the first defect area；When | δ
X | during≤spec, then judge that ith pixel is not in described first defect area.In the present invention, to predetermined value spec not
There is special restriction, for example, predetermined value spec can be any number between 0 to 3.
In the present invention, described standard gray angle value can be artificially set it is also possible to by described step s11 and described
Following steps s115 described standard gray angle value xs of calculating carrying out between step s12:
The average gray value of the gray value of each pixel in s115, calculating described imageBy this average gray valueIf
It is set to described standard gray angle value xs.
When the gray value of a pixel exceedes described preset value spec with the absolute value of the difference of described standard gray angle value, then
Can determine that described pixel is in described first defect area.
Can be difficult using detection method of the prior art using detection method provided by the present invention detection coroner
The defect finding.
For example, the area of described first defect area can be not more than 2mm2, or described first defect area is along described substrate
Short transverse extend, and the width of the first defect area is not more than 1mm.So-called " short transverse of substrate " refers to, substrate is used for
In display device and when this display device normally shows, the short transverse of image.(the example when described first defect area narrower width
As when the width of described first defect area is less than 1mm), the defect in picture altitude direction is difficult to be found.And, it is if described
Normal area gray value around the gray value of each pixel of the first defect area and this first defect area relatively when (for example, first
When the absolute value of the difference of the gray value in normal area around the gray value of each pixel of defect area and this first defect area is less than 2),
Coroner is difficult to find above-mentioned first defect area using detection method of the prior art.Due to the first pure color and the second pure color it
Between there is larger contrast, then easily detect described first defect area using detection method provided by the present invention.
Essence inspection step in detection method provided by the present invention can be made with detection method of the prior art cooperation
With.That is, as shown in figure 1, in detection method provided by the present invention, can include between described step s1 and described step s2
Rough Inspection step, this Rough Inspection step includes: s15, judges whether deposit the second defect area on the image of described substrate to be detected, this second
The area of defect area be more than described first defect area area (for example, the area of the second defect area can be more than 2mm2), when
When two defect areas are bar defect, the width of this second defect area can be more than 1mm.Or, described second defect area is permissible
Width along the image of described substrate to be detected extends.Or, the gray value of each pixel of the second defect area with this second
Larger (for example, the gray value of each pixel of the second defect area and this second defect of gray value difference in the normal area around defect area
The absolute value of the difference of the gray value in normal area around area is more than 3).In a word, compared with the first defect area, the second defect area is phase
To obvious defect, it is easy to coroner's naked eyes and finds.So-called " width of substrate " refers to, substrate is used in display device
And this display device is when normally showing, the width of image.
When there is not described second defect area on the image of described substrate to be detected, then execute described step s2.
After increasing described Rough Inspection step in detection method provided by the present invention, can rapidly filter out including
The substrate of two defect areas, can shorten the time needed for whole detection method, improve the efficiency of detection method, and can be maximum
Avoid missing inspection to limit.
As another aspect of the present invention, provide a kind of detection means of detection base board defect, this detection means is used for
Execute above-mentioned detection method.As shown in figure 3, described detection means can include image acquisition units 100, this image acquisition units
100 images that can gather substrate to be detected, wherein, described detection means also includes processor 200 and color conversion cell
300, image acquisition units 100 are connected with processor 200 and color conversion cell 300 respectively, by described substrate to be detected
Image is sent respectively to processor 200 and color conversion cell 300, and processor 200 can be determined that in described image first lacks
Sunken area and normal area, and result of determination is sent to color conversion cell 300, this color conversion cell 300 can be according to described
The color of the pixel of described first defect area is converted to the first pure color, turns the color of the pixel in described normal area by judged result
It is changed to the second pure color.
It is easily understood that described color conversion cell 300 is electrically connected with display unit 400, display unit 400 can show
Show the image after color elements 300 conversion.After image acquisition units collect the image of substrate to be detected, this image is sent out
Give processor 200 and color conversion cell 300.
" judged result " generating in processor 200 includes whether there is described first defect area in described image and works as
When there is described first defect area in described image, the information such as position of this first defect area.
As mentioned above it is possible, the color of the pixel of described first defect area is converted to the first pure color, by described normal area
Pixel color be converted to the second pure color after, improve the contrast of described first defect area and described normal area, be easy to
Coroner distinguishes the first defect area and normal area, reduces the appearance of missing inspection situation.
In the present invention, the concrete form of image acquisition units 100 is not particularly limited.Such as image acquisition list
Unit 100 can include linear camera and lighting unit, and described linear camera is connected with described processor, and described lighting unit is permissible
Send the light being radiated on substrate to be detected.
When described image is for gray-scale maps, for execution step s11 and step s12, described processor can obtain described
The absolute value of the gray value of each pixel and the difference of standard gray angle value in the gray value of each pixel and described image on image, and institute
State the corresponding region of pixel that gray value and the absolute value of the difference of described standard gray angle value can exceed predetermined value by processor to sentence
Be set to described first defect area, by the absolute value of gray value and the difference of described standard gray angle value in the pixel pair less than predetermined value
The regional determination answered is described normal area.
For execution step s115, described processor is set to this processor and can calculate each pixel in described image
The average gray value of gray value, and this average gray value can be set to described standard gray angle value.
Preferably, described first defect area extends along the short transverse of described substrate.
It is understood that the embodiment of above principle being intended to be merely illustrative of the present and the exemplary enforcement adopting
Mode, but the invention is not limited in this.For those skilled in the art, in the essence without departing from the present invention
In the case of god and essence, various modifications and improvement can be made, these modifications and improvement are also considered as protection scope of the present invention.
Claims (9)
1. a kind of detection method of detection base board defect, this detection method includes:
Step s1, the image of acquisition substrate to be detected；It is characterized in that,
Described detection method also includes essence inspection step, and this essence inspection step includes:
Step s2, judge upper in the image of described substrate to be detected to whether there is the first defect area；
When there is described first defect area in the image of described substrate to be detected, described essence inspection step includes:
Step s3, the color of the pixel in described first defect area is converted to the first pure color, by the normal area in described image
The color of interior pixel is converted to the second pure color.
2. detection method according to claim 1 it is characterised in that in described step s1 obtain base described to be detected
The image of plate is gray-scale maps, and described step s1 includes:
The gray value of each pixel in step s11, acquisition described image；
The absolute value of the difference of the gray value of each pixel and standard gray angle value in step s12, calculating described image；
In described step s2, gray value is corresponding with the pixel that the absolute value of the difference of described standard gray angle value exceedes predetermined value
Regional determination is described first defect area, by the absolute value of gray value and the difference of described standard gray angle value less than predetermined value
The corresponding regional determination of pixel is described normal area.
3. detection method according to claim 2 is it is characterised in that wrap between described step s11 and described step s12
Include:
In step s115, calculating described image, the average gray value of the gray value of each pixel, this average gray value is set to
Described standard gray angle value.
4. detection method as claimed in any of claims 1 to 3 is it is characterised in that described first defect area is along institute
The short transverse stating the image of substrate to be detected extends.
5. detection method according to claim 4 is it is characterised in that include thick between described step s1 and described step s2
Inspection step, this Rough Inspection step includes:
Step s15, judge whether to deposit the second defect area on the image of described substrate to be detected, the area of described second defect area is big
In the area of described first defect area, and/or the width of the image along described substrate to be detected for described second defect area prolongs
Stretch,
When there is not described second defect area on the image of described substrate to be detected, then execute described step s2.
6. a kind of detection means of detection base board defect, this detection means includes image acquisition units, this image acquisition units energy
Enough gather the image of substrate to be detected it is characterised in that described detection means includes processor and color conversion cell, described figure
As collecting unit is connected with described processor and described color conversion cell, respectively described image can be sent respectively to institute
State processor and described color conversion cell, described processor can determine that the first defect area and normal area in described image,
And send result of determination to described color conversion cell, described color conversion cell can will be described according to described judged result
The color of the pixel in the first defect area is converted to the first pure color, that the color of the pixel in described normal area is converted to second is pure
Color.
7., it is characterised in that described image is gray-scale maps, described processor can for detection means according to claim 6
Obtain the exhausted of the gray value of each pixel in described image and the gray value of each pixel in described image and the difference of standard gray angle value
To value, and described processor can be corresponding with the pixel that the absolute value of the difference of described standard gray angle value exceedes predetermined value by gray value
Regional determination be described first defect area, by the absolute value of gray value and the difference of described standard gray angle value less than predetermined value
The corresponding regional determination of pixel be described normal area.
8. detection means according to claim 7 is it is characterised in that described processor can calculate in described image each
The average gray value of the gray value of pixel, and this average gray value can be set to described standard gray angle value.
9. the detection means according to claim 7 or 8 it is characterised in that described first defect area along described substrate height
Degree direction extends.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410041819.2A CN103792705B (en) | 2014-01-28 | 2014-01-28 | Detecting method and detecting device for detecting substrate defects |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201410041819.2A CN103792705B (en) | 2014-01-28 | 2014-01-28 | Detecting method and detecting device for detecting substrate defects |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN103792705A CN103792705A (en) | 2014-05-14 |
| CN103792705B true CN103792705B (en) | 2017-02-01 |
Family
ID=50668540
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201410041819.2A Active CN103792705B (en) | 2014-01-28 | 2014-01-28 | Detecting method and detecting device for detecting substrate defects |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN103792705B (en) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104101614B (en) * | 2014-05-26 | 2016-08-31 | 京东方科技集团股份有限公司 | A kind of detection method and device |
| CN104297147B (en) * | 2014-09-24 | 2016-08-24 | 京东方科技集团股份有限公司 | Substrate scratches detection device and detection method, the detecting system of degree |
| CN105467634B (en) * | 2016-01-27 | 2018-11-09 | 京东方科技集团股份有限公司 | A kind of detection method and device of the multicolour pattern missing of color membrane substrates |
| CN107144993B (en) * | 2017-06-30 | 2020-05-05 | 惠科股份有限公司 | Display panel detection method and device |
| CN108037142B (en) * | 2017-12-04 | 2021-01-19 | 江苏维普光电科技有限公司 | Mask optical defect detection method based on image gray value |
| CN108508053B (en) * | 2018-04-26 | 2021-01-12 | 武汉新芯集成电路制造有限公司 | Method for detecting systematic infinitesimal physical defects |
| CN108844966A (en) * | 2018-07-09 | 2018-11-20 | 广东速美达自动化股份有限公司 | A kind of screen detection method and detection system |
| KR101975816B1 (en) * | 2018-07-10 | 2019-08-28 | 주식회사 에이치비테크놀러지 | Apparatus and Method for Discriminating Defects in Auto Repair System |
| TWI761651B (en) * | 2018-12-28 | 2022-04-21 | 聯策科技股份有限公司 | Optical inspection system and method with high information |
| CN111007086A (en) * | 2019-11-25 | 2020-04-14 | 合肥维信诺科技有限公司 | Defect detection method and device and storage medium |
| CN111044522B (en) * | 2019-12-14 | 2022-03-11 | 中国科学院深圳先进技术研究院 | Defect detection method and device and terminal equipment |
| CN113105249B (en) * | 2021-03-01 | 2023-06-02 | 东阳富仕特磁业有限公司 | Gyromagnetic ferrite preparation method and gyromagnetic ferrite ball milling production line |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1573411A (en) * | 2003-05-30 | 2005-02-02 | 三星康宁精密琉璃株式会社 | Line scanning examination method for inclined transportation |
| CN1813185A (en) * | 2003-06-30 | 2006-08-02 | 奥林巴斯株式会社 | Defect dispay unit |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0690151B2 (en) * | 1986-05-01 | 1994-11-14 | 神東塗料株式会社 | A method for detecting the presence / absence of defects in a transparent circuit board having a fine transparent conductive circuit. |
| JP4097834B2 (en) * | 1999-02-03 | 2008-06-11 | タカノ株式会社 | Rib missing inspection method for ribbed color filter substrate |
| US8428334B2 (en) * | 2010-03-26 | 2013-04-23 | Cooper S.K. Kuo | Inspection System |
-
2014
- 2014-01-28 CN CN201410041819.2A patent/CN103792705B/en active Active
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1573411A (en) * | 2003-05-30 | 2005-02-02 | 三星康宁精密琉璃株式会社 | Line scanning examination method for inclined transportation |
| CN1813185A (en) * | 2003-06-30 | 2006-08-02 | 奥林巴斯株式会社 | Defect dispay unit |
Also Published As
| Publication number | Publication date |
|---|---|
| CN103792705A (en) | 2014-05-14 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN103792705B (en) | Detecting method and detecting device for detecting substrate defects | |
| JP4882529B2 (en) | Defect detection method and defect detection apparatus | |
| US8027036B2 (en) | Apparatus for detecting particles on a glass surface and a method thereof | |
| CN109919933B (en) | VR device, picture detection method and device thereof, and computer-readable storage medium | |
| KR101702841B1 (en) | Method for monitoring defect in polaroid films | |
| JPWO2014017066A1 (en) | Liquid crystal display panel inspection method and liquid crystal display panel inspection apparatus | |
| WO2007004517A1 (en) | Surface inspecting apparatus | |
| WO2014132506A1 (en) | Method for detecting display panel defects and device for detecting display panel defects | |
| CN105205803A (en) | Display panel defect detection method | |
| JP2009229197A (en) | Linear defect detecting method and device | |
| CN110620887B (en) | Image generation device and image generation method | |
| JP2010181328A (en) | Device, program and method for inspecting surface of solar battery wafer | |
| TWI310084B (en) | Automatic inspecting method for inspecting the polar direction of the polar element | |
| CN113567342A (en) | Transparent object defect detection method and device | |
| JP5509465B2 (en) | Glass bottle inspection equipment | |
| CN110136619A (en) | Failure detection method, device, the method for quality control of display panel | |
| JP2004219291A (en) | Line defect detection method and device for screen | |
| JP2006201523A (en) | Method and instrument for inspecting liquid crystal display panel | |
| KR20140082335A (en) | Method and apparatus of inspecting mura of flat display | |
| CN112465780A (en) | Method and device for monitoring abnormal film thickness of insulating layer | |
| JP2009074828A (en) | Flaw detection method and flaw detector | |
| JP2007010597A (en) | Surface inspection device | |
| KR100971081B1 (en) | Defect Inspection Method of Polarizing Film | |
| KR20170122321A (en) | Method for optical inspection of display panel | |
| TWI251175B (en) | Method to enhance low contrast image detectivity based on human visual effect |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |