JP2004537156A5 - - Google Patents
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- Publication number
- JP2004537156A5 JP2004537156A5 JP2002551895A JP2002551895A JP2004537156A5 JP 2004537156 A5 JP2004537156 A5 JP 2004537156A5 JP 2002551895 A JP2002551895 A JP 2002551895A JP 2002551895 A JP2002551895 A JP 2002551895A JP 2004537156 A5 JP2004537156 A5 JP 2004537156A5
- Authority
- JP
- Japan
- Prior art keywords
- cooling structure
- electronic device
- microfluidic
- comprised
- microfluidic cooling
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001816 cooling Methods 0.000 claims 11
- 238000000034 method Methods 0.000 claims 5
- 239000000919 ceramic Substances 0.000 claims 3
- 239000000463 material Substances 0.000 claims 3
- 229910052710 silicon Inorganic materials 0.000 claims 3
- 239000010703 silicon Substances 0.000 claims 3
- 238000004519 manufacturing process Methods 0.000 claims 2
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/741,754 US6809424B2 (en) | 2000-12-19 | 2000-12-19 | Method for making electronic devices including silicon and LTCC and devices produced thereby |
| PCT/US2001/046775 WO2002050888A2 (en) | 2000-12-19 | 2001-12-10 | Method for making electronic devices including silicon and ltcc |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2004537156A JP2004537156A (ja) | 2004-12-09 |
| JP2004537156A5 true JP2004537156A5 (enExample) | 2005-04-28 |
| JP4454226B2 JP4454226B2 (ja) | 2010-04-21 |
Family
ID=24982035
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2002551895A Expired - Fee Related JP4454226B2 (ja) | 2000-12-19 | 2001-12-10 | シリコンとltccを含む電子装置の製造方法及びそれにより製造された電子装置 |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US6809424B2 (enExample) |
| EP (1) | EP1362368A2 (enExample) |
| JP (1) | JP4454226B2 (enExample) |
| KR (1) | KR100574582B1 (enExample) |
| CN (1) | CN1494739A (enExample) |
| AU (1) | AU2002225952A1 (enExample) |
| WO (1) | WO2002050888A2 (enExample) |
Families Citing this family (19)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6976527B2 (en) * | 2001-07-17 | 2005-12-20 | The Regents Of The University Of California | MEMS microcapillary pumped loop for chip-level temperature control |
| JP3896840B2 (ja) * | 2001-12-13 | 2007-03-22 | ソニー株式会社 | 冷却装置、電子機器装置及び冷却装置の製造方法 |
| US6741469B1 (en) * | 2003-02-07 | 2004-05-25 | Sun Microsystems, Inc. | Refrigeration cooling assisted MEMS-based micro-channel cooling system |
| EP1642335B1 (de) * | 2003-07-08 | 2008-08-13 | Infineon Technologies AG | Integrierte kühl-schaltungsanordnung, betriebsverfahren und herstellungsverfahren |
| US7199437B2 (en) * | 2004-01-20 | 2007-04-03 | Harris Corporation | Fabrication process for embedding optical band gap structures in a low temperature co-fired ceramic substrate |
| US7115182B2 (en) * | 2004-06-15 | 2006-10-03 | Agency For Science, Technology And Research | Anodic bonding process for ceramics |
| JP4375186B2 (ja) * | 2004-09-30 | 2009-12-02 | 株式会社日立製作所 | 陽極接合構造を用いた電子装置 |
| US7691723B2 (en) | 2005-01-07 | 2010-04-06 | Honeywell International Inc. | Bonding system having stress control |
| JP4740926B2 (ja) | 2007-11-27 | 2011-08-03 | フェリカネットワークス株式会社 | サービス提供システム、サービス提供サーバ、及び情報端末装置 |
| US7622786B2 (en) * | 2007-12-28 | 2009-11-24 | Aptina Imaging Corporation | EMI shielding for imager devices |
| DE102008014619C5 (de) * | 2008-03-17 | 2015-06-25 | Friedrich-Schiller-Universität Jena | Adaptiver Spiegel und Verfahren zu dessen Herstellung |
| JP5175650B2 (ja) * | 2008-08-06 | 2013-04-03 | ニッコー株式会社 | 陽極接合可能な磁器及び前記磁器用組成物 |
| JP5130151B2 (ja) * | 2008-08-26 | 2013-01-30 | パナソニック株式会社 | 静電容量型半導体物理量センサの製造方法及び静電容量型半導体物理量センサ |
| ATE554361T1 (de) * | 2009-04-28 | 2012-05-15 | Abb Research Ltd | Wärmerohr mit gewundenem rohr |
| EP2246654B1 (en) * | 2009-04-29 | 2013-12-11 | ABB Research Ltd. | Multi-row thermosyphon heat exchanger |
| EP2328172B1 (en) * | 2009-10-02 | 2019-06-26 | Abb Research Ltd. | A power-electronic arrangement |
| US8179676B2 (en) * | 2010-07-21 | 2012-05-15 | Telefonaktiebolaget L M Ericsson (Publ) | Optical interconnects in cooling substrates |
| CN102815665A (zh) * | 2011-06-07 | 2012-12-12 | 北京大学 | 一种低温共烧陶瓷基板内嵌微流管道的接口方法 |
| KR101255935B1 (ko) * | 2011-07-08 | 2013-04-23 | 삼성전기주식회사 | 전력 모듈 패키지 및 그 제조방법 |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3540957A (en) | 1966-10-05 | 1970-11-17 | Texas Instruments Inc | Ceramic bonding |
| US3783218A (en) | 1972-01-12 | 1974-01-01 | Gen Electric | Electrostatic bonding process |
| JPS54131892A (en) | 1978-04-05 | 1979-10-13 | Hitachi Ltd | Semiconductor pressure converter |
| US4573067A (en) * | 1981-03-02 | 1986-02-25 | The Board Of Trustees Of The Leland Stanford Junior University | Method and means for improved heat removal in compact semiconductor integrated circuits |
| US4481497A (en) | 1982-10-27 | 1984-11-06 | Kulite Semiconductor Products, Inc. | Transducer structures employing ceramic substrates and diaphragms |
| US4452624A (en) | 1982-12-21 | 1984-06-05 | The United States Of America As Represented By The Secretary Of The Navy | Method for bonding insulator to insulator |
| EP0161740B1 (en) | 1984-05-09 | 1991-06-12 | Kabushiki Kaisha Toshiba | Method of manufacturing semiconductor substrate |
| SE9100392D0 (sv) | 1991-02-08 | 1991-02-08 | Pharmacia Biosensor Ab | A method of producing a sealing means in a microfluidic structure and a microfluidic structure comprising such sealing means |
| EP0529837B1 (en) * | 1991-08-26 | 1996-05-29 | Sun Microsystems, Inc. | Method and apparatus for cooling multi-chip modules using integral heatpipe technology |
| EP0539741B1 (en) | 1991-09-30 | 2003-01-15 | Canon Kabushiki Kaisha | Anodic bonding process with light irradiation |
| JPH05169666A (ja) | 1991-12-25 | 1993-07-09 | Rohm Co Ltd | インクジェットプリントヘッドの製造方法 |
| US5318820A (en) * | 1992-09-24 | 1994-06-07 | Hughes Aircraft Company | HTCC/LTCC use of multiple ceramic tapes in high rate production |
| JP2533272B2 (ja) | 1992-11-17 | 1996-09-11 | 住友電気工業株式会社 | 半導体デバイスの製造方法 |
| DE4311762C2 (de) | 1993-04-08 | 1995-02-02 | Josef Dr Kemmer | Verfahren zur Verbindung elektrischer Kontaktstellen |
| US5493305A (en) | 1993-04-15 | 1996-02-20 | Hughes Aircraft Company | Small manufacturable array lattice layers |
| US5455385A (en) | 1993-06-28 | 1995-10-03 | Harris Corporation | Multilayer LTCC tub architecture for hermetically sealing semiconductor die, external electrical access for which is provided by way of sidewall recesses |
| US5621837A (en) | 1993-08-09 | 1997-04-15 | Nippon Telegraph & Telephone Corporation | Opto-electronic hybrid integration platform, optical sub-module, opto-electronic hybrid integration circuit and process for fabricating platform |
| EP0658937A1 (en) | 1993-12-08 | 1995-06-21 | Hughes Aircraft Company | Vertical IC chip stack with discrete chip carriers formed from dielectric tape |
| DE4408352C2 (de) * | 1994-03-12 | 1996-02-08 | Meinhard Prof Dr Knoll | Miniaturisierter stofferkennender Durchflußsensor sowie Verfahren zu seiner Herstellung |
| US5585069A (en) | 1994-11-10 | 1996-12-17 | David Sarnoff Research Center, Inc. | Partitioned microelectronic and fluidic device array for clinical diagnostics and chemical synthesis |
| US5591679A (en) | 1995-04-12 | 1997-01-07 | Sensonor A/S | Sealed cavity arrangement method |
| JP3160796B2 (ja) | 1995-05-30 | 2001-04-25 | 株式会社日立製作所 | 半導体圧力検出器 |
| US5611541A (en) * | 1995-08-24 | 1997-03-18 | Paino; Robert | Method of playing a ball game |
| JP3292798B2 (ja) * | 1995-10-04 | 2002-06-17 | 三菱電機株式会社 | 半導体装置 |
| US5892279A (en) * | 1995-12-11 | 1999-04-06 | Northrop Grumman Corporation | Packaging for electronic power devices and applications using the packaging |
| JP3079983B2 (ja) * | 1995-12-26 | 2000-08-21 | 株式会社日立製作所 | 半導体型燃焼圧センサ |
| US5866469A (en) | 1996-06-13 | 1999-02-02 | Boeing North American, Inc. | Method of anodic wafer bonding |
| US5801442A (en) * | 1996-07-22 | 1998-09-01 | Northrop Grumman Corporation | Microchannel cooling of high power semiconductor devices |
| US6091146A (en) | 1997-12-09 | 2000-07-18 | Trw Inc. | Ceramic lid for large multi-chip modules |
| AU1183101A (en) * | 1999-10-19 | 2001-04-30 | Imego Ab | Method relating to anodic bonding |
| US6232151B1 (en) * | 1999-11-01 | 2001-05-15 | General Electric Company | Power electronic module packaging |
| US6462410B1 (en) * | 2000-08-17 | 2002-10-08 | Sun Microsystems Inc | Integrated circuit component temperature gradient reducer |
-
2000
- 2000-12-19 US US09/741,754 patent/US6809424B2/en not_active Expired - Lifetime
-
2001
- 2001-12-10 JP JP2002551895A patent/JP4454226B2/ja not_active Expired - Fee Related
- 2001-12-10 AU AU2002225952A patent/AU2002225952A1/en not_active Abandoned
- 2001-12-10 WO PCT/US2001/046775 patent/WO2002050888A2/en not_active Ceased
- 2001-12-10 CN CNA018221300A patent/CN1494739A/zh active Pending
- 2001-12-10 EP EP01995388A patent/EP1362368A2/en not_active Withdrawn
- 2001-12-10 KR KR1020037008195A patent/KR100574582B1/ko not_active Expired - Lifetime
-
2004
- 2004-08-19 US US10/921,511 patent/US6987033B2/en not_active Expired - Lifetime
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