JP2004317503A5 - - Google Patents

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Publication number
JP2004317503A5
JP2004317503A5 JP2004100790A JP2004100790A JP2004317503A5 JP 2004317503 A5 JP2004317503 A5 JP 2004317503A5 JP 2004100790 A JP2004100790 A JP 2004100790A JP 2004100790 A JP2004100790 A JP 2004100790A JP 2004317503 A5 JP2004317503 A5 JP 2004317503A5
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JP
Japan
Prior art keywords
lens
scanning unit
cell
light
unit according
Prior art date
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Granted
Application number
JP2004100790A
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English (en)
Japanese (ja)
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JP4559105B2 (ja
JP2004317503A (ja
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Publication date
Priority claimed from DE10317736A external-priority patent/DE10317736A1/de
Application filed filed Critical
Publication of JP2004317503A publication Critical patent/JP2004317503A/ja
Publication of JP2004317503A5 publication Critical patent/JP2004317503A5/ja
Application granted granted Critical
Publication of JP4559105B2 publication Critical patent/JP4559105B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004100790A 2003-04-11 2004-03-30 測定本体を光学的に走査するエンコーダ用の走査ユニット Expired - Fee Related JP4559105B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE10317736A DE10317736A1 (de) 2003-04-11 2003-04-11 Abtasteinheit für eine Positionsmesseinrichtung zum optischen Abtasten einer Maßverkörperung

Publications (3)

Publication Number Publication Date
JP2004317503A JP2004317503A (ja) 2004-11-11
JP2004317503A5 true JP2004317503A5 (https=) 2007-01-18
JP4559105B2 JP4559105B2 (ja) 2010-10-06

Family

ID=32864487

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004100790A Expired - Fee Related JP4559105B2 (ja) 2003-04-11 2004-03-30 測定本体を光学的に走査するエンコーダ用の走査ユニット

Country Status (6)

Country Link
US (1) US7230726B2 (https=)
EP (1) EP1467185B1 (https=)
JP (1) JP4559105B2 (https=)
CN (1) CN100350217C (https=)
DE (1) DE10317736A1 (https=)
ES (1) ES2550403T3 (https=)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102005013222B4 (de) * 2005-03-17 2015-12-31 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung
DE102005015743B4 (de) 2005-04-06 2018-08-23 Dr. Johannes Heidenhain Gmbh Abtasteinheit für eine Positionsmesseinrichtung zum optischen Abtasten einer Maßverkörperung und Positionsmesseinrichtung
JP4953653B2 (ja) * 2006-02-15 2012-06-13 株式会社ミツトヨ 光電式エンコーダ
JP5087239B2 (ja) * 2006-06-26 2012-12-05 株式会社ミツトヨ 光電式エンコーダ
JP5294009B2 (ja) * 2008-10-14 2013-09-18 株式会社安川電機 絶対位置検出装置および絶対位置検出装置を搭載したモータ
US8902434B2 (en) * 2010-08-19 2014-12-02 Elesta Relays Gmbh Position measuring device and method for determining an absolute position
DE102011007459B4 (de) * 2011-04-15 2023-05-11 Dr. Johannes Heidenhain Gmbh Optische Längenmesseinrichtung
JP6359254B2 (ja) 2013-09-03 2018-07-18 株式会社ミツトヨ 光電式エンコーダ
DE102014002221A1 (de) 2014-02-21 2015-08-27 Elmotec Statomat Vertriebs Gmbh Verfahren und Vorrichtung zum Wickeln von Polsternen
JP6629014B2 (ja) 2015-09-08 2020-01-15 株式会社ミツトヨ エンコーダ
ES2701307T3 (es) * 2016-06-07 2019-02-21 Heidenhain Gmbh Dr Johannes Medida materializada así como dispositivo de medición de posición
DE102022200195A1 (de) 2022-01-11 2023-07-13 Dr. Johannes Heidenhain Gmbh Optische Positionsmesseinrichtung
CN114696193B (zh) * 2022-06-02 2022-11-01 杭州灵西机器人智能科技有限公司 用于3d测量的多线激光系统、产生及扫描方法

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4112295A (en) * 1974-12-30 1978-09-05 Instytut Geodezji I Kartograffi Apparatus for direct measurement of displacements with a holographic scale
JPH0616142B2 (ja) * 1984-03-26 1994-03-02 キヤノン株式会社 レンズ形成装置
NL8502988A (nl) * 1985-11-01 1987-06-01 Philips Nv Halfgeleidende radieele fotodetector, en inrichting bevattende een dergelijke detector.
DE59101604D1 (de) * 1990-08-09 1994-06-16 Hohner Elektrotechnik Kg Optoelektronische Abtasteinrichtung.
US5822125A (en) * 1996-12-20 1998-10-13 Eastman Kodak Company Lenslet array system
CA2214193A1 (en) * 1997-10-20 1999-04-20 Pat Sin Hao Optical encoder
GB9810350D0 (en) * 1998-05-14 1998-07-15 Ciba Geigy Ag Organic compounds
GB9926574D0 (en) * 1999-11-11 2000-01-12 Renishaw Plc Absolute position measurement
JP4116224B2 (ja) * 2000-03-23 2008-07-09 ローム株式会社 レンズアレイの製造方法
JP4271841B2 (ja) * 2000-04-05 2009-06-03 ローム株式会社 レンズアレイユニットおよびこれを備えた光学装置
DE10022619A1 (de) 2000-04-28 2001-12-06 Heidenhain Gmbh Dr Johannes Abtasteinheit für eine optische Positionsmesseinrichtung
GB0109057D0 (en) 2001-04-11 2001-05-30 Renishaw Plc Absolute postition measurement
DE10217726A1 (de) * 2002-04-17 2003-11-27 Heidenhain Gmbh Dr Johannes Optische Positionsmesseinrichtung
DE10323088A1 (de) * 2003-05-16 2004-12-02 Dr. Johannes Heidenhain Gmbh Positionsmesseinrichtung

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