JP2004227749A - 差動cpp型gmrヘッド - Google Patents
差動cpp型gmrヘッド Download PDFInfo
- Publication number
- JP2004227749A JP2004227749A JP2004000817A JP2004000817A JP2004227749A JP 2004227749 A JP2004227749 A JP 2004227749A JP 2004000817 A JP2004000817 A JP 2004000817A JP 2004000817 A JP2004000817 A JP 2004000817A JP 2004227749 A JP2004227749 A JP 2004227749A
- Authority
- JP
- Japan
- Prior art keywords
- layer
- sensor
- layers
- ferromagnetic
- free
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005291 magnetic effect Effects 0.000 claims abstract description 87
- 229910052751 metal Inorganic materials 0.000 claims abstract description 42
- 239000002184 metal Substances 0.000 claims abstract description 42
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims abstract description 17
- 230000005294 ferromagnetic effect Effects 0.000 claims description 110
- 230000005415 magnetization Effects 0.000 claims description 41
- 230000005290 antiferromagnetic effect Effects 0.000 claims description 36
- 230000008878 coupling Effects 0.000 claims description 26
- 238000010168 coupling process Methods 0.000 claims description 26
- 238000005859 coupling reaction Methods 0.000 claims description 26
- 239000010931 gold Substances 0.000 claims description 24
- 239000010948 rhodium Substances 0.000 claims description 24
- 239000010949 copper Substances 0.000 claims description 23
- 239000000463 material Substances 0.000 claims description 13
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 claims description 13
- 229910052721 tungsten Inorganic materials 0.000 claims description 13
- 239000010937 tungsten Substances 0.000 claims description 13
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 12
- 229910052802 copper Inorganic materials 0.000 claims description 12
- 229910052715 tantalum Inorganic materials 0.000 claims description 12
- GUVRBAGPIYLISA-UHFFFAOYSA-N tantalum atom Chemical compound [Ta] GUVRBAGPIYLISA-UHFFFAOYSA-N 0.000 claims description 12
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 11
- 229910052737 gold Inorganic materials 0.000 claims description 11
- 229910052703 rhodium Inorganic materials 0.000 claims description 11
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims description 11
- 230000008859 change Effects 0.000 claims description 6
- 238000010586 diagram Methods 0.000 abstract description 3
- 229910003271 Ni-Fe Inorganic materials 0.000 description 10
- 230000000694 effects Effects 0.000 description 5
- 239000010408 film Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 5
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 description 4
- 230000008901 benefit Effects 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 229910052707 ruthenium Inorganic materials 0.000 description 4
- 239000000758 substrate Substances 0.000 description 4
- 239000000725 suspension Substances 0.000 description 4
- 229910020598 Co Fe Inorganic materials 0.000 description 3
- 229910002519 Co-Fe Inorganic materials 0.000 description 3
- 238000007476 Maximum Likelihood Methods 0.000 description 3
- 230000001965 increasing effect Effects 0.000 description 3
- 229910052748 manganese Inorganic materials 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 241001061076 Melanonus zugmayeri Species 0.000 description 2
- 229910017052 cobalt Inorganic materials 0.000 description 2
- 239000010941 cobalt Substances 0.000 description 2
- GUTLYIVDDKVIGB-UHFFFAOYSA-N cobalt atom Chemical compound [Co] GUTLYIVDDKVIGB-UHFFFAOYSA-N 0.000 description 2
- 230000001419 dependent effect Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 230000003071 parasitic effect Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000000926 separation method Methods 0.000 description 2
- 238000009751 slip forming Methods 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 239000010409 thin film Substances 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- 101000619542 Homo sapiens E3 ubiquitin-protein ligase parkin Proteins 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 230000005316 antiferromagnetic exchange Effects 0.000 description 1
- 239000002885 antiferromagnetic material Substances 0.000 description 1
- 229910010293 ceramic material Inorganic materials 0.000 description 1
- 239000002772 conduction electron Substances 0.000 description 1
- 238000005260 corrosion Methods 0.000 description 1
- 230000007797 corrosion Effects 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000000280 densification Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 239000003302 ferromagnetic material Substances 0.000 description 1
- 230000004907 flux Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000001939 inductive effect Effects 0.000 description 1
- 238000001659 ion-beam spectroscopy Methods 0.000 description 1
- 230000005381 magnetic domain Effects 0.000 description 1
- 239000000696 magnetic material Substances 0.000 description 1
- 238000001755 magnetron sputter deposition Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 102000045222 parkin Human genes 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000035699 permeability Effects 0.000 description 1
- 238000005498 polishing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000006641 stabilisation Effects 0.000 description 1
- 238000011105 stabilization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B5/3903—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects using magnetic thin film layers or their effects, the films being part of integrated structures
- G11B5/3906—Details related to the use of magnetic thin film layers or to their effects
- G11B5/3945—Heads comprising more than one sensitive element
- G11B5/3948—Heads comprising more than one sensitive element the sensitive elements being active read-out elements
- G11B5/3951—Heads comprising more than one sensitive element the sensitive elements being active read-out elements the active elements being arranged on several parallel planes
- G11B5/3954—Heads comprising more than one sensitive element the sensitive elements being active read-out elements the active elements being arranged on several parallel planes the active elements transducing on a single track
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y10/00—Nanotechnology for information processing, storage or transmission, e.g. quantum computing or single electron logic
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B82—NANOTECHNOLOGY
- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
- B82Y25/00—Nanomagnetism, e.g. magnetoimpedance, anisotropic magnetoresistance, giant magnetoresistance or tunneling magnetoresistance
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
- G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
- G11B5/127—Structure or manufacture of heads, e.g. inductive
- G11B5/33—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only
- G11B5/39—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects
- G11B2005/3996—Structure or manufacture of flux-sensitive heads, i.e. for reproduction only; Combination of such heads with means for recording or erasing only using magneto-resistive devices or effects large or giant magnetoresistive effects [GMR], e.g. as generated in spin-valve [SV] devices
Landscapes
- Engineering & Computer Science (AREA)
- Chemical & Material Sciences (AREA)
- Nanotechnology (AREA)
- Crystallography & Structural Chemistry (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Theoretical Computer Science (AREA)
- Magnetic Heads (AREA)
- Hall/Mr Elements (AREA)
- Thin Magnetic Films (AREA)
- Measuring Magnetic Variables (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US10/349,552 US6927948B2 (en) | 2003-01-23 | 2003-01-23 | Differential CPP GMR sensor with free layers separated by metal gap layer |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2004227749A true JP2004227749A (ja) | 2004-08-12 |
| JP2004227749A5 JP2004227749A5 (https=) | 2007-02-08 |
Family
ID=32735418
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004000817A Pending JP2004227749A (ja) | 2003-01-23 | 2004-01-06 | 差動cpp型gmrヘッド |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US6927948B2 (https=) |
| JP (1) | JP2004227749A (https=) |
| CN (1) | CN100347747C (https=) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8174799B2 (en) | 2007-07-20 | 2012-05-08 | Hitachi Global Storage Technologies Netherlands B.V. | Differential magnetoresistive magnetic head |
| US8270122B2 (en) | 2008-02-14 | 2012-09-18 | Hitachi, Ltd. | Magnetic recording and reproducing device including a differential read head |
| US8570689B2 (en) | 2008-12-09 | 2013-10-29 | HGST Netherlands B.V. | Differential magnetoresistive effect head and magnetic recording/reading device |
Families Citing this family (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2004296000A (ja) * | 2003-03-27 | 2004-10-21 | Hitachi Ltd | 磁気抵抗効果型ヘッド、及びその製造方法 |
| US7477490B2 (en) * | 2004-06-30 | 2009-01-13 | Seagate Technology Llc | Single sensor element that is naturally differentiated |
| US7436632B2 (en) * | 2004-06-30 | 2008-10-14 | Seagate Technology Llc | Differential/dual CPP recording head |
| US7443637B2 (en) * | 2005-07-11 | 2008-10-28 | Hitachi Global Storage Technologies Netherlands B.V. | Giant magnetoresistance sensor with side longitudinal bias stacks and method for forming same |
| US20070153432A1 (en) * | 2005-12-29 | 2007-07-05 | Tdk Corporation | Magnetic head |
| US7881018B2 (en) * | 2007-09-05 | 2011-02-01 | Hitachi Global Storage Technologies Netherlands B.V. | Differential current perpendicular to plane giant magnetoresistive sensor structure having improved robustness against spin torque noise |
| US7577021B2 (en) * | 2007-11-21 | 2009-08-18 | Magic Technologies, Inc. | Spin transfer MRAM device with separated CPP assisted writing |
| US20090207534A1 (en) * | 2008-02-19 | 2009-08-20 | Tdk Corporation | Magneto-resistance effect element including stack with dual free layer and magnetized shield electrode layers |
| US7913570B2 (en) | 2008-03-08 | 2011-03-29 | Texas Research International, Inc. | Environmental damage sensor |
| US8411392B2 (en) * | 2008-06-24 | 2013-04-02 | Seagate Technology Llc | Magnetic field sensor including multiple magnetoresistive sensing elements for patterned media |
| US7974047B2 (en) * | 2008-09-02 | 2011-07-05 | Hitachi Global Storage Technologies Netherlands, B.V. | Current perpendicular to plane differential magnetoresistance read head design using a current confinement structure proximal to an air bearing surface |
| US8659853B2 (en) * | 2009-09-07 | 2014-02-25 | Agency For Science, Technology And Research | Sensor arrangement |
| US20110216432A1 (en) * | 2010-03-05 | 2011-09-08 | Tdk Corporation | Magnetic head comprising two magnetic field sensing part |
| US9784802B1 (en) | 2012-04-11 | 2017-10-10 | Louisiana Tech Research Corporation | GMR nanowire sensors |
| US10718636B1 (en) | 2012-04-11 | 2020-07-21 | Louisiana Tech Research Corporation | Magneto-resistive sensors |
| US9103654B1 (en) | 2012-04-11 | 2015-08-11 | Louisiana Tech University Research Foundation, A Division Of Louisiana Tech University Foundation, Inc. | GMR nanowire sensors |
| US9542962B2 (en) | 2015-01-23 | 2017-01-10 | HGST Netherlands B.V. | Multi-sensor reader structure having a current path with increased size to reduce noise |
| US9704516B2 (en) * | 2015-11-30 | 2017-07-11 | International Business Machines Corporation | Shorting-resistant current perpendicular to plane sensors |
| US11201280B2 (en) * | 2019-08-23 | 2021-12-14 | Western Digital Technologies, Inc. | Bottom leads chemical mechanical planarization for TMR magnetic sensors |
| US12591026B2 (en) * | 2023-06-13 | 2026-03-31 | Allegro Microsystems, Llc | Tunnel magnetoresistance element to detect out-of-plane changes in a magnetic field intensity of a magnetic field |
Family Cites Families (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5155643A (en) | 1990-10-30 | 1992-10-13 | Mars Incorporated | Unshielded horizontal magnetoresistive head and method of fabricating same |
| JP2741837B2 (ja) | 1993-08-06 | 1998-04-22 | インターナショナル・ビジネス・マシーンズ・コーポレイション | 薄膜磁気抵抗ヘッド |
| US5491600A (en) | 1994-05-04 | 1996-02-13 | International Business Machines Corporation | Multi-layer conductor leads in a magnetoresistive head |
| US5701222A (en) * | 1995-09-11 | 1997-12-23 | International Business Machines Corporation | Spin valve sensor with antiparallel magnetization of pinned layers |
| US5751521A (en) * | 1996-09-23 | 1998-05-12 | International Business Machines Corporation | Differential spin valve sensor structure |
| US6195228B1 (en) | 1997-01-06 | 2001-02-27 | Nec Research Institute, Inc. | Thin, horizontal-plane hall sensors for read-heads in magnetic recording |
| US6469873B1 (en) * | 1997-04-25 | 2002-10-22 | Hitachi, Ltd. | Magnetic head and magnetic storage apparatus using the same |
| US6313973B1 (en) | 1998-06-30 | 2001-11-06 | Kabushiki Kaisha Toshiba | Laminated magnetorestrictive element of an exchange coupling film, an antiferromagnetic film and a ferromagnetic film and a magnetic disk drive using same |
| JP3212569B2 (ja) * | 1999-01-27 | 2001-09-25 | アルプス電気株式会社 | デュアルスピンバルブ型薄膜磁気素子及び薄膜磁気ヘッド及びデュアルスピンバルブ型薄膜磁気素子の製造方法 |
| US6449134B1 (en) * | 1999-08-05 | 2002-09-10 | International Business Machines Corporation | Read head with file resettable dual spin valve sensor |
| US6643103B1 (en) * | 2000-01-05 | 2003-11-04 | Seagate Technology Llc | Very high linear resolution CPP differential dual spin valve magnetoresistive head |
| US6417999B1 (en) | 2000-02-04 | 2002-07-09 | Read-Rite Corporation | Magnetoresistive head stabilized structure and method of fabrication thereof |
| US20020101689A1 (en) * | 2000-04-05 | 2002-08-01 | Xuefei Tang | High sensitivity spin valve stacks using oxygen in spacer layer deposition |
| US6538859B1 (en) * | 2000-07-31 | 2003-03-25 | International Business Machines Corporation | Giant magnetoresistive sensor with an AP-coupled low Hk free layer |
| US6680827B2 (en) * | 2000-08-07 | 2004-01-20 | Tdk Corporation | Dual spin valve CPP MR with flux guide between free layers thereof |
| JP3760095B2 (ja) * | 2000-12-14 | 2006-03-29 | 株式会社日立グローバルストレージテクノロジーズ | 2素子型再生センサ、垂直磁気記録再生用薄膜磁気ヘッド及び垂直磁気記録再生装置 |
| US6654209B2 (en) | 2001-01-10 | 2003-11-25 | Seagate Technology Llc | Low resistance lead structure for a low resistance magnetic read head |
| US6693776B2 (en) * | 2001-03-08 | 2004-02-17 | Hitachi Global Storage Technologies Netherlands B.V. | Spin valve sensor with a spin filter and specular reflector layer |
| US6650509B2 (en) * | 2001-03-20 | 2003-11-18 | Hitachi Global Storage Technologies Netherlands B.V. | Dual spin valve sensor with AP pinned layers |
| JP3563375B2 (ja) * | 2001-06-19 | 2004-09-08 | アルプス電気株式会社 | 磁気検出素子及び前記磁気検出素子を用いた薄膜磁気ヘッド |
| US6728078B2 (en) * | 2001-06-20 | 2004-04-27 | Hitachi Global Storage Technologies Netherlands B.V. | High resistance dual antiparallel (AP) pinned spin valve sensor |
-
2003
- 2003-01-23 US US10/349,552 patent/US6927948B2/en not_active Expired - Fee Related
-
2004
- 2004-01-06 JP JP2004000817A patent/JP2004227749A/ja active Pending
- 2004-01-29 CN CNB2004100078197A patent/CN100347747C/zh not_active Expired - Fee Related
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8174799B2 (en) | 2007-07-20 | 2012-05-08 | Hitachi Global Storage Technologies Netherlands B.V. | Differential magnetoresistive magnetic head |
| US8270122B2 (en) | 2008-02-14 | 2012-09-18 | Hitachi, Ltd. | Magnetic recording and reproducing device including a differential read head |
| US8570689B2 (en) | 2008-12-09 | 2013-10-29 | HGST Netherlands B.V. | Differential magnetoresistive effect head and magnetic recording/reading device |
Also Published As
| Publication number | Publication date |
|---|---|
| US6927948B2 (en) | 2005-08-09 |
| CN1551113A (zh) | 2004-12-01 |
| US20040145835A1 (en) | 2004-07-29 |
| CN100347747C (zh) | 2007-11-07 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US6667861B2 (en) | Dual/differential GMR head with a single AFM layer | |
| CN114730569B (zh) | 含不同堆叠传感器的二维磁记录读取头结构及磁盘驱动器 | |
| US6473275B1 (en) | Dual hybrid magnetic tunnel junction/giant magnetoresistive sensor | |
| JP3629449B2 (ja) | スピン・バルブ(sv)磁気抵抗センサ、磁気読取り/書込みヘッドおよびディスク・ドライブ・システム | |
| US6947264B2 (en) | Self-pinned in-stack bias structure for magnetoresistive read heads | |
| US6600638B2 (en) | Corrosion resistive GMR and MTJ sensors | |
| US6985338B2 (en) | Insulative in-stack hard bias for GMR sensor stabilization | |
| US6327122B1 (en) | Spin valve sensor having antiparallel (AP) pinned layer with high resistance and low coercivity | |
| US6927948B2 (en) | Differential CPP GMR sensor with free layers separated by metal gap layer | |
| US6259586B1 (en) | Magnetic tunnel junction sensor with AP-coupled free layer | |
| JP5816673B2 (ja) | 交換結合側面遮蔽構造を備えた面垂直電流(cpp)磁気抵抗(mr)センサ | |
| US6819530B2 (en) | Current perpendicular to the planes (CPP) sensor with free layer stabilized by current field | |
| US6295187B1 (en) | Spin valve sensor with stable antiparallel pinned layer structure exchange coupled to a nickel oxide pinning layer | |
| US20030235016A1 (en) | Stabilization structures for CPP sensor | |
| US20150287426A1 (en) | Magnetic read head having spin hall effect layer | |
| US6738237B2 (en) | AP-pinned spin valve design using very thin Pt-Mn AFM layer | |
| US6466417B1 (en) | Laminated free layer structure for a spin valve sensor | |
| JP2003152239A (ja) | 磁気抵抗効果素子、及び、それを有する読み取りヘッド並びにドライブ | |
| KR19990006435A (ko) | 자기 저항 스핀 밸브 판독 센서 및 그를 포함한 자기 헤드 및 자기 디스크 드라이브 | |
| JP3675712B2 (ja) | 磁気抵抗センサ、磁気抵抗ヘッド、および磁気記録/再生装置 | |
| US6788502B1 (en) | Co-Fe supermalloy free layer for magnetic tunnel junction heads | |
| US6724586B2 (en) | Bias structure for magnetic tunnel junction magnetoresistive sensor | |
| US7038889B2 (en) | Method and apparatus for enhanced dual spin valve giant magnetoresistance effects having second spin valve self-pinned composite layer | |
| US7196878B2 (en) | Self-pinned spin valve sensor with stress modification layers for reducing the likelihood of amplitude flip | |
| US6473278B1 (en) | Giant magnetoresistive sensor with a high resistivity free layer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20061219 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20061219 |
|
| RD02 | Notification of acceptance of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7422 Effective date: 20061219 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20071225 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20080108 |
|
| A02 | Decision of refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A02 Effective date: 20080610 |