JP2004093192A5 - - Google Patents

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Publication number
JP2004093192A5
JP2004093192A5 JP2002251244A JP2002251244A JP2004093192A5 JP 2004093192 A5 JP2004093192 A5 JP 2004093192A5 JP 2002251244 A JP2002251244 A JP 2002251244A JP 2002251244 A JP2002251244 A JP 2002251244A JP 2004093192 A5 JP2004093192 A5 JP 2004093192A5
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JP
Japan
Prior art keywords
movable member
magnetic force
insertion hole
contact
measurement
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002251244A
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English (en)
Japanese (ja)
Other versions
JP4093828B2 (ja
JP2004093192A (ja
Filing date
Publication date
Application filed filed Critical
Priority to JP2002251244A priority Critical patent/JP4093828B2/ja
Priority claimed from JP2002251244A external-priority patent/JP4093828B2/ja
Publication of JP2004093192A publication Critical patent/JP2004093192A/ja
Publication of JP2004093192A5 publication Critical patent/JP2004093192A5/ja
Application granted granted Critical
Publication of JP4093828B2 publication Critical patent/JP4093828B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2002251244A 2002-08-29 2002-08-29 測定用プローブ及び光学式測定装置 Expired - Fee Related JP4093828B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2002251244A JP4093828B2 (ja) 2002-08-29 2002-08-29 測定用プローブ及び光学式測定装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002251244A JP4093828B2 (ja) 2002-08-29 2002-08-29 測定用プローブ及び光学式測定装置

Publications (3)

Publication Number Publication Date
JP2004093192A JP2004093192A (ja) 2004-03-25
JP2004093192A5 true JP2004093192A5 (https=) 2005-10-27
JP4093828B2 JP4093828B2 (ja) 2008-06-04

Family

ID=32057884

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002251244A Expired - Fee Related JP4093828B2 (ja) 2002-08-29 2002-08-29 測定用プローブ及び光学式測定装置

Country Status (1)

Country Link
JP (1) JP4093828B2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007135857A1 (ja) * 2006-05-18 2007-11-29 Panasonic Corporation 形状測定装置用プローブ及び形状測定装置
JP4291849B2 (ja) 2006-12-20 2009-07-08 パナソニック株式会社 三次元測定プローブ
JP2008203191A (ja) * 2007-02-22 2008-09-04 Nippon Steel Materials Co Ltd 接触式形状測定器用プローブヘッド
JP5154149B2 (ja) * 2007-06-20 2013-02-27 パナソニック株式会社 三次元測定プローブ
TWI353885B (en) * 2009-06-26 2011-12-11 Primax Electronics Ltd Thickness detecting mechanism
CN103398663A (zh) * 2013-08-09 2013-11-20 昆山允可精密工业技术有限公司 一种单测头自动薄板厚度测量装置
JP5945788B2 (ja) * 2014-05-29 2016-07-05 パナソニックＩｐマネジメント株式会社 三次元形状測定装置
US11128086B2 (en) * 2018-05-11 2021-09-21 The Boeing Company Apparatus for contact insertion and retention testing
CN115247991B (zh) * 2022-07-18 2025-04-25 江西荧光磁业有限公司 一种钕铁硼永磁材料表面镀层检测装置及其检测方法

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