JP2003528737A5 - - Google Patents

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Publication number
JP2003528737A5
JP2003528737A5 JP2001545230A JP2001545230A JP2003528737A5 JP 2003528737 A5 JP2003528737 A5 JP 2003528737A5 JP 2001545230 A JP2001545230 A JP 2001545230A JP 2001545230 A JP2001545230 A JP 2001545230A JP 2003528737 A5 JP2003528737 A5 JP 2003528737A5
Authority
JP
Japan
Prior art keywords
product
components
nanomaterial
bonded product
animal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001545230A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003528737A (ja
Filing date
Publication date
Priority claimed from GBGB9929521.4A external-priority patent/GB9929521D0/en
Application filed filed Critical
Publication of JP2003528737A publication Critical patent/JP2003528737A/ja
Publication of JP2003528737A5 publication Critical patent/JP2003528737A5/ja
Pending legal-status Critical Current

Links

JP2001545230A 1999-12-15 2000-11-30 接合製品およびその製造方法 Pending JP2003528737A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
GB9929521.4 1999-12-15
GBGB9929521.4A GB9929521D0 (en) 1999-12-15 1999-12-15 Bonded products and methods of fabrication therefor
PCT/GB2000/004552 WO2001044140A1 (en) 1999-12-15 2000-11-30 Bonded products and methods of fabrication therefor

Publications (2)

Publication Number Publication Date
JP2003528737A JP2003528737A (ja) 2003-09-30
JP2003528737A5 true JP2003528737A5 (enExample) 2008-01-31

Family

ID=10866282

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001545230A Pending JP2003528737A (ja) 1999-12-15 2000-11-30 接合製品およびその製造方法

Country Status (7)

Country Link
US (2) US6832716B2 (enExample)
EP (1) EP1242334A1 (enExample)
JP (1) JP2003528737A (enExample)
AU (1) AU773042B2 (enExample)
CA (1) CA2394136C (enExample)
GB (1) GB9929521D0 (enExample)
WO (1) WO2001044140A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6717212B2 (en) * 2001-06-12 2004-04-06 Advanced Micro Devices, Inc. Leaky, thermally conductive insulator material (LTCIM) in semiconductor-on-insulator (SOI) structure
US7083694B2 (en) * 2003-04-23 2006-08-01 Integrated Materials, Inc. Adhesive of a silicon and silica composite particularly useful for joining silicon parts
JP2005183903A (ja) * 2003-12-22 2005-07-07 Rohm & Haas Electronic Materials Llc 電子デバイスおよび電子デバイスを形成する方法
JP2005183904A (ja) * 2003-12-22 2005-07-07 Rohm & Haas Electronic Materials Llc 電子部品にはんだ領域を形成する方法及びはんだ領域を有する電子部品
WO2006121870A2 (en) 2005-05-09 2006-11-16 Vesta Research, Ltd. Silicon nanosponge particles
WO2006124625A2 (en) * 2005-05-12 2006-11-23 Nanosys, Inc. Use of nanoparticles in film formation and as solder
GB0515357D0 (en) * 2005-07-27 2005-08-31 Psimedica Ltd Silicon package material
US20080003778A1 (en) * 2006-06-13 2008-01-03 Rensselaer Polytechnic Institute Low-temperature welding with nano structures
JP5621262B2 (ja) * 2010-01-12 2014-11-12 大日本印刷株式会社 Memsデバイスの製造方法
US8940616B2 (en) 2012-07-27 2015-01-27 Globalfoundries Singapore Pte. Ltd. Bonding method using porosified surfaces for making stacked structures
CN104409343A (zh) * 2014-12-03 2015-03-11 复旦大学 一种具有光学边缘的氮化硅隔膜的制备方法
US12309537B2 (en) * 2022-09-30 2025-05-20 Huawei Technologies Co., Ltd. Assemblies and methods for managing spectral hole burning

Family Cites Families (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6121112A (en) * 1905-08-29 2000-09-19 Canon Kabushiki Kaisha Fabrication method for semiconductor substrate
GB8927709D0 (en) 1989-12-07 1990-02-07 Secretary Of The State For Def Silicon quantum wires
DE4018715A1 (de) * 1990-06-12 1991-12-19 Bayer Ag Verfahren zur herstellung von metall- und/oder keramik-verbund-teilen
JPH06232236A (ja) * 1991-08-20 1994-08-19 Fujitsu Ltd 半導体装置の製造方法
DE69333152T2 (de) * 1992-01-30 2004-05-27 Canon K.K. Verfahren zur Herstellung eines Halbleitersubstrates
JP3191972B2 (ja) * 1992-01-31 2001-07-23 キヤノン株式会社 半導体基板の作製方法及び半導体基板
JP3237888B2 (ja) * 1992-01-31 2001-12-10 キヤノン株式会社 半導体基体及びその作製方法
DE4317174A1 (de) 1993-05-22 1994-11-24 Bosch Gmbh Robert Verbundsystem mit mindestens zwei anorganischen keramischen Schichten und Verfahren zu deren Herstellung
DE4342527A1 (de) * 1993-12-15 1995-06-22 Forschungszentrum Juelich Gmbh Verfahren zum elektrischen Kontaktieren von porösem Silizium
JPH07187836A (ja) * 1993-12-24 1995-07-25 Toshiba Ceramics Co Ltd レーザ光によるSi含有セラミックスの接合方法
JPH10505538A (ja) 1994-08-25 1998-06-02 キューキューシー,インコーポレイテッド ナノ規模の粒子およびその用途
DE19621144A1 (de) * 1995-05-19 1996-11-21 Hahn Meitner Inst Berlin Gmbh Halbleiterbauelement auf der Basis von Silizium mit einer porösen Schicht und Verfahren für die Herstellung poröser Siliziumschichten
GB2337255B (en) 1995-08-03 2000-03-15 Secr Defence Biomaterial
GB9611437D0 (en) 1995-08-03 1996-08-07 Secr Defence Biomaterial
US6017773A (en) * 1997-04-04 2000-01-25 University Of Rochester Stabilizing process for porous silicon and resulting light emitting device
US6064149A (en) * 1998-02-23 2000-05-16 Micron Technology Inc. Field emission device with silicon-containing adhesion layer
KR100348513B1 (ko) * 1998-09-04 2002-08-13 캐논 가부시끼가이샤 반도체기판의 제작방법
CN1160186C (zh) * 1999-06-03 2004-08-04 宾夕法尼亚州研究基金会 纳米尺度的组合物、复合结构、其制造和应用

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