JP2003518865A5 - - Google Patents

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Publication number
JP2003518865A5
JP2003518865A5 JP2001548529A JP2001548529A JP2003518865A5 JP 2003518865 A5 JP2003518865 A5 JP 2003518865A5 JP 2001548529 A JP2001548529 A JP 2001548529A JP 2001548529 A JP2001548529 A JP 2001548529A JP 2003518865 A5 JP2003518865 A5 JP 2003518865A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001548529A
Other versions
JP2003518865A (ja
Filing date
Publication date
Priority claimed from US09/473,863 external-priority patent/US6356101B1/en
Application filed filed Critical
Publication of JP2003518865A publication Critical patent/JP2003518865A/ja
Publication of JP2003518865A5 publication Critical patent/JP2003518865A5/ja
Pending legal-status Critical Current

Links

JP2001548529A 1999-12-28 2000-12-19 デジタル回路中のグリッチを低減する回路および方法 Pending JP2003518865A (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/473,863 US6356101B1 (en) 1999-12-28 1999-12-28 Glitch removal circuitry
US09/473,863 1999-12-28
PCT/US2000/034406 WO2001048925A1 (en) 1999-12-28 2000-12-19 Circuitry and method for removing glitches in digital circuits

Publications (2)

Publication Number Publication Date
JP2003518865A JP2003518865A (ja) 2003-06-10
JP2003518865A5 true JP2003518865A5 (ja) 2008-02-07

Family

ID=23881329

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001548529A Pending JP2003518865A (ja) 1999-12-28 2000-12-19 デジタル回路中のグリッチを低減する回路および方法

Country Status (5)

Country Link
US (1) US6356101B1 (ja)
EP (1) EP1243073A1 (ja)
JP (1) JP2003518865A (ja)
TW (1) TW584987B (ja)
WO (1) WO2001048925A1 (ja)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002330346A (ja) * 2001-05-02 2002-11-15 Fujitsu Ltd Ｃｍｏｓセンサ回路
JP3744867B2 (ja) * 2002-03-19 2006-02-15 株式会社半導体理工学研究センター データ保持回路
US6794908B2 (en) * 2002-05-31 2004-09-21 Honeywell International Inc. Radiation-hard circuit
US6894540B1 (en) 2003-12-17 2005-05-17 Freescale Semiconductor, Inc. Glitch removal circuit
US20060119410A1 (en) * 2004-12-06 2006-06-08 Honeywell International Inc. Pulse-rejecting circuit for suppressing single-event transients
US7193451B2 (en) * 2005-01-24 2007-03-20 Honeywell International, Inc. Method and system for reducing glitch effects within combinational logic
US20060267653A1 (en) * 2005-05-25 2006-11-30 Honeywell International Inc. Single-event-effect hardened circuitry
US7236001B2 (en) * 2005-09-02 2007-06-26 Honeywell International Inc. Redundancy circuits hardened against single event upsets
US7212056B1 (en) * 2005-10-12 2007-05-01 Honeywell International Inc. Radiation hardened latch
US20070103185A1 (en) * 2005-11-03 2007-05-10 Honeywell International Inc. Dual path redundancy with stacked transistor voting
US8115515B2 (en) * 2006-03-28 2012-02-14 Honeywell International Inc. Radiation hardened differential output buffer
US7619455B2 (en) * 2007-04-19 2009-11-17 Honeywell International Inc. Digital single event transient hardened register using adaptive hold
US9178553B2 (en) * 2012-01-31 2015-11-03 Broadcom Corporation Systems and methods for enhancing audio quality of FM receivers
US9130643B2 (en) 2012-01-31 2015-09-08 Broadcom Corporation Systems and methods for enhancing audio quality of FM receivers
US9264025B2 (en) * 2013-08-14 2016-02-16 Nanya Technology Corporation Glitch filter and filtering method
KR102433746B1 (ko) * 2015-12-30 2022-08-17 엘지디스플레이 주식회사 게이트 드라이브 ic와 이를 포함한 표시장치
WO2018189288A1 (en) * 2017-04-12 2018-10-18 Telefonaktiebolaget Lm Ericsson (Publ) Short pulse suppression for phase/frequency detector
KR20220062748A (ko) 2020-11-09 2022-05-17 삼성전자주식회사 반도체 회로

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4216388A (en) * 1978-08-07 1980-08-05 Rca Corporation Narrow pulse eliminator
JPS62231521A (ja) * 1986-03-31 1987-10-12 Nec Corp 半導体集積回路
JPS6362413A (ja) * 1986-09-02 1988-03-18 Mitsubishi Electric Corp 半導体集積回路装置
US4825102A (en) 1986-09-11 1989-04-25 Matsushita Electric Industrial Co., Ltd. MOS FET drive circuit providing protection against transient voltage breakdown
DE3708499A1 (de) * 1987-03-16 1988-10-20 Sgs Halbleiterbauelemente Gmbh Digitale gegentakt-treiberschaltung
US5019724A (en) 1989-12-20 1991-05-28 Sgs-Thomson Microelectronics, Inc. Noise tolerant input buffer
JPH04160816A (ja) * 1990-10-24 1992-06-04 Nec Ic Microcomput Syst Ltd 出力回路
JPH04192808A (ja) * 1990-11-27 1992-07-13 Olympus Optical Co Ltd 出力バッファ回路
JPH04287517A (ja) * 1991-03-18 1992-10-13 Fujitsu Ltd 半導体装置における出力バッファ
US5184032A (en) * 1991-04-25 1993-02-02 Texas Instruments Incorporated Glitch reduction in integrated circuits, systems and methods
US5198710A (en) * 1991-05-30 1993-03-30 Texas Instruments Incorporated Bi-directional digital noise glitch filter
US5367205A (en) 1993-05-13 1994-11-22 Micron Semiconductor, Inc. High speed output buffer with reduced voltage bounce and no cross current
US5440178A (en) * 1993-11-30 1995-08-08 Sgs-Thomson Microelectronics, Inc. Static test mode noise filter
US5748034A (en) * 1995-06-07 1998-05-05 Cirrus Logic, Inc. Combinational logic circuit, system and method for eliminating both positive and negative glitches
US5760612A (en) 1996-08-13 1998-06-02 Advanced Micro Devices Inc. Inertial delay circuit for eliminating glitches on a signal line
US5761612A (en) 1996-09-19 1998-06-02 Northern Telecom Limited Wireless receiver
KR100281108B1 (ko) * 1997-12-26 2001-02-01 김영환 노이즈제거장치

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