JP2003270537A5 - - Google Patents

Download PDF

Info

Publication number
JP2003270537A5
JP2003270537A5 JP2002073455A JP2002073455A JP2003270537A5 JP 2003270537 A5 JP2003270537 A5 JP 2003270537A5 JP 2002073455 A JP2002073455 A JP 2002073455A JP 2002073455 A JP2002073455 A JP 2002073455A JP 2003270537 A5 JP2003270537 A5 JP 2003270537A5
Authority
JP
Japan
Prior art keywords
optical system
optical
imaging
support
shape
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2002073455A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003270537A (ja
JP4084061B2 (ja
Filing date
Publication date
Application filed filed Critical
Priority claimed from JP2002073455A external-priority patent/JP4084061B2/ja
Priority to JP2002073455A priority Critical patent/JP4084061B2/ja
Priority to PCT/JP2002/008935 priority patent/WO2003079089A1/ja
Priority to CNB028285794A priority patent/CN100559228C/zh
Priority to EP02772834A priority patent/EP1486810B1/en
Priority to DE60232196T priority patent/DE60232196D1/de
Priority to US10/506,107 priority patent/US7307784B2/en
Publication of JP2003270537A publication Critical patent/JP2003270537A/ja
Publication of JP2003270537A5 publication Critical patent/JP2003270537A5/ja
Publication of JP4084061B2 publication Critical patent/JP4084061B2/ja
Application granted granted Critical
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

JP2002073455A 2002-03-18 2002-03-18 高安定性光学顕微鏡 Expired - Fee Related JP4084061B2 (ja)

Priority Applications (6)

Application Number Priority Date Filing Date Title
JP2002073455A JP4084061B2 (ja) 2002-03-18 2002-03-18 高安定性光学顕微鏡
DE60232196T DE60232196D1 (de) 2002-03-18 2002-09-03 Hochstabiles optisches mikroskop
CNB028285794A CN100559228C (zh) 2002-03-18 2002-09-03 高稳定性光学显微镜
EP02772834A EP1486810B1 (en) 2002-03-18 2002-09-03 High-stability optical microscope
PCT/JP2002/008935 WO2003079089A1 (fr) 2002-03-18 2002-09-03 Microscope optique a haute stabilite
US10/506,107 US7307784B2 (en) 2002-03-18 2002-09-03 High-stability optical microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002073455A JP4084061B2 (ja) 2002-03-18 2002-03-18 高安定性光学顕微鏡

Publications (3)

Publication Number Publication Date
JP2003270537A JP2003270537A (ja) 2003-09-25
JP2003270537A5 true JP2003270537A5 (https=) 2005-07-21
JP4084061B2 JP4084061B2 (ja) 2008-04-30

Family

ID=28035240

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002073455A Expired - Fee Related JP4084061B2 (ja) 2002-03-18 2002-03-18 高安定性光学顕微鏡

Country Status (6)

Country Link
US (1) US7307784B2 (https=)
EP (1) EP1486810B1 (https=)
JP (1) JP4084061B2 (https=)
CN (1) CN100559228C (https=)
DE (1) DE60232196D1 (https=)
WO (1) WO2003079089A1 (https=)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4558366B2 (ja) * 2004-03-30 2010-10-06 オリンパス株式会社 システム顕微鏡
DE102005001102B4 (de) * 2005-01-08 2021-04-29 Carl Zeiss Microscopy Gmbh Temperierbares Objektiv für Mikroskope
WO2007011844A1 (en) * 2005-07-19 2007-01-25 Physical Sciences, Inc. Side view imaging microwell array
US7854524B2 (en) * 2007-09-28 2010-12-21 Anorad Corporation High stiffness low mass supporting structure for a mirror assembly
EP2246725A3 (en) * 2009-04-30 2011-01-26 Olympus Corporation Microscope with fixed imaging unit and movable objective lens
DE202009010772U1 (de) 2009-08-11 2009-11-26 Deutsches Krebsforschungszentrum Stiftung des öffentlichen Rechts Anordnung zur Abbildungsstabilisierung
EP3358387A1 (en) 2010-08-27 2018-08-08 The Board of Trustees of The Leland Stanford Junior University Microscopy imaging device with advanced imaging properties
US9428384B2 (en) * 2011-01-18 2016-08-30 Jizhong He Inspection instrument
WO2015029032A1 (en) 2013-08-26 2015-03-05 Parasight Ltd. Digital microscopy systems, methods and computer program products
JP6849405B2 (ja) * 2016-11-14 2021-03-24 浜松ホトニクス株式会社 分光計測装置及び分光計測システム
CN108414446A (zh) * 2018-03-30 2018-08-17 广东顺德墨赛生物科技有限公司 微流控芯片荧光检测设备、方法以及装置
AU2020370212B2 (en) 2019-10-22 2025-09-25 S.D. Sight Diagnostics Ltd Accounting for errors in optical measurements
CN110888230A (zh) * 2019-11-28 2020-03-17 天津职业技术师范大学(中国职业培训指导教师进修中心) 一种智能生物显微镜
CN114787625B (zh) 2019-12-12 2026-01-13 思迪赛特诊断有限公司 检测血液样品中的血小板
BR112022011312A2 (pt) * 2019-12-12 2022-08-23 S D Sight Diagnostics Ltd Análise de um analito disposto dentro de um meio

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3259012A (en) * 1960-09-12 1966-07-05 Inv S Finance Corp Microscope having bridge type support arm for body tube and focusing mechanism
GB1260653A (en) * 1968-01-25 1972-01-19 Watson W & Sons Ltd Improvements in or relating to optical apparatus
US3830560A (en) * 1970-09-14 1974-08-20 R Onanian Microscope apparatus
JPS5524566Y2 (https=) * 1975-10-28 1980-06-12
US5317153A (en) * 1991-08-08 1994-05-31 Nikon Corporation Scanning probe microscope
JP3431309B2 (ja) * 1994-10-14 2003-07-28 オリンパス光学工業株式会社 倒立形顕微鏡用保温装置
JP2966311B2 (ja) * 1995-03-10 1999-10-25 科学技術振興事業団 顕微測光装置
DE19530136C1 (de) * 1995-08-16 1997-02-13 Leica Mikroskopie & Syst Einrichtung zur Fokusstabilisierung in einem Mikroskop
JP3221823B2 (ja) * 1995-11-24 2001-10-22 キヤノン株式会社 投影露光装置およびこれを用いた露光方法ならびに半導体製造方法
US5764409A (en) * 1996-04-26 1998-06-09 Alpha Innotech Corp Elimination of vibration by vibration coupling in microscopy applications
CN1609593B (zh) * 1996-08-16 2012-04-25 Ge保健尼亚加拉公司 用于分析井板、凝胶和斑点的数字成像系统
US6091911A (en) * 1996-08-30 2000-07-18 Nikon Corporation Microscope photographing unit with brightness control for observation optical system
JP3437406B2 (ja) * 1997-04-22 2003-08-18 キヤノン株式会社 投影露光装置
US5970260A (en) * 1997-09-10 1999-10-19 Konica Corporation Camera equipped with zoom lens
CA2243090A1 (en) * 1998-07-10 2000-01-10 Timothy M. Richardson Inverted darkfield contrast microscope and method

Similar Documents

Publication Publication Date Title
JP2003270537A5 (https=)
JPH1172715A5 (https=)
JP5646278B2 (ja) 顕微鏡アダプタユニット
CN100559228C (zh) 高稳定性光学显微镜
JP2004510198A5 (https=)
JP3365791B2 (ja) システム顕微鏡
CN111065950B (zh) 用于宽场、共焦和多光子显微镜的动态聚焦和变焦系统
JP2003043373A5 (https=)
JP6978592B2 (ja) 広領域の共焦点及び多光子顕微鏡で用いる動的フォーカス・ズームシステム
WO2009014108A1 (ja) 対物レンズ、レボルバ及びこれらを備える倒立顕微鏡
JP2009092772A (ja) 顕微鏡、培養装置
WO2002061484A1 (en) Apparatus for direct optical fiber through-lens illumination of microscopy or observational objects
JP3661276B2 (ja) 望遠機能付顕微鏡
JP4106139B2 (ja) 高解像マクロスコープ
CN220872770U (zh) 望远镜
JP2001264637A (ja) 球面収差補正光学系、球面収差補正光学装置、及び該補正光学系又は該補正装置を備える光学観察装置
US7936502B2 (en) Microscope
JPS60227214A (ja) 双眼実体顕微鏡
CN114778500A (zh) 一种高功率大视场多波段照明荧光成像系统
JP5055568B2 (ja) 位相差顕微鏡
JPH0949971A (ja) 顕微鏡
Dickensheets et al. MEMS-in-the-lens 3D beam scanner for in vivo microscopy
JP2002162570A (ja) 正立顕微鏡
RU2247419C1 (ru) Бинокулярная наблюдательная система
JPH11160627A (ja) 倒立顕微鏡