JP2003257846A - 光源ユニット、照明装置、露光装置及び露光方法 - Google Patents
光源ユニット、照明装置、露光装置及び露光方法Info
- Publication number
- JP2003257846A JP2003257846A JP2002061589A JP2002061589A JP2003257846A JP 2003257846 A JP2003257846 A JP 2003257846A JP 2002061589 A JP2002061589 A JP 2002061589A JP 2002061589 A JP2002061589 A JP 2002061589A JP 2003257846 A JP2003257846 A JP 2003257846A
- Authority
- JP
- Japan
- Prior art keywords
- light
- light source
- illumination
- wavelength
- leaked
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/7085—Detection arrangement, e.g. detectors of apparatus alignment possibly mounted on wafers, exposure dose, photo-cleaning flux, stray light, thermal load
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70058—Mask illumination systems
- G03F7/70091—Illumination settings, i.e. intensity distribution in the pupil plane or angular distribution in the field plane; On-axis or off-axis settings, e.g. annular, dipole or quadrupole settings; Partial coherence control, i.e. sigma or numerical aperture [NA]
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Engineering & Computer Science (AREA)
- Environmental & Geological Engineering (AREA)
- Epidemiology (AREA)
- Public Health (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002061589A JP2003257846A (ja) | 2002-03-07 | 2002-03-07 | 光源ユニット、照明装置、露光装置及び露光方法 |
TW092101775A TW200303970A (en) | 2002-03-07 | 2003-01-28 | Light source unit, lighting device, exposure device and exposure method |
KR10-2003-0013970A KR20030074264A (ko) | 2002-03-07 | 2003-03-06 | 광원 유닛, 조명 장치, 노광 장치 및 노광 방법 |
CN03107145A CN1444099A (zh) | 2002-03-07 | 2003-03-07 | 光源元件、照明装置、曝光装置及曝光方法 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002061589A JP2003257846A (ja) | 2002-03-07 | 2002-03-07 | 光源ユニット、照明装置、露光装置及び露光方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2003257846A true JP2003257846A (ja) | 2003-09-12 |
JP2003257846A5 JP2003257846A5 (zh) | 2006-06-29 |
Family
ID=28034835
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2002061589A Pending JP2003257846A (ja) | 2002-03-07 | 2002-03-07 | 光源ユニット、照明装置、露光装置及び露光方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP2003257846A (zh) |
KR (1) | KR20030074264A (zh) |
CN (1) | CN1444099A (zh) |
TW (1) | TW200303970A (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012208351A (ja) * | 2011-03-30 | 2012-10-25 | Orc Manufacturing Co Ltd | 測光装置および露光装置 |
JPWO2019146448A1 (ja) * | 2018-01-24 | 2021-01-07 | 株式会社ニコン | 露光装置及び露光方法 |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7573019B2 (en) * | 2004-06-18 | 2009-08-11 | Nikon Corporation | Light detecting apparatus, illumination optical apparatus, exposure apparatus and exposure method |
NL2009020A (en) * | 2011-07-22 | 2013-01-24 | Asml Netherlands Bv | Radiation source, method of controlling a radiation source, lithographic apparatus, and method for manufacturing a device. |
KR101946830B1 (ko) | 2017-10-19 | 2019-02-12 | 주식회사 한진엔지니어링 | 발전소 바텀애쉬와 질석을 포함하는 건축 내장재 보드의 제조방법 |
-
2002
- 2002-03-07 JP JP2002061589A patent/JP2003257846A/ja active Pending
-
2003
- 2003-01-28 TW TW092101775A patent/TW200303970A/zh unknown
- 2003-03-06 KR KR10-2003-0013970A patent/KR20030074264A/ko not_active Application Discontinuation
- 2003-03-07 CN CN03107145A patent/CN1444099A/zh active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012208351A (ja) * | 2011-03-30 | 2012-10-25 | Orc Manufacturing Co Ltd | 測光装置および露光装置 |
JPWO2019146448A1 (ja) * | 2018-01-24 | 2021-01-07 | 株式会社ニコン | 露光装置及び露光方法 |
JP2022051810A (ja) * | 2018-01-24 | 2022-04-01 | 株式会社ニコン | 露光装置および露光方法 |
Also Published As
Publication number | Publication date |
---|---|
TW200303970A (en) | 2003-09-16 |
CN1444099A (zh) | 2003-09-24 |
KR20030074264A (ko) | 2003-09-19 |
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Legal Events
Date | Code | Title | Description |
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A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20050222 |
|
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