JP2003139507A - サブミクロン精度のエッジ検出器 - Google Patents

サブミクロン精度のエッジ検出器

Info

Publication number
JP2003139507A
JP2003139507A JP2002231314A JP2002231314A JP2003139507A JP 2003139507 A JP2003139507 A JP 2003139507A JP 2002231314 A JP2002231314 A JP 2002231314A JP 2002231314 A JP2002231314 A JP 2002231314A JP 2003139507 A JP2003139507 A JP 2003139507A
Authority
JP
Japan
Prior art keywords
light
detector
fiber
edge
optical
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
JP2002231314A
Other languages
English (en)
Japanese (ja)
Other versions
JP2003139507A5 (enExample
Inventor
Edward Steketee
エドワード・ステケティー
John Bernard Medberry
ジョン・バーナード・メドベリー
Benno Guggenheimer
ベンノ・グゲンハイマー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Agilent Technologies Inc
Original Assignee
Agilent Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Agilent Technologies Inc filed Critical Agilent Technologies Inc
Publication of JP2003139507A publication Critical patent/JP2003139507A/ja
Publication of JP2003139507A5 publication Critical patent/JP2003139507A5/ja
Withdrawn legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/028—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring lateral position of a boundary of the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V8/00—Prospecting or detecting by optical means
    • G01V8/10—Detecting, e.g. by using light barriers
    • G01V8/12—Detecting, e.g. by using light barriers using one transmitter and one receiver
    • G01V8/16—Detecting, e.g. by using light barriers using one transmitter and one receiver using optical fibres

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Geophysics And Detection Of Objects (AREA)
  • Optical Couplings Of Light Guides (AREA)
JP2002231314A 2001-08-22 2002-08-08 サブミクロン精度のエッジ検出器 Withdrawn JP2003139507A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/935,018 US6806484B2 (en) 2001-08-22 2001-08-22 Sub-micron accuracy edge detector
US09/935018 2001-09-28

Publications (2)

Publication Number Publication Date
JP2003139507A true JP2003139507A (ja) 2003-05-14
JP2003139507A5 JP2003139507A5 (enExample) 2005-11-04

Family

ID=25466456

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2002231314A Withdrawn JP2003139507A (ja) 2001-08-22 2002-08-08 サブミクロン精度のエッジ検出器

Country Status (2)

Country Link
US (2) US6806484B2 (enExample)
JP (1) JP2003139507A (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012159498A (ja) * 2011-01-12 2012-08-23 Canon Inc 変位測定装置、変位測定方法、光学用部材成形用金型の製造方法及び光学用部材

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6806484B2 (en) * 2001-08-22 2004-10-19 Agilent Technologies, Inc. Sub-micron accuracy edge detector
SE0202505D0 (sv) * 2002-08-23 2002-08-23 Micronic Laser Systems Ab Method for aligning a substrate on a stage
WO2008060955A2 (en) * 2006-11-09 2008-05-22 The Board Of Regents For Oklahoma State University Fiber optic web edge sensor
US20090182454A1 (en) * 2008-01-14 2009-07-16 Bernardo Donoso Method and apparatus for self-calibration of a substrate handling robot
AT511200B1 (de) * 2011-10-20 2012-10-15 Isiqiri Interface Tech Gmbh Echtzeitmessung von relativen positionsdaten und/oder von geometrischen massen eines bewegten körpers unter verwendung optischer messmittel
US9138905B2 (en) * 2013-02-22 2015-09-22 Valmet Technologies, Inc. Method for calibrating the position of the slitter blades of a slitter-winder
GB2541689B (en) 2015-08-26 2020-04-15 Rolls Royce Plc Apparatus and methods for determining location of at least a part of an object
EP3670052B1 (en) * 2018-08-10 2021-11-17 Yamazaki Mazak Corporation Gear phase detection method, gear production method, workpiece edge position detection method, and gear phase-detecting machine tool
FR3088422B1 (fr) * 2018-11-14 2021-07-09 Ifotec Detecteur de position, dispositif de detection d’ouverture de porte et procede associe
CN111521116A (zh) * 2020-05-25 2020-08-11 广州冠粤路桥检测有限公司 一种交安设施激光投影检测装置及检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5187375A (en) 1990-12-11 1993-02-16 Texas Instruments Incorporated Optical object edge detector using partially covered reference sensor
US5389795A (en) * 1991-02-11 1995-02-14 Rye; Timothy W. Method and apparatus for directing air and optical signals to detect edge cracks and other absences of product
US5389789A (en) * 1992-05-20 1995-02-14 Union Camp Corporation Portable edge crack detector for detecting size and shape of a crack and a portable edge detector
US6624433B2 (en) * 1994-02-22 2003-09-23 Nikon Corporation Method and apparatus for positioning substrate and the like
US6201559B1 (en) * 1996-12-19 2001-03-13 Minolta Co., Ltd. Method for measuring the quantity of light emergent from an optical tip array and image forming apparatus provided with an optical tip array
US5796097A (en) * 1997-03-05 1998-08-18 California Lightwave Laboratories, Inc. Chemical sensor and method
US6256555B1 (en) * 1998-12-02 2001-07-03 Newport Corporation Robot arm with specimen edge gripping end effector
US6806484B2 (en) * 2001-08-22 2004-10-19 Agilent Technologies, Inc. Sub-micron accuracy edge detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012159498A (ja) * 2011-01-12 2012-08-23 Canon Inc 変位測定装置、変位測定方法、光学用部材成形用金型の製造方法及び光学用部材

Also Published As

Publication number Publication date
US20030042441A1 (en) 2003-03-06
US6765223B2 (en) 2004-07-20
US20030063294A1 (en) 2003-04-03
US6806484B2 (en) 2004-10-19

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