JP2002534675A5 - - Google Patents
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- Publication number
- JP2002534675A5 JP2002534675A5 JP2000592621A JP2000592621A JP2002534675A5 JP 2002534675 A5 JP2002534675 A5 JP 2002534675A5 JP 2000592621 A JP2000592621 A JP 2000592621A JP 2000592621 A JP2000592621 A JP 2000592621A JP 2002534675 A5 JP2002534675 A5 JP 2002534675A5
- Authority
- JP
- Japan
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE19900346A DE19900346A1 (de) | 1999-01-07 | 1999-01-07 | Präzisions-Probendrehvorrichtung |
| DE19900346.7 | 1999-01-07 | ||
| PCT/EP2000/000088 WO2000040952A2 (de) | 1999-01-07 | 2000-01-07 | Präzisions-probendrehvorrichtung |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002534675A JP2002534675A (ja) | 2002-10-15 |
| JP2002534675A5 true JP2002534675A5 (enExample) | 2007-03-15 |
| JP5346421B2 JP5346421B2 (ja) | 2013-11-20 |
Family
ID=7893714
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000592621A Expired - Lifetime JP5346421B2 (ja) | 1999-01-07 | 2000-01-07 | 試料分析システムの光学装置及び試料位置の検出方法 |
Country Status (10)
| Country | Link |
|---|---|
| US (2) | US6621085B1 (enExample) |
| EP (2) | EP1464950A3 (enExample) |
| JP (1) | JP5346421B2 (enExample) |
| AT (1) | ATE279721T1 (enExample) |
| AU (1) | AU2106500A (enExample) |
| DE (2) | DE19900346A1 (enExample) |
| DK (1) | DK1144988T3 (enExample) |
| ES (1) | ES2225079T3 (enExample) |
| PT (1) | PT1144988E (enExample) |
| WO (1) | WO2000040952A2 (enExample) |
Families Citing this family (14)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19900346A1 (de) * | 1999-01-07 | 2000-07-13 | Europ Lab Molekularbiolog | Präzisions-Probendrehvorrichtung |
| US6404849B1 (en) * | 1999-08-11 | 2002-06-11 | Abbott Laboratories | Automated sample handling for X-ray crystallography |
| GB0222334D0 (en) * | 2001-10-04 | 2002-10-30 | X Ray Res Gmbh | Automatic adjusting method for a goniometer and associated device |
| WO2003050598A2 (en) * | 2001-12-12 | 2003-06-19 | The Regents Of The University Of California | Integrated crystal mounting and alignment system for high-throughput biological crystallography |
| DE10336110B4 (de) * | 2003-08-06 | 2008-01-03 | Proteros Biostructures Gmbh | Vorrichtung und Verfahren zum Behandeln eines Proteinkristalls |
| JP5096747B2 (ja) * | 2006-03-02 | 2012-12-12 | 株式会社神戸製鋼所 | ビーム検出部材およびそれを用いたビーム検出器 |
| DE102009018570B4 (de) * | 2009-04-24 | 2018-12-20 | Carl Zeiss Industrielle Messtechnik Gmbh | Computertomograph mit einer Werkstückauflage zur Lagerung eines Werkstückes |
| JP6108674B2 (ja) * | 2012-03-16 | 2017-04-05 | 株式会社日立ハイテクサイエンス | 荷電粒子ビーム装置及び試料搬送装置 |
| US9613728B2 (en) * | 2013-03-15 | 2017-04-04 | Proto Manufacturing Ltd. | X-ray diffraction apparatus and method |
| DE102015118017B4 (de) * | 2015-10-22 | 2017-06-08 | Gsi Helmholtzzentrum Für Schwerionenforschung Gmbh | Drehmodul für eine Beschleunigeranlage |
| NL2026054B1 (en) * | 2020-07-13 | 2022-03-15 | Delmic Ip B V | Method and apparatus for micromachining a sample using a Focused Ion Beam |
| DE102020122517B4 (de) * | 2020-08-28 | 2022-06-09 | Helmholtz-Zentrum Berlin für Materialien und Energie Gesellschaft mit beschränkter Haftung | Vorrichtung zur Rotation einer Probe um zwei orthogonale Achsen |
| JP7559621B2 (ja) * | 2021-03-03 | 2024-10-02 | 株式会社島津製作所 | Ｘ線分析装置およびｘ線分析方法 |
| CN113877699B (zh) * | 2021-09-28 | 2024-01-23 | 上海金自天正信息技术有限公司 | 自动破碎装置 |
Family Cites Families (24)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH595945A5 (enExample) * | 1975-06-06 | 1978-02-28 | Robert Habib | |
| CA1257714A (en) * | 1985-11-12 | 1989-07-18 | Michael Goldowsky | Goniometer |
| DE3546095A1 (de) * | 1985-12-24 | 1987-06-25 | Zeiss Carl Fa | Goniometertisch |
| US4821303A (en) * | 1986-12-05 | 1989-04-11 | The Dow Chemical Company | Combined thermal analyzer and x-ray diffractometer |
| JP2533169B2 (ja) * | 1988-07-14 | 1996-09-11 | 株式会社東芝 | Ｘ線回折装置 |
| JPH0235343A (ja) * | 1988-07-26 | 1990-02-05 | Rigaku Corp | 微小領域ｘ線回折装置及びその試料セッティング方法 |
| JP2857406B2 (ja) * | 1989-03-10 | 1999-02-17 | 住友重機械工業株式会社 | 荷電粒子ビームモニタ |
| JPH02248899A (ja) * | 1989-03-22 | 1990-10-04 | Nippon Steel Corp | Ｘ線の拡大・単色化装置及びこの装置を利用したｘ線ｃｔ装置 |
| JPH06100677B2 (ja) * | 1989-05-26 | 1994-12-12 | 株式会社島津製作所 | Ｘ線回折装置 |
| JPH0390845A (ja) * | 1989-09-01 | 1991-04-16 | Hitachi Ltd | 表面分析方法およびその装置 |
| JPH03216537A (ja) * | 1990-01-22 | 1991-09-24 | Rigaku Corp | 中性子回折装置のダイレクトビームストッパ位置調節装置 |
| US5434901A (en) * | 1992-12-07 | 1995-07-18 | Olympus Optical Co., Ltd. | Soft X-ray microscope |
| JPH0738989U (ja) * | 1993-12-22 | 1995-07-14 | アロカ株式会社 | 放射線ビーム位置決め装置 |
| US6091796A (en) * | 1994-11-23 | 2000-07-18 | Thermotrex Corporation | Scintillator based microscope |
| JP3468623B2 (ja) * | 1995-08-08 | 2003-11-17 | 理学電機株式会社 | Ｘ線回折装置の光学系切換装置 |
| US5786600A (en) * | 1995-12-19 | 1998-07-28 | Eastman Kodak Company | (Barium hafnate:Ti, Ce, Pb) phosphors phosphor screens and phosphor preparation methods |
| JP3263920B2 (ja) * | 1996-02-01 | 2002-03-11 | 日本電子株式会社 | 電子顕微鏡用試料作成装置および方法 |
| US5912939A (en) * | 1997-02-07 | 1999-06-15 | Hirsch; Gregory | Soft x-ray microfluoroscope |
| DE19726884C1 (de) * | 1997-06-24 | 1998-10-15 | Fraunhofer Ges Forschung | Fiberoptische Röntgenkamera |
| US5898179A (en) * | 1997-09-10 | 1999-04-27 | Orion Equipment, Inc. | Method and apparatus for controlling a workpiece in a vacuum chamber |
| JPH11248651A (ja) * | 1998-03-04 | 1999-09-17 | Canon Inc | 微小領域ｘ線回折装置 |
| US6269144B1 (en) * | 1998-03-04 | 2001-07-31 | William P. Dube | Method and apparatus for diffraction measurement using a scanning x-ray source |
| DE19900346A1 (de) * | 1999-01-07 | 2000-07-13 | Europ Lab Molekularbiolog | Präzisions-Probendrehvorrichtung |
| US6567497B2 (en) * | 2001-04-20 | 2003-05-20 | Lockheed Martin Corporation | Method and apparatus for inspecting a structure using X-rays |
-
1999
- 1999-01-07 DE DE19900346A patent/DE19900346A1/de not_active Withdrawn
-
2000
- 2000-01-07 US US09/868,646 patent/US6621085B1/en not_active Expired - Lifetime
- 2000-01-07 DE DE2000508227 patent/DE50008227D1/de not_active Expired - Lifetime
- 2000-01-07 EP EP04016152A patent/EP1464950A3/de not_active Withdrawn
- 2000-01-07 JP JP2000592621A patent/JP5346421B2/ja not_active Expired - Lifetime
- 2000-01-07 PT PT00901074T patent/PT1144988E/pt unknown
- 2000-01-07 EP EP00901074A patent/EP1144988B1/de not_active Expired - Lifetime
- 2000-01-07 WO PCT/EP2000/000088 patent/WO2000040952A2/de not_active Ceased
- 2000-01-07 AU AU21065/00A patent/AU2106500A/en not_active Abandoned
- 2000-01-07 ES ES00901074T patent/ES2225079T3/es not_active Expired - Lifetime
- 2000-01-07 DK DK00901074T patent/DK1144988T3/da active
- 2000-01-07 AT AT00901074T patent/ATE279721T1/de not_active IP Right Cessation
-
2003
- 2003-07-22 US US10/623,739 patent/US6927399B2/en not_active Expired - Lifetime