JP2002500373A5 - - Google Patents

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JP2002500373A5
JP2002500373A5 JP2000527355A JP2000527355A JP2002500373A5 JP 2002500373 A5 JP2002500373 A5 JP 2002500373A5 JP 2000527355 A JP2000527355 A JP 2000527355A JP 2000527355 A JP2000527355 A JP 2000527355A JP 2002500373 A5 JP2002500373 A5 JP 2002500373A5
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JP
Japan
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JP2000527355A
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JP2002500373A (ja
JP4271371B2 (ja
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Priority claimed from PCT/US1999/000088 external-priority patent/WO1999034920A1/en
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JP2000527355A 1998-01-12 1999-01-05 微量分析方法及び装置 Expired - Lifetime JP4271371B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US7117998P 1998-01-12 1998-01-12
US60/071,179 1998-01-12
PCT/US1999/000088 WO1999034920A1 (en) 1998-01-12 1999-01-05 Method and apparatus for performing microassays

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2007326956A Division JP4448166B2 (ja) 1998-01-12 2007-12-19 微量分析方法及び装置

Publications (3)

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JP2002500373A JP2002500373A (ja) 2002-01-08
JP2002500373A5 true JP2002500373A5 (ja) 2008-02-28
JP4271371B2 JP4271371B2 (ja) 2009-06-03

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JP2000527355A Expired - Lifetime JP4271371B2 (ja) 1998-01-12 1999-01-05 微量分析方法及び装置
JP2007326956A Expired - Lifetime JP4448166B2 (ja) 1998-01-12 2007-12-19 微量分析方法及び装置
JP2009141991A Expired - Lifetime JP4668334B2 (ja) 1998-01-12 2009-06-15 微量分析方法及び装置

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Application Number Title Priority Date Filing Date
JP2007326956A Expired - Lifetime JP4448166B2 (ja) 1998-01-12 2007-12-19 微量分析方法及び装置
JP2009141991A Expired - Lifetime JP4668334B2 (ja) 1998-01-12 2009-06-15 微量分析方法及び装置

Country Status (9)

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US (6) US6387331B1 (ja)
EP (3) EP1714699B1 (ja)
JP (3) JP4271371B2 (ja)
AT (2) ATE477850T1 (ja)
AU (1) AU2102699A (ja)
CA (1) CA2316912C (ja)
DE (2) DE69942697D1 (ja)
ES (1) ES2350702T3 (ja)
WO (1) WO1999034920A1 (ja)

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