JP2002141016A5 - - Google Patents

Download PDF

Info

Publication number
JP2002141016A5
JP2002141016A5 JP2001268393A JP2001268393A JP2002141016A5 JP 2002141016 A5 JP2002141016 A5 JP 2002141016A5 JP 2001268393 A JP2001268393 A JP 2001268393A JP 2001268393 A JP2001268393 A JP 2001268393A JP 2002141016 A5 JP2002141016 A5 JP 2002141016A5
Authority
JP
Japan
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP2001268393A
Other versions
JP2002141016A (ja
JP5250166B2 (ja
Filing date
Publication date
Priority claimed from GBGB0021902.2A external-priority patent/GB0021902D0/en
Application filed filed Critical
Publication of JP2002141016A publication Critical patent/JP2002141016A/ja
Publication of JP2002141016A5 publication Critical patent/JP2002141016A5/ja
Application granted granted Critical
Publication of JP5250166B2 publication Critical patent/JP5250166B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

JP2001268393A 2000-09-06 2001-09-05 Ｔｏｆ質量分析計用のイオン光学システム Expired - Lifetime JP5250166B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0021902.2A GB0021902D0 (en) 2000-09-06 2000-09-06 Ion optics system for TOF mass spectrometer
GB0021902.2 2000-09-06

Publications (3)

Publication Number Publication Date
JP2002141016A JP2002141016A (ja) 2002-05-17
JP2002141016A5 true JP2002141016A5 (ja) 2008-09-11
JP5250166B2 JP5250166B2 (ja) 2013-07-31

Family

ID=9898981

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001268393A Expired - Lifetime JP5250166B2 (ja) 2000-09-06 2001-09-05 Ｔｏｆ質量分析計用のイオン光学システム

Country Status (4)

Country Link
US (2) US6888129B2 (ja)
EP (1) EP1220288B1 (ja)
JP (1) JP5250166B2 (ja)
GB (2) GB0021902D0 (ja)

Families Citing this family (31)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer
US6818887B2 (en) * 2002-11-25 2004-11-16 DRäGERWERK AKTIENGESELLSCHAFT Reflector for a time-of-flight mass spectrometer
US7157701B2 (en) * 2004-05-20 2007-01-02 Mississippi State University Research And Technology Corporation Compact time-of-flight mass spectrometer
US7067802B1 (en) * 2005-02-11 2006-06-27 Thermo Finnigan Llc Generation of combination of RF and axial DC electric fields in an RF-only multipole
US7351959B2 (en) * 2005-05-13 2008-04-01 Applera Corporation Mass analyzer systems and methods for their operation
US7385186B2 (en) * 2005-05-13 2008-06-10 Applera Corporation Methods of operating ion optics for mass spectrometry
US7405396B2 (en) * 2005-05-13 2008-07-29 Applera Corporation Sample handling mechanisms and methods for mass spectrometry
GB2462065B (en) 2008-07-17 2013-03-27 Kratos Analytical Ltd TOF mass spectrometer for stigmatic imaging and associated method
CA2755661C (en) * 2009-03-27 2017-09-26 Dh Technologies Development Pte. Ltd. Heated time of flight source
JP5403509B2 (ja) * 2009-04-17 2014-01-29 国立大学法人大阪大学 イオン源および質量分析装置
US8093565B2 (en) * 2010-01-28 2012-01-10 The United States of America as represented by the Adminstrator of the National Aeromautics and Space Administration Wind and temperature spectrometer with crossed small-deflection energy analyzer
EP2569800A4 (en) * 2010-05-11 2017-01-18 DH Technologies Development Pte. Ltd. An ion lens for reducing contaminant effects in an ion guide of a mass spectrometer
GB2486628B (en) * 2010-08-02 2016-05-25 Kratos Analytical Ltd Methods and apparatuses for cleaning at least one surface of an ion source
WO2013051321A1 (ja) * 2011-10-03 2013-04-11 株式会社島津製作所 飛行時間型質量分析装置
JP2013101918A (ja) 2011-10-13 2013-05-23 Canon Inc 質量分析装置
GB201118270D0 (en) * 2011-10-21 2011-12-07 Shimadzu Corp TOF mass analyser with improved resolving power
JP6053919B2 (ja) * 2012-05-31 2016-12-27 シーメンス アクチエンゲゼルシヤフトＳｉｅｍｅｎｓ Ａｋｔｉｅｎｇｅｓｅｌｌｓｃｈａｆｔ 荷電粒子を偏向させる偏向板および偏向装置
GB2533608B (en) 2014-12-23 2019-08-28 Kratos Analytical Ltd A time of flight mass spectrometer
CN107895684B (zh) * 2017-12-14 2024-03-26 广州禾信康源医疗科技有限公司 离子源及质谱仪
GB2576077B (en) 2018-05-31 2021-12-01 Micromass Ltd Mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
US11373849B2 (en) 2018-05-31 2022-06-28 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201810824D0 (en) 2018-06-01 2018-08-15 Micromass Ltd An outer source assembly and associated components
GB2625377A (en) * 2022-12-16 2024-06-19 Thermo Fisher Scient Bremen Gmbh Interface Ion guide

Family Cites Families (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR1580234A (ja) * 1968-05-15 1969-09-05
DE2739828C2 (de) * 1977-09-03 1986-07-03 Gesellschaft für Strahlen- und Umweltforschung mbH, 8000 München Einrichtung zur Analyse von Proben
JPS6220231A (ja) * 1985-07-18 1987-01-28 Seiko Instr & Electronics Ltd Ｉｃｐ質量分析装置
US4864130A (en) * 1986-06-04 1989-09-05 Arch Development Corporation Photo ion spectrometer
DE3718244A1 (de) * 1987-05-30 1988-12-08 Grix Raimund Speicherionenquelle fuer flugzeit-massenspektrometer
GB2236186B (en) * 1989-08-22 1994-01-05 Finnigan Mat Gmbh Process and device for laser desorption of analyte molecular ions, especially of biomolecules
GB2250858B (en) * 1990-10-22 1994-11-30 Kratos Analytical Ltd Charged particle extraction arrangement
DE4220802A1 (de) 1992-06-25 1994-01-05 Bosch Gmbh Robert Vorrichtung zum Auflöten von Bauelementen auf Platinen
DE4322102C2 (de) * 1993-07-02 1995-08-17 Bergmann Thorald Flugzeit-Massenspektrometer mit Gasphasen-Ionenquelle
JPH10501095A (ja) * 1994-05-31 1998-01-27 ユニバーシティ オブ ワーウィック タンデム質量分析
US5495108A (en) * 1994-07-11 1996-02-27 Hewlett-Packard Company Orthogonal ion sampling for electrospray LC/MS
JP3549005B2 (ja) 1994-08-31 2004-08-04 株式会社トプコン 電界放出型電子銃
JPH08148116A (ja) * 1994-11-18 1996-06-07 Hitachi Ltd 顕微レーザ飛行時間型質量分析計
US5614711A (en) * 1995-05-04 1997-03-25 Indiana University Foundation Time-of-flight mass spectrometer
DE19520276C2 (de) * 1995-06-02 1999-08-26 Bruker Daltonik Gmbh Vorrichtung für die Einführung von Ionen in ein Massenspektrometer
US5742049A (en) 1995-12-21 1998-04-21 Bruker-Franzen Analytik Gmbh Method of improving mass resolution in time-of-flight mass spectrometry
JP3424431B2 (ja) * 1996-03-29 2003-07-07 株式会社日立製作所 質量分析装置
US5777325A (en) * 1996-05-06 1998-07-07 Hewlett-Packard Company Device for time lag focusing time-of-flight mass spectrometry
JP3643917B2 (ja) * 1996-05-17 2005-04-27 株式会社ルネサステクノロジ 顕微レーザ質量分析計
JPH09326243A (ja) * 1996-06-05 1997-12-16 Shimadzu Corp Ｍａｌｄｉ−ｔｏｆ質量分析装置
JPH10172506A (ja) * 1997-09-19 1998-06-26 United States Department Of Energ フォトイオン分光計
GB9807915D0 (en) * 1998-04-14 1998-06-10 Shimadzu Res Lab Europe Ltd Apparatus for production and extraction of charged particles
US5965884A (en) * 1998-06-04 1999-10-12 The Regents Of The University Of California Atmospheric pressure matrix assisted laser desorption
WO2000017909A1 (en) * 1998-09-23 2000-03-30 Varian Australia Pty Ltd Ion optical system for a mass spectrometer
GB0021902D0 (en) * 2000-09-06 2000-10-25 Kratos Analytical Ltd Ion optics system for TOF mass spectrometer

Similar Documents

Publication Publication Date Title
BE2022C531I2 (ja)
BE2022C502I2 (ja)
BE2022C547I2 (ja)
BE2017C056I2 (ja)
BE2017C051I2 (ja)
BE2017C032I2 (ja)
BE2016C051I2 (ja)
BE2015C046I2 (ja)
BE2014C052I2 (ja)
BE2014C036I2 (ja)
BE2014C026I2 (ja)
BE2017C050I2 (ja)
BE2014C004I2 (ja)
BE2014C006I2 (ja)
BE2011C034I2 (ja)
BE2007C047I2 (ja)
AU2002307149A8 (ja)
BRPI0209186B1 (ja)
BE2016C021I2 (ja)
BE2014C008I2 (ja)
BRPI0204884A2 (ja)
CH1379220H1 (ja)
BE2017C059I2 (ja)
BRPI0101486B8 (ja)
BE2012C051I2 (ja)