JP2002122519A - 表面清浄度測定方法及び表面清浄度を測定する装置 - Google Patents

表面清浄度測定方法及び表面清浄度を測定する装置

Info

Publication number
JP2002122519A
JP2002122519A JP2001156215A JP2001156215A JP2002122519A JP 2002122519 A JP2002122519 A JP 2002122519A JP 2001156215 A JP2001156215 A JP 2001156215A JP 2001156215 A JP2001156215 A JP 2001156215A JP 2002122519 A JP2002122519 A JP 2002122519A
Authority
JP
Japan
Prior art keywords
component
smear
wiping
target surface
body portion
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2001156215A
Other languages
English (en)
Japanese (ja)
Other versions
JP2002122519A5 (cg-RX-API-DMAC7.html
Inventor
Mark Stewart Schroder
マーク・スチューアド・スクローダー
Donald E Woodmansee
ドナルド・アーネスト・ウッドマンシー
Douglas Frank Beadie
ダグラス・フランク・ビーディー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2002122519A publication Critical patent/JP2002122519A/ja
Publication of JP2002122519A5 publication Critical patent/JP2002122519A5/ja
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/94—Investigating contamination, e.g. dust
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/28—Measuring arrangements characterised by the use of mechanical techniques for measuring roughness or irregularity of surfaces
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B08—CLEANING
    • B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B1/00—Cleaning by methods involving the use of tools
    • B08B1/10—Cleaning by methods involving the use of tools characterised by the type of cleaning tool
    • B08B1/14—Wipes; Absorbent members, e.g. swabs or sponges
    • B08B1/143—Wipes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00—Sampling; Preparing specimens for investigation
    • G01N1/02—Devices for withdrawing samples
    • G01N2001/028—Sampling from a surface, swabbing, vaporising

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2001156215A 2000-09-26 2001-05-25 表面清浄度測定方法及び表面清浄度を測定する装置 Pending JP2002122519A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/669574 2000-09-26
US09/669,574 US6397690B1 (en) 2000-09-26 2000-09-26 Tools for measuring surface cleanliness

Publications (2)

Publication Number Publication Date
JP2002122519A true JP2002122519A (ja) 2002-04-26
JP2002122519A5 JP2002122519A5 (cg-RX-API-DMAC7.html) 2008-07-10

Family

ID=24686863

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001156215A Pending JP2002122519A (ja) 2000-09-26 2001-05-25 表面清浄度測定方法及び表面清浄度を測定する装置

Country Status (5)

Country Link
US (2) US6397690B1 (cg-RX-API-DMAC7.html)
EP (1) EP1191323A3 (cg-RX-API-DMAC7.html)
JP (1) JP2002122519A (cg-RX-API-DMAC7.html)
KR (1) KR100779279B1 (cg-RX-API-DMAC7.html)
CZ (1) CZ20011861A3 (cg-RX-API-DMAC7.html)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009053189A (ja) * 2007-08-10 2009-03-12 Tongfang Nuctech Co Ltd 試料採取用スワイプの変形を防止する携帯型試料採取装置および試料を採取する方法
JP2016070861A (ja) * 2014-10-01 2016-05-09 三浦工業株式会社 試料採取ペン
JP2020173146A (ja) * 2019-04-10 2020-10-22 株式会社エルメックス 拭き取り枠

Families Citing this family (30)

* Cited by examiner, † Cited by third party
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US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness
US7144427B2 (en) * 2002-12-05 2006-12-05 Depuy Products, Inc. Apparatus and method for advancing synovial fluid in a prosthetic joint
GB2426334A (en) * 2005-05-20 2006-11-22 Orion Diagnostica Oy Application of a reagent to a matrix material
US20070192979A1 (en) * 2005-05-31 2007-08-23 Knopow Jeremy F Cleaning implement having a visual indicator for determining debris removal effectiveness and end of useful life
US8011050B2 (en) * 2005-05-31 2011-09-06 S.C. Johnson & Son, Inc. Fabric sweeper
CN101470051A (zh) * 2007-12-29 2009-07-01 同方威视技术股份有限公司 擦拭采样组件
FR2927168B1 (fr) * 2008-02-01 2012-10-19 Ctip Conseil Table representant differentes nuances de gris notees de 0 a 9 permettant de noter par comparaison un prelevement realise sur un tissu ou papier blanc dans le but de quantifier un niveau de proprete de surfaces
US20100050354A1 (en) * 2008-02-28 2010-03-04 Neavin Timothy S Instrument for cleaning surgical instruments during surgery
DE102008059112A1 (de) * 2008-11-26 2010-06-17 Eads Deutschland Gmbh Probensammler und Probensammeleinrichtung für eine Analyseeinrichtung sowie Verfahren zu dessen Betrieb
CA2696647A1 (en) * 2009-03-17 2010-09-17 The Procter & Gamble Company Demonstrative methods for paper towel products
IT1394043B1 (it) * 2009-03-25 2012-05-25 Dussmann Service S R L Metodo di misurazione della pulizia di un ambiente
US8397554B2 (en) * 2010-01-22 2013-03-19 The Procter & Gamble Company Method of testing softness attributes of paper towel products
USD689660S1 (en) 2010-06-24 2013-09-10 S.C. Johnson & Son, Inc. Fabric sweeper
USD657573S1 (en) 2010-07-02 2012-04-17 S.C. Johnson & Son, Inc. Lid for a fabric sweeper device
EP2410317A1 (de) * 2010-07-13 2012-01-25 Krämer AG Bassersdorf Verfahren zum Beurteilen von an einem Körper anhaftenden Partikeln
CN102095599A (zh) * 2010-10-12 2011-06-15 上海宏力半导体制造有限公司 机械手臂表面金属污染检测方法
CN103282512B (zh) * 2010-12-28 2016-09-21 萨尼根有限公司 用非接触式划分系统从固体表面收集微生物样品的方法以及用于划分固体表面的装置
WO2012175820A1 (fr) * 2011-06-20 2012-12-27 Long Lasting Innovation - L2I Procede de determination de la concentration surfacique en molecules actives d'une surface d'un element actif et dispositif pour sa mise en œuvre
BR112015014361A2 (pt) * 2012-12-17 2017-07-11 Man Chung Wo Andrew conjunto de amostragem para amostragem de um espécime, módulo de microscópio aplicado para proporcionar uma imagem de uma amostra, e aparelho de microscópio
FR3039647B1 (fr) * 2015-07-31 2020-11-13 Commissariat Energie Atomique Procede d'analyse d'impuretes organiques presentes a la surface d'un substrat, et dispositif de collecte des impuretes organiques a la surface d'un substrat
SE540253C2 (en) * 2016-07-01 2018-05-15 Expertus Kemiteknik Ab Device for surface sampling with removal device
AU2018337036B2 (en) 2017-09-21 2023-07-06 Becton, Dickinson And Company Augmented reality devices for hazardous contaminant testing
EP3684511A4 (en) 2017-09-21 2021-06-23 Becton, Dickinson and Company HAZARDOUS CONTAMINANT TEST DEMARCATION TEMPLATE
CA3075773A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company Hazardous contaminant collection kit and rapid testing
CN111278987B (zh) 2017-09-21 2024-02-23 贝克顿·迪金森公司 以高拾取和脱落效率收集有害污染物的采样系统和技术
CN209400423U (zh) 2017-09-21 2019-09-17 贝克顿·迪金森公司 横向流测定物、测定物读取器装置和包括其的系统
WO2019060266A1 (en) * 2017-09-21 2019-03-28 Becton, Dickinson And Company REACTIVE DEMARCATION TEMPLATE FOR DANGEROUS CONTAMINANT TEST
WO2019060264A1 (en) 2017-09-21 2019-03-28 Becton, Dickinson And Company HAZARDOUS CONTAMINANT COLLECTION KIT AND FAST TEST
JP7479385B2 (ja) 2019-01-28 2024-05-08 ベクトン・ディキンソン・アンド・カンパニー 一体化されたスワブ及び検査デバイスを有する有害汚染物質採取デバイス
USD963489S1 (en) * 2020-12-12 2022-09-13 Hans Wyssen Air sampler

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5470493A (en) * 1977-11-17 1979-06-06 Nissan Chem Ind Ltd Preparation of unsaturated alcohol
JPS586290A (ja) * 1981-07-03 1983-01-13 Ebara Corp 曝気装置
GB2185571A (en) * 1986-01-10 1987-07-22 British Nuclear Fuels Plc Swabbing device
JPS636484A (ja) * 1986-06-26 1988-01-12 Toshiba Corp 揺動式スミヤヘツド
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
JPH08320315A (ja) * 1995-05-25 1996-12-03 Konica Corp 界面活性剤の検出方法及び界面活性剤検出用キット
JPH0915170A (ja) * 1995-06-29 1997-01-17 Hitachi Cable Ltd 粉末状物質付着量測定方法
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis
US6021681A (en) * 1997-06-27 2000-02-08 The United States Of America As Represented By The United States Department Of Energy Sampling device with a capped body and detachable handle
JP2002131196A (ja) * 2000-09-26 2002-05-09 General Electric Co <Ge> 表面の微粒子汚染物質を測定する装置

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2835246A (en) * 1954-12-22 1958-05-20 Boettger Paul Handling medical specimens
US3074276A (en) * 1959-04-20 1963-01-22 Walter S Moos Radioactivity smear sampler
US3091967A (en) * 1960-05-13 1963-06-04 William R Hurdlow Swipe sampler
US3572128A (en) 1969-06-13 1971-03-23 Wesley C L Hemeon Dustfall sampling apparatus
IT1056108B (it) 1975-09-04 1982-01-30 Cnen Dispositivo per il controllo indiretto della contaminazionne radioattiva di superfici
JPS6291842A (ja) * 1985-10-18 1987-04-27 Hitachi Ltd 清浄度評価法
US5084005A (en) * 1988-07-13 1992-01-28 Becton, Dickinson And Company Swab for collection of biological samples
KR100279510B1 (ko) * 1996-09-25 2001-02-01 이구택 스트립 표면의 오염도 측정장치
JPH10235658A (ja) * 1997-02-26 1998-09-08 Mitsuboshi Belting Ltd 樹脂材料の金型汚染性測定方法
US6397690B1 (en) * 2000-09-26 2002-06-04 General Electric Company Tools for measuring surface cleanliness

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5470493A (en) * 1977-11-17 1979-06-06 Nissan Chem Ind Ltd Preparation of unsaturated alcohol
JPS586290A (ja) * 1981-07-03 1983-01-13 Ebara Corp 曝気装置
GB2185571A (en) * 1986-01-10 1987-07-22 British Nuclear Fuels Plc Swabbing device
JPS636484A (ja) * 1986-06-26 1988-01-12 Toshiba Corp 揺動式スミヤヘツド
US5373748A (en) * 1992-09-22 1994-12-20 University Of Medicine And Dentistry Of New Jersey Wipe template sampler
JPH08320315A (ja) * 1995-05-25 1996-12-03 Konica Corp 界面活性剤の検出方法及び界面活性剤検出用キット
JPH0915170A (ja) * 1995-06-29 1997-01-17 Hitachi Cable Ltd 粉末状物質付着量測定方法
US5859375A (en) * 1996-04-03 1999-01-12 Barringer Research Limited Apparatus for and method of collecting trace samples for analysis
US6021681A (en) * 1997-06-27 2000-02-08 The United States Of America As Represented By The United States Department Of Energy Sampling device with a capped body and detachable handle
JP2002131196A (ja) * 2000-09-26 2002-05-09 General Electric Co <Ge> 表面の微粒子汚染物質を測定する装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009053189A (ja) * 2007-08-10 2009-03-12 Tongfang Nuctech Co Ltd 試料採取用スワイプの変形を防止する携帯型試料採取装置および試料を採取する方法
JP2016070861A (ja) * 2014-10-01 2016-05-09 三浦工業株式会社 試料採取ペン
JP2020173146A (ja) * 2019-04-10 2020-10-22 株式会社エルメックス 拭き取り枠
JP7182787B2 (ja) 2019-04-10 2022-12-05 株式会社エルメックス 拭き取り枠

Also Published As

Publication number Publication date
EP1191323A3 (en) 2004-05-19
EP1191323A2 (en) 2002-03-27
CZ20011861A3 (cs) 2002-05-15
KR100779279B1 (ko) 2007-11-23
KR20020024769A (ko) 2002-04-01
US20020035869A1 (en) 2002-03-28
US6378386B1 (en) 2002-04-30
US6397690B1 (en) 2002-06-04

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